ITU-T K 94-2012 Mutual disturbance test method for evaluating performance degradation of converged terminal devices (Study Group 5)《(预发布)为融合终端设备性能退化评价的互扰试验法》.pdf

《ITU-T K 94-2012 Mutual disturbance test method for evaluating performance degradation of converged terminal devices (Study Group 5)《(预发布)为融合终端设备性能退化评价的互扰试验法》.pdf》由会员分享，可在线阅读，更多相关《ITU-T K 94-2012 Mutual disturbance test method for evaluating performance degradation of converged terminal devices (Study Group 5)《(预发布)为融合终端设备性能退化评价的互扰试验法》.pdf（20页珍藏版）》请在麦多课文档分享上搜索。

1、 International Telecommunication Union ITU-T K.94TELECOMMUNICATION STANDARDIZATION SECTOR OF ITU (05/2012) SERIES K: PROTECTION AGAINST INTERFERENCE Mutual disturbance test method for evaluating performance degradation of converged terminal devices Recommendation ITU-T K.94 Rec. ITU-T K.94 (05/2012)

2、 i Recommendation ITU-T K.94 Mutual disturbance test method for evaluating performance degradation of converged terminal devices Summary With the rapid progress of the telecommunication terminal technology, more and more converged devices are appearing on the market. As the modules of the converged

3、devices are so close together, if the printed circuit board (PCB) is not designed properly, without adequate earthing, shielding or filtering, an electromagnetic compatibility (EMC) disturbance can occur between the modules. Recommendation ITU-T K.94 analyses the EMC disturbance between different mo

4、dules in converged terminal devices and defines a conducted test method. This mutual-disturbance test can be used as one of the immunity test items listed in Recommendation ITU-T K.34 and Recommendation ITU-T K.48 to determine the level of performance degradation. History Edition Recommendation Appr

5、oval Study Group 1.0 ITU-T K.94 2012-05-29 5 ii Rec. ITU-T K.94 (05/2012) FOREWORD The International Telecommunication Union (ITU) is the United Nations specialized agency in the field of telecommunications, information and communication technologies (ICTs). The ITU Telecommunication Standardization

6、 Sector (ITU-T) is a permanent organ of ITU. ITU-T is responsible for studying technical, operating and tariff questions and issuing Recommendations on them with a view to standardizing telecommunications on a worldwide basis. The World Telecommunication Standardization Assembly (WTSA), which meets

7、every four years, establishes the topics for study by the ITU-T study groups which, in turn, produce Recommendations on these topics. The approval of ITU-T Recommendations is covered by the procedure laid down in WTSA Resolution 1. In some areas of information technology which fall within ITU-Ts pur

8、view, the necessary standards are prepared on a collaborative basis with ISO and IEC. NOTE In this Recommendation, the expression “Administration“ is used for conciseness to indicate both a telecommunication administration and a recognized operating agency. Compliance with this Recommendation is vol

9、untary. However, the Recommendation may contain certain mandatory provisions (to ensure, e.g., interoperability or applicability) and compliance with the Recommendation is achieved when all of these mandatory provisions are met. The words “shall“ or some other obligatory language such as “must“ and

10、the negative equivalents are used to express requirements. The use of such words does not suggest that compliance with the Recommendation is required of any party. INTELLECTUAL PROPERTY RIGHTS ITU draws attention to the possibility that the practice or implementation of this Recommendation may invol

11、ve the use of a claimed Intellectual Property Right. ITU takes no position concerning the evidence, validity or applicability of claimed Intellectual Property Rights, whether asserted by ITU members or others outside of the Recommendation development process. As of the date of approval of this Recom

12、mendation, ITU had not received notice of intellectual property, protected by patents, which may be required to implement this Recommendation. However, implementers are cautioned that this may not represent the latest information and are therefore strongly urged to consult the TSB patent database at

13、 http:/www.itu.int/ITU-T/ipr/. ITU 2012 All rights reserved. No part of this publication may be reproduced, by any means whatsoever, without the prior written permission of ITU. Rec. ITU-T K.94 (05/2012) iii Table of Contents Page 1 Scope 1 2 References. 1 3 Definitions 1 3.1 Terms defined elsewhere

14、 1 3.2 Terms defined in this Recommendation . 1 4 Abbreviations and acronyms 2 5 Basic test configuration 2 5.1 Test chamber 2 5.2 Generic test set-up 2 6 Generic test procedure 3 7 Test procedure for typical converged devices 3 7.1 GSM/Wireless LAN converged device 4 7.2 UMTS/Wireless LAN converged

