IESNA LM-84-2014 Approved Method for Measuring Luminous Flux and Color Maintenance of LED Lamps Light Engines and Luminaires.pdf

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1、IES LM-84-14Approved Method: Measuring Luminous Flux and Color Maintenance of LED Lamps, Light Engines, and LuminairesIES LM-84-14IES Approved Method for MeasuringLuminous Flux and Color Maintenance of LED Lamps, Light Engines, and LuminairesPublication of this Committee report has been approved by

2、IES.Suggestions for revision should be directed to IES.IES LM-84-14Copyright 2014 by the Illuminating Engineering Society of North America.Approved by the IES Board of Directors, March 31, 2014, as a Transaction of the Illuminating Engineering Society of North America.All rights reserved. No part of

3、 this publication may be reproduced in any form, in any electronic retrieval system or otherwise, without prior written permission of the IES.Published by the Illuminating Engineering Society of North America, 120 Wall Street, New York, New York 10005.IES Standards and Guides are developed through c

4、ommittee consensus and produced by the IES Office in New York. Careful attention is given to style and accuracy. If any errors are noted in this document, please forward them to Rita Harrold, Director of Technology, at the above address for verification and correction. The IES welcomes and urges fee

5、dback and comments. ISBN # 978-0-87995-288-4Printed in the United States of America.DISCLAIMERIES publications are developed through the consensus standards development process approved by the American National Standards Institute. This process brings together volunteers represent-ing varied viewpoi

6、nts and interests to achieve consensus on lighting recommendations. While the IES administers the process and establishes policies and procedures to promote fairness in the development of consensus, it makes no guaranty or warranty as to the accuracy or completeness of any information published here

7、in. The IES disclaims liability for any injury to persons or property or other damages of any nature whatsoever, whether special, indirect, consequential or compensatory, directly or indirectly result-ing from the publication, use of, or reliance on this document.In issuing and making this document

8、available, the IES is not undertaking to render professional or other services for or on behalf of any person or entity. Nor is the IES undertaking to perform any duty owed by any person or entity to someone else. Anyone using this document should rely on his or her own independent judgment or, as a

9、ppropriate, seek the advice of a competent professional in determining the exercise of reasonable care in any given circumstances.The IES has no power, nor does it undertake, to police or enforce compliance with the contents of this document. Nor does the IES list, certify, test or inspect products,

10、 designs, or installations for compliance with this document. Any certification or statement of compliance with the require-ments of this document shall not be attributable to the IES and is solely the responsibility of the certifier or maker of the statement.IES LM-84-14Prepared by the Solid-State

11、Lighting Subcommittee of theIESNA Testing Procedures CommitteeLM-84 Working Group Jim Anderson, Technical CoordinatorSolid-State Lighting SubcommitteeEmil Radkov ChairAlex Baker Dennis Bradley Dave Ellis Jim Hospodarsky Jianzhong Jiao Mihaly Kotrebai Kevin Krueger Rand Lee Emil Radkov Michael Riebli

12、ng Gary Steinberg Ralph Tuttle Jeremy Yon John Adinolfi*Carl Andersen*Alex BakerPeter Behnke*Robert BergerRolf BergmanBarry Besmanoff*Carl Bloomfield*Dennis Bradley*Eric BretschneiderKevin Broughton*Jennifer Burns*Michael Buzard*David Chan*Gigi ChanXiaolu Chen*Jason Chesley*Jeonghyeon Choi*Pei-Ting

13、Chou*Ashfaqul Chowdhury*Zane Coleman*Grace Connelly*Keith Cook*Steven Coyne*James Creveling*James Dakin*Ronald Daubach*Lynn Davis*Marc Dyble*David Eckel*Phil Elizondo*Steven Ellersick*David EllisCaryl Kinsey Fox*Calvin Galberth*Austin Gelder*David Grandin*Michael GratherYongfeng Guan*Kei HaraguchiRu

