NAVY MIL-STD-1309 D-1992 DEFINITIONS OF TERMS FOR TESTING MEASUREMENT AND DIAGNOSTICS《测量和诊断测试的定义》.pdf

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1、NOT MEASUREMENT SENSITIVE IMIL-STD-1309D12 February 1992SUPERSEDINGMIL-STD-1309C18 November 1983MILITARY STANDARDDefinitions of TermsforTesting, Measurement and DiagnosticsAMSC N/A AREA ATTSDISTRIBUTION STATEMENT A. Approved for public release; distribution isunlimited.Provided by IHSNot for ResaleN

2、o reproduction or networking permitted without license from IHS-,-,-MIL-STD-1309DFOREWORD1. This military standard is approved for use by all Departments andAgencies of the Department of Defense.2. Beneficial comments (recommendations, additions, deletions) and anypertinent data which may be of use

3、in improving this document should be addressedto: Commander, Naval Sea Systems Command, SEA 55Z3, Department of the Navy,Washington, DC 20362-5101 by using the self-addressed Standardization DocumentImprovement Proposal (DD Form 1426) appearing at the end of this document or byletter.3. Testing, mea

4、surement, and the use of diagnostic devices are a prerequi-site for maintaining operational readiness of equipment used by the three servicesin the performance of their assigned tasks. In order to improve commun-icationsand to facilitate coordination, key words or terms, more commonly used, are defi

5、nedin this standard.4. Not every testing, measurement and diagnostic term is listed.Oscilloscope, voltmeter and similar terms, which can be readily found in anystandard technical dictionary, have been excluded. This document contains termsselected from the following sources:SPECIFICATIONSMIL-T-28800

6、 Test Equipment for Use with Electrical andElectronic Equipment, General SpecificationsforAFGS-87256 Generic Integrated Maintenance DiagnosticsSTANDARDSDOD-STD-1OOMIL-STD-415MIL-STD-471MIL-STD-721MIL-STD-1364MIL-sTD-1388MIL-STD-2077DOD-STD-2121MIL-STD-2165Engineering Drawing Practices (Chapter 700 -

7、Definitions)Test Provisions for Electronic Systems andAssociated Equipment, Design Criteria forMaintainability Demonstration (Demonstrationand Evaluation of Equipment/System Built-in-Test/External Test/Fault Isolation/TestabilityAttributes and Requirements addendum)Definitions of Terms for Reliabili

8、ty andMaintainabilityStandard General Purpose Electronic TestEquipmentLogistics Support Analysis (Appendix B,Glossary)- General Requirements Test Program SetsDetermination of Electronic Test EquipmentParametersTestability Program for Electronic Systemsand EquipmentsiiProvided by IHSNot for ResaleNo

9、reproduction or networking permitted without license from IHS-,-,-MIL-STD-1309DOTHERAR 750-43 - Test, Measurement, and Diagnostic EquipmentJoint DARCOM/NMC/AFLC/AFSC/Commanders Selection Guide for Digital TestProgram Generation SystemsAMERICAN NATIONAL STANDARDS INSTITUTE (ANSI)/INSTITUTE OFELECTRIC

10、AL AND ELECTRONICS ENGINEERS, INC. (IEEE)100-1974 - Dictionary of Electrical and Electronics Terms100-1988 - Dictionary of Electrical and Electronics Terms416-1984 - ATLAS Test Language716-1985 - C/ATLhS Test LanguageiiiProvided by IHSNot for ResaleNo reproduction or networking permitted without lic

11、ense from IHS-,-,-MIL-STD-1309DCONTENTSParagraph IlltX21.2.3.4.5.6.SCOPE. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1.1 Purpose . . . . . . . . . . . . . . . . . . . . . . . . . .1.2 Scope . . . . . . . . . . . . . . . . . . . . . . . . . .APPLICABLE DOCUMENTS . . . . . . . . . . . .

12、. . . . . . . . . .2.1 Government documents. . . . . . . . . . . . . . . . . . . .2.2 Non-Government publications . . . . . . . . . . . . . . . .2.3 Orderofprecedence . . . . . . . . . . . . . . . . . . . .DEFINITIONS. . . . . . . . . . . . . . . . . . . . . . . . . .3.1 Definitions of terms used in

13、 this standard . . . . . . . . .3.2 Definitions of acronyms used in this standard . . . . . . .GENERAL REQUIREMENTS . . . . . . . . . . . . . . . . . . . . . .4.1 Purpose of TMDE definitions . . . . . . . . . . . . . .DETAILED REQUIREMENTS. . . . . . . . . . . . . . . . . . . . .NOTES . . . . . . .

