ANSI IEEE C37 90 2-2004 Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers《中继系统对无线电收发机辐射电磁干扰的抵抗能力标准》.pdf
《ANSI IEEE C37 90 2-2004 Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers《中继系统对无线电收发机辐射电磁干扰的抵抗能力标准》.pdf》由会员分享,可在线阅读,更多相关《ANSI IEEE C37 90 2-2004 Withstand Capability of Relay Systems to Radiated Electromagnetic Interference from Transceivers《中继系统对无线电收发机辐射电磁干扰的抵抗能力标准》.pdf(18页珍藏版)》请在麦多课文档分享上搜索。
1、IEEE Std C37.90.2-2004(Revision ofIEEE Std C37.90.2-1995)IEEE StandardsC37.90.2TMIEEE Standard for Withstand Capability ofRelay Systems to Radiated ElectromagneticInterference from Transceivers3 Park Avenue, New York, NY 10016-5997, USAIEEE Power Engineering SocietySponsored by thePower Systems Rela
2、ying CommitteeIEEE Standards17 December 2004Print: SH95285PDF: SS95285Recognized as anAmerican National Standard (ANSI)The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2004 by the Institute of Electrical and Electronics Engineers, Inc.Al
3、l rights reserved. Published 17 December 2004. Printed in the United States of America.IEEE is a registered trademark in the U.S. Patent (978) 750-8400. Permission to photocopy portions of any individual standard for educationalclassroom use can also be obtained through the Copyright Clearance Cente
4、r.Note: Attention is called to the possibility that implementation of this standard may require use of subject mat-ter covered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall
5、 not be responsible for identifying patentsfor which a license may be required by an IEEE standard or for conducting inquiries into the legal validity orscope of those patents that are brought to its attention.Copyright 2004 IEEE. All rights reserved. iiiIntroductionIEEE Standard for Withstand Capab
6、ility of Relay Systems to Radiated Electromagnetic Interference fromTransceivers was developed and published initially as a Trial Use Standard with an field strengthrequirement of 10 volts/meter over the frequency range of 25 Mhz. to 1000 Mhz. The Trial Use standardexpired after 2 years of publicati
7、on. Following reviews of inputs received from use of the Trial UseStandard, the final C37.90.2 document was subsequently released with a field strength requirement of 35volts/meter. This field strength magnitude was established based upon test information received from theWorking Group members.This
8、publication is a revision of the IEEE Std C37.90.2-1995. This revision of IEEE Std C37.90.2 containschanges so it will harmonize more closely with currently published IEC standards whenever possible. Thetest requirement changes are as described below.a) The minimum test frequency of the sweep range
9、has been changed from 25 Mhz to 80 Mhz, which isthe same as IEC 60255-22-3 B1. b) The maximum sweep rate was changed from 0.005 octave/sec. to 1.5 103decades per second,which is the same as IEC 60255-22-3 B1.c) Added a Spot Frequency test, as specified in IEC 60255-22-3 B1.Notice to usersErrataErrat
10、a, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata periodically.InterpretationsCurrent interpretations can be accessed at the following URL: http:/standard
11、s.ieee.org/reading/ieee/interp/index.html.PatentsAttention is called to the possibility that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights
12、in connection therewith. The IEEE shall not be responsible for identifyingpatents or patent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are brought to its attention.(This introduction
