JEDEC JESD320-A-1992 Conditions for Measurement of Diode Static Parameters《二极管统计参数的测量条件》.pdf

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1、JEDEC STANDARD Conditions for Measurement of Diode Static Parameters JESD32O-A (Revision of EIA-320) DECEMBER 1992 (Reaffirmed: APRIL 1999, APRIL 2002) JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved thr

2、ough the JEDEC Board of Directors level and subsequently reviewed and approved by the JEDEC legal counsel. JEDEC standards and publications are designed to serve the public interest through ehting misunderstandmgs between manufacturers and purchasers, facilitating interchangeability and improvement

3、of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally. JEDEC standards and publications are adopted without regard to whether or no

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5、cations represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met. Inquiries, comments, and suggestions rel

6、ative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or call (703) 907-7559 or www.jedec.org Published by OJEDEC Solid State Technology Association 2002 2500 Wilson Boulevard Arlington, VA 22201-3834 This document may be downloaded free of cha

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8、 1-800-854-7179, International (303) 397-7956 Printed in the U.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by JEDEC and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering int a

9、 license agreement. For informatioq contact: JEDEC Solid State Technology Association 2500 Wilson Boulevard Arlingtq Virginia 2220 1 - 3 8 34 or call (703) 907-7559 EIA-3 2 O -A Page 1 CONDITIONS FOR MEASUREMENT OF DIODE BTATIC PARAMETERS (From Standards Proposal No. 2720-A, formulated under the cog

10、nizance of JC-22.4 Subcommittee on Signal and Regulator Diodes) 1. PURPOSE When measuring a temperature-sensitive static parameter under conditions such that the product of the applied voltage and current at the test point produces a power dissipation level that will cause significant heating of the

11、 junction, the measured result may be subject to errors due to thermal or transient effects. In order to avoid such errors, the measurement should be made under defined conditions. 2. STEADY STATE de MEASUREMENTS When making measurements under conditions of steady state dc, a condition of thermal eq

12、uilibrium may be considered to have been achieved if halving the time between the application of power and the taking of the reading causes no error in the indicated results within the required accuracy of measurement. For these purposes very long pulses or step functions may be considered as steady

13、 state dc. When appropriate, the mounting conditions (TL or T,) or the thermal resistance (reference point to ambient RK, or R,) shall be specified. 3. PULSE MEASUREMENTS When a measurement is made under pulse conditions, the point of measurement after the start of the pulse shall be chosen such tha

14、t it is long enough to avoid electrical transient effects, and short enough to avoid heating effects. This can be ensured if halving the minimum selected time, or doubling the maximum selected time, will not produce errors beyond the defined accuracy of the measurement. The pulse measurement may be intended to correlate to a steady state dc measurement, provided that a correlation has been established.