ANSI IEEE C57 12 58-1991 Guide for Conducting a Transient Voltage Analysis of a Dry-Type Transformer Coil《干式变压器线圈瞬态电压分析指南》.pdf

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1、Copyright 1998 IEEE All Rights Reserved 1Recognized as an American National Standard (ANSI) IEEE C57.12.58-1991 (R2008) IEEE Guide for Conducting a Transient Voltage Analysis of a Dry-Type Transformer CoilSponsorTransformers Committeeof theIEEE Power Engineering SocietyApproved 27 June 1991Reaffirme

2、d 25 September 2008IEEE Standards BoardApproved 11 October 1991Reaffirmed 6 February 1997American National Standards InstituteAbstract: General recommendations for measuring voltage transients in dry-type distribution and powertransformers are provide. Recurrent surge voltage generator circuitry, in

3、strumentation, test sample, testpoint location, mounting the test coil, conducting the test, and reporting results are covered.The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1991 by the Institute of Electrical and Electronics En

4、gineers, Inc.All rights reserved. Published 1991. Printed in the United States of AmericaISBN 1-55937-158-7No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without theprior written permission of the publisher.Authorized licensed use limited t

5、o: IHS Stephanie Dejesus. Downloaded on February 17, 2009 at 15:48 from IEEE Xplore. Restrictions apply.iiIEEE Standards documents are developed within the Technical Committees of the IEEE Societies and the StandardsCoordinating Committees of the IEEE Standards Board. Members of the committees serve

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13、 consideration.Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAIEEE Standards documents are adopted by the Institute of Electrical and Electronics Engineers without regard towhether the

14、ir adoption may involve patents on articles, materials, or processes. Such adoption does not assumeany liability to any patent owner, nor does it assume any obligation whatever to parties adopting the standardsdocuments.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on Februar

15、y 17, 2009 at 15:48 from IEEE Xplore. Restrictions apply.iiiForeword(This Foreword is not a part of IEEE C57.12.58-1991, IEEE Guide for Conducting a Transient Voltage Analysis of a Dry-TypeTransformer Coil.)This guide covers general recommendations for measuring voltage transients in dry-type distri

16、bution and powertransformers.Insulation is recognized as one of the most important constructional elements of a transformer. Its chief function is toconfine the current to useful paths, preventing its flow into harmful channels. Any weakness of insulation may resultin the failure of the transformer.

17、 Dielectric strength is a measure of the effectiveness with which insulation performs.It was once accepted that low-frequency tests alone were adequate to demonstrate the dielectric strength oftransformers. As more became known about lightning phenomena, and as impulse-testing apparatus was develope

18、d, itbecame apparent that the distribution of impulse voltage stress through the transformer winding varies with theconfiguration of the windings.Impulse voltages are distributed initially on the basis of winding capacitances. If this initial distribution differs fromthe final low-frequency inductan

19、ce distribution, the impulse energy will oscillate between the two distributions untilthe energy is dissipated and the inductance distribution is reached. In severe cases, these internal oscillations canproduce voltages to ground that approach twice the applied voltage. Along with the variation in s

20、ize of transformerwindings and the physical configuration of the windings, the impulse voltage distribution when chopping the appliedwave was considered by the task force that developed this guide. Since there was insufficient information on how tointerpret the short-time oscillations on the insulat

21、ion system, the inclusion of the chopped wave was deferred until alater date.The Dry-Type Dielectric Working Group was formed by the Transformers Committee of the IEEE Power EngineeringSociety to determine standard methods for examining the impulse voltage distribution within dry-type transformerwin

22、dings; to establish a means for defining the location and magnitude of maximum voltage stress in a dry-typetransformer coil; and to support other committee activities, such as the Thermal Evaluation Working Group(C57.12.56).At the time that this standard was completed, the Dry-Type Dielectric Workin

23、g Group had the following membership:A D. Kline, Chair B. F. AllenR. BancroftD. A. BarnardA. BimbirisM. CambreO. R. ComptonJ. FrankR. E. GearhartR. HayesR. H. HollisterJ. W. HuppA. M. IversonA. J. JonnattiS. P. KennedyE. LoenigM. L. ManningR. A. MarekM. I. MitelmanJ. J. NayW. F. PatersonR. I. Provos

24、tJ. RoddenV. ThenappanR. E. Uptegraff, Jr.G. H. VaillancourtH. J. WindischAt the time that it balloted and approved this standard for submission to the IEEE Standards Board, the TransformersCommittee of the IEEE Power Engineering Society had the following membership:E. J. AdolphsonL. C. Aicher*D. J.