15、 device 5 7.3 CDMA/Wireless LAN converged device . 6 7.4 GSM/CDMA converged device . 8 Annex A Wireless LAN receiver sensitivity test methodology 10 A.1 General description . 10 A.2 Unicast test packets 10 A.3 Frequency channels and data rates . 10 A.4 Test procedure 10 Annex B CDMA receiver sensiti

16、vity test methodology . 11 B.1 General description . 11 B.2 Network parameters and test channels . 11 B.3 Test procedure 11 Bibliography. 12 iv Rec. ITU-T K.94 (05/2012) Introduction With the rapid progress of the telecommunication terminal technology, more and more converged devices are appearing o

17、n the market. Converged devices usually contain two or more modules which can transmit at the same time, for example: GSM/Wireless LAN dual mode terminal, WCDMA/Wireless LAN dual mode terminal, CDMA/Wireless LAN dual mode terminal, GSM/CDMA dual mode terminal. As the two modules are physically close

18、 to each other, if the PCB is not designed properly, without adequate earthing, shielding or filtering, an EMC disturbance could occur between the modules. In order to limit the EMC disturbance between these modules, this Recommendation defines a test method that can be used as one of the EMC immuni

19、ty test items on a converged device. Rec. ITU-T K.94 (05/2012) 1 Recommendation ITU-T K.94 Mutual disturbance test method for evaluating performance degradation of converged terminal devices 1 Scope This Recommendation analyses the electromagnetic compatibility (EMC) disturbance between different mo

20、dules in converged terminal devices and defines a conducted test method. As more and more converged devices appear on the market, this Recommendation will help the industry to analyse and reduce such disturbance. Furthermore, this mutual-disturbance test can be used as one of the immunity test items

21、 listed in ITU-T K.34 and ITU-T K.48 to determine the level of performance degradation. This Recommendation only covers the EMC mutual-disturbance between the different modules in converged devices. Examples of such devices include: GSM/Wireless LAN converged devices, WCDMA/Wireless LAN converged de

22、vices, CDMA/Wireless LAN converged devices and GSM/CDMA converged devices. 2 References The following ITU-T Recommendations and other references contain provisions which, through reference in this text, constitute provisions of this Recommendation. At the time of publication, the editions indicated

23、were valid. All Recommendations and other references are subject to revision; users of this Recommendation are therefore encouraged to investigate the possibility of applying the most recent edition of the Recommendations and other references listed below. A list of the currently valid ITU-T Recomme

24、ndations is regularly published. The reference to a document within this Recommendation does not give it, as a stand-alone document, the status of a Recommendation. ITU-T K.34 Recommendation ITU-T K.34 (2003), Classification of electromagnetic environmental conditions for telecommunication equipment

25、 Basic EMC Recommendation. ITU-T K.48 Recommendation ITU-T K.48 (2006), EMC requirements for telecommunication equipment Product family Recommendation. ETSI TS 134 114 ETSI TS 134 114 (2008), Digital cellular telecommunications system (Phase 2+); Universal Mobile Telecommunications System (UMTS); Us

26、er Equipment (UE)/Mobile Station (MS) Over The Air (OTA) antenna performance; Conformance testing (3GPP TS 34.114 version 7.0.0 Release 7). 3 Definitions 3.1 Terms defined elsewhere None. 3.2 Terms defined in this Recommendation This Recommendation defines the following terms: 3.2.1 converged device

27、: A device containing two or more transmitters that can operate simultaneously. Examples of transmitter types are GSM, wireless LAN, WCDMA and CDMA. 3.2.2 minimum forward-link power: The minimum power of receiver BER (or FER) arriving to a certain level by the transmission of a base station. 2 Rec.

28、ITU-T K.94 (05/2012) 3.2.3 standby mode: One mode of the converged device. In this mode, the module is registered to the network and can respond to a request from the network. 4 Abbreviations and acronyms This Recommendation uses the following abbreviations and acronyms: ACK Acknowledge AP Access Po

29、int BER Bit Error Ratio CDMA Code Division Multiple Access EMC Electromagnetic Compatibility EUT Equipment Under Test FER Frame Error Rate FRR Frame Reception Rate GSM Global System for Mobile communications LAN Local Area Network NID Network Identification PC Personal Computer PCB Printed Circuit B

30、oard RBER Residual Bit Error Ratio RF Radio Frequency Rx Receiver SID System Identification UMTS Universal Mobile Telecommunication System WCDMA Wideband Code Division Multiple Access 5 Basic test configuration 5.1 Test chamber To avoid other disturbances, all the test cases should be performed in a

