EN ISO TS 17200-2015 en Nanotechnology - Nanoparticles in powder form - Characteristics and measurements《纳米技术 粉末形式的纳米颗粒 特性和测量》.pdf

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1、BSI Standards PublicationNanotechnology Nanoparticles in powder form Characteristics and measurementsPD CEN ISO/TS 17200:2015National forewordThis Published Document is the UK implementation of CEN ISO/TS17200:2015. It is identical to ISO/TS 17200:2013.The UK participation in its preparation was ent

2、rusted to TechnicalCommittee NTI/1, Nanotechnologies.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British

3、 Standards Institution 2015.Published by BSI Standards Limited 2015ISBN 978 0 580 88463 4ICS 07.030Compliance with a British Standard cannot confer immunity fromlegal obligations.This Published Document was published under the authority of theStandards Policy and Strategy Committee on 31 May 2015.Am

4、endments/corrigenda issued since publicationDate Text affectedPUBLISHED DOCUMENTPD CEN ISO/TS 17200:2015TECHNICAL SPECIFICATION SPCIFICATION TECHNIQUE TECHNISCHE SPEZIFIKATION CEN ISO/TS 17200 May 2015 ICS 07.030 English Version Nanotechnology - Nanoparticles in powder form - Characteristics and mea

5、surements (ISO/TS 17200:2013) Nanotechnologies - Nanoparticules sous forme de poudre -Caractristiques et mesures (ISO/TS 17200:2013) Nanotechnologien - Nanopartikel in Pulverform - Eigenschaften und Messung (ISO/TS 17200:2013) This Technical Specification (CEN/TS) was approved by CEN on 16 May 2015

6、for provisional application. The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to submit their comments, particularly on the question whether the CEN/TS can be converted into a European Standard. CEN members are required t

7、o announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS available promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in parallel to the CEN/TS) until the final decision about the possible conversio

8、n of the CEN/TS into an EN is reached. CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembo

9、urg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom. EUROPEAN COMMITTEE FOR STANDARDIZATION COMIT EUROPEN DE NORMALISATION EUROPISCHES KOMITEE FR NORMUNG CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels

10、 2015 CEN All rights of exploitation in any form and by any means reserved worldwide for CEN national Members. Ref. No. CEN ISO/TS 17200:2015 EPD CEN ISO/TS 17200:2015CEN ISO/TS 17200:2015 (E) 2 Contents Page Foreword 3 PD CEN ISO/TS 17200:2015CEN ISO/TS 17200:2015 (E) 3 Foreword The text of ISO/TS

11、17200:2013 has been prepared by Technical Committee ISO/TC 229 “Nanotechnologies” of the International Organization for Standardization (ISO) and has been taken over as CEN ISO/TS 17200:2015 by Technical Committee CEN/TC 352 “Nanotechnologies” the secretariat of which is held by AFNOR. Attention is

12、drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsible for identifying any or all such patent rights. According to the CEN-CENELEC Internal Regulations, the national standards organizations of the foll

13、owing countries are bound to announce this Technical Specification: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherla

14、nds, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. Endorsement notice The text of ISO/TS 17200:2013 has been approved by CEN as CEN ISO/TS 17200:2015 without any modification. PD CEN ISO/TS 17200:2015ISO/TS 17200:2013(E) ISO 2013 Al

15、l rights reserved iiiContents PageForeword ivIntroduction v1 Scope . 12 Normative references 13 Terms and definitions . 14 Fundamental characteristics with corresponding measurement methods . 25 Sample preparation . 26 Measurement methods 36.1 Chemical composition 36.2 Specific surface area by BET m

16、ethod . 46.3 Crystal structure by XRD method . 46.4 Average crystallite size by XRD (Scherrer formula) method 46.5 Average and standard deviation of the measured primary particle sizes by TEM method 47 Test report . 4Annex A (informative) Applicability of this Technical Specification . 6Bibliography

17、 7PD CEN ISO/TS 17200:2015ISO/TS 17200:2013(E)ForewordISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each memb

18、er body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Ele

19、ctrotechnical Commission (IEC) on all matters of electrotechnical standardization.The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types

20、of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2. www.iso.org/directivesAttention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held resp

21、onsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received. www.iso.org/patentsAny trade name used in this document is information given for t

22、he convenience of users and does not constitute an endorsement.The committee responsible for this document is ISO/TC 229, Nanotechnologies.iv ISO 2013 All rights reservedPD CEN ISO/TS 17200:2015ISO/TS 17200:2013(E)IntroductionAs is commonly noticed for every technology concerned with the development

23、 of new materials, and for nanotechnology in particular, information sharing on material characteristics by sellers and buyers, and sometimes also by regulators, is important and is facilitated by the development of appropriate material specifications. For a comprehensive exchange of information, it

24、 is essential to agree on the description of the material characteristics. However, many characteristics of nanomaterials cannot be determined using general and well-established measurement methods. This may become the cause for inconsistency in experimental results and induce confusion in commerce

