IEC 60679-1-2017 Piezoelectric dielectric and electrostatic oscillators of assessed quality - Part 1 Generic specification《评定质量的压电、介电和静电振荡器 第1部分 通用规范》.pdf

《IEC 60679-1-2017 Piezoelectric dielectric and electrostatic oscillators of assessed quality - Part 1 Generic specification《评定质量的压电、介电和静电振荡器 第1部分 通用规范》.pdf》由会员分享，可在线阅读，更多相关《IEC 60679-1-2017 Piezoelectric dielectric and electrostatic oscillators of assessed quality - Part 1 Generic specification《评定质量的压电、介电和静电振荡器 第1部分 通用规范》.pdf（40页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 60679-1 Edition 4.0 2017-07 INTERNATIONAL STANDARD Piezoelectric, dielectric and electrostatic oscillators of assessed quality Part 1: Generic specification IEC 60679-1:2017-07(en) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2017 IEC, Geneva, Switzerland All rights reserved. Unless otherw

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9、glossary 65 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002. Some entries have been collected from earlier publications of IEC TC 37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/c

10、sc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. IEC 60679-1 Edition 4.0 2017-07 INTERNATIONAL STANDARD Piezoelectric, dielectric and electrostatic oscillators of assessed quality Part 1: Generic specificat

11、ion INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 31.140 ISBN 978-2-8322-4608-5 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. 2 IEC 60679-1:2017 IEC 2017 CONTENTS FOREWORD . 4 1 Scope 6 2 No

12、rmative references 6 3 Terms, definitions and general information 7 3.1 General . 7 3.2 Terms and definitions 7 3.3 Preferred values for ratings and characteristics 21 3.3.1 General . 21 3.3.2 Climatic category (40/85/56) 22 3.3.3 Bump severity 22 3.3.4 Vibration severity . 22 3.3.5 Shock severity .

13、 22 3.3.6 Leak rate . 22 3.4 Marking . 23 3.4.1 General . 23 3.4.2 Packaging 23 4 Quality assessment procedures . 23 4.1 General . 23 4.2 Primary stage of manufacture . 23 4.3 Structurally similar components 23 4.4 Subcontracting 23 4.5 Incorporated components 24 4.6 Manufacturers approval 24 4.7 Ap

14、proval procedures . 24 4.7.1 General . 24 4.7.2 Capability approval 24 4.7.3 Qualification approval 24 4.8 Procedures for capability approval 25 4.8.1 General . 25 4.8.2 Eligibility for capability approval . 25 4.8.3 Application for capability approval . 25 4.8.4 Granting of capability approval 25 4

15、.8.5 Capability manual 25 4.9 Procedures for qualification approval 25 4.9.1 General . 25 4.9.2 Eligibility for qualification approval . 25 4.9.3 Application for qualification approval . 25 4.9.4 Granting of qualification approval 25 4.9.5 Quality conformance inspection . 26 4.10 Test procedures 26

16、4.11 Screening requirements 26 4.12 Rework and repair work 26 4.12.1 Rework 26 4.12.2 Repair work . 26 4.13 Certified test records. 26 4.14 Validity of release . 26 4.15 Release for delivery 26 IEC 60679-1:2017 IEC 2017 3 4.16 Unchecked parameters . 27 Annex A (normative) Load circuit for logic driv

17、e . 28 A.1 TTL and Schottky 28 A.2 CMOS . 30 A.3 ECL 30 A.4 LVDS 31 Annex B (normative) Latch-up test . 32 B.1 Definition 32 B.1.1 Latch-up 32 B.1.2 Test procedure 32 B.2 Test method 32 Annex C (normative) Electrostatic discharge sensitivity classification 33 C.1 Definition 33 C.1.1 Electrostatic di

18、scharge (ESD) 33 C.1.2 Test procedure 33 C.2 Test methods 33 C.2.1 General . 33 C.2.2 Leaded oscillator . 33 C.2.3 SMD oscillator . 33 C.2.4 The impact of ESD on Oscillator in steady-state 33 Annex D (normative) Digital interfaced crystal oscillators function . 34 Bibliography 35 Figure 1 Basic conf

19、igurations of SAW resonators . 9 Figure 2 Example of the use of frequency offset. 11 Figure 3 Linearity of frequency modulation deviation 16 Figure 4 Characteristics of an output waveform 18 Figure 5 Definition of start-up time . 19 Figure 6 Clock signal with period jitter 19 Figure 7 Phase jitter m