13、 is not part of IEEE Std C37.90.2-2004, IEEE Standard for Withstand Capability of Relay Systems toRadiated Electromagnetic Interference from Transceivers.)iv Copyright 2004 IEEE. All rights reserved.ParticipantsThis standard was prepared by the I18 Working Group of the Relaying Practices Subcommitte
14、e of the IEEEPower System Relaying Subcommittee. At the time this standard was approved, the working group had thefollowing members.Jeffrey A. Burnworth, ChairAt the time this standard was approved, the Relaying Practices and Consumers Interface Subcommitteemembership was as follows:J. Gilbert, Chai
15、rJeffrey GilbertWilliam HiginbothamG. JohnsonWilliam C. KotheimerRobert D. PettigrewRoger E. RayMiriam SandersMark SimonVeselin SkendzicJohn TengdinA. P. ApostolovM. BajpaiB. L. BeckwithJ. R. BoyleJeffrey A. BurnworthM. W. CarpenterJack Chadwick, Jr.M. ClarkM. W. ConroyC. DownsP. R. DrumI. O. Hasenw
16、inkleS. H. HorowitzJ. D. HuddlestonJ. W. InglesonM. KezunovicWilliam C. KotheimerP. A. KotosE. KritzauskasW. LoweW. J. Marsh, Jr.M. J. McDonaldP. J. MclarenM. MeisingerB. NelsonRobert D. PettigrewT. PhillippeeM. M. RenieriM. S. SachdevT. S. SidhuMark SimonL. E SmithJ. E. StephensR. SullivanMark Swan
17、sonJ. TeagueJ. S. ThorpD. A. TziouvarasE. A. UdrenY. YoungS. E. ZochollCopyright 2004 IEEE. All rights reserved. vThe following members of the individual balloting committee voted on this standard. Balloters may havevoted for approval, disapproval, or abstention. When the IEEE-SA Standards Board app
18、roved this standard on 24 September 2004, it had the followingmembership:Don Wright, ChairSteve M. Mills, Vice ChairJudith Gorman, Secretary*Member EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeRichard DeBlasio, DOE Represent
19、ativeAlan Cookson, NIST RepresentativeWilliam AckermanSteve AlexandersonMunnu BajpaiMichael BaslerKenneth BehrendtRobert BereshStuart BoucheyDaniel BrosnanGustavo BrunelloJohn BurgerJeffrey A. BurnworthJohn W. Chadwick, Jr.R DaubertByron DavenportMatthew DavisPaul DrumAmir El-SheikhWalter ElmoreGary
20、 EngmannKenneth FoderoMarcel FortinFrank GerleveJeffrey GilbertAnthony GiulianteRoger HeddingCharles HenvilleWilliam HiginbothamEdward Horgan, Jr.John HorwathJames D. Huddleston, IIIJoseph L KoepfingerWilliam KotheimerMarc LacroixJason LinWilliam LoweJohn McDonaldMark McGranaghanGary MichelBruce Mus
21、chlitzGerald NicelyMario RanieriPeter RaschioRoger E. RayMichael RobertsCharles RogersJames RuggieriMohindar S. SachdevMiriam SandersTarlochan SidhuH. Jin SimMark SimonH. Lee SmithJames SmithJohn TengdinRon WestfallKarl ZimmermanCharles WagnerChuck AdamsH. Stephen BergerMark D. BowmanJoseph A. Brude
22、rBob DavisRoberto de BoissonJulian Forster*Arnold M. GreenspanMark S. HalpinRaymond HapemanRichard J. HollemanRichard H. HulettLowell G. JohnsonJoseph L. Koepfinger*Hermann KochThomas J. McGeanDaleep C. MohlaPaul NikolichT. W. OlsenRonald C. PetersenGary S. RobinsonFrank StoneMalcolm V. ThadenDoug T
23、oppingJoe D. Watsonvi Copyright 2004 IEEE. All rights reserved.CONTENTS1. Overview 11.1 Scope 11.2 Purpose. 12. Definitions . 13. Test severity level 24. Test equipment. 25. Test set-up 36. Test procedure 36.1 Frequency sweep or step test . 46.2 Keying test . 46.3 Spot Frequency test 46.4 Criteria f
24、or acceptance . 57. Test records 6Annex A (informative) Transceiver field strength. 7Annex B (informative) Test Waveform specification . 8Annex C (informative) Field strength calibration, IEC 61000-4. 9Annex D (informative) Bibliography 11Copyright 2004 IEEE. All rights reserved. 1IEEE Standard for
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