IEC 60512-16-7-2008 Connectors for electronic equipment - Tests and measurements - Part 16-7 Mechanical tests on contacts and terminations - Test 16g Measuremen.pdf

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1、 IEC 60512-16-7Edition 1.0 2008-07INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equipment Tests and measurements Part 16-7: Mechanical tests on contacts and terminations Test 16g: Measurement of contact deformation after crimping Connecteurs pour quipements lectroniques Essais

2、 et mesures Partie 16-7: Essais mcaniques des contacts et des sorties Essai 16g: Mesure de la dformation dun contact aprs sertissage IEC60512-16-7:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this pub

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16、erv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-16-7Edition 1.0 2008-07INTERNATIONAL STANDARD NORME IN

17、TERNATIONALEConnectors for electronic equipment Tests and measurements Part 16-7: Mechanical tests on contacts and terminations Test 16g: Measurement of contact deformation after crimping Connecteurs pour quipements lectroniques Essais et mesures Partie 16-7: Essais mcaniques des contacts et des sor

18、ties Essai 16g: Mesure de la dformation dun contact aprs sertissage INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE GICS 31.220.10 PRICE CODECODE PRIXISBN 2-8318-9882-X Registered trademark of the International Electrotechnical Commission Marque dpose de la Commi

19、ssion Electrotechnique Internationale 2 60512-16-7 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-7: Mechanical tests on contacts and terminations Test 16g: Measurement of contact deformation after crimping FOREWORD 1) The Inte

20、rnational Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and elec

21、tronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committe

22、es; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for St

23、andardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has

24、 representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurat

25、e, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional

26、publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity wi

27、th an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any person

28、al injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative refer

29、ences cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for

30、identifying any or all such patent rights. International Standard IEC 60512-16-7 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces test 16g of IEC 60512

31、-8, issued in 1993. This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which explains the structure of the IEC 60512 series. The text of this standard is based on the following documents: FDIS Report on voting 48B/1888/FDIS 48B/1921/RVD Full information on the voting for

32、 the approval of this standard can be found in the report on voting indicated in the above table. 60512-16-7 IEC:2008 3 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic

33、equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At t

34、his date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 4 60512-16-7 IEC:2008 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-7: Mechanical tests on contacts and terminations Test 16g: Measurement of contact deformation after crimping 1

35、 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of IEC technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this part of IEC 60512 is to detail a st

36、andard test method to assess the effectiveness of contacts to resist deformation (damage) from crimping operations. Although this test is intended for cylindrical contacts, especially machined contacts, it is applicable to contacts with other geometries and construction. In which case, the detail sp

37、ecification shall contain sufficient detail, given under clause 4, to enable the test to be done. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest

38、 edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination 3 Preparations 3.1 Preparation of specimen The specimen shall consist of contact-wire assemblies

39、. The length of cable protruding from the contact shall be at least 100 mm. Number of specimens: 10 specimens for each barrel size (5 for the minimum wire size and 5 for the maximum wire size) unless otherwise specified in the detail specification. The crimping tool(s) shall be those specified in th

40、e detail specification. If none are so specified, the contact manufacturers instructions for tooling shall be followed. In any case, full details of tooling shall be given in any reports supporting claims of conformance to this part of IEC 60512. Any preconditioning given in the detail specification

41、 shall be applied. 60512-16-7 IEC:2008 5 3.2 Equipment A mounting collet shall be provided such that the contact may be rotated around its longitudinal axis to permit measurements at the specified points. The precision of the collet shall be such that the run-out of a steel gauge pin of 1,5 to 2,0 m

42、m diameter measured 10 to 15 mm from the collet face shall not exceed 0,1 % of such distance. 4 Test procedure The contact shall be held in a collet in region H as shown in Figure 1, so that the contact can be rotated around the longitudinal axis to permit measurements at the specified points. A sui

43、table test arrangement is shown in Figure 2. In the case of cylindrical contacts, readings (preferably with an indicator gauge) of the position of the contact shall be taken before and after crimping. The total excursion of the position when the contact is rotated is halved to give the deformation (

44、or damage). Non-circular contacts shall be measured in a similar manner. The deformation (or damage) may be similarly calculated. MX YHIEC 1005/08 Key X Twice the male contact diameter. Also used for corresponding female contact OR If not circular, corresponding characteristic dimension of each cont

45、act. Y Mid point between end of crimp barrel, or end of contact, and beginning of crimp indentation M Measurement points for contact deformation H (Example of) Holding area NOTE This should correspond to the area in which the contact is intended to be held in use. Figure 1 Example of holding and mea

46、surement points 6 60512-16-7 IEC:2008 Dial indicator 0,025 mm (0,001 in) Conductor Contact Super precision collet IEC 1006/08Figure 2 Typical test arrangement for deformation measurement 5 Measurements and requirements 5.1 Before testing Visual examination according to IEC 60512-1-1 shall be carried

47、 out. There shall be no defects that would impair the validity of the test. 5.2 After testing The requirements of the detail specification for deformation shall be met. Visual examination according to IEC 60512-1-1 shall be carried out. There shall be no defects, other than any found under 5.1, that

48、 would impair the normal functioning of the component. 6 Details to be specified When this test is required by the detail specification, the following details shall be specified. a) wire type and size; b) specification of crimping tool(s) to be used; c) area(s) of contact to be held by the mounting

49、collet; NOTE This should correspond to the housing or insert location point(s). d) points of measurement on the contact; if other than those given in 3.2; e) values of deformation permitted, for each point of measurement; f) number of specimens to be tested if different than specified in 3.1; g) any deviation from the standard test method. 60512-16-7 IEC:2008 7 Bibliography IEC 60352