JEDEC J-STD-033C-1-2014 Handling Packing Shipping and Use of Moisture Reflow Sensitive Surface Mount Devices.pdf
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1、JOINTINDUSTRYSTANDARDHandling, Packing,Shipping and Use ofMoisture/ReflowSensitive SurfaceMount DevicesIPC/JEDEC J-STD-033C-1August 2014Supersedes IPC/JEDEC J-STD-033CFebruary 2012Notice JEDEC and IPC Standards and Publications are designed to serve the publicinterest through eliminating misundersta
2、ndings between manufacturers andpurchasers, facilitating interchangeability and improvement of products,and assisting the purchaser in selecting and obtaining with minimum delaythe proper product for his particular need. Existence of such Standards andPublications shall not in any respect preclude a
3、ny member or nonmemberof JEDEC or IPC from manufacturing or selling products not conformingto such Standards and Publications, nor shall the existence of such Standardsand Publications preclude their voluntary use by those other than JEDECand IPC members, whether the standard is to be used either do
4、mesticallyor internationally.Recommended Standards and Publications are adopted by JEDEC andIPC without regard to whether their adoption may involve patents on articles,materials, or processes. By such action, JEDEC and IPC do not assume anyliability to any patent owner, nor do they assume any oblig
5、ation whateverto parties adopting the Recommended Standard or Publication. Users are alsowholly responsible for protecting themselves against all claims of liabilitiesfor patent infringement.The material in this joint standard was developed by the JEDEC JC-14.1Committee on Reliability Test Methods f
6、or Packaged Devices and the IPCPlastic Chip Carrier Cracking Task Group (B-10a)For Technical Information Contact:JEDECSolid State Technology Association3103 North 10th Street, Suite 240-SArlington, VA 22201-2107Tel 703 907.0026Fax 703 907.7501IPC3000 Lakeside Drive, Suite 309SBannockburn, Illinois60
7、015-1249Tel 847 615.7100Fax 847 615.7105Please use the Standard Improvement Form shown at the end of thisdocument.Copyright 2014. JEDEC Solid State Technology Association, Arlington, Virginia, and IPC, Bannockburn, Illinois, USA. All rights reservedunder both international and Pan-American copyright
8、 conventions. Any copying, scanning or other reproduction of these materials withoutthe prior written consent of the copyright holder is strictly prohibited and constitutes infringement under the Copyright Law of the UnitedStates.IPC/JEDEC J-STD-033C-1Handling, Packing,Shipping and Use ofMoisture/Re
9、flowSensitive SurfaceMount DevicesA joint standard developed by the JEDEC JC-14.1 Committee onReliability Test Methods for Packaged Devices and the B-10a PlasticChip Carrier Cracking Task Group of IPCUsers of this standard are encouraged to participate in thedevelopment of future revisions.Contact:J
10、EDECSolid State Technology Association3103 North 10th Street, Suite 240-SArlington, VA 22201-2107Tel 703 907.0026Fax 703 907.7501IPC3000 Lakeside Drive, Suite 309SBannockburn, Illinois60015-1249Tel 847 615.7100Fax 847 615.7105Supersedes:IPC/JEDEC J-STD-033C -February 2012IPC/JEDEC J-STD-033B.1includ
11、es Amendment 1 -January 2007IPC/JEDEC J-STD-033B -October 2005IPC/JEDEC J-STD-033A -July 2002IPC/JEDEC J-STD-033 -April 1999JEDEC JEP124IPC-SM-786A - January 1995IPC-SM-786 - December 1990This Page Intentionally Left BlankAcknowledgmentMembers of the Joint IPC/JEDEC Moisture Classification Task Grou
12、p have worked to develop this document. We wouldlike to thank them for their dedication to this effort. Any standard involving a complex technology draws material from avast number of sources. While the principal members of the Joint Moisture Classification Working Group are shown below,it is not po
