IEC 62802-2017 Measurement methods of a half-wavelength voltage and a chirp parameter for Mach-Zehnder optical modulators in high-frequency radio on fibre (RoF).pdf

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1、 IEC 62802 Edition 1.0 2017-07 INTERNATIONAL STANDARD Measurement methods of a half-wavelength voltage and a chirp parameter for Mach-Zehnder optical modulators in high-frequency radio on fibre (RoF) systems IEC 62802:2017-07(en) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2017 I

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10、and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. IEC 62802 Edition 1.0 2017-07 INTERNATIONAL STANDARD Measurement methods of a half-wavelength volta

11、ge and a chirp parameter for Mach-Zehnder optical modulators in high-frequency radio on fibre (RoF) systems INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 33.060.20; 33.180.99 ISBN 978-2-8322-4609-2 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obta

12、ined this publication from an authorized distributor. colour inside 2 IEC 62802:2017 IEC 2017 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 8 2 Normative references 8 3 Terms, definitions and abbreviated terms 8 3.1 Terms and definitions 8 3.2 Abbreviated terms . 10 4 Electro-optic material-based M

13、ach-Zehnder optical modulators . 10 4.1 Mach-Zehnder optical modulators . 10 4.1.1 Component parts . 10 4.1.2 Structure . 10 4.2 Requirements for MZMs 11 4.2.1 General . 11 4.2.2 Substrate material . 11 4.2.3 Optical waveguide design 11 5 Sampling for quality control . 11 5.1 Sampling. 11 5.2 Sampli

14、ng frequency 11 6 Measurement method of a half wavelength voltage 11 6.1 Circuit diagram . 11 6.2 Measurement conditions . 12 6.2.1 Temperature and environment . 12 6.2.2 Warming-up of measurement equipment 12 6.3 Principle of measurement method . 13 6.3.1 General . 13 6.3.2 Mathematical expressions

15、 of basic measurement principle 13 6.3.3 Principle of half-wavelength voltage and chirp parameter with fixed DC-bias condition (method A) 14 6.3.4 Principle of half-wavelength voltage and chirp parameter using DC-bias sweep (method B) 14 6.3.5 Principle of half-wavelength voltage and chirp parameter

16、 using minimum transmission bias and maximum transmission bias (method C) 15 6.4 Measurement procedure . 15 6.4.1 Method A . 15 6.4.2 Method B . 16 6.4.3 Method C . 16 Annex A (informative) Measurement methods for parallel integrated Mach-Zehnder modulators 18 A.1 General . 18 A.2 Examples 18 A.2.1

17、Quad parallel Mach-Zehnder modulators . 18 A.2.2 Dual parallel Mach-Zehnder modulators with four RF electrodes 20 Bibliography 22 Figure 1 Transfer curve of a Mach-Zehnder optical modulator 9 Figure 2 Optical phase retardations . 10 IEC 62802:2017 IEC 2017 3 Figure 3 Circuit diagram . 12 Figure A.1

18、Optical sideband generation from a sub-MZM element in a parallel MZM 19 Figure A.2 Halfwave voltages of sub-MZMs of a quad parallel MZM . 19 Figure A.3 Chirp parameters of sub-MZMs of a quad parallel MZM 20 Figure A.4 Structure of dual parallel Mach-Zehnder modulators with four RF electrodes 20 4 IE

19、C 62802:2017 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT METHODS OF A HALF-WAVELENGTH VOLTAGE AND A CHIRP PARAMETER FOR MACH-ZEHNDER OPTICAL MODULATORS IN HIGH-FREQUENCY RADIO ON FIBRE (ROF) SYSTEMS FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide o

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30、nt rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62802 has been prepared by IEC technical committee 103: Transmitting equipment for radiocommunication. The text of this International Standard is based on the following documents: C

31、DV Report on voting 103/131/CDV 103/161/RVC Full information on the voting for the approval of this International Standard can be found in the report on voting indicated in the above table. This document has been drafted in accordance with the ISO/IEC Directives, Part 2. IEC 62802:2017 IEC 2017 5 Th

32、e committee has decided that the contents of this document will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific document. At this date, the document will be reconfirmed, withdrawn, replaced by a revised edition,

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34、this document using a colour printer. 6 IEC 62802:2017 IEC 2017 INTRODUCTION A variety of microwave/millimeter-wave-photonic devices are useful for wireless communication and broadcasting systems. An optical modulator is an interface which converts an electronic signal to an optical signal. In the f

