NAVY MIL-T-81404 B-1985 TEST SET ELECTRICAL CIRCUIT GUIDED MISSILE LAUNCHER AND AIRCRAFT AN ASM-149C《AN ASM-149C导弹发射和飞机电气线路的测试设置》.pdf
《NAVY MIL-T-81404 B-1985 TEST SET ELECTRICAL CIRCUIT GUIDED MISSILE LAUNCHER AND AIRCRAFT AN ASM-149C《AN ASM-149C导弹发射和飞机电气线路的测试设置》.pdf》由会员分享,可在线阅读,更多相关《NAVY MIL-T-81404 B-1985 TEST SET ELECTRICAL CIRCUIT GUIDED MISSILE LAUNCHER AND AIRCRAFT AN ASM-149C《AN ASM-149C导弹发射和飞机电气线路的测试设置》.pdf(20页珍藏版)》请在麦多课文档分享上搜索。
1、-. - MIL-T-L404B 47 7777706 0256300 3 a 1. sc MILITARY SPECIFICATION TEST SET, ELECTRICAL CIRCUIT, GUIDED MISSILE LAUNCHER AND AIRCRAFT, AN/ASM-l49C This specification is approved for use by the Naval Air Systems Command, Department of the Navy and is available for use by all departments and agencie
2、s of the Department of Defense. E MIL-T-81404B (AS) 19 February 1985 SUPERSEDING 2 January 1968 MI L-T-81404A ( AS) 1.1 Scope. This specification establishes the design, performance, and acceptance requirements for the AN/ASM-149; Guided Missi1 e Launcher and Air- craft Electrical Circuit Test Set,
3、herein after referred to as the Test Set. 2. APPLICABLE DOCUMENTS 2.1 Government documents . 2.1.1 Specifications, standards, and handbooks . Un1 ess otherwise specified, the following specifications, standards and handbooks of the issue listed in that issue of Department of Defense Index of Specifi
4、cations and Standards (DoDISS) specified in the solicitation form a part of this specification to the extent specified herein. t I Beneficial conments (recomnendations, additions, deletions) and any pertinent data wnich may be of use In improving this document should be addressed to: Conmanding Offi
5、cer, Naval Air Engineering Center. Engineering Specifications and Standards Department (ESSD) Code 93, Lakehurst, NJ 08733, by using the self-addressed Standardization Document Improvement Proposal (M) Fonn 1426) appearing at the end of this document or by letter. 1 I FSC 4935 THIS DOCUMENT CONTAINS
6、 30 PAGES Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-T-L404B 47 7797706 0256303 5 MIL-T-81404B( AS) SPECIFICATIONS Military MIL-T-5422 Testi ng , Envi ronmenta 1 , Aircraft El ect roni c Equi pment MIL-1-6181 MIL-E-17555 MIL-T-18303 MIL-T-21
7、200 STANDARDS Military MIL-STD-454 MIL-STD-470 Interference Control Requirements, Ai rcra ft Equi pment Electronic and Electrical Equipment, Accessories, and Repair Parts: Packaging and Packing of Test Procedures; Preproduction and Inspec ti on, for Ai rcra ft El ectroni c Equi pment , Format for Te
8、st Equipment for use with Electronic and Electrical Equipment, General Specification for Standard Requirements for Electronic Equipment Maintainability Program Requirements for Systems and Equi pments Prediction MIL-STD-471 Ma i ntai na bi 1 i ty Demonstra ti ons MIL-STD-781 MIL-STD-1385 HANDBOOKS M
9、ilitary MIL-HDBK-472 Re1 iabil ity Tests Exponential Distribution Preclusion of Ordnance Hazards in El ectromagneti c Fiel ds ; Genera 1 Requirements for Mi 1 i ta ry Standardization Handbook, Maintai nabi 1 ity Predictions 2.1.2 Other Government documents, drawings, and publications. The following
10、other Government documents, drawings, and publications form a part of this specification to the extent specified herein. 2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-T-81404B 47 m 7777906 0256302 7 m MIL-T-81404B( AS) BULLETINS ANA Bulletin
11、No. 400 Air Force-Navy Aeronautical Bulletin Electronic Equipment; Aircraft and Guided Missiles, Applicable Documents DRAWINGS Naval Air Systems Command DL 1017AS106 Test Set, Electrical Circuit Guided Missile Launcher and Aircraft AN/ASM-149 MANUALS Naval Air Systems Command NAVAIR 17-15ASM149B-1 M
