IEC 62884-1-2017 Measurement techniques of piezoelectric dielectric and electrostatic oscillators - Part 1 Basic methods for the measurement《压电 介电和静电振荡器的测量技术 第1部分 基本测量方法》.pdf

《IEC 62884-1-2017 Measurement techniques of piezoelectric dielectric and electrostatic oscillators - Part 1 Basic methods for the measurement《压电 介电和静电振荡器的测量技术 第1部分 基本测量方法》.pdf》由会员分享，可在线阅读，更多相关《IEC 62884-1-2017 Measurement techniques of piezoelectric dielectric and electrostatic oscillators - Part 1 Basic methods for the measurement《压电 介电和静电振荡器的测量技术 第1部分 基本测量方法》.pdf（66页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 62884-1 Edition 1.0 2017-06 INTERNATIONAL STANDARD Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Part 1: Basic methods for the measurement IEC 62884-1:2017-06(en) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2017 IEC, Geneva, Switzerland Al

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11、oscillators Part 1: Basic methods for the measurement INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 31.140 ISBN 978-2-8322-4395-4 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside

12、2 IEC 62884-1:2017 IEC 2017 CONTENTS FOREWORD . 6 1 Scope 8 2 Normative references 8 3 Terms and definitions 9 3.1 General . 9 3.2 Terms and definitions 10 4 Test and measurement procedures 10 4.1 General . 10 4.2 Test and measurement conditions . 10 4.2.1 Standard conditions for testing 10 4.2.2 Eq

13、uilibrium conditions 10 4.2.3 Air flow conditions for temperature tests 10 4.2.4 Power supplies 11 4.2.5 Precision of measurement . 11 4.2.6 Precautions . 11 4.2.7 Alternative test methods 11 4.3 Visual inspection . 11 4.3.1 General . 11 4.3.2 Visual test A 11 4.3.3 Visual test B 11 4.3.4 Visual tes

14、t C 12 4.4 Dimensions and gauging procedures 12 4.4.1 Dimensions Test A 12 4.4.2 Dimensions Test B 12 4.5 Electrical test procedures 12 4.5.1 Insulation resistance 12 4.5.2 Voltage proof . 12 4.5.3 Input power . 13 4.5.4 Output frequency . 14 4.5.5 Frequency/temperature characteristics 15 4.5.6 Freq

15、uency/load coefficient . 16 4.5.7 Frequency/voltage coefficient 17 4.5.8 Frequency stability with thermal transient 17 4.5.9 Oscillation start-up. 18 4.5.10 Stabilization time . 22 4.5.11 Frequency adjustment range 22 4.5.12 Retrace characteristics 22 4.5.13 Oscillator output voltage (sinusoidal) .

16、23 4.5.14 Oscillator output voltage (pulse waveform) 24 4.5.15 Oscillator output waveform (sinusoidal) . 25 4.5.16 Oscillator output waveform (pulse) . 27 4.5.17 Oscillator output power (sinusoidal) . 27 4.5.18 Oscillator output impedance (sinusoidal) . 27 4.5.19 Re-entrant isolation . 28 4.5.20 Out

17、put suppression of gated oscillators . 28 4.5.21 3-state output characteristics . 29 4.5.22 Amplitude modulation characteristics . 30 IEC 62884-1:2017 IEC 2017 3 4.5.23 Frequency modulation characteristics 36 4.5.24 Spurious response . 40 4.5.25 Phase noise . 40 4.5.26 Phase noise vibration . 41 4.5

18、.27 Phase noise acoustic 41 4.5.28 Noise pedestal . 42 4.5.29 Spectral purity . 43 4.5.30 Incidental frequency modulation 43 4.5.31 RMS fractional frequency fluctuations 44 4.5.32 Electromagnetic interference (radiated) . 48 4.6 Mechanical and environmental test procedures . 52 4.6.1 Robustness of t

19、erminations (destructive) . 52 4.6.2 Sealing test (non-destructive) 54 4.6.3 Soldering (solderability and resistance to soldering heat) (destructive) 54 4.6.4 Rapid change of temperature: severe shock by liquid immersion (non- destructive) 57 4.6.5 Rapid change of temperature: thermal shock in air (

20、non-destructive) . 57 4.6.6 Bump (destructive) 57 4.6.7 Vibration (destructive) 58 4.6.8 Shock (destructive) 58 4.6.9 Free fall (destructive) . 59 4.6.10 Acceleration, steady-state (non-destructive) 59 4.6.11 Acceleration 2g tip over 59 4.6.12 Acceleration noise . 59 4.6.13 Low air pressure (non-des

21、tructive) . 59 4.6.14 Dry heat (non-destructive) . 59 4.6.15 Damp heat, cyclic (destructive) 59 4.6.16 Cold (non-destructive) . 60 4.6.17 Climatic sequence (destructive) . 60 4.6.18 Damp heat, steady-state (destructive) . 60 4.6.19 Salt mist, cyclic (destructive) . 60 4.6.20 Mould growth (non-destru