14、di Hechfellner*Kyle Hemmi*Timothy Henning*Sylvia Herman*Tanya Hernandez*John Hickman*Yoelit Hiebert*Mark Hodapp*James HospodarskyBin Hou*Shuming Hua*Jeff HulettPo-Chieh Hung*Andrew JacksonJe Jang*David JenkinsAndrew (Sangkyoo) Jeon*Jianzhong JiaoJim KahnDemetrios KarambelasHamid Kashani*Tokihisa Kaw

15、abata*Philip Keebler*Shawn Keeney*Tae Yeon Koo*Mihaly KotrebaiBecky KueblerJaekwang Lee*Rand LeeSunghee Lee*Michael Lehman*James Leland*Richard Li*Kurt Liepmann*Joseph Linquata*Steven LongoMin-Hao Lu*Jeremy Ludyjan*Ruiqing Ma*Vikrant Mahajan*Joseph MarellaMark McClear*Greg McKeeJonathan Melman*C. Ca

16、meron MillerMaria Nadal*Ronald Naus*Dante Nava*David Neal*Brandon Neale*Paul Nie*Andy Nishida*Michael OBoyle*Dan OHare*Yoshihiro Ohno*Michael ORegan*Marcel Pabst*Doosung Park*Sagar Patel*Michael Piscitelli*Michael Poplawski*Bruno Primerano*Emil RadkovSid Rane*Bipin Rao*Irina Rasputnis*Eric RichmanKe

17、lvin Rong*Ronald Rykowski*Evelyn Sahaja*Mark SapcoeJason SchutzKeith ScottFrank Shum*Scot Solimine*Lloyd Stafford*Gregory Staples*Gary SteinbergHeidi Steward*Jacki Swiernik*David Szombatfalvy*Ted Tomonaga*Ralph TuttleTatsukiyo Uchida*Venkat Venkataramanan*Yaqi Wang*Joseph Welch*Kurt Wilcox*Brienne W

18、illcock*Vivian Wu*Wensheng Xu*Jeremy YonRichard Young*William Young*Gary Yu*John ZhangYuqin Zong* Advisory Member* Honorary MemberIES LM-84-14IES Testing Procedures CommitteeCameron Miller, ChairC. AndersenL. Ayers*A. Baker*R. BergerR. Bergin*R. BergmanE. BretschneiderD. Brooks*K. Broughton*D. Chan*

19、P-T Chou*R. Collins*K. Curry*R. Daubach*D. EllisP. Franck*R. Heinisch*K. Hemmi*T. Hernandez*R. HoranJ. HospodarskyS. Hua*P-C. Hung*D. Husby*S. Hutton*A. JacksonD. Jenkins*J. JiaoHS. JungM. KalkasD. KarambelasH. Kashani*R. Kelley*M. KotrebaiB. KueblerJ. Lawton*L. Leetzow*K. Lerbs*R. Levin*I. Lewin*R.

20、 Li*R. Low*J. MarellaP. McCarthyG. McKeeC. MillerB. MosherW. NewlandY. Ohno*G. Plank*E. RadkovD. RandolphE. Richman*M. SapcoeJ. Schutz*A. Smith*D. Smith*J K. Son*R. Speck*L. Stafford*G. SteinbergR. TuttleK. Wagner*J. Walker*H. Waugh*J. Welch*K. Wilcox*J. Yon*J. Zhang* Advisory Member* Honorary Membe

21、rIES LM-84-14Contents1.0 Scope .12.0 Normative References 13.0 Definitions13.1 Device Under Test (DUT) 13.2 Luminous Flux Maintenance.13.3 Maintenance Test 13.4 Non-Operational DUT 14.0 Physical and Environmental Conditions 14.1 General14.2 Mounting DUTs .14.3 Vibration.14.4 Ambient Temperature Duri

22、ng Maintenance Test .24.5 Humidity.24.6 Air Movement.24.7 Operating Orientation 25.0 Electrical Conditions .25.1 Input Voltage .25.2 AC Line Voltage Waveshape .25.3 Line Impedance .25.4 Voltage Regulation.25.5 Wiring .26.0 Photometric and Thermal Measurement Procedure.26.1 Photometry Measurement.26.

