IEEE 1122-1998 en Standard for Digital Recorders for Measurements in High-Voltage Impulse Tests《高电压脉冲测试中测量用数字记录器》.pdf

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1、The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1998 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1998. Printed in the United States of America.ISBN 0-7381-0197-4No part of this pub

2、lication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 1122-1998 (R2007)(Revision ofIEEE Std 1122-1987)IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse TestsSponsorPower System

3、s Instrumentation and Measurement Committeeof theIEEE Power Engineering SocietyReaffirmed 26 September 2007Approved 19 March 1998IEEE-SA Standards BoardAbstract: This standard defines the terms specifically related to the digital recorders used formonitoring high-voltage and high-current impulse tes

4、ts, specifies the necessary performancecharacteristics for such digital recorders to ensure their compliance with the requirements for high-voltage and high-current impulse tests, and describes the tests and procedures that are necessaryto show that these performance characteristics are within the s

5、pecified limits.Keywords: digital oscilloscope, digital recorder, digitizer, high-impulse current, high-impulse volt-age, impulse testsIEEE Standardsdocuments are developed within the IEEE Societies and the Standards Coordinat-ing Committees of the IEEE Standards Association (IEEE-SA) Standards Boar

6、d. Members of thecommittees serve voluntarily and without compensation. They are not necessarily members of theInstitute. The standards developed within IEEE represent a consensus of the broad expertise on thesubject within the Institute as well as those activities outside of IEEE that have expresse

7、d an inter-est in participating in the development of the standard.Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not implythat there are no other ways to produce, test, measure, purchase, market, or provide other goods andservices related to the scope of the IEE

8、E Standard. Furthermore, the viewpoint expressed at thetime a standard is approved and issued is subject to change brought about through developments inthe state of the art and comments received from users of the standard. Every IEEE Standard is sub-jected to review at least every five years for rev

9、ision or reaffirmation. When a document is morethan five years old and has not been reaffirmed, it is reasonable to conclude that its contents,although still of some value, do not wholly reflect the present state of the art. Users are cautioned tocheck to determine that they have the latest edition

10、of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, regardless ofmembership affiliation with IEEE. Suggestions for changes in documents should be in the form of aproposed change of text, together with appropriate supporting comments.Interpretations: Oc

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13、 except in those cases where the matter has previously received formalconsideration. Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE-SA Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy portions of any indivi

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15、od Drive, Danvers, MA 01923 USA;(978) 750-8400. Permission to photocopy portions of any individual standard for educational class-room use can also be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard mayrequire use of s

16、ubject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be required by an IEEE standard or for

17、conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.Copyright 1998 IEEE. All rights reserved.iiiIntroduction(This introduction is not part of IEEE Std 1122-1998, IEEE Standard for Digital Recorders for Measurements in High-Voltage Impulse Tests.)Th

18、e first edition of this standard was published in 1987. The International Electrotechnical Commission(IEC) published an equivalent standard in 1991, IEC 1083-1, Digital recorders for measurements in high-voltage impulse testsPart 1: Requirements for digital recorders.From the outset there has been c

19、loseliaison between the two working groups and it was agreed that each working group would try to provide itsparent organization with documents that were substantially and technically the same. Liaison has beenmaintained with Technical Committee 10 (TC 10) of the IEEE Instrumentation and Measurement

20、 Society,Waveform Measurement and Analysis. This edition of the standard incorporates comments and theresponses to questions that have been received by the working group since 1987.This standard states the performance requirements for an impulse digitizer and the tests necessary to verifythat these

21、performance requirements have been met. When an impulse digitizer is used and maintained inaccordance with this standard it will meet the accuracy requirements specified in IEEE Std 4-1995.This standard was developed by the P1122 Working Group of the Digital Techniques in Electrical Measure-ments Su

22、bcommittee of the Power Systems Instrumentation and Measurement Committee of the IEEEPower Engineering Society.The P1122 Working Group had the following members:T. R. McComb,ChairThis standard was sponsored by the Power Systems Instrumentation and Measurement Committee, whichalso served as the ballo

23、ting committee that approved this document for submission to the IEEE StandardsBoard. The following persons were voting members of the balloting committee:J. Kuffel, ChairS. M. Benda-BerlijnJ. CsomayK. FeserG. J. FitzpatrickE. GockenbachS. GrzybowskiE. HaniqueJ. KuffelW. LarzelereA. LuxR. MalewskiJ.

