ETSI TS 102 230-2-2016 Smart Cards UICC-Terminal interface Physical electrical and logical test specification Part 2 UICC features (V9 1 0 Release 9)《智能卡 通用集成电路卡-终端接口 物理、电气和逻辑测试规范 .pdf
《ETSI TS 102 230-2-2016 Smart Cards UICC-Terminal interface Physical electrical and logical test specification Part 2 UICC features (V9 1 0 Release 9)《智能卡 通用集成电路卡-终端接口 物理、电气和逻辑测试规范 .pdf》由会员分享,可在线阅读,更多相关《ETSI TS 102 230-2-2016 Smart Cards UICC-Terminal interface Physical electrical and logical test specification Part 2 UICC features (V9 1 0 Release 9)《智能卡 通用集成电路卡-终端接口 物理、电气和逻辑测试规范 .pdf(164页珍藏版)》请在麦多课文档分享上搜索。
1、 ETSI TS 102 230-2 V9.1.0 (2016-06) Smart Cards; UICC-Terminal interface; Physical, electrical and logical test specification; Part 2: UICC features (Release 9) TECHNICAL SPECIFICATION ETSI ETSI TS 102 230-2 V9.1.0 (2016-06) 2 Release 9 Reference RTS/SCP-00102230Uv910 Keywords smart card, testing ET
2、SI 650 Route des Lucioles F-06921 Sophia Antipolis Cedex - FRANCE Tel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16 Siret N 348 623 562 00017 - NAF 742 C Association but non lucratif enregistre la Sous-Prfecture de Grasse (06) N 7803/88 Important notice The present document can be downloaded from: http
3、:/www.etsi.org/standards-search The present document may be made available in electronic versions and/or in print. The content of any electronic and/or print versions of the present document shall not be modified without the prior written authorization of ETSI. In case of any existing or perceived d
4、ifference in contents between such versions and/or in print, the only prevailing document is the print of the Portable Document Format (PDF) version kept on a specific network drive within ETSI Secretariat. Users of the present document should be aware that the document may be subject to revision or
5、 change of status. Information on the current status of this and other ETSI documents is available at https:/portal.etsi.org/TB/ETSIDeliverableStatus.aspx If you find errors in the present document, please send your comment to one of the following services: https:/portal.etsi.org/People/CommiteeSupp
6、ortStaff.aspx Copyright Notification No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm except as authorized by written permission of ETSI. The content of the PDF version shall not be modified without the written authoriz
7、ation of ETSI. The copyright and the foregoing restriction extend to reproduction in all media. European Telecommunications Standards Institute 2016. All rights reserved. DECTTM, PLUGTESTSTM, UMTSTM and the ETSI logo are Trade Marks of ETSI registered for the benefit of its Members. 3GPPTM and LTE a
8、 re Trade Marks of ETSI registered for the benefit of its Members and of the 3GPP Organizational Partners. GSM and the GSM logo are Trade Marks registered and owned by the GSM Association. ETSI ETSI TS 102 230-2 V9.1.0 (2016-06)3Release 9Contents Intellectual Property Rights 11 Foreword . 11 Modal v
9、erbs terminology 11 Introduction 12 1 Scope 13 2 References 13 2.1 Normative references . 13 2.2 Informative references 14 3 Definitions, symbols and abbreviations . 15 3.1 Definitions 15 3.2 Symbols 17 3.3 Abbreviations . 17 3.4 Formats . 18 3.4.1 Format of the table of optional features 18 3.4.2 F
10、ormat of the applicability table . 19 3.4.3 Status and Notations . 19 3.4.4 Numbers and Strings . 19 4 Test environment 20 4.1 Table of optional features . 20 4.2 Applicability table 21 4.3 Information provided by the device supplier 23 4.4 Test equipment . 23 4.4.1 Overview 23 4.4.2 Measurement/set
11、ting uncertainties 24 4.4.2.1 Vcc24 4.4.2.2 RST . 24 4.4.2.3 CLK. 24 4.4.2.4 I/O . 24 4.4.3 Precision force-inducing contacting device 24 4.4.4 Temperature controllable environment . 25 4.4.5 Temperature measuring device . 25 4.4.6 Voltage measuring device. 25 4.4.7 Precision measuring device. 25 4.