31、 shielded chamber as defined in clause 5.2. 5.2 Generic test set-up An outline of the test set-up is shown in Figure 1. The converged device is put into a shielded chamber, while all the test equipment is outside of the chamber. To measure the conducted disturbance, the converged device modules shou

32、ld be modified to have a connection to a base station emulator via RF cables entering the shielded chamber. There will be two or more base station emulators depending on how many modules the converged device has. Rec. ITU-T K.94 (05/2012) 3 K.94(12)F_01Base station emulator Shielded chamberBase stat

33、ion emulatorRF cableConverged deviceunder testRF cableFigure 1 Test set-up illustration of the converged devices 6 Generic test procedure Assuming that the converged device has only two modules module A and module B the following procedures are used to determine the disturbance from module B to modu

34、le A. The disturbance from module A to module B can be determined using the same procedure. 1) To perform this test, the converged device should be modified to include a test port connection for both module A and module B. 2) Put the converged device in the shielded chamber to minimize external dist

35、urbances. Only the converged device should be put in the shielded chamber; all the testing equipment should be put outside. 3) Connect module A with its network emulator using an RF cable. Before the test, the cable loss between the converged device and its network emulator should be measured and la

36、ter used to compensate the test result. 4) Measure the conducted sensitivity of all the channels of module A according to the method of different product standards or Annex A of this Recommendation. During the test, module B should be set to the standby mode if module A has too many channels. It is

37、acceptable if the separation between the two test channels is lower than 500 kHz. 5) Record the conducted sensitivity of each channel, as SENori-x, where x represents the channel number. 6) Connect module B with its network emulator at the lowest channel; the test settings should conform to the meth

38、od of different product standards or Annex A of this Recommendation. During the following test, module B should maintain the maximum power output condition. 7) Measure the conducted sensitivity of module A as specified in step 4) again. Record the conducted sensitivity of each channel as SENdis-x. 8

39、) The performance degradation of module A at channel x can be expressed as SENdeg-x= SENdis-x SENori-x. 9) Connect module B with its network emulator at the middle channel and high channel separately. Perform steps 6) to 8) again and determine the disturbance from module B at the middle channel and

40、high channel. 10) Record all the performance degradation results. 7 Test procedure for typical converged devices Test procedures for some typical converged devices are given in this clause. For those converged devices not listed here, the generic method in clause 6 applies. 4 Rec. ITU-T K.94 (05/201

41、2) 7.1 GSM/Wireless LAN converged device 7.1.1 General description In this clause, the GSM module is module A and the wireless LAN module is module B. 7.1.2 GSM performance degradation test procedure The following procedures are used to evaluate the GSM performance degradation in presence with the W

42、ireless LAN module: 1) To perform this test, the GSM/wireless LAN converged device should be modified to include the test port connection for both module A and module B. 2) Put the converged device in the shielded chamber to minimize external disturbances. Only the converged device should be put in

43、the shielded chamber; all the testing equipment should be put outside. 3) Connect module A with its network emulator using an RF cable. Before the test, the cable loss between the converged device and its network emulator should be measured and later used to compensate the test result. 4) Measure th

44、e conducted sensitivity of all the channels of module A according to ETSI TS 134 114. Measure the Class II residual BER (RBER) on module A. The number of frames observed shall be consistent with a 95% confidence level, but may be limited to 135 frames maximum. The measured RBER must not exceed 2.44%

45、 during the sensitivity search. During the test, module B should be set to the standby mode. If module A has too many channels, it is acceptable if the separation between the two test channels is lower than 500 kHz. 5) Record the conducted sensitivity of each channel as SENori-x, where x represents

46、the channel number. 6) Connect module B with its network emulator at the lowest channel; the test settings should conform to Annex A of this Recommendation. During the following test, module B should maintain the maximum power output condition. 7) Measure the conducted sensitivity of module A as spe

47、cified in step 4) again. Record the conducted sensitivity of each channel as SENdis-x. 8) The performance degradation of module A at channel x can be expressed as SENdeg-x= SENdis-x SENori-x. 9) Connect module B with its network emulator at the middle channel and high channel separately. Perform ste

48、ps 6) to 8) again and determine the disturbance from module B at the middle channel and high channel. 10) Record all the performance degradation results. 7.1.3 Wireless LAN performance degradation test procedure The following procedures are used to evaluate the wireless LAN performance degradation i

49、n presence with the GSM module: 1) To perform this test, the converged device should be modified to include the test port connection for both module A and module B. 2) Put the converged device in the shielded chamber to minimize external disturbances. Only the converged device should be put in the shielded chamber; all the testing equipment should be put outside. 3) Connect module B with its network emulator using an RF cable. Before the test, the cable loss between the converged device and its network emulator should be measured and later used