23、2 LED Source In-Situ Case Temperature Measurement .27.0 Maintenance Test Procedures 37.1 Seasoning or Aging37.2 Handling.37.3 Marking .37.4 Operating Cycle .37.5 Timekeeping37.6 Operating Duration and Measurement Intervals .37.7 Operation of Dimmable or Controllable DUTs .37.8 Recording Non-Operatio

24、nal DUTs 3IES LM-84-148.0 Test Report .38.1 Administrative Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38.1.1 Testing agency identification.38.1.2 Report issue date 38.1.3 Testing start date .38.1.4 Testing completion date 3

25、8.1.5 Description of Test Equipment .48.1.6 Individual(s) performing testing.48.1.7 Individual(s) reviewing and approving test results .48.2 DUT Identification .48.2.1 Manufacturers name 48.2.2 Design (or model) identifier .48.2.3 DUT identification, e.g. serial number 48.2.4 Description of DUT48.2.

26、5 Non-integrated LED driver or power supply .48.2.6 Date of manufacture of the DUT48.3 Physical and Ambient Conditions 48.3.1 Operating orientation 48.3.2 Ambient temperature 48.3.3 Humidity48.4 Deviations .48.4.1 Deviations from test method listed in this document .48.4.2 List of non-standard condi

27、tions.48.4.3 Deviation from nominal or specified operating conditions or testing .48.5 Maintenance Test Duration (in Hours) .48.6 Measurement Intervals (in Hours) 48.7 Non-operational DUTs48.8 Results 48.8.1 Luminous flux48.8.2 Luminous flux maintenance .48.8.3 Chromaticity coordinates .48.8.3 Elect

28、rical parameters 48.9 Other Typical Items 48.9.1 Special test conditions .48.9.2 Measured L50(hours) and L70(hours) of individual DUTs, when applicable48.9.3 Statement of uncertainties (if required).4Annex A Recommendations for Measurement of In-Situ Conditions LED Case Temperature, Ts5Annex B Ratio

29、nale for not describing Maintenance Test Duration and Measurement Intervals .6Annex C Checking and Recording Non-Operational DUTs During Maintenance Test .6Informative References61IES LM-84-14INTRODUCTIONThe method for measuring luminous flux and color maintenance of LED light sources has been docu-

30、mented in IES LM-80-08. At the solid-state light-ing (SSL) system level such as LED lamps, light engines, and luminaires, other system components, in addition to the LED light sources, also contribute to luminous flux decay and color change over time. The system performance changes over time can be

31、directly tested at the SSL product level. This docu-ment addresses the evaluation of the changes in performance of SSL systems over time and can be a useful tool for engineering evaluations and luminous flux maintenance for entire assemblies when envi-ronmental considerations and variability for the

32、 base LED deprecation is incorporated into the analysis.Furthermore, performances of SSL systems, LED integrated lamps, non-integrated lamps, LED light engines, and LED luminaires, are typically but not without exception affected by operational and envi-ronmental variables such as operating cycle, c

33、ondi-tions imposed by auxiliary equipment and fixtures, ambient temperature, airflow and orientation. This test method has been developed to establish con-sistent and environmental conditions across labora-tories to achieve reproducible results and to permit reliable comparison of results.1.0 ScopeT

34、his document provides the method for measure-ment of luminous flux and color maintenance of LED lamps, integrated; LED lamps, non-integrated; LED light engines, and LED luminaires. The method describes the procedures to be followed and the pre-cautions to be observed in obtaining and reproduc-ing lu

35、minous flux and color maintenance measure-ments under standard operating conditions. This approved method does not provide guidance or recommendations regarding sampling, predictive estimations or extrapolation of luminous flux mainte-nance beyond the final measurement. 2.0 NORMATIVE REFERENCES2.1 I