12、aintenance Instruction (Intermediate Depot ) wi t h Ca 1 i brat i on In st ruc t i ons and IPB Missile, Launcher and Aircraft El ectri ca 1 Ci rcui t Test Set AN/ASM149B-1 Suppl ementa 1 Tec hni ca 1 Ma nua 1 (Confidential ) NAVAIR 17-15ASM14B-lA (Copies of specifications, standards, handbooks, draw
13、ings and pub1 ications required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contract i ng off i Cer . ) 2.1.3 Order of precedence. of this specification and the references cited herein, the text of this spe
14、cification shall take precedence. In the event of a conflict between the text 3. REQUIREMENTS subjected to first article inspection (see 4.4 and 6.3). 3.1 First article. When specified (see 6.2.1), a sample shall be 3.2 Parts and materials. 3.2.1 Supplemental requirements. In the event that the cont
15、ractor proposes to alter the equipment design delineated by this specification and applicable drawings, the following supplemental requirements for the selection of parts and materials are applicable. Parts and materials selected for use in the equipment shall conform to the requirements of MIL-T-21
16、200. selected from those parts included in ANA Bulletin No. 400, unless the parts listed therein will not perform as required in the intended applications and environments specified herein, in which case 3.2.1 applies. 3.2.1.1 Basic conformance. Parts shall be 3 Provided by IHSNot for ResaleNo repro
17、duction or networking permitted without license from IHS-,-,-MIL-T-L404B 47 H 7777706 0256303 7 H MIL-T-81404B( AS) 3.2.1.2 Interchangeability. The test set shall meet the interchange- a bi 1 i ty requi rements of MIL-T-21200. The drawings 1 i sted in DL 1017AS100 shall be standard for measuring int
18、erchangeability of all applicable units, assemblies, subassemblies, and parts. 3.3 Design and construction. The test set shall be manufactured in accordance with DL 1017AS100, except insofar as errors of omission or commission in the data list may be incompatible with this specification. any case, i
19、t is a condition of final acceptance that the test sets manufactured meet all the performance requirements of this specification, and appropriate test documents. In 3.3.1 Reliability. 3.3.1.1 Operational stability. The test set shall operate with required performance, continuously or intermittently
20、for a period of at least 50 hours without the necessity for readjustment of any controls which are inaccessible to the operator during nomal use (see 4.4.1.2). of 10,000 hours with minimum servicing and replacement of parts. 3.3.1.2 Operating life. The test set shall have a total operating life 3.3.
21、1.3 Reliability in mean-time-between-failures (MTBFL. The test set shall have a minimum of 300 hours of mean (operating) time between failures when tested and accepted as specified in 4.5.3. 3.3.2 Radio interference. The generation of radio interference by the equipment and vulnerability of the test
22、 set to radio interference shall be within the limits of MIL-1-6181 except that broadband switching transient interference may exceed the limits as follows: a. Conducted 50 db above 1 microvolt/mhz b. Radiated below 25 mhz 30 db above 1 microvolt/mhz c. Radiated above 15 mhz 10 db above 1 microvolt/
23、mhz The test set shall operate within the specified tolerance limits specified in 3.5 while being operated in a radio frequency interference environment as specified in MIL-STD-l385.(see 4.6) establish normal performance characteristics under standard conditions and for making laboratory bench tests
24、. 3.3.3 Standard conditions. The following conditions shall be used to a Tempera ture Room ambient (30 5 10C) b. Altitude Normal ground c. Vibration None d. Humidity Room ambient e. Input power voltage 115 3: 1.5 volts, 400 3: 5 Hz ac 4 Provided by IHSNot for ResaleNo reproduction or networking perm
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