13、ssible to include all of those who assisted in the evolution of this Standard. To each of them, the members of theJEDEC and IPC extend their gratitude.IPC Plastic Chip CarrierCracking Task Group, B-10aChairmanSteven MartellSonoscan, Inc.JEDEC JC 14.1CommitteeChairmanJack McCullenIntel CorporationJED
14、EC JC 14ChairmanNick LycoudesFreescale SemiconductorJoint Working Group MembersDoug Derry, AccuAssemblyRanjit Gannamani, Advanced MicroDevicesJoseph Smetana, Alcatel-LucentRussell Nowland, Alcatel-LucentBradley Smith, Allegro MicroSystemsInc.Maurice Brodeur, Analog DevicesInc.Bill Strachan, ASTA - P
15、ortsmouthUniversityLyle Burhenn, BAE SystemsPlatform SolutionsMary Bellon, Boeing Research the replacement of an attached compo-nent; or the heating and repositioning of a previously attached component.1.5.12 Shelf Life The minimum time that a dry-packed, moisture-sensitive device can be stored in a
16、n unopened moisturebarrier bag (MBB) such that a specified interior bag ambient humidity is not exceeded.1.5.13 SMD Surface mount device.Note: For the purpose of this standard, SMD is restricted to include only plastic-encapsulated SMDs and other packagesmade with moisture-permeable materials.1.5.14
17、 Solder Reflow A solder attachment process in which previously applied solder or solder paste is melted to attacha component to a printed circuit board.IPC/JEDEC J-STD-033C-1 August 201421.5.15 Water Vapor Transmission Rate (WVTR) A measure of the permeability of plastic film or metallized plastic f
18、ilmmaterial to moisture.2 APPLICABLE DOCUMENTS (Normative)2.1 American Society for Testing and Materials (ASTM)1ASTM F 1249 Standard Test Method for Water Vapor Transmission Rate Through Plastic Film and Sheeting Using a Modu-lated Infrared Sensor.ASTM F 392 Standard Test Method for Flex Durability
19、of Flexible Barrier Materials2.2 Electronic Industries Alliance (EIA, JEDEC)2EIA-541 Packaging Material Standards for ESD Sensitive ItemsJESD625 Requirements for Handling Electrostatic Discharge Sensitive Devices (ESDS)JEP113 Symbol and Labels for Moisture Sensitive DevicesJESD22-A113 Preconditionin
20、g of Non-hermetic Surface Mount Components Prior to Reliability TestingJESD22-A120 Test Method for the Measurement of Moisture Diffusivity and Water Solubility in Organic Materials Used inIntegrated Circuits2.3 IPC Standards3IPC-7711 Rework of Electronic AssembliesIPC-7721 Repair and Modification of
21、 Printed Boards and Electronic Assemblies2.4 Joint Industry Standards4J-STD-020 Moisture/Reflow Sensitivity Classification for Non-hermetic Solid State Surface Mount DevicesJ-STD-075 Classification of Non-IC Electronic Components for Assembly Processes2.5 Department of Defense5MIL-PRF-81705 Type I -
22、 Barrier Materials Flexible, Electrostatic-free, Heat SealableMIL-D-3464 Type II - Desiccant, Activated, Bagged, Packaging Use and Static Dehumidification3 DRY PACKING3.1 Requirements Dry-packing requirements for the various moisture sensitivity levels are shown in Table 3-1. The lev-els are determi
23、ned per J-STD-020, J-STD-075, and/or per JESD22-A113 plus environmental reliability testing. As a mini-mum, all materials used in dry packing should conform to EIA-541.3.2 Drying of SMD Packages and Carrier Materials Before Being Sealed in MBBs3.2.1 Drying Requirements - Levels 2a - 5a SMD packages
24、classified at Levels 2a through 5a must be dried (see Clause4) prior to being sealed in MBBs. The period between drying and sealing must not exceed the MET less the time allowedfor distributors to open the bags and repack parts. If the suppliers actual MET is more than the default 24 hours, then the
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