IEEE 1293 CORR 1-2008 en Standard Specification Format Guide and Test Procedure for Linear Single-Axis Nongyroscopic Accelerometers Corrigendum 1 Changes to Ann.pdf
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1、IEEE Std 1293-1998/Cor 1-2008(Corrigendum toIEEE Std 1293-1998)IEEE Standard Specification Format Guide and Test Procedure for Linear, Single-Axis, Nongyroscopic AccelerometersCorrigendum 1: Changes to Annex K and Annex L IEEE3 Park Avenue New York, NY 10016-5997, USA25 November 2008IEEE Aerospace a
2、nd Electronic Systems SocietySponsored by theGyro and Accelerometer Panel 1293TM-1998/Cor 1-2008IEEE Std 1293-1998/Cor 1-2008 (Corrigendum to IEEE Std 1293-1998) IEEE Standard Specification Format Guide and Test Procedure for Linear, Single-Axis, Nongyroscopic Accelerometers Corrigendum 1: Changes t
3、o Annex K and Annex L Sponsor Gyro and Accelerometer Panel of the IEEE Aerospace and Electronic Systems Society Approved 26 September 2008 IEEE-SA Standards Board Abstract: Specification and test requirements for linear, single-axis, nongyroscopic accelerometers for use as a sensor in attitude contr
4、ol systems, linear displacement measuring systems, and linear rate measuring systems are defined. The specification format guide and test procedure standard applies to force-rebalance accelerometers (pendulous or translational proof mass), vibrating beam accelerometers (VBAs), and micromechanical ac
5、celerometers that range from lesser accuracy to high accuracy devices. Keywords: accelerometers, force-rebalance mode, inertial instrument, inertial sensor, MEMS, MEMS gyro, micro-electro-mechanical system, nongyroscopic accelerometers, open loop mode, ratiometric output, VBA The Institute of Electr
6、ical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2008 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 25 November 2008. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +
7、1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2008 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1293-1998/Cor1-2008, IEEE Standar
8、d Specification Format Guide and Test Procedure for Linear, Single-Axis, Nongyroscopic Accelerometers, Corrigendum 1: Changes to Annex K and Annex L. This is the first corrigendum to IEEE Std 1293-1998. Notice to users Laws and regulations Users of these documents should consult all applicable laws
9、and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards,
10、 intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and
11、 regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEE
12、E documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current
13、 edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site
14、at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA Web site at http:/standards.ieee.org. Errata Errata, if any, for this and all o
15、ther standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. v Copyright 2008 IEEE. All rights reserved. Interpretations Current interpretations can be accessed at the following U
16、RL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validit
17、y of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in co
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