IEC TR 62981-2017 Studies and comparisons of magnetic measurements on grain-oriented electrical steelsheet determined by the single sheet test method and Epstei.pdf
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1、 IEC TR 62981 Edition 1.0 2017-05 TECHNICAL REPORT Studies and comparisons of magnetic measurements on grain-oriented electrical steelsheet determined by the single sheet test method and Epstein test method IEC TR 62981:2017-05(en) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2017
2、 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Comm
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4、11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologi
5、es. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEC Catalogue - webstore.iec.ch/catalogue The stand-alone application for consulti
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7、ety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available
8、online and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing 20 000 terms and definitions in English and French, with equivalent terms in 16 additional languages. Also known as the International Electrot
9、echnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary 65 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002. Some entries have been collected from earlier publications of IEC TC 37, 77, 8
10、6 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. IEC TR 62981 Edition 1.0 2017-05 TECHNICAL REPORT Studies and comparisons of magnetic measurement
11、s on grain-oriented electrical steelsheet determined by the single sheet test method and Epstein test method INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 29.030 ISBN 978-2-8322-4332-9 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this pub
12、lication from an authorized distributor. colour inside 2 IEC TR 62981:2017 IEC 2017 CONTENTS FOREWORD . 4 1 Scope 6 2 Normative references 6 3 Terms and definitions 6 4 Background . 7 4.1 Historical background and former concepts of the SST-Epstein relationship 7 4.2 Establishing reference values fo
13、r grain-oriented electrical steels determined by independent SSTs A new approach to the purpose 8 5 Preliminary comparisons and experiments . 9 5.1 General . 9 5.2 Comparison of the relative difference P SE= (P SST P eps )/P Epsmeasured by steel manufacturers on their own products using own set-ups
14、10 5.3 Preliminary comparisons and experiments made by four Chinese laboratories using six SSTs with stacked yokes 11 5.4 Necessity of comparing independent SST results 13 6 International comparison of SST measurements on grain-oriented electrical steel and accompanying Epstein measurements 15 6.1 G
15、eneral conditions, samples, participants . 15 6.2 Circulation of the samples and measurement procedure . 16 6.3 Results and analysis of the measured quantities . 17 6.4 Conclusions of the international comparison . 30 7 Summary and conclusions . 31 Bibliography 32 Figure 1 Epstein frame and single s
16、heet tester, schematic view, windings partly omitted . 7 Figure 2 Relative difference P SE= 100 (P SST P EP ) / P EPversus peak magnetic polarization J measured by six contributors on samples of their own products . 10 Figure 3 Contact pattern for the measurement of lamination resistance in the air
17、gap of SST yokes 11 Figure 4 Ratio of the power loss P SSTto that of the SST with the best yokes, P SSTopt , versus lamination conductivity factor C Yof the yokes 12 Figure 5 Ratio of the power loss at 100 Hz to that at 40 Hz, P 100 /P 40 , at 1,7 T, versus lamination conductivity factor C Yof the y
18、okes 13 Figure 6 Relative difference P SE= 100(P SST P EP ) / P EPversus magnetic polarization . 14 Figure 7 Relative difference P SE= 100(P SST P EP ) / P EPat 1,7 T determined by three standard laboratories, IEN, NPL and PTB, on S- and P-type g.-o. sample pairs . 14 Figure 8 Dispersion of manufact
19、urers grain-oriented material production in form of Epstein samples (PTB 1999) . 15 Figure 9 Example of scattering of the laboratories best estimates around the reference value (CGO sample No. 2, unweighted average, dash-dotted line) 18 Figure 10 Example of scattering of the laboratories best estima
20、tes around the reference value (HGO sample No. 4, unweighted average, dash-dotted line) 19 Figure 11 Example of scattering of the laboratories best estimates around the reference value (HGO sample No. 5, unweighted average, dash-dotted line) 19 Figure 12 Samples No. 1 to No. 5: ratio of SST to Epste
21、in power loss reference values P SE (J p ) = ( ) / at 50 Hz versus peak polarization 20 IEC TR 62981:2017 IEC 2017 3 Figure 13 Overall dispersion (all labs, J pvalues, and samples) of the laboratories best estimates P iof the power loss at 50 Hz around their reference values . 23 Figure 14 Overall d
22、ispersion (all labs, J pvalues, and samples) of the laboratories best estimates S iof the apparent power at 50 Hz around their reference values, with and without outliers . 24 Figure 15 Dispersion around the reference value of the laboratories best values of the power loss P measured at 50 Hz by the
23、 Epstein and the SST methods at 1,7 T 25 Figure 16 Dispersion around the reference value of the laboratories best values of the apparent power S measured at 50 Hz by the Epstein and the SST methods at 1,7 T . 26 Figure 17 Overall dispersion (European metrological laboratories only, all J pvalues and
24、 samples) of the laboratories best estimates P iof the power loss at 50 Hz around their reference values, with and without outliers 27 Figure 18 Dispersion of the laboratories best estimates of SST (a) and Epstein (b) power loss at 50 Hz 28 Figure 19 Dispersion of the laboratories best estimates of
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