35、ield of optical fibre communication systems, the IEC 62007 series was published in 1999. Microwave/millimeter-wave RoF systems are comprised mainly of two parts: one is RF to photonic converter (E/O), and the other is photonic to RF converter (O/E). Radio waves are converted into an optical signal a

36、t E/O. This signal is transferred through the optical fibre and then the radio waves are regenerated at O/E. A variety of photonic devices that carry microwave and millimeter-wave signals as subcarrier frequencies are used for high-frequency RoF systems. In particular, the Mach-Zehnder optical modul

37、ator (MZM) plays an important role to convert electronic (high-frequency above millimeter-wave) signal to optical signal. In high-frequency RoF systems, specifications of drive voltages, chirp characteristics, inter-modulation distortion of the modulators have been the important technical parameters

38、. This document is prepared to provide the measurement method of MZMs to the industry for evaluating electro-optic material of the modulators to be used in high-frequency RoF systems. This document defines the measurement methods of a half-wavelength voltage and a chirp parameter, which have a signi

39、ficant impact on the performance of RoF systems. Additionally, these methods are also used for the estimation of the intermodulation distortions and transmission performances. The half-wavelength voltage and the chirp parameter can be measured at the same time using the methods defined in this docum

40、ent. The nonlinear distortion characteristics are also important for the performance of the systems. The intermodulation distortion of the MZM is calculated from the driving voltage and the half-wavelength voltage. The detailed explanations and calculation method of intermodulation distortions from

41、the normalized optical modulation index (NOMI) are described in IEC PAS 62593:20081 1 , Annex B. The International Electrotechnical Commission (IEC) draws attention to the fact that it is claimed that compliance with this document may involve the use of patents concerning: a) a method for characteri

42、zation of optical modulator, and method for controlling high frequency oscillator using the same (JP 3538619B), b) a method and apparatus for measurement of characteristic of optical modulator (JP 3866082B), c) a method for evaluating characteristic of optical modulator having Mach-Zehnder interfero

43、meter (WO 2011-027409), d) a method of measuring half-wave voltage of optical modulator (JP 2009-229926A). Details pertaining to the patent holders and the locations where the patents are referred to in the document are given in Table 1. _ 1 Numbers in square brackets refer to the Bibliography. IEC

44、62802:2017 IEC 2017 7 Table 1 Patents present in this document Related clause Patent holder Patent number Clause 6 Annex A (informative) National Institute of Information and Communications Technology JP 3538619 6.4.3 National Institute of Information and Communications Technology Sumitomo Osaka Cem

45、ent Co., Ltd. JP 3866082 A.2.1 National Institute of Information and Communications Technology Sumitomo Osaka Cement Co., Ltd. (WO 2011-027409) EP 2477021A US 8867042 CN 102575971 JP 5622154 A.2.2 Sumitomo Osaka Cement Co., Ltd. (JP2009-229926A) JP 4991610 IEC takes no position concerning the eviden

46、ce, validity and scope of these patent rights. The holders of these patent rights have assured the IEC that he/she is willing to negotiate licences under reasonable and non-discriminatory terms and conditions with applicants throughout the world. In this respect, the statement of the holders of thes

47、e patent rights are registered with IEC. Information may be obtained from: National Institute of Information and Communications Technology 4-2-1 Nukui-Kitamachi, Koganei, Tokyo 184-8795, Japan Sumitomo Osaka Cement Co., Ltd. 6-28 Rokubancho, Chiyoda-Ku, Tokyo 102-8465, Japan. Attention is drawn to t

48、he possibility that some of the elements of this document may be the subject of patent rights other than those identified above. IEC shall not be held responsible for identifying any or all such patent rights. ISO (www.iso.org/patents) and IEC (http:/patents.iec.ch) maintain on-line data bases of pa

49、tents relevant to their standards. Users are encouraged to consult the databases for the most up-to-date information concerning patents. 8 IEC 62802:2017 IEC 2017 MEASUREMENT METHODS OF A HALF-WAVELENGTH VOLTAGE AND A CHIRP PARAMETER FOR MACH-ZEHNDER OPTICAL MODULATORS IN HIGH-FREQUENCY RADIO ON FIBRE (ROF) SYSTEMS 1 Scope This document specifies measurement methods of a half-wavelength voltage and a chirp parameter applicable to MZMs in microwave and millimeter-wave RoF systems. In add