20、easures 20 Figure 8 Gaussian distribution of jitter 20 Figure 9 Jitter amplitude and period of jitter frequency . 20 Figure 10 Jitter tolerance according to ITU-T G.825, ATIS-0900101, Telcordia GR- 253 and ETSI EN 300 462 21 Figure A.1 Circuit for TTL . 28 Figure A.2 Circuit for Schottky logic . 29

21、Figure A.3 Circuit for PECL 30 Figure A.4 Circuit for LVDS 31 Table A.1 Values to be used when calculating R 1and R 2. 30 Table A.2 Operating condition 31 Table A.3 DC Electrical characteristics output load = 50 to Vcc-2V . 31 Table D.1 Function of the digital interface 34 4 IEC 60679-1:2017 IEC 201

22、7 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY Part 1: Generic specification FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechn

23、ical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

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27、onal use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order

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29、y indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bod

30、ies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, propert

31、y damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in thi

32、s publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or

33、 all such patent rights. International Standard IEC 60679-1 has been prepared by IEC technical committee TC 49: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. This fourth edition cancels and replaces the third edition publ

34、ished in 2007. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) the title has been changed; b) additional matters related to oscillator using SAW or MEMS resonator in “Terms, definitions and gene

35、ral information“ have been included; c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to IEC 62884 series); IEC 60679-1:2017 IEC 2017 5 d) the content of Annex A has been extended; e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been adde

36、d; f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added; g) Annex D has been added. The text of this standard is based on the following documents: FDIS Report on voting 49/1229/FDIS 49/1233/RVD Full information on the voting for the approval of this International Sta

37、ndard can be found in the report on voting indicated in the above table. This document has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60679 series, published under the general title piezoelectric, dielectric and electrostatic oscillators of assesse

38、d quality can be found on the IEC website. Future standards in this series will carry the new general title as cited above. Titles of existing standards in this series will be updated at the time of the next edition. The committee has decided that the contents of this document will remain unchanged

39、until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific document. At this date, the document will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later dat

40、e. 6 IEC 60679-1:2017 IEC 2017 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY Part 1: Generic specification 1 Scope This part of IEC 60679 specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillato

41、rs (DRO) and oscillators using FBAR (hereinafter referred to as “Oscillator“), of assessed quality using either capability approval or qualification approval procedures. NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration. 2 Normative references The followi

42、ng documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 6002

43、7 (all parts), Letter symbols to be used in electrical technology IEC 60050-561, International electrotecnical vocabulary Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Available at www.electropedia.org IEC 60469

44、, Transitions, pulses and related waveforms Terms, definitions and algorithms IEC 60617, Graphical symbols for diagrams. Available at http:/std.iec.ch/iec60617 IEC 60748-2, Semiconductor devices Integrated circuits Part 2: Digital integrated circuits IEC 60749-26, Semiconductor devices Mechanical an

45、d climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing Human body model (HBM) IEC 60749-27, Semiconductor devices Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing Machine model (MM) IEC TR 61000-4-1, Electromagnetic compatibi

46、lity (EMC) Part 4-1: Testing and measurement techniques Overview of the IEC 61000-4 series IEC 61340-5-1, Electrostatics Part 5-1: Protection of electronic devices from electrostatic phenomena General requirements IEC 62884-1:2017, Measurement techniques of piezoelectric, dielectric, and electrostat

47、ic oscillators Part 1: Basic methods for the measurement ISO 80000-1, Quantities and units Part 1: General Where any discrepancies occur for any reason, documents shall rank in the following order of precedence: IEC 60679-1:2017 IEC 2017 7 detail specification; sectional specification; generic speci

48、fication; any other international documents (for example of the IEC) to which reference is made. The same order of precedence shall apply to equivalent national documents. 3 Terms, definitions and general information 3.1 General Units, graphical symbols, letter symbols and terminology shall, whereve

49、r possible, be taken from the following standards: IEC 60027; IEC 60050-561; IEC 60469; IEC 60617; ISO 80000-1. 3.2 Terms and definitions For the purposes of this document, the following terms and definitions apply. ISO and IEC maintain terminological databases for use in standardization at the following addresses: IEC Electropedia: available at http:/www.electropedia.org/ ISO Online browsing platform: available at http:/