14、. . . . . . . . . . . . . . . . . . . . . . .6.1 Intended Use . . . . . . . . . . . . . . . . . . . . . . .6.2 Acquisition requirements . . . . . . . . . . . . . . . . .6.3 Subject term (key word) listing . . . . . . . . . . . . . .6.4 Chances from Drevious issue . . . . . . . . . . . . . . .1111112

15、22565858585858585858ivProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-1309D1. SCOPE1.1 Purpose. The purpose of this standard is to standardize the defini-tions of the most commonly used terms for testing, measurement and diagnostics.1.2 Scope

16、. This standard establishes the definitions most commonly used fortest, measurement and diagnostics.2. APPLICABLE DOCUMENTS2.1 Government documents.2.1.1 Secifications, standards. and handbooks. The following specifica-tions, standards, and handbooks form a part of this docwnent to the extentspecifi

17、ed herein. Unless otherwise specified, the issues of these documents arethose listed in the issue of the Department of Defense Index of Specifications andStandards (DODISS) and supplement thereto, cited in the solicitation (see 6.2).SPECIFICATIONSMILITARYMIL-T-28800STANDARDSMILITARYMIL-STD-1839 -MIL

18、-STD-2077(NAVY)-MIL-STD-7935.1-S -MIL-STD-38793 -MIL-STD-45662 -Test Equipment for Use with Electrical andElectronic Equipment, General SpecificationsforCalibration and Measurement RequirementsGeneral Requirements Test Program SetsAutomated Data Systems Documentation StandardsTechnical Manuals: Prep

19、aration of CalibrationProceduresCalibration Systems Requirements2.2 Fen-Government Duplications. The following documents form a part ofthis standard to the extent specified herein. Unless otherwise specified, theissues of the documentsDoDISS specified in thedocuments not listed insolicitation (see 6

20、.2).IEEE Std 416-1984716-1989which are DOD adopted shall be those listed in the issue ofsolicitation. Unless otherwise specified, the issues ofthe DODISS are the issued of the documents cited in the- IEEE Standard ATLAS Test Language- C/ATLAS Test Language(Application for copies should be addressed

21、to the Institute of Electricaland Electronics Engineers, Inc., 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ08855-1331.)(Non-Government standards and other publications are normally available fromthe organizations that prepare or distribute the documents. These documents alsomay be available in or th

22、rough libraries or other informational services.)1Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-1309D2.3 Order of Precedence. In the event of a conflict between the text ofthis document and the references cited herein, the text of this docu

23、ment shall takeprecedence. Nothing in this document, however, supersedes appli-cable laws andregulations unless a specific exemption has been obtained.3. DEFINITIONS3.1 Definitions of terms used in this standard. The following defini-tionsshall apply to the terms stated.3.1.1 Absolute error. The mag

24、nitude of the error without regard toalgebraic sign.3.1.2 Absolute measurement. The measurement in which the comparison isdirectly with quantities whose units are basic units of the system. Notes: (a)For example, the measurement of speed by measurements of distance and time is anabsolute measurement

25、, but the measurement of speed by a speedometer is not anabsolute measurement. (b) The word absolute implies nothing about precision oraccuracy.3.1.3 Accelerated life test. A test in which certain factors, such asvoltage, temperature, and so forth, are increased or decreased beyond normaloperating v

26、alues to obtain observable deterioration in reasonable period of time,and thereby afford some measure of the probable life under normal operatingconditions or some measure of the durability of the equipment when exposed to thefactors being aggravated.3.1.4 Acceptance test. Aoperating in accordance w

27、ith the3.1.5 Accessory. (1) Antest to verify if the unit under test (UUT) isoperational specifications.accessory is an assembly of a group of parts or aunit which is not always required for the operation of a test set or unit asoriginally designed but serves to extend the functions or capabilities o

28、f the testset; similarly as headphones for a radio set supplied with a loud-speaker, avibrator power unit for use with a set having a built-in power supply, or a remotecontrol unit for use with a set having integral controls. (2) A part, subassembly,or assembly designed for use in conjunction with o

29、r to supplement another assembly,or a unit or set, contributing to the effectiveness thereof without extending orvarying the basic function of the assembly or set. An accessory may be used fortesting, adjusting, or cali-brating purposes. (Examples: test instrument,recording camera for radar set, hea

30、dphones, emergency power supply).3.1.6 Accuracy. (1) The quality of freedom from mistake or error, that is,of conformity to truth or to a rule. Notes: (a) Accuracy is distinguished fromprecision as in the following example: A six-place table is more precise than afour-place table. However, if there

31、are errors in the six-place table, it may bemore or less accurate than the four-place table. (b) The accuracy of an indicatedor recorded value is expressed by the ratio of the error of the indicated value tothe true value. It is usually expressed in percent. Since the true value cannotbe determined

