NEMA 77-2017 Temporal Light Artifacts Test Methods and Guidance for Acceptance Criteria.pdf

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1、NEMA Standards Publication National Electrical Manufacturers Association NEMA 77-2017 Temporal Light Artifacts: Test Methods and Guidance for Acceptance Criteria NEMA Standards Publication 77-2017 Temporal Light Artifacts: Test Methods and Guidance for Acceptance Criteria Published by: National Elec

2、trical Manufacturers Association 1300 North 17 thStreet, Suite 900 Rosslyn, Virginia 22209 www.nema.org 2017 National Electrical Manufacturers Association. All rights including translation into other languages, reserved under the Universal Copyright Convention, the Berne Convention for the Protectio

3、n of Literary and Artistic Works, and the International and Pan American Copyright Conventions. 2017 National Electrical Manufacturers Association NOTICE AND DISCLAIMER The information in this publication was considered technically sound by the consensus of persons engaged in the development and app

4、roval of the document at the time it was developed. Consensus does not necessarily mean that there is unanimous agreement among every person participating in the development of this document. NEMA standards and guideline publications, of which the document contained herein is one, are developed thro

5、ugh a voluntary consensus standards development process. This process brings together volunteers and/or seeks out the views of persons who have an interest in the topic covered by this publication. While NEMA administers the process and establishes rules to promote fairness in the development of con

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12、or health purposes. Any certification or other statement of compliance with any health or safety-related information in this document shall not be attributable to NEMA and is solely the responsibility of the certifier or maker of the statement. NEMA 77-2017 Page i 2017 National Electrical Manufactur

13、ers Association CONTENTS Foreword iv 1 General . 1 1.1 Scope 1 1.2 References . 1 2 Definitions . 3 2.1 Flicker . 3 2.2 Flicker Index . 3 2.3 Jitter 3 2.4 Maximum Light Output Waveform (MLOW) . 4 2.5 Modulation Depth 4 2.6 Percent Flicker 4 2.7 Phantom Array Effect 4 2.8 Short Term Flicker Indicator

14、, P st. 4 2.9 Stroboscopic Effect . 4 2.10 Stroboscopic Visibility Measure (SVM) . 4 2.11 Temporal Light Artifact (TLA) . 5 3 Background . 5 3.1 TLA in Common Experience . 5 3.2 Quantification of TLA 5 3.2.1 Modulation Depth and Flicker Index 6 3.2.2 Review of IEEE 1789 Metrics and Recommendations .

15、 7 3.2.3 Balancing TLA Requirements with Performance Requirements . 8 3.2.4 Metrics for Objective Assessment of TLA Visibility . 9 4 Selected Metrics . 14 5 Measurement MethodLight Source . 14 5.1 General . 14 NEMA 77-2017 Page ii 2017 National Electrical Manufacturers Association 5.2 Testing Enviro

16、nment . 15 5.3 Mains Supply 15 5.4 Test Equipment . 15 5.5 Data Collection . 16 5.6 Detailed Instructions . 17 5.6.1 Equipment Setup for Light Source DUT 18 5.6.2 Test Procedure for Light Source DUT . 18 5.6.3 Confirm Data Integrity . 20 5.6.4 Evaluate Results . 21 5.7 Conditions of Testing 22 6 Mea

17、surement MethodDimmer . 23 6.1 General . 23 6.2 Testing Environment . 23 6.3 Mains Supply 23 6.4 Test Equipment . 23 6.5 Data Collection . 24 6.6 Detailed Instructions . 26 6.6.1 Equipment Setup for Dimmer DUT . 26 6.6.2 Test Procedure for Dimmer DUT 27 6.6.3 Confirm Data Integrity . 28 6.6.4 Evalua

18、te Results . 28 6.7 Conditions of Testing 29 7 Recommendations 29 Annex A . 31 NEMA 77-2017 Page iii 2017 National Electrical Manufacturers Association FIGURES Figure 1 Definitions of Percent Flicker (Also called Modulation Depth or Modulation Percent) and Flicker Index . 3 Figure 2 Example of Strob

19、oscopic Effect. 6 Figure 3 Comparison of IEEE 1789 Recommended Limits with Several Existing Light Sources and with SVM and Pst 7 Figure 4 Plot of ASSIST and IEC Pst metrics Calculated for a 30% Modulation Depth Single- Frequency Sine Wave Light Waveform 10 Figure 5 Plot of the Visibility Threshold .