25、 AllanB. AllenR. AllustiartiM. S. AltmanJ. C. ArnoldJ. AubinR. BancroftD. BarnardD. L. BaselP. L. Bellaschi*S. Bennon*W. B. BinderJ. V. BonucchiJ. D. BorstC. V. BrownO. R. ComptonAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 17, 2009 at 15:48 from IEEE Xplore. Res

26、trictions apply.ivF. W. CookJ. L. CorkranD. W. CroftsJ. N. DavisD. H. DouglasR. F. DudleyJ. C. Dutton*J. K Easley*J. A. EbertF. E. ElliottD. J. FallonH. G. FischerS. L. Foster*M. FrydmanH. E. Gabel*R. E. GearhartD. W. GerlachD. A. GilliesR. S. GirgisR. L. GrubbF. J. GryszkiewiczG. HallJ. H. HarlowF.

27、 W. HeinrichsW. R. HenningK. R. HightonP. J. HoeflerC. HoeselR. H. HollisterC. C. Honey*E. HowellsY. P. IijimaG. W. Iliff*D. C. Johnson*D. L. JohnsonA. J. JonnattiC. P. KappelerR. B. Kaufman*J. J. KellyW. N. KennedyJ. P. KinneyA. D. KlineE. KoeningJ. G. LackeyR. E. LeeH. F. LightL. W. Long*L. A. Low

28、dermilkR. I. LoweH. B. Margolis*T. MassoudaJ. W. MatthewsJ. McGillC. J. McMillenW. J. McNuttS. P. MehtaC. K. MillerC. H. MillianR. E. MinkwitzM. MitelmanH. R. MooreR. J. MusilW. H. MutschlerE. T. NortonR. A. Olsson*P. E. OrehekB. K. PatelW. F. PattersonH. A. PearceD. PercoL. W. PierceJ. M. PollittC.

29、 P. RaymondC. A. RobbinsW. P. SampatL. J. SavioW. E. SaxonD. N. SharmaV. ShenoyL. R. SmithW. W. SteinL. R. StenslandF. StevensD. SundinL. A. SwensonD. S. TakachA. L. TantonV. ThenappanR. C. Thomas*J. A. ThompsonT. P. TraubD. E. TruaxW. B. UhlR. E. Uptegraff, Jr.G. H. VaillancourtR. A. VeitchL. B. Wa

30、genaarR. J. WheartyA. L. WilksJ. G. WoodW. E. WrennA. C. Wurdack*Member EmeritusThe Accredited Standards Committee on Transformers, Regulators, and Reactors, C57, that reviewed and approvedthis document, had the following members at the time of approval:Leo J. Savio, Chair John A. Gauthier, Secretar

31、y Organization Represented. Name of RepresentativeElectric Light and Power Group . P. E. OrehekS. M. A. RizviF. StevensJ. SullivanJ. C. ThompsonM. C. Mingoia (Alt.)Institute of Electrical and Electronics Engineers J. D. BorstJ. DavisJ. H. HarlowL. SavioH. D. SmithR. A. VeitchAuthorized licensed use

32、limited to: IHS Stephanie Dejesus. Downloaded on February 17, 2009 at 15:48 from IEEE Xplore. Restrictions apply.vNational Electrical Manufacturers Association G. D. CoulterP. DeweverJ. D. DouglasA. A. GhafourianK. R. LinsleyR. L. PlasterH. RobinR. E. Uptegraff, Jr.P. J. Hopkinson (Alt.)J. Nay (Alt.

33、)Tennessee Valley Authority. F. A. LewisUnderwriters Laboratories, Inc. W. T. OGradyUS Department of Agriculture, REA J. BohlkUS Department of Energy, Western Area Power Administration . D. R. TorgersonUS Department of the Interior, Bureau of Reclamation F. W. Cook, Sr.US Department of the Navy, Civ

34、il Engineering Corps . H. P. StickleyWhen the IEEE Standards Board approved this standard on June 27, 1991, it had the following membership:Marco W. Migliaro, Chair Donald C. Loughry, Vice Chair Andrew G. Salem, Secretary Dennis BodsonPaul L. BorrillClyde CampJames M. DalyDonald C. FleckensteinJay F