24、 McBrideA. MoldenG. RizziG. SchneiderK. SchonY. ZhangJ. M. BelangerJ. A. BraunJ. M. CarrL. CoffeenS. W. CramptonV. DaGrosaG. J. FitzpatrickE. HaniqueR. E. HebnerR. HopkinsH. KirkhamJ. A. KiseS. R. KnudsenW. LarzelereD. W. LenkD. McAuliffJ. McBrideT. R. McCombH. M. MillicanJ. H. MoranO. PetersonsR. R

25、eidP. H. ReynoldsR. L. RichardsonH. M. SchneiderJ. C. SmithE. SoG. E. StemlerD. TrainR. S. TurgelC. F. Von HerrmannB. H. WardivCopyright 1998 IEEE. All rights reserved.When the IEEE-SA Standards Board approved this standard on 19 March 1998, it had the followingmembership:Richard J. Holleman,ChairDo

26、nald N. Heirman,Vice ChairJudith Gorman,Secretary*Member EmeritusValerie E. ZelentyIEEE Standards Project EditorSatish K. AggarwalClyde R. CampJames T. CarloGary R. EngmannHarold E. EpsteinJay Forster*Thomas F. GarrityRuben D. GarzonJames H. GurneyJim D. IsaakLowell G. JohnsonRobert KennellyE. G. “A

27、l” KienerJoseph L. Koepfinger*Stephen R. LambertJim LogothetisDonald C. LoughryL. Bruce McClungLouis-Franois PauRonald C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonHans E. WeinrichDonald W. ZipseCopyright 1998 IEEE. All rights reserved.vContents1. Scope 12. References 13. Definitions 24

28、. Conditions of use . 64.1 Range of operating conditions . 64.2 Reference conditions 65. Analysis of the impulse waveform 65.1 General. 65.2 Equivalent oscillogram method . 65.3 Procedures for reading digital records . 76. Accuracy requirements for impulse measurements . 86.1 Limits on overall uncer

29、tainty. 86.2 Limits on individual uncertainties . 86.3 Input impedance. 117. Acceptance tests. 117.1 Differential nonlinearity (impulse conditions). 117.2 Internal noise level. 117.3 Rise time 117.4 Interference test 117.5 Ripple. 127.6 Integral nonlinearity. 128. Performance tests. 128.1 Pulse cali

30、bration. 128.2 Alternative method. 139. Performance checks . 149.1 General. 149.2 Pulse calibration. 159.3 Alternative check . 1510. Record of performance 15Annex A (informative) Bibliography 16Copyright 1998 IEEE. All rights reserved.1IEEE Standard for Digital Recorders for Measurements in High-Vol

31、tage Impulse Tests1. ScopeThis standard is applicable to digital recorders and digital oscilloscopes used for measurements during testswith high-impulse voltages and high-impulse currents. It covers the measuring characteristics and calibra-tions required to meet the measuring accuracy specified in

32、IEEE Std 4-1995 and IEEE Std C57.98-1993B10.1The characteristics of general-purpose digital recorders are covered in IEEE Std 1057-1994 B9. Generalmethods of pulse measurement are covered in IEC 60469-1 (1987-12) B4 and IEC 60469-2 (1987-12)B5.This standarda) Defines the terms specifically related t

33、o the digital recorders used for monitoring high-voltage andhigh-current impulse tests;b) Specifies the necessary performance characteristics for such digital recorders to ensure their compli-ance with the requirements for high-voltage and high-current impulse tests;c) Describes the tests and proced

34、ures that are necessary to show that these performance characteristicsare within the specified limits.2. ReferencesThis standard shall be used in conjunction with the following publication:IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing.21The numbers in brackets correspond to thos

35、e of the bibliography in Annex A.2IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway,NJ 08855-1331, USA.IEEEStd 1122-1998 IEEE STANDARD FOR DIGITAL RECORDERS FOR2Copyright 1998 IEEE. All rights reserved.3. Definitions3