20、 11 Figure 6 Plot of the SVM Metric, as a Function of Frequency, for Single Sine Wave Modulation 12 Figure 7 Plot of the SVM Metric . 13 Figure 8 Equipment setup for TLA measurement of a light source. 14 Figure 9 General Test Procedure for Light Sources 18 Figure 10 Setup Measurement Equipment and L

21、ight Source DUT . 18 Figure 11 Procedure for Collecting Light Source TLA Data 20 Figure 12 Confirm Light Source Data Integrity 21 Figure 13 Procedure to Evaluate Light Source DUT Measurements 22 Figure 14 Equipment Setup for Dimmer Measurement . 23 Figure 15 Output of Dimmer DUT 25 Figure 16 General

22、 Test Procedure for Dimmers . 26 Figure 17 Setup Measurement Equipment and Dimmer DUT . 26 Figure 18 Procedure to Collect Dimmer Data 27 Figure 19 Procedure to Confirm Dimmer Data Integrity 28 Figure 20 Procedure to Evaluate Dimmer DUT Measurements 29 TABLES Table 1 Equipment Requirements for TLA Me

23、asurement 16 Table 2 Data Sampling Scheme . 17 Table 3 Column Headings for Measurement Data Map . 17 Table 4 Equipment Requirements for Dimmer TLA Measurement 24 Table 5 Format for Data Results Table 25 Table 6 Guidelines for Pst and SVM Acceptance Criteria 30 NEMA 77-2017 Page iv 2017 National Elec

24、trical Manufacturers Association Foreword A NEMA working group formed by a compilation of the Lighting, Lighting Controls, and Luminaire Sections has prepared this standard, Temporal Light Artifacts: Test Methods and Guidance for Acceptance Criteria. This standard provides measurement methods for me

25、trics that address temporal light artifacts (TLA) for light sources, as well as measurement methods for leading-edge phase cut dimmers. It provides initial broad guidelines for limits on these metrics. Inquiries, comments, and proposed or recommended revisions should be submitted to: Senior Technica

26、l Director, Operations National Electrical Manufacturers Association 1300 North 17 th Street, Suite 900 Rosslyn, Virginia 22209 Section approval of the standard does not necessarily imply that all section members voted for its approval or participated in its development. At the time the standard was

27、 approved, the Lighting Controls, Light Source and Luminaire sections were composed of the following members: Acuity Brands, Inc. Appleton Group Atlas Lighting Products, Inc. Coleman Cable LLC Cree, Inc. Current, powered by GE Dialight Eaton Lighting Solutions EiKO Global, LLC Energy Focus, Inc. Ene

28、rlites Inc. EYE Lighting International of N.A., Inc. Feit Electric Company, Inc. Focal Point LLC General Electric Lighting Halco Lighting Technologies Hubbell Lighting, Inc. Intense Lighting LEDVANCE LLC Legrand/Pass negative jitter is the variation in times between negative leading edges. Jitter sh

29、ould typically be observed over many hundreds of cycles, and the highest observed jitter value is used. Jitter does not need to be evenly distributed and centered on the firing angle setting. For example, 999 cycles where the firing edge is perfectly reproduced followed by a single edge that is 100s late = 100s jitter. Figure 1 Definitions of Percent Flicker (Also called Modulation Depth or Modulation Percent) and Flicker Index