12、4.8 Current measuring device . 25 4.4.9 Timing Measurements on contact I/O . 25 4.4.10 Default conditions for DUT operation 26 4.5 Test execution 26 4.5.1 Parameter variations . 26 4.5.2 Required application . 26 4.5.2.1 Application requirements 26 4.5.2.2 Required application files . 26 4.5.2.2.1 R
13、equirements for file creation and update . 26 4.5.2.2.2 EFTRANS16b. 27 4.5.2.2.3 EFLF4R20b. 27 4.5.2.2.4 EFLF4R10b. 28 4.5.2.2.5 EFCYC4R3b. 28 4.5.2.2.6 DF on ADF (Application DF) level . 29 4.5.2.2.7 EFSUBTRANS. 29 4.5.2.2.8 EFSUBLF30 4.5.2.2.9 EFSUBCYC30 4.6 Pass criterion 31 ETSI ETSI TS 102 230-
14、2 V9.1.0 (2016-06)4Release 95 Conformance Requirements . 31 5.1 Conformance requirement naming . 31 5.2 Physical characteristics . 31 5.3 Electrical specifications of the UICC - Terminal interface 32 5.4 Initial communication establishment procedures . 33 5.5 Transmission protocols . 34 5.6 Applicat
15、ion and file structure . 39 5.7 Security features . 43 5.8 Structure of commands and responses 45 5.9 Commands 46 5.10 Transmission oriented commands 54 5.11 Application independent files . 54 5.12 Application independent protocol 54 5.13 Support of APDU-based UICC applications over USB . 55 6 Test
16、cases 55 6.1 Introduction 55 6.2 Physical characteristic tests 56 6.2.1 Dimensions of the UICC card . 56 6.2.1.1 Test execution . 56 6.2.1.2 Initial conditions . 56 6.2.1.3 Test procedure . 56 6.2.2 Temperature range for card operation . 56 6.2.2.1 Test execution . 56 6.2.2.2 Initial conditions . 56
17、 6.2.2.3 Test procedure 1 57 6.2.2.4 Test procedure 2 57 6.3 Electrical specifications of the UICC - Terminal interface 57 6.3.1 Supply voltage Vcc(contact C1) 57 6.3.1.1 Vcc- Voltage limits 57 6.3.1.1.1 Test execution 57 6.3.1.1.2 Initial conditions 57 6.3.1.1.3 Test procedure . 58 6.3.1.2 Vcc- Idl
18、e current limits 58 6.3.1.2.1 Test execution 58 6.3.1.2.2 Initial conditions 58 6.3.1.2.3 Test procedure . 58 6.3.1.3 Vcc- Current limits in clock-stop-mode . 58 6.3.1.3.1 Test execution 58 6.3.1.3.2 Initial conditions 58 6.3.1.3.3 Test procedure . 59 6.3.2 Reset RST (contact C2) 59 6.3.2.1 RST - St
19、atic operation . 59 6.3.2.1.1 Test execution 59 6.3.2.1.2 Initial conditions 59 6.3.2.2 Test procedure . 59 6.3.3 Programming voltage Vpp (contact C6) . 59 6.3.3.1 Vpp - Static operation . 59 6.3.3.1.1 Test execution 59 6.3.3.1.2 Initial conditions 59 6.3.3.1.3 Test procedure 1 60 6.3.3.1.4 Test pro
20、cedure 2 60 6.3.4 Clock CLK (contact C3) . 60 6.3.4.1 Frequency and duty cycle 60 6.3.4.1.1 Test execution 60 6.3.4.1.2 Initial conditions 60 6.3.4.1.3 Test procedure . 61 6.3.4.2 Voltage and current . 61 6.3.4.2.1 Test execution 61 6.3.4.2.2 Initial conditions 61 6.3.4.2.3 Test procedure . 62 ETSI
21、ETSI TS 102 230-2 V9.1.0 (2016-06)5Release 96.3.5 I/O (contact C7) 62 6.3.5.1 Voltage and current . 62 6.3.5.1.1 Test execution 62 6.3.5.1.2 Initial conditions 62 6.3.5.1.3 Test procedure 1 63 6.3.5.1.4 Test procedure 2 63 6.3.5.1.5 Test procedure 3 64 6.4 Initial communication establishment procedu
22、re . 64 6.4.1 Supply voltage switching 64 6.4.1.1 Supply voltage classes. 64 6.4.1.2 Power consumption of the UICC during ATR 64 6.4.1.2.1 Test execution 64 6.4.1.2.2 Initial conditions 64 6.4.1.2.3 Test procedure . 65 6.4.1.3 Application related electrical parameters 65 6.4.1.3.1 Test execution 65
23、6.4.1.3.2 Initial conditions 65 6.4.1.3.3 Test procedure . 65 6.4.2 ATR content 65 6.4.2.1 ATR - Major capabilities 65 6.4.2.1.1 Test execution 65 6.4.2.1.2 Initial conditions 65 6.4.2.1.3 Test procedure . 66 6.4.2.2 ATR - Speed enhancement 66 6.4.2.2.1 Test execution 66 6.4.2.2.2 Initial conditions
24、 66 6.4.2.2.3 Test procedure . 66 6.4.2.3 Global Interface bytes . 66 6.4.2.3.1 Test execution 66 6.4.2.3.2 Initial conditions 66 6.4.2.3.3 Test procedure . 67 6.4.3 PPS procedure . 67 6.4.3.1 Test execution . 67 6.4.3.2 Initial conditions . 67 6.4.3.3 Test procedure . 67 6.4.4 Reset procedures . 67
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