IEC TR 61926-1-1-1999 Design automation - Part 1-1 Harmonization of ATLAS test languages《设计自动化 第1-1部分 ATLAS试验语言的一致性》.pdf

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1、TECHNICAL REPORT IEC TR 61926-1-1 First edition 1999-10 Design automation Part 1-1: Harmonization of ATLAS test languages Automatisation de la conception Partie 1-1: Harmonisation de langages dessais ATLAS Reference number IEC/TR 61926-1-1:1999(E)Numbering As from 1 January 1997 all IEC publications

2、 are issued with a designation in the 60000 series. Consolidated publications Consolidated versions of some IEC publications including amendments are available. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incorporating amendment 1

3、and the base publication incorporating amendments 1 and 2. Validity of this publication The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to the date of the reconfirmation of the public

4、ation is available in the IEC catalogue. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is to be found at the following IEC sources: IEC web site* Catalogue of

5、 IEC publications Published yearly with regular updates (On-line catalogue)* IEC Bulletin Available both at the IEC web site* and as a printed periodical Terminology, graphical and letter symbols For general terminology, readers are referred to IEC 60050: International Electrotechnical Vocabulary (I

6、EV). For graphical symbols, and letter symbols and signs approved by the IEC for general use, readers are referred to publications IEC 60027: Letter symbols to be used in electrical technology, IEC 60417: Graphical symbols for use on equipment. Index, survey and compilation of the single sheets and

7、IEC 60617: Graphical symbols for diagrams. * See web site address on title page.TECHNICAL REPORT IEC TR 61926-1-1 First edition 1999-10 Design automation Part 1-1: Harmonization of ATLAS test languages Automatisation de la conception Partie 1-1: Harmonisation de langages dessais ATLAS PRICE CODE IEC

8、 1999 Copyright - all rights reserved No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission 3, rue de Varemb Ge

9、neva, Switzerland Telefax: +41 22 919 0300 e-mail: inmailiec.ch IEC web site http:/www.iec.ch S For price, see current catalogueCommission Electrotechnique InternationaleInternational Electrotechnical Commission 2 TR 61926-1-1 IEC:1999(E) CONTENTS Page FOREWORD 3 OVERVIEW 4 INTRODUCTION 13 Clause 1

10、Scope 14 2 Reference documents 14 3 Definitions 14 4 Symbols and abbreviations. 15 5 Background information and history 15 6 Relationship between C/ATLAS and ATLAS 16 7 Current events . 17 8 Implementations of ATLAS and C/ATLAS . 18 9 Harmonization methods 18 10 Conclusions .22 11 Recommendations .

11、23 12 Benefits . 23 13 Other languages and/or implementations 24 Annex A (informative) Comparisons of 416, 716, and 626 definitions 1984 to 1995. 25 Bibliography . 45TR 61926-1-1 IEC:1999(E) 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ DESIGN AUTOMATION Part 1-1: Harmonization of ATLAS test languag

12、es FOREWORD 1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardization

13、 in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. Inte

14、rnational, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) Th

15、e formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested National Committees. 3) The documents produced have the form of recomm

16、endations for international use and are published in the form of standards, technical specifications, technical reports or guides and they are accepted by the National Committees in that sense. 4) In order to promote international unification, IEC National Committees undertake to apply IEC Internati

17、onal Standards transparently to the maximum extent possible in their national and regional standards. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. 5) The IEC provides no marking procedure to indicate its approva

18、l and cannot be rendered responsible for any equipment declared to be in conformity with one of its standards. 6) Attention is drawn to the possibility that some of the elements of this technical report may be the subject of patent rights. The IEC shall not be held responsible for identifying any or

19、 all such patent rights. The main task of IEC technical committees is to prepare International Standards. However, a technical committee may propose the publication of a technical report when it has collected data of a different kind from that which is normally published as an International Standard

20、, for example “state of the art“. Technical reports do not necessarily have to be reviewed until the data they provide are considered to be no longer valid or useful by the maintenance team. IEC 61926-1-1, which is a technical report, has been prepared by IEC technical committee 93: Design automatio

21、n. The text of this technical report is based on the following documents: Enquiry draft Report on voting 93/93/CDV 93/102/RVC Full information on the voting for the approval of this technical report can be found in the report on voting indicated in the above table. This publication has been drafted

22、in accordance with the ISO/IEC Directives, Part 3. This document which is purely informative is not to be regarded as an International Standard. A bilingual version of the technical report may be issued at a later date. 4 TR 61926-1-1 IEC:1999(E) OVERVIEW A common standard test language has been of

23、interest to the electronics testing community for many years. Such a common language offers a single communications “medium“ for the description of Unit Under Test (UUT) test requirements to both humans and machines, as well as the hope for Test Program Set (TPS) cost savings through code re-use and

24、 code sharing (just as a single spoken language would benefit mankind in international communications, or a single computer programming language would allow “anyone“ to read/develop/maintain computer software code). The Abbreviated Test Language for All Systems (ATLAS) TM) 1)was developed, and is be

25、ing maintained, to provide this communications “ medium“. This technical report presents the efforts taking place, as well as recommendations/ suggestions to harmonize two differing ATLAS test language specification “dialects“, to enable a common use across two user communities The evolution of the

26、ATLAS language leading to the interest in harmonization of the two dominant representations of this language today, i.e. C/ATLAS 716-95 and ATLAS 626-3, took place in a technological time and context which the reader may find helpful and interesting to know when considering ATLAS today. The followin