22、ctive) 60 4.6.21 Immersion in cleaning solvent (non-destructive) 60 4.6.22 Radiation hardness 60 Bibliography 61 Figure 1 Test circuits for insulation resistance measurements 12 Figure 2 Test circuit for voltage proof test 13 Figure 3 Test circuit for oscillator input power measurement 13 Figure 4 T

23、est circuit for oven and oscillator input power measurement . 14 Figure 5 Test circuit for measurement of output frequency, method1 15 Figure 6 Test circuit for measurement of output frequency, method 2 . 15 Figure 7 Test circuit for measurement of frequency/temperature characteristics . 16 Figure 8

24、 Thermal transient behaviour of typical oscillator . 18 Figure 9 Generalized oscillator circuit 19 Figure 10 Test circuit for start-up behaviour and start-up time measurement 20 Figure 11 Typical start-up behaviour with slow supply voltage ramp . 20 4 IEC 62884-1:2017 IEC 2017 Figure 12 Definition o

25、f start-up time . 21 Figure 13 Supply voltage waveform for periodical t SUmeasurement . 22 Figure 14 Typical oscillator stabilization characteristic . 22 Figure 15 Example of retrace characteristic . 23 Figure 16 Test circuit for the measurement of output voltage . 24 Figure 17 Test circuit for the

26、measurement of pulse outputs 24 Figure 18 Characteristics of an output waveform 24 Figure 19 Test circuit for harmonic distortion measurement . 25 Figure 20 Quasi-sinusoidal output waveforms 25 Figure 21 Frequency spectrum for harmonic distortion . 26 Figure 22 Test circuit for the determination of

27、isolation between output ports . 28 Figure 23 Test circuit for measuring suppression of gated oscillators . 29 Figure 24 Test circuit for 3-state disable mode output current 29 Figure 25 Test circuit for output gating time 3-state . 30 Figure 26 Test circuit for modulation index measurement . 31 Fig

28、ure 27 Modulation waveform for index calculation . 31 Figure 28 Logarithmic signal amplitude scale . 31 Figure 29 Test circuit to determine amplitude modulation sensitivity 33 Figure 30 Frequency spectrum of amplitude modulation distortion . 33 Figure 31 Test circuit to determine pulse amplitude mod

29、ulation . 34 Figure 32 Pulse modulation characteristic 35 Figure 33 Test circuit for the determination of modulation input impedance 36 Figure 34 Test circuit for the measurement of f.m. deviation 36 Figure 35 Test circuit for the measurement of f.m. sensitivity . 38 Figure 36 Test circuit for the m

30、easurement of frequency modulation distortion . 39 Figure 37 Test circuit for the measurement of single-sideband phase noise . 40 Figure 38 Typical noise pedestal spectrum 42 Figure 39 Test circuit for the measurement of incidental frequency modulation 44 Figure 40 Test circuit for method 1 . 45 Fig

31、ure 41 Test circuit for method 2 . 46 Figure 42 Circuit modifications for methods 1 and 2 . 47 Figure 43 Time-domain short-term frequency stability of a typical 5 MHz precision oscillator . 48 Figure 44 Radiated interference tests 49 Figure 45 Characteristics of line impedance of stabilizing network

32、 . 50 Figure 46 Circuit diagram of line impedance of stabilizing network . 51 Figure 47 Reflow temperature profile for solderability 55 Figure 48 Reflow temperature profile for resistance to soldering heat 56 Table 1 Measuring sets bandwidth . 52 Table 2 Tensile force . 52 Table 3 Thrust force . 53

33、Table 4 Bending force 53 IEC 62884-1:2017 IEC 2017 5 Table 5 Torque force 54 Table 6 Solderability Test condition, reflow method . 55 Table 7 Resistance to soldering heat Test condition and severity, reflow method . 57 6 IEC 62884-1:2017 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREME

34、NT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS Part 1: Basic methods for the measurement FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committ

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45、l Standard IEC 62884-1 has been prepared by IEC technical committee 49: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. The text of this International Standard is based on the following documents: CDV Report on voting 49/11

46、87A/CDV 49/1200/RVC Full information on the voting for the approval of this International Standard can be found in the report on voting indicated in the above table. This document has been drafted in accordance with the ISO/IEC Directives, Part 2. IEC 62884-1:2017 IEC 2017 7 A list of all parts in t

47、he IEC 62884 series, published under the general title Measurement techniques of piezoelectric, dielectric and electrostatic oscillators, can be found on the IEC website. A bilingual version of this publication may be issued at a later date. IMPORTANT The colour inside logo on the cover page of this

48、 publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 8 IEC 62884-1:2017 IEC 2017 MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILL

49、ATORS Part 1: Basic methods for the measurement 1 Scope This part of IEC 62884 specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as “Oscillator“). NOTE Dielectric Resonator Oscillators (DROs) and oscillators using FBAR are under consideration. 2