IEC 62860-1-2013 Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators《基于环形振荡器的有机晶体管特征描述试验方法》.pdf

《IEC 62860-1-2013 Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators《基于环形振荡器的有机晶体管特征描述试验方法》.pdf》由会员分享，可在线阅读，更多相关《IEC 62860-1-2013 Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators《基于环形振荡器的有机晶体管特征描述试验方法》.pdf（26页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 62860-1 Edition 1.0 2013-08 INTERNATIONAL STANDARD Test methods for the characterization of organic transistor-based ring oscillators IEC 62860-1:2013(E) IEEE Std. 1620.1-2006 IEEE Std 1620.1 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2006 IEEE All rights reserved. IEEE is a registered t

2、rademark in the U.S. Patent any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEEE Standards documents are developed with

3、in IEEE Societies and Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. IEEE develops its standards through a consensus development process, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunt

4、eers are not necessarily members of IEEE and serve without compensation. While IEEE administers the process and establishes rules to promote fairness in the consensus development process, IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its st

5、andards. Use of IEEE Standards documents is wholly voluntary. IEEE documents are made available for use subject to important notices and legal disclaimers (see http:/standards.ieee.org/IPR/disclaimers.html for more information). IEC collaborates closely with IEEE in accordance with conditions determ

6、ined by agreement between the two organizations. 2) The formal decisions of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. The forma

7、l decisions of IEEE on technical matters, once consensus within IEEE Societies and Standards Coordinating Committees has been reached, is determined by a balanced ballot of materially interested parties who indicate interest in reviewing the proposed standard. Final approval of the IEEE standards do

8、cument is given by the IEEE Standards Association (IEEE-SA) Standards Board. 3) IEC/IEEE Publications have the form of recommendations for international use and are accepted by IEC National Committees/IEEE Societies in that sense. While all reasonable efforts are made to ensure that the technical co

9、ntent of IEC/IEEE Publications is accurate, IEC or IEEE cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications (including IEC/IEEE Publica

10、tions) transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC/IEEE Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC and IEEE do not provide any attestation of conformi

11、ty. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC and IEEE are not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this p

12、ublication. 7) No liability shall attach to IEC or IEEE or their directors, employees, servants or agents including individual experts and members of technical committees and IEC National Committees, or volunteers of IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Asso

13、ciation (IEEE-SA) Standards Board, for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC/IEEE Publication or any other IEC or I

14、EEE Publications. 8) Attention is drawn to the normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that implementation of this IEC/IEEE Publication may require us

15、e of material covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. IEC or IEEE shall not be held responsible for identifying Essential Patent Claims for which a license may be required,

16、 for conducting inquiries into the legal validity or scope of Patent Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard ar

17、e expressly advised that iv IEC 62860-1:2013(E) IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. International Standard

18、 IEC 62860-1/IEEE Std 1620.1-2006 has been processed through IEC technical committee 113: Nanotechnology standardization for electrical and electronic products and systems, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the following documents: IEEE Std FDIS Report on

19、voting IEEE Std 1620.1-2006 113/185/FDIS 113/195/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The IEC Technical Committee and IEEE Technical Committee have decided that the contents of this publication will re

20、main unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this standard may be is

21、sued at a later date. IEC 62860-1:2013(E) v IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators Sponsor Microprocessor Standards Committee of the IEEE Compu

22、ter Society Approved 8 June 2006 IEEE-SA Standards Board vi IEC 62860-1:2013(E) IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. Abstract: Recommended methods and standardized reporting practices for electrical characterization of printed and organic rin

23、g oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for hig

24、h-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring

25、oscillators. Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator IEC 62860-1:2013(E) vii IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. IEEE Introduction This introduction is not part

26、 of IEEE Std 1620.1-2006, IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators. This standard covers recommended methods and standardized reporting practices for electrical characterization of organic transistor-based ring oscillators. Due to the natur

27、e of organic transistors and circuitry, significant measurement errors can be introduced if not properly addressed. This standard describes the most common sources of measurement error and gives recommended practices in order to minimize and/or characterize the effect of each. Standard reporting pra

28、ctices are included in order to minimize confusion in analyzing reported data. Disclosure of environmental conditions and design-of-experiment are included so that results can be appropriately assessed by the research community. These reporting practices also support repeatability of results, so tha

29、t new discoveries may be confirmed more efficiently. The practices in this standard were compiled from research and industry organizations developing organic transistor devices, materials, circuitry, and manufacturing techniques. These practices are based on standard operating procedures utilized in

30、 laboratories worldwide. The development of this standard was initiated in 2004 to facilitate the evolution of organic transistor circuitry from the laboratory into a sustainable industry. Standardized characterization methods and reporting practices create a means of effective comparison of informa

31、tion and a foundation for manufacturing readiness. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpreta

32、tions Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard

33、, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal

34、 validity or scope of those patents that are brought to its attention. viii IEC 62860-1:2013(E) IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights reserved. IEC 62860-1:2013(E) 1 IEEE Std 1620.1-2006 Published by IEC under license from IEEE. 2006 IEEE. All rights re

35、served. Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators 1. Overview 1.1 Scope This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing cond

36、itions during characterization. 1.2 Purpose The purpose of this standard is to provide a method for systematically characterizing organic transistor- based ring oscillators. This standard is intended to maximize reproducibility of published results by providing a framework for testing organic ring o

37、scillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for r

38、eporting data, so that information is clear and consistent throughout the research community and industry. 1.3 Electrical characterization overview 1.3.1 Testing apparatus Testing shall be performed using an electronic device test system with an accuracy and resolution of at least 0.1% of the measur

39、ement values for both signal level and timing or frequency measurements. In order to maintain the necessary accuracy, this test method requires that the instrumentation be calibrated against a known and appropriate set of standards e.g., National Institute of Standards and Technology (NIST). These c

40、alibrations may be performed by the equipment user or as a service by the equipment vendor. Calibration is not performed against a known organic field-effect transistor (OFET), organic circuit, or other FET-type device; the basic instrument operations (e.g., voltage, current, and resistance) are calibrated