ITU-T O 172-2005 Jitter and Wander Measuring Equipment for Digital Systems which are Based on the Synchronous Digital Hierarchy (SDH) (Study Group 4 Covering Note Erratum 10 2005)《.pdf
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1、 International Telecommunication Union ITU-T O.172TELECOMMUNICATION STANDARDIZATION SECTOR OF ITU (04/2005) SERIES O: SPECIFICATIONS OF MEASURING EQUIPMENT Equipment for the measurement of digital and analogue/digital parameters Jitter and wander measuring equipment for digital systems which are bas
2、ed on the synchronous digital hierarchy (SDH) ITU-T Recommendation O.172 ITU-T O-SERIES RECOMMENDATIONS SPECIFICATIONS OF MEASURING EQUIPMENT General O.1O.9 Maintenance access O.10O.19 Automatic and semi-automatic measuring systems O.20O.39 Equipment for the measurement of analogue parameters O.40O.
3、129 Equipment for the measurement of digital and analogue/digital parameters O.130O.199 Equipment for the measurement of optical channel parameters O.200O.209 For further details, please refer to the list of ITU-T Recommendations. ITU-T Rec. O.172 (04/2005) i ITU-T Recommendation O.172 Jitter and wa
4、nder measuring equipment for digital systems which are based on the synchronous digital hierarchy (SDH) Summary This Recommendation specifies instrumentation that is used to generate and measure jitter and wander in digital systems based on the SDH. Measurement requirements for both SDH line interfa
5、ces and SDH tributary interfaces operating at PDH bit rates are addressed in this Recommendation. The requirements for the characteristics of the jitter and wander measuring equipment that are specified in this Recommendation must be adhered to in order to ensure consistency of results between equip
6、ment produced by different manufacturers. Source ITU-T Recommendation O.172 was approved on 13 April 2005 by ITU-T Study Group 4 (2005-2008) under the ITU-T Recommendation A.8 procedure. Keywords Input jitter tolerance, Input wander tolerance, Jitter generation, Jitter measurement, Jitter transfer f
7、unction, Output jitter, Output wander, Phase transients, Pointer jitter, Pointer sequence generation, Wander generation, Wander measurement, Wander noise transfer. ii ITU-T Rec. O.172 (04/2005) FOREWORD The International Telecommunication Union (ITU) is the United Nations specialized agency in the f
8、ield of telecommunications. The ITU Telecommunication Standardization Sector (ITU-T) is a permanent organ of ITU. ITU-T is responsible for studying technical, operating and tariff questions and issuing Recommendations on them with a view to standardizing telecommunications on a worldwide basis. The
9、World Telecommunication Standardization Assembly (WTSA), which meets every four years, establishes the topics for study by the ITU-T study groups which, in turn, produce Recommendations on these topics. The approval of ITU-T Recommendations is covered by the procedure laid down in WTSA Resolution 1.
10、 In some areas of information technology which fall within ITU-Ts purview, the necessary standards are prepared on a collaborative basis with ISO and IEC. NOTE In this Recommendation, the expression “Administration“ is used for conciseness to indicate both a telecommunication administration and a re
11、cognized operating agency. Compliance with this Recommendation is voluntary. However, the Recommendation may contain certain mandatory provisions (to ensure e.g. interoperability or applicability) and compliance with the Recommendation is achieved when all of these mandatory provisions are met. The
12、words “shall“ or some other obligatory language such as “must“ and the negative equivalents are used to express requirements. The use of such words does not suggest that compliance with the Recommendation is required of any party. INTELLECTUAL PROPERTY RIGHTS ITU draws attention to the possibility t
13、hat the practice or implementation of this Recommendation may involve the use of a claimed Intellectual Property Right. ITU takes no position concerning the evidence, validity or applicability of claimed Intellectual Property Rights, whether asserted by ITU members or others outside of the Recommend
14、ation development process. As of the date of approval of this Recommendation, ITU had not received notice of intellectual property, protected by patents, which may be required to implement this Recommendation. However, implementors are cautioned that this may not represent the latest information and
15、 are therefore strongly urged to consult the TSB patent database. ITU 2005 All rights reserved. No part of this publication may be reproduced, by any means whatsoever, without the prior written permission of ITU. ITU-T Rec. O.172 (04/2005) iii CONTENTS Page 1 Scope 1 2 References. 1 2.1 Normative re
16、ferences 1 2.2 Informative references 2 3 Definitions 2 4 Abbreviations 3 5 Conventions 3 6 Functional block diagram . 4 7 Interfaces. 4 7.1 Optical interfaces 4 7.2 Electrical interfaces 5 7.3 External reference clock input 5 7.4 Input interface sensitivity . 5 8 Jitter/wander generation function .
17、 5 8.1 Modulation source 5 8.2 Clock generator 6 8.3 Digital test pattern generator 6 8.4 Pointer sequence generator. 7 8.5 Minimum jitter/wander generation capability 8 8.6 Generation accuracy . 9 9 Jitter measurement function 11 9.1 Reference timing signal 11 9.2 Measurement capabilities . 11 9.3
18、Measurement bandwidths. 13 9.4 Measurement accuracy . 15 9.5 Jitter transfer measurement accuracy . 18 9.6 Additional facilities 18 10 Wander measurement function. 18 10.1 Reference timing signal 18 10.2 Measurement of TIE (Time Interval Error) 18 10.3 Measurement of transient TIE (Time Interval Err
19、or) . 19 10.4 Measurement of MTIE (Maximum Time Interval Error). 20 10.5 Measurement of TDEV (Time Deviation) . 22 10.6 Measurement of frequency offset. 23 10.7 Measurement of frequency drift rate 24 11 TDEV wander noise generation function . 26 iv ITU-T Rec. O.172 (04/2005) Page 12 MTIE wander nois
20、e generation function 26 13 Operating environment . 26 Annex A Structured test signals for the measurement of jitter. 27 A.1 Introduction 27 A.2 Test signal structure for STM-N signals 27 A.3 Test signal structure for concatenated STM-N signals. 28 Annex B Definition of band-limited peak-to-peak pha
21、se slope error. 29 Annex C MTIE upper limit for TDEV wander noise . 30 Appendix I Guidelines concerning the measurement of jitter in SDH systems 32 Appendix II Guidelines concerning the measurement of wander in SDH systems 33 II.1 Wander measurements 33 II.2 Clock stability measurements. 34 Appendix
22、 III Guidelines concerning the generation of pointer test sequences. 35 Appendix IV Total jitter measurement function response 36 IV.1 Introduction 36 IV.2 Measurement filter parameters . 36 IV.3 Mask limits for high-pass measurement filter response. 36 Appendix V Verification of MTIE and TDEV calcu
23、lation algorithms 38 V.1 TIE noise source functional description. 38 V.2 First example of TIE noise generator . 38 V.3 Second example of TIE noise generator. 38 Appendix VI MTIE generation evaluation . 39 Appendix VII Method for verification of measurement result accuracy and intrinsic fixed error .
24、 42 VII.1 Verification description and application 42 VII.2 System implementation 42 VII.3 Results and interpretation. 45 Appendix VIII Method for characterization of transmit intrinsic jitter 47 VIII.1 Verification description and application 47 VIII.2 Method 47 VIII.3 Diagnostic test pattern 49 VI
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