36、ES LM-79-08, IES Approved Method for the Electrical and Photometric Measurements of Solid-State Lighting Products.3.0 DEFINITIONS3.1 Device Under Test (DUT) An LED lamp, integrated; LED lamp, non-integrated; LED light engine or LED luminaire that is being tested.3.2 Luminous Flux Maintenance Luminou

37、s flux maintenance (often referred to as “lumen maintenance”) is the remaining luminous flux over the initial flux (typically expressed as a percentage) at any selected elapsed operating time. Luminous flux maintenance is the complement of luminous flux depreciation (or “lumen depreciation”). 3.3 Ma

38、intenance TestThe continuing steady operation test for the DUT when it is energized.3.4 Non-Operational DUTA DUT which, when energized, does not emit light. 4.0 PHYSICAL AND ENVIRONMENTAL CONDITIONS DURING OPERATION AND HANDLING4.1 General Variation may occur in luminous flux maintenance values of t

39、he DUT due to changes in ambient tem-perature or air movement due to the DUTs thermal management design. DUTs should be checked and as necessary cleaned prior to measurement and maintenance test. Manufacturers handling instruc-tions (e.g., electro-static discharge or ESD, etc.) shall be observed. Un

40、usual environmental condi-tions, such as thermal interference from HVAC systems or solar loading, are to be reduced to levels reasonably expected to minimize influence relative to operation when the conditions are removed.4.2 Mounting DUTsThe DUT shall be mounted in accordance with the manufacturer

41、recommendations 4.3 VibrationDUTs should not be subjected to excessive vibration or shock during operation or handling.2IES LM-84-144.4 Ambient Temperature During Maintenance TestIf a maintenance test at other ambient temperature is not specified, the ambient temperature during main-tenance test of

42、the DUT between photometric mea-surements shall be maintained at 25C 5C. The ambient temperature variation of the operating envi-ronment shall be monitored with a sufficient number of and appropriately located temperature measure-ment points. Ambient temperature sensors shall be shielded from direct

43、 optical radiation from the DUTs and from thermal interference from any other sources (e. g., heat sink). When the ambient temperature falls outside of the allowed temperature range, testing shall be terminated and the event noted, including the out of tolerance ambient temperature. If an ambient te

44、mperature other than 25C is speci-fied, the ambient temperature tolerance shall be 5C and the test conditions shall be included in the test report.4.5 HumidityHumidity of the DUT operating environment shall be maintained to less than 65% RH during the mainte-nance test.4.6 Air MovementThe DUTs self-

45、induced airflow should not be restrict-ed, and should reflect the DUTs installation or appli-cation condition. All other airflow to the DUT should be minimized. 4.7 Operating OrientationDuring maintenance test, the DUT shall be in the same the orientation as it will be during its photomet-ric measur

46、ement (Section 6.1). Operating orienta-tion shall correspond to the manufacturers recom-mended orientation, and shall be reported. 5.0 ELECTRICAL CONDITIONS5.1 Input VoltageContinuous rated input voltage per the manufac-turers specifications shall be applied for operation of the DUT for the duration

47、 of the maintenance test. 5.2 AC Line Voltage Wave ShapeWhen a wave form altering DUT control device is not used, an AC power supply shall have a sinusoidal voltage wave shape at the prescribed frequency (typ-ically 60 Hz or 50 Hz) such that the total harmonic distortion does not exceed 3% of the fu

48、ndamental during the maintenance test of the DUT. 5.3 Line ImpedanceOptionally, the impedance of the electrical system powering the DUT should be identified. Use of AC power supplies with low output impedance may be preferable to maintain consistent test conditions. 5.4 Line Voltage RegulationBranch

49、 circuit input voltage shall be regulated to within 2% of the rated rms value. The input voltage to each DUT or driver shall be verified periodically. Time between verifications shall not exceed 3000 hours of DUT operation. 5.5 WiringWiring of test racks should be in accordance with national, state or provincial, and local electrical codes, and in accordance with the manufacturers recommendations of the DUT or system. For non-integrated lamps, the driver shall be grounded per the manufacturers specifications.An inspection of electric contacts including the DUT holder