27、g material provides a brief overview of the technical history of Automatic Testing, Automatic Test Equipment and the Testing Economics which existed during the time that ATLAS was evolving. At the conclusion of this background section, a brief history of ATLAS will be included to complete the techno

28、logical picture and provide the reader with a context for assessing the ATLAS issues being faced today. The need for an automated means to perform testing followed closely on the heels of the explosive growth in complexity and functionality of the units requiring test. This explosion was driven by m

29、iniaturization. More and more capability could be packaged into a single device in the same physical envelope using less and less power and operating at faster and faster speeds. By the early 1950s, it became clear that a methodology was required which would allow faster testing. The throughput 2)of

30、 units through a manufacturers factory was being limited by a test bottleneck. This was due to the large number of tests required for newer units being designed and built and the limitations of the speeds at which a factory technician could perform these growing number of tests. In addition to throu

31、ghput problems, other testing problems were appearing when testing was done manually, including the consistency of test. The need to perform the same tests in the same way every time was too often found to be compromised by the mood, mental state, health and/or interest of the test technician. Addit

32、ionally, there were qualitative and economic issues involved. The quality of work conditions under which a person is expected to quickly and consistently perform repetitive work with increasing rapidity was coming under question and scrutiny, as was the cost of the human test technician per unit tes

33、ted. _ 1) ATLAS is a trade mark of the Institute of Electrical and Electronics Engineers. 2)Throughput the number of units per unit time that can be processed.TR 61926-1-1 IEC:1999(E) 5 A final element to this growing problem was the increasing complexity of the tests which needed to be performed. T

34、he tests and testing process reflecting the increasing complexity of the units to be tested became more difficult to perform and interpret. This further exacerbated the time and cost issues noted above by imposing a training cost to enable the technician to perform as required, plus a need for highe

35、r skilled technicians who were more costly and more difficult to find. The problems described in respect to the factory environment were being repeated in the field repair environment. Many companies in order to reduce time and shipping costs established field repair and maintenance depots. However,

36、 it was not long before these field depots were confronting very similar problems. These problems were made more difficult by the fact that the units requiring test and repair covered a broad variety of types and configurations. This meant that the test technician had less opportunity to become fami

37、liar with the traits and characteristics of a single unit. In addition, the field technician was at a remote site, not a factory. Therefore, he needed additional support documentation to compensate for the lack of access to the design engineer available at a factory for advice and guidance. The fiel

38、d technician had to be supported by a large number of expensive spares so that he could effect the needed repair. The expense of the repair, time and spares was at the mercy of the knowledge and diagnostic skill of the repair technician. 6 TR 61926-1-1 IEC:1999(E) Suppliers and users of Automatic Te

39、st Equipment (ATE) The users On the user side there was a clear dichotomy in the use and application of ATE. The NATO forces were driven by the cold war and the perceived need to extract from technology its benefits in order to support their defense strategy and posture. Production rates, production

40、 costs, field maintenance and repair of what was arguably the most sophisticated of electronics were issues that were required to be addressed. Additionally, the ability of NATO to train and retain qualified field test technicians was under strain as local economies improved and increasing numbers o

41、f trained technicians left military service. Commercially the airlines faced increasingly difficult field test and maintenance problems. Driven by concerns over safety, a far-flung set of test and maintenance repair depots and a very difficult avionics requiring test and maintenance, they too began

42、to seek alternative test maintenance and repair approaches. Other commercial enterprises, particularly those with broad markets and widespread field depot operations were close behind the airlines in identifying the need for a new and improved way to test. It is safe to say that by the late 1950s al

43、l three, i.e., NATO, airlines and large commercial electronics developers were well on their way to developing test solutions, based upon auto- matic testing. The suppliers The suppliers to the three major using communities of ATE were not the same. The suppliers of ATE to the NATO communities were

44、commercial suppliers of standard bench-top instruments configured to be controlled automatically for factory testing, and the suppliers of weapon systems for support of these systems in the field. The suppliers of ATE to the commercial airlines in the factories were the same as those for NATO, and t

45、he suppliers of ATE at the factory test depots were the suppliers of the avionics units used in the aircraft. The suppliers of ATE to other large commercial suppliers tended to be the suppliers of factory ATE used by NATO and commercial airlines in the factory, and alternative commercial suppliers o

46、f ATE in depots or occasionally ATE fashioned by themselves.TR 61926-1-1 IEC:1999(E) 7 Automatic Test Equipment (ATE) An ATE system has the general configuration shown in figure 1. This configuration is generally applicable from the earliest configuration of ATE to current systems. Test program (7)

47、Control (memory) (6) Routing (5) Input (1) Output (2) UUT (8) Measurement (4) Stimulus (3) IEC 1353/99 Figure 1 General configuration of an ATE system The eight elements of figure 1 perform as follows in any ATE system. 1 Input the ATE input subsystem allows the ATE operator both to select the opera

48、ting mode under which the system will perform (i.e. print all test results, stop after each test, print only failures) as well as provide the various media by which the operator can communicate with the system, i.e. tape, Compact Disk (CD), keyboard, floppy. 2 Output the output subsystem provides th

49、e means by which the ATE system commu- nicates with the ATE operator. This can include visual indicators (lights), cathode ray tubes, printers and even voice. 3S t i m u l u s the stimulus subsystem consists of programmable 3)devices which can provide either power or signals to a UUT. 4 Measurement the measurement subsystem consists of programmable devices which can assess the parametric values of power or signals from a UUT. 5 Routing the routing subsystem consists of switching devices which by progra