35、orster*David F. FranklinIngrid FrommThomas L. HannanDonald N. HeirmanKenneth D. HendrixJohn W. HorchBen C. JohnsonIvor N. KnightJoseph L. Koepfinger*Irving KolodnyMichael A. LawlerJohn E. May, Jr.Lawrence V. McCallDonald T. Michael*Stig L. NilssonJohn L. RankineRonald H. ReimerGary S. RobinsonTerran

36、ce R. Whittemore*Member EmeritusAdam SickerIEEE Standards Project EditorAuthorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 17, 2009 at 15:48 from IEEE Xplore. Restrictions apply.viCLAUSE PAGE1. General 11.1 Functional Diagram 11.2 Recurrent Surge Generator. 11.3 Voltag

37、e Measurement 22. Recurrent Surge Voltage Generator Circuitry 22.1 Description of the Circuit. 22.2 Selection of Element Values 33. Instrumentation .63.1 General. 63.2 Frequency Response 63.3 Common-Mode Rejection 73.4 Grounding Practice 84. Test Sample.94.1 Sample Description 94.2 Description of Tr

38、ansient Phenomena. 94.3 Test Leads 95. Test Point Locations95.1 General. 95.2 Pancake-Type (Disc-Type) Coils. 95.3 Layer-Wound Coils 105.4 End Turns. 115.5 Additional Test Points 116. Mounting the Test Coil .127. Conducting the Test 127.1 Test Coil. 127.2 Surge Generator . 127.3 Voltage Measurements

39、. 128. Reporting Results139. Bibliography13Annex A (informative) Solution of Decay Rate of Surge Generator14Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 17, 2009 at 15:48 from IEEE Xplore. Restrictions apply.Copyright 1991 IEEE All Rights Reserved 1IEEE Guide for

40、 Conducting a Transient Voltage Analysis of a Dry-Type Transformer Coil1. General1.1 Functional DiagramSince the function of transient analysis is to determine the response of various parts of the coil to an impulse wave, thecircuitry and instrumentation must be designed with that goal in mind. From

41、 a functional point of view, therelationship between the test specimen, circuitry, and instrumentation may be seen best in the form of a block diagram,as shown in Fig 1.Figure 1 Block Diagram of Transient Analysis System1.2 Recurrent Surge GeneratorThe voltage-generation and wave-shaping functions a

42、re performed by a device called a recurrent surge generator. Thisgenerator must duplicate, at some voltage compatible with low-voltage instrumentation, the wave shapes seen at theoutput of an impulse generator. The surge generator, since it is operating at a low voltage, may generate the wave on are

43、current basis. In fact, observation of voltages on an oscilloscope face will be facilitated if the voltage wave isrecurrent.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on February 17, 2009 at 15:48 from IEEE Xplore. Restrictions apply.2 Copyright 1991 IEEE All Rights Reserv

44、edIEEE C57.12.58-1991 IEEE GUIDE FOR CONDUCTING A TRANSIENT VOLTAGE1.3 Voltage MeasurementThe voltage is applied across the test coil at the line terminals. Voltages between various points within the coil aremeasured with a high-frequency oscilloscope or other device using a differential amplifier a

45、nd probes at the input. Itis highly desirable that there be synchronization between the generator and the recording instrumentation. This may beaccomplished by either a delay in the signal or triggering in advance of the wave. This will ensure the establishmentof a zero reference point at the readou

46、t. Digital equipment may offer other synchronization methods.2. Recurrent Surge Voltage Generator Circuitry2.1 Description of the CircuitThe circuitry is shown in Fig 2 in its simplest form to provide the function of voltage generation and wave shaping. Thevoltage is obtained from an ac source and i

47、s transformed to a desired level through a variable auto transformer andisolation transformer. Only the isolation transformer is shown in Fig 2. The peak output voltage is limited by thevoltage capability of the instrumentation and by ratings of the resistors and capacitors in the wave-shaping porti

48、on ofthe circuitry. The most practical range is between 50 and 150 V. The higher the voltage, the higher the accuracy. Therepetition rate of the wave may be the ac power frequency.Figure 2 Schematic of Wave Generation and Shaping CircuitThe generator capacitor, C1, is charged during the positive hal

49、f-cycle through the diode, D1. The diode must be ratedso that it will hold off twice the transformer output voltage during the negative half-cycle. The diode must also becapable of carrying the maximum charging current.The actual pulse generation is performed by the capacitor, C1, and the switch, SW1. The switch is closedsynchronously with the power frequency. This should occur during the negative half-cycle, when the diode, D1 isblocking. The switch may take different forms, such as a thyratron, ac-driven mercury-wetted switches, and an SCR Itis important that there be no b