IEC 61000-4-11-2004 Electromagnetic compatibility (EMC) - Part 4-11 Testing and measurement techniques - Voltage dips short interruptions and voltage variations.pdf

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1、 IEC 61000-4-11Edition 2.0 2004-03INTERNATIONAL STANDARD NORME INTERNATIONALEElectromagnetic compatibility (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity tests Compatibilit lectromagntique (CEM) Partie 4-11: Techniques dessai et

2、de mesure Essais dimmunit aux creux de tension, coupures brves et variations de tension IEC61000-4-11:2004 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEMTHIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2004 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of

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17、NORME INTERNATIONALEElectromagnetic compatibility (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity tests Compatibilit lectromagntique (CEM) Partie 4-11: Techniques dessai et de mesure Essais dimmunit aux creux de tension, coupures

18、brves et variations de tension INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE UICS 33.100.20 PRICE CODECODE PRIXISBN 2-8318-7449-1BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM 1 August 2010 ICS 33.100.20 French text overleaf SC 77A/Publication 61000-4-11

19、 (2004), Second edition/I-SH 01 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity tests INTERPRETATION SHEET 1 This interpretation sheet has been prepared by subcommittee 77A: Low frequency phenomena, o

20、f IEC technical committee 77: Electromagnetic compatibility. The text of this interpretation sheet is based on the following documents: ISH Report on voting 77A/726/ISH 77A/731/RVDFull information on the voting for the approval of this interpretation sheet can be found in the report on voting indica

21、ted in the above table. _ Interpretation of the rise-time and fall-time requirements during EUT testing in IEC 61000-4-11:2004: Electromagnetic compatibility (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity tests. 1) In IEC 61000-4

22、-11:2004, Table 4 does not apply to EUT (equipment under test) testing. Table 4 is for generator calibration and design only. 2) With reference to Table 1 and Table 2, there is no requirement in 61000-4-11:2004 for rise-time and fall-time when testing EUT; therefore, it is not necessary to measure t

23、hese parameters during tests. 3) With reference to Table 4, all of the requirements apply to design and calibration of the generator. The requirements of Table 4 only apply when the load is a non-inductive 100 resistor. The requirements of Table 4 do not apply during EUT testing. 61000-4-11 IEC:2004

24、 3 CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope6 2 Normative references.6 3 Terms and definitions6 4 General.8 5 Test levels.8 6 Test instrumentation.12 7 Test set-up.14 8 Test procedures15 9 Evaluation of test results.17 10 Test report18 Annex A (normative) Test circuit details19 Annex B (informative

25、) Electromagnetic environment classes.22 Annex C (informative) Test instrumentation23 Bibliography26 Figure 1 Voltage dip - Examples.11 Figure 2 Short interruption11 Figure 3 Voltage variation.12 Figure 4 Phase-to-neutral and phase-to-phase testing on three-phase systems.17 Figure A.1 Circuit for de

26、termining the inrush current drive capability of the short interruptions generator20 Figure A.2 Circuit for determining the peak inrush current requirement of an EUT.21 Figure C.1 Schematics of test instrumentation for voltage dips, short interruptions and voltage variations.24 Figure C.2 Schematic

27、of test instrumentation for three-phase voltage dips, short interruptions and voltage variations using power amplifier25 Table 1 Preferred test level and durations for voltage dips.9 Table 2 Preferred test level and durations for short interruptions9 Table 3 Timing of short-term supply voltage varia

28、tions10 Table 4 Generator specifications13 2 61000-4-11 IEC:200461000-4-11 IEC:2004 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity tests FOREWORD 1) The

29、International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and

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38、rences cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for

39、 identifying any or all such patent rights. International Standard IEC 61000-4-11 has been prepared by subcommittee 77A: Low frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility. This second edition cancels and replaces the first edition published in 1994 and its amendme

40、nt 1 (2000). This second edition constitutes a technical revision in which 1) preferred test values and durations have been added for the different environment classes; 2) the tests for the three-phase systems have been specified. It forms part 4-11 of IEC 61000. It has the status of a Basic EMC Pub

41、lication in accordance with IEC Guide 107. 61000-4-11 IEC:2004 3 61000-4-11 IEC:2004 7 The text of this standard is based on the following documents: FDIS Report on voting 77A/452/FDIS 77A/455/RVD Full information on the voting for the approval of this standard can be found in the report on voting i

42、ndicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication will remain unchanged until 2008. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edit

43、ion, or amended. 4 61000-4-11 IEC:2004Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de cette norme. Cette publication a t rdige selon les Directives ISO/CEI, Partie 2. Le comit a dcid que le contenu de cette publication ne sera pas

44、modifi avant 2008. A cette date, la publication sera: reconduite; supprime; remplace par une dition rvise, ou amende. The contents of the interpretation sheet 1 of August 2010 have been included in this copy. 61000-4-11 IEC:2004 9 INTRODUCTION IEC 61000 is published in separate parts according to th

45、e following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do

46、 not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Eac

47、h part is further subdivided into several parts, published either as International Standards or as technical specifications or technical reports, some of which have already been published as sections. Others will be published with the part number followed by a dash and a second number identifying th

48、e subdivision (example: 61000-6-1). 61000-4-11 IEC:2004 5 61000-4-11 IEC:2004 11 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-11: Testing and measurement techniques Voltage dips, short interruptions and voltage variations immunity tests 1 Scope This part of IEC 61000 defines the immunity test methods

49、and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50