25、and technology transfer. Furthermore, the rapid discovery of new materials from nanotechnology increases the number of characteristics that need to be specified for an appropriate dissemination of information.In order to address this need, a systematic arrangement of characteristics has been carried

26、 out across different fields of application specific to each nano-object by identifying a list of fundamental characteristics commonly used in these circumstances and by developing tailor-made technical specifications for the list, as seen in ISO/TS 11931 and ISO/TS 11937.Another approach that was f

27、ollowed for ISO/TS 12805 resulted in the development of a list of characteristics applicable to specifying nano-objects that are useful to the wider community of users of information on nano-objects.To increase the reach of outcomes from these efforts, members of ISO/TC 229 have discussed and planne

28、d the systematic development of an ISO technical specification for defining a list of fundamental characteristics that are widely applicable to a broad range of nano-objects. This Technical Specification is intended to define the list of fundamental characteristics universally for nanoparticles in p

29、owder form, which covers a very broad range of nano-objects.In order to develop a common understanding among sellers, buyers, and regulators, this Technical Specification uses the chemical composition, crystal structure, particle size, and surface area as fundamental measures for characterizing nano

30、-objects from a chemical, physical, and surface scientific point of view that is of significant interest to users of the nano-objects. However, since measurement procedures used for determining the characteristics of nano-objects often rely on various idealized assumptions, the resulting characteris

31、tics of nano-objects with identical name may not guarantee the equivalence of measured results. This issue can be addressed by adopting well-recognized measurement methods that can provide reliable measurement results.The measurement methods adopted in this Technical Specification are well known in

32、the industry. Instruments used for measurement and data processing software are well developed and provide reliable measurement results when operated under a valid quality system.The description of measurement methods is limited in this Technical Specification to important supplementary notices. For

33、 basic information about applying the methods, it is assumed that operating instructions are provided with any instruments, appropriate data processing software is available, and analysis has the required technical skills. The methods are applicable to situations where procedures are subcontracted t

34、o independent test laboratories. Since quantitative criteria concerning characteristics depend on the specific intentions among users, they are not described in this Technical Specification. These criteria are subject to agreement between users of this Technical Specification, namely, sellers, buyer

35、s, and regulators of nanoparticles in powder form.Nanotechnology is a rapidly growing and evolving field. Users of this Technical Specification should maintain familiarity with the legislative environment and latest developments in human and environmental health and safety regarding nanotechnology.I

36、f the seller or the buyer wishes to assess the environmental, safety, or health risks of the material, they may refer to ISO/TR 12885:2008 for further guidance. It has been assumed in the preparation of this Technical Specification that the execution of its provisions will be entrusted to appropriat

37、ely qualified and experienced people. ISO 2013 All rights reserved vPD CEN ISO/TS 17200:2015Nanotechnology Nanoparticles in powder form Characteristics and measurements1 ScopeThis Technical Specification lists fundamental characteristics which are commonly determined for nanoparticles in powder form

38、. The Technical Specification prescribes specific measurement methods for each of these characteristics.This Technical Specification does not specify acceptable quantitative criteria for the characteristics because they are subject to agreement between sellers, buyers, and regulators.Excluded in thi

39、s Technical Specification are characteristics specifically related to health, safety, and environmental issues, as well as characteristics that pertain to specific applications of nanoparticles in powder form.2 Normative referencesThe following documents, in whole or in part, are normatively referen

40、ced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.ISO 9277:2010, Determination of the specific surface area of solids by gas ad

41、sorption BET methodISO 13322-1, Particle size analysis Image analysis methods Part 1: Static image analysis methodsISO 14488, Particulate materials Sampling and sample splitting for the determination of particulate propertiesISO/TS 27687, Nanotechnologies Terminology and definitions for nano-objects

42、 Nanoparticle, nanofibre and nanoplate3 Terms and definitionsFor the purposes of this document, the terms and definitions given in ISO/TS 27687 and the following apply.3.1transmission electron microscopyTEMmethod that produces magnified images or diffraction patterns of the specimen by an electron b

43、eam which passes through the specimen and interacts with itSOURCE: ISO 29301:20103.2X-ray diffractionXRDmethod to determine crystallographic and geometrical information about a sample by observing the diffraction pattern due to an X-ray beam scattered by a sampleTECHNICAL SPECIFICATION ISO/TS 17200:

44、2013(E) ISO 2013 All rights reserved 1PD CEN ISO/TS 17200:2015ISO/TS 17200:2013(E)3.3specific surface areaabsolute surface area of the sample divided by sample massSOURCE: ISO 9277:2010, definition 3.11Note 1 to entry: In this Technical Specification, the absolute surface area is estimated by measur

45、ing the amount of physically adsorbed gas using the BET method.143.4Feret diameterdistance between two parallel tangents on opposite sides of the image of a particleSOURCE: ISO 13322-1:20044 Fundamental characteristics with corresponding measurement methodsThe fundamental characteristics