36、.1 actual resolution (ra):The logarithm to base 2 of the (maximum value used, , minus the value cor-responding to the baseline, )/(the standard deviation of the noise, times ).NOTEThe rated resolution is the maximum resolution that could be achieved when measuring an impulse whosepeak-value is equal

37、 to the full-scale range and when there is no reduction in the effective resolution caused by non-idealbehavior of the digital recorder. Reductions in resolution caused by using less than full-scale deflection can be quantified(e.g., an 8-bit recorder has a rated resolution of 1 in 256). The resolut

38、ion used to record an impulse is approximately 1 in(maximum value minus minimum value). For a (maximum minus minimum) value of 198 the number of bits is reducedto 7.63 (0.37 lost bits) while for a value of 98 the number of bits is equivalent to 6.61 (1.39 lost bits). The resolution isalso reduced by

39、 noise and the total reduction in resolution gives an actual resolution which is the logarithm to base 2 ofthe (maximum value minus minimum value)/(the standard deviation of the noise times ); see equation 97 of IEEEStd 1057-1994 B9.3.2 automatically processed data:The data available from the digiti

40、zer when some processing functioncannot be avoided.3.3 average code bin width (Wo):The product of the full-scale value and the rated resolution.NOTEThe average code bin width is equal to the static scale factor.3.4 code bin width of code k (Wk):The range of input voltage allocated to code k (see Fig

41、ure 1).VmaxVbsn12ralog2nmaxnbsn12-=12Figure 1Quantization characteristic of an ideal 3-bit digitizerCode transition thresholds (T2and T3), a code bin width (W3=Wo), nominal voltage (Pi) of each code and the straight line joining the mid-points of the code binsIEEEMEASUREMENTS IN HIGH-VOLTAGE IMPULSE

42、 TESTS Std 1122-1998Copyright 1998 IEEE. All rights reserved.33.5 code k:An integer between 1 and 2N(or between 0 and 2N-1) where Nis the number of bits.3.6 differential nonlinearity (DNL):The difference between a measured code bin width and the averagecode bin width, divided by the average code bin

43、 width (see Figure 2).3.7 digital recorder for measurements in high-voltage impulse tests (impulse digitizer):An instrumentthat can make a temporary digital record of a scaled high-voltage or high-current impulse and can convertthis temporary digital record to a permanent record (either analog or di

44、gital).NOTEAn impulse digitizer contains an analog-to-digital converter, memory, and a timing circuit (a high-frequencyclock and/or an analog sweep). It may be equipped with attenuators, amplifiers, display, output interface ports, and/or acontroller. It has a permanent recording device (e.g., disc

45、drive, digital cassette recorder, bubble memory, plotter, printer,and/or camera). It is protected against electromagnetic interference.3.8 full-scale value (Dfs):The largest value of the actuating electrical quantity that can be indicated on thescale or, in the case of instruments having their zero

46、between the ends of the scale, the full-scale value is thearithmetic sum of the values of the actuating electrical quantity corresponding to the two ends of the scale.NOTEFor an impulse digitizer, the full-scale value is given by the minimum voltage that produces a change in the out-put correspondin

47、g to 2N.3.9 integral nonlinearity of the time-base:The difference between a known time interval and its measuredvalue determined from the record as the product of the sample interval and the corresponding number (notnecessarily integer) of samples.Figure 2Differential nonlinearity (DNL) for direct v

48、oltageCurve I, quantization characteristic of an ideal 3-bit digitizer; Curve II, quantization charac-teristic of a 3-bit digitizer with levels 2, 3, and 4 showing large DNLIEEEStd 1122-1998 IEEE STANDARD FOR DIGITAL RECORDERS FOR4Copyright 1998 IEEE. All rights reserved.3.10 notation:For raw data,

49、each sample in the record of samples is denoted Aiwhere igives the position ofthe sample in the record and Airepresents the value. These values may be available as integers (e.g,. 231),values scaled by the instrument scale factor (e.g., 8.34 V), values scaled by the instrument scale factorincluding attenuators (e.g., 2.12 kV), or values scaled by the scale factor of the measuring system (e.g.,1.05 MV or 2.37 kA). The entire record of raw data is denoted by A.Processed records are denoted by B, C,D,etc.3.11 offset:The output fo