32、exactly, the measured or calculated value of highest availableaccuracy is taken to be the true value or reference value. Hence, when a meter iscalibrated in a given echelon, the measurement made on a meter of a higher-accuracy2Provided by IHSNot for ResaleNo reproduction or networking permitted with

33、out license from IHS-,-,-MIL-STD-1309Dechelon usually will be used as the reference value. Comparison of resultsobtained by different measurement procedures is often useful in establishing thetrue value. (2) The degree of correctness with which a measured value agrees withthe true value.3.1.7 Accura

34、cy aumentation routine. Test routines using auxiliary testequipment that is more accurate than the automatic test equipment complement, asmay be necessary when test accuracy ratios cannot be met otherwise.3.1.8 Accuracv enhancement. A process which provides accuracies beyond theindividual instrument

35、 capability by monitoring the instrument performance withanother instrument of much greater accuracy over the duration of the test, or bymeans of software algorithms.3.1.9 Accuracy rating. The accuracy classification of the instrument. Itis given as the limit, usually expressed as a percentage of fu

36、ll-scale value ofreading or of programmed value, that errors will not exceed when the instrument isused under reference conditions.3.1.10 Acquisition time. The time required for a test and measurementsystem to acquire an input signal, the minimum time needed to accurately measurethe applied input.3.

37、1.11 Active built-in-test (BIT). A type of BIT which periodicallydisrupts the prime system operation through the injection of test stimuli into thesystem. Also referred to as BIT, active,3.1.12 Active redundance. That condition where parallel back-up items areoperating simultaneously, rather than be

38、ing switched on when needed.3.1.13 Active sensor. (1) A sensor requiring a source of power other thanthe signal being measured. (2) A sensor that provides a signal by stimulating theUuT.3.1.14 Active testing. The process of determining equipment static anddynamic characteristics by performing a seri

39、es of measurements during a series ofknown operating conditions. Active testing may require an interruption of normalequipment operations and it involves measurements made over the range of equipmentoperation.3.1.15 Adauter. (1) A device for connecting parts that will not mate. Anaccessory to conver

40、t a device to a new or modified use. (2) A device or series ofdevices designed to provide a compatible connection between the unit under test andthe test equipment. May include proper stimuli or loads not contained in the testequipment.3.1.16 Adater kit. A kit containing an assortment of cables and

41、adaptersfor use with test or support equipment.3.1.17 Adiust. Change the value of some element of the mechanism, or thecircuit of the instrument or of an auxiliary device, to bring the indication to a3Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-M

42、IL-STD-1309Ddesired value, within a specified tolerance for a particular value of the quantitymeasured.3.1.18 Adjustment. Changing (by electronic, electrical or physical means) avariable in an item to cause a change in its output characteristics.3.1.19 Alorithmicallv jzeneratedpattern. An array of d

43、igital data auto-matically generated by a predetermined software routine or program. The patternmay be generated and applied in real time.3.1.20 Alim. To adjust a circuit, equipment or system so that their func-tions are properly synchronized or their relative positions properly oriented. Forexample

44、, trimmers, padders, or variable inductances in tuned circuits are adjustedto give a desired response for fixed tuned equipment or to provide tracking fortuneable equipment.3.1.21 Alignment. Performing the adjustments that are necessary to returnan item to specified operation.3.1.22 Alimment kit. A

45、set of instruments or tools necessary for theadjustment of electrical or mechanical components.3.1.23 Alimment roram. A program used to align instruments and signalpaths to known characteristics.3.1.24 Ambipuitv delav. A delay model which allows the minimum and maximumpropagational delay through an

46、element to be specified. The state of the elementbetween minimum and maximum delay is unknown, and is called the ambiguity region.3.1.25 AmbijzuitvKrouv. (1) A group of replaceable items which may havefaults resulting in the same fault signature. (2) The group of items to which agiven fault is isola

47、ted, any one of which may be the actual faulty item.3.1.26 Analo. Data in the form of continuously variable quantities, suchas voltage, frequency, current, etc.3.1.27 Analo computer. A computer which represents variables by existinganalogies. Thus, a computer which solves problems by translating exi

48、sting condi-tions such as flow, temperature, pressure, angular position or voltage into relatedmechanical or electrical equivalent quantities as an analog for the existingphenomenon being investigated. In general, it is a computer which uses an analogfor each variable and produces analog as outputs.

49、 Thus, an analog computermeasures continuous quantities whereas a digital computer operates on discretedata.3.1.28 Ancillarv euiment. Equipment which is auxiliary or supplementaryto prime equipment installation. Ancillary equipment usually consists of standardoff-the-shelf items such as an oscilloscope or distortion analyzer.3.1.29 Aperture delav. The time elapsed from the hold command to when theswitch actually opens.4Provided by IHSNot f