IEC 61298-3-2008 Process measurement and control devices - General methods and procedures for evaluating performance - Part 3 Tests for the effects of influence.pdf

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1、 IEC 61298-3 Edition 2.0 2008-10 INTERNATIONAL STANDARD NORME INTERNATIONALE Process measurement and control devices General methods and procedures for evaluating performance Part 3: Tests for the effects of influence quantities Dispositifs de mesure et de commande de processus Mthodes et procdures

2、gnrales dvaluation des performances Partie 3: Essais pour la dtermination des effets des grandeurs dinfluence IEC 61298-3:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduce

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17、rement and control devices General methods and procedures for evaluating performance Part 3: Tests for the effects of influence quantities Dispositifs de mesure et de commande de processus Mthodes et procdures gnrales dvaluation des performances Partie 3: Essais pour la dtermination des effets des g

18、randeurs dinfluence INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE U ICS 25.040.40 PRICE CODE CODE PRIX ISBN 2-8318-1003-2 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 61298

19、-3 IEC:2008 CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references .7 3 Terms and definitions .8 4 General considerations.9 4.1 Criteria9 4.2 General procedures.10 4.3 General EMC requirements .10 5 Ambient temperature effects.11 5.1 Criteria11 5.2 Test procedure11 6 Ambient relative hu

20、midity effects 12 7 Vibration.12 7.1 General considerations12 7.2 Initial resonance search 14 7.3 Endurance conditioning by sweeping.14 7.4 Final resonance search .14 7.5 Final measurements 14 8 Shock, drop and topple.14 9 Mounting position .15 10 Over-range.15 11 Output load effects .16 11.1 Electr

21、ical output 16 11.2 Pneumatic output 16 12 Power supply16 12.1 Supply voltage and frequency variations.16 12.2 Transient supply voltage effects .17 12.3 Supply voltage depression17 12.4 Short-term supply voltage interruptions.18 12.5 Fast transient/burst immunity requirements.19 12.6 Surge immunity

22、requirements .19 12.7 Reverse supply voltage protection (d.c. devices) 20 12.8 Supply pressure variations20 12.9 Supply pressure interruptions .20 12.10 Conducted radio frequency requirements21 13 Superimposed voltages 21 13.1 Line to earth voltages21 13.2 Line to line voltages (series mode) 21 13.3

23、 Earthing 21 14 Harmonic distortion effects .21 15 Magnetic field effects22 16 Electromagnetic field immunity test 23 17 Electrostatic discharge .24 61298-3 IEC:2008 3 18 Effect of open-circuited and short-circuited input 25 19 Effect of open-circuited and short-circuited output 25 20 Effects of pro

24、cess medium conditions.25 20.1 Temperature of process fluid.25 20.2 Flow of process fluid through the device26 20.3 Static line pressure effect26 21 Atmospheric pressure effects .27 22 Flow of purge gas through the device .27 23 Accelerated operational life test27 24 Operational long-term drift test

25、 (optional) .27 Bibliography29 Figure 1 Arrangement for supply voltage depression or interruption tests.18 Figure 2 Arrangement for harmonic distortion effects test 22 Figure 3 Examples of application of the test field .23 Figure 4 Test set-up of the effects of static pressure26 Figure 5 Time schedu

26、le of input changes and changes of ambient temperature .28 Table 1 Ambient temperature test ranges.11 Table 2 Vibration test levels.13 Table 3 Power supply classes (IEC 60654-2) .17 Table 4 Power supply commutations-interruptions (IEC 60654-2).18 Table 5 Burst characteristics (IEC 61326-1).19 Table

27、6 Surge characteristics (IEC 61326-1)20 Table 7 Conducted RF characteristics (IEC 61326-1).21 4 61298-3 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION PROCESS MEASUREMENT AND CONTROL DEVICES GENERAL METHODS AND PROCEDURES FOR EVALUATING PERFORMANCE Part 3: Tests for the effects of influence quan

28、tities FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization

29、 in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entr

30、usted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the Inter

31、national Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since

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33、 IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in

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35、lared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC Nation

36、al Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is

37、drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall

38、not be held responsible for identifying any or all such patent rights. International Standard IEC 61298-3 has been prepared by sub-committee 65B: Devices and process analysis, of IEC technical committee 65: Industrial-process measurement, control and automation. This second edition cancels and repla

39、ces the first edition published in 1998. This second edition constitutes a technical revision. This edition is a general revision with respect to the previous edition and does not include any significant changes (see Introduction). 61298-3 IEC:2008 5 The text of this standard is based on the followi

40、ng documents: FDIS Report on voting 65B/687/FDIS 65B/695/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of

41、 the IEC 61298 series, under the general title Process measurement and control devices General methods and procedures for evaluating performance, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date i

42、ndicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 6 61298-3 IEC:2008 INTRODUCTION This standard is not intended as a substitute for exist

43、ing standards, but is rather intended as a reference document for any future standard developed within the IEC, or other standards organizations, concerning the evaluation of process instrumentation. Any revision of existing standards should take this standard into account. This common standardized

44、basis should be utilized for the preparation of future relevant standards, as follows: any test method or procedure, already treated in this standard, should be specified and described in the new standard by referring to the corresponding clause of this standard. Consequently new editions of this st

45、andard are revised without any change in numbering and scope of each clause; any particular method or procedure, not covered by this standard, should be developed and specified in the new standard in accordance with the criteria, as far as they are applicable, stated in this standard; any conceptual

46、 or significant deviation from the content of this standard should be clearly identified and justified if introduced in a new standard. 61298-3 IEC:2008 7 PROCESS MEASUREMENT AND CONTROL DEVICES GENERAL METHODS AND PROCEDURES FOR EVALUATING PERFORMANCE Part 3: Tests for the effects of influence quan

47、tities 1 Scope This part of IEC 61298 specifies general methods and procedures for conducting tests and reporting on the functional and performance characteristics of process measurement and control devices. The tests are applicable to any such devices characterized by their own specific input and o

48、utput variables, and by the specific relationship (transfer function) between the inputs and outputs, and include analogue and digital devices. For devices that require special tests, this standard should be used, together with any product-specific standard specifying special tests. This standard co

49、vers tests for the effects of influence quantities. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-300, International Electrotechnical Vocab