IEC 60444-8-2016 Measurement of quartz crystal unit parameters - Part 8 Test fixture for surface mounted quartz crystal units《石英晶体元件参数的测量.第8部分 表面贴装石英晶体元件用测量夹具》.pdf

《IEC 60444-8-2016 Measurement of quartz crystal unit parameters - Part 8 Test fixture for surface mounted quartz crystal units《石英晶体元件参数的测量.第8部分 表面贴装石英晶体元件用测量夹具》.pdf》由会员分享，可在线阅读，更多相关《IEC 60444-8-2016 Measurement of quartz crystal unit parameters - Part 8 Test fixture for surface mounted quartz crystal units《石英晶体元件参数的测量.第8部分 表面贴装石英晶体元件用测量夹具》.pdf（20页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 60444-8 Edition 2.0 2016-12 INTERNATIONAL STANDARD Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units IEC 60444-8:2016-12(en) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2016 IEC, Geneva, Switzerland All rights reserve

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10、ebstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. IEC 60444-8 Edition 2.0 2016-12 INTERNATIONAL STANDARD Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted

11、 quartz crystal units INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 31.140 ISBN 978-2-8322-3718-2 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 IEC 60444-8:2016 IEC 2016 CONT

12、ENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope 6 2 Normative references . 6 3 Specifications 6 4 Leadless surface mounted quartz crystal units . 6 4.1 Enclosure 6 4.2 Overtone and frequency range 7 5 Specifications of measurement method, test fixture 7 5.1 Specifications of measurement method . 7 5.2 Sp

13、ecifications of transmission test fixture 7 5.3 Specifications of reflection test fixture . 10 5.4 Measuring equipment 13 6 Calibration . 13 6.1 Calibration of the transmission test system 13 6.2 Additional calibration of the transmission test system with C Ladapter board 13 6.3 Calibration of the r

14、eflection measurement system 13 Bibliography 15 Figure 1 Transmission -network test fixture: Simplified equivalent circuit diagram, frequency range from 1 MHz to 500 MHz . 7 Figure 2 Transmission -network test Fixture with physical load capacitors: simplified equivalent circuit, frequency range from

15、 1 MHz to 30 MHz . 7 Figure 3 Transmission -network test fixture: Three-dimensional projection for the test fixture . 8 Figure 4 Transmission -network test fixture: Mechanical design of the test fixture . 9 Figure 5 Transmission -network test fixture with physical load capacitors: Structure of the t

16、est fixture . 10 Figure 6 Design of the reflection test fixture 11 Figure 7 Mechanical details of the reflection test fixture 13 Figure 8 Calibration technique for the reflection test fixture . 14 IEC 60444-8:2016 IEC 2016 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT OF QUARTZ CRYSTAL U

17、NIT PARAMETERS Part 8: Test fixture for surface mounted quartz crystal units FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

18、international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (her

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24、f conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this p

25、ublication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indire

26、ct, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the

27、correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60444-8 has been prepar

28、ed by IEC technical committee 49: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition inc

29、ludes the following significant technical changes with respect to the previous edition: a) modification of Clause 1; b) modification of 5.2; c) modification of 5.3; d) modification of 5.4; 4 IEC 60444-8:2016 IEC 2016 e) 6.3 Calibration of the reflection measurement system. The text of this standard

30、is based on the following documents: CDV Report on voting 49/1126/CDV 49/1175/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A

31、 list of all parts in the IEC 60444 series, published under the general title Measurement of quartz crystal unit parameters, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site u

32、nder “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. IMPORTANT The colour inside logo on the cover

33、page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. IEC 60444-8:2016 IEC 2016 5 INTRODUCTION This document focuses on test fixtures applied to l

34、eadless surface mounted quartz crystal units. The document is the specification for fixtures 12 1that allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters of leadless surface mounted quartz crystal units. The measurement m

35、ethod using an automatic network analyzer with error correction is described in IEC 60444-5, which also contains proposals for test fixtures for quartz crystal units in through-hole packages. The measuring frequency range is from 1 MHz to 1 200 MHz, and is limited to 1 MHz to 30 MHz, if a physical l

36、oad capacitance is used. The use of the test fixtures in connection with error correction measurement techniques yields measurement accuracy of about 10 6over of the frequency range, and the accuracy of the resonance resistance is 2 or 10 %. This document forms Part 8 of a series of publications dea

37、ling with measurements of quartz crystal unit parameters. The IEC 60444 series consists of the following parts under the general title Measurement of quartz crystal unit parameters: Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by ze

38、ro phase technique in a -network Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units Part 4: Method for the measurement of the load resonance frequency f L , load resonance resistance R Land the calculation of other derived values of quartz crystal units, up t

39、o 30 MHz Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction Part 6: Measurement of drive level dependence (DLD) Part 7: Measurement of activity and frequency dips of quartz crystal units Part 8 Text fixture for s

40、urface mounted quartz crystal units Part 11 Standard method for the determination of the load resonance frequency f Land the effective load capacitance C Leffusing automatic network analyzer techniques and error correction. _ 1Numbers in square brackets refer to the Bibliography. 6 IEC 60444-8:2016

41、IEC 2016 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS Part 8: Test fixture for surface mounted quartz crystal units 1 Scope This part of IEC 60444 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures all

42、ow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L 1 , C 1and C 0using the measurement techniques specified in IEC 60444-5 and for the determination of load resonance frequency and load resonance resistance according to I

43、EC TR 60444-4 and IEC 60444-11. Two test fixtures are described in this document: 1) A fixture using the -network circuit with electrical values as described in IEC 60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for t

44、he measurement of load resonance parameters up to 30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the measurement system and C L adapter board is explained hereinafter. 2) A fixture based on the reflection method, suitable for a frequency range u

45、p to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC 60444-11. 2 Normative references The following documents are referred to in the text in such a way that some or all of their content constitutes

46、requirements of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60444-5, Measurement of quartz crystal units parameters Part 5: Methods for the determination of equivale

47、nt electrical parameters using automatic network analyzer techniques and error correction 3 Specifications The test fixture and the method for measuring the (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters shall be specified in the contract be

48、tween the crystal unit supplier and the user. The crystal unit requires special consideration as it has no lead wires, in particular if load resonance parameters are to be determined 3. 4 Leadless surface mounted quartz crystal units 4.1 Enclosure No particular specification shall be made regarding

49、the enclosure type. However, it is recommended that enclosures such as those shown in IEC 61837, be used. IEC 60444-8:2016 IEC 2016 7 4.2 Overtone and frequency range No particular specification shall be made regarding the overtone. The frequency range is from 1 MHz to 500 MHz for the described transmission fixture when the physical load capacitance is not used, and from 1 MHz to 30 MHz when the physical load capacitance is used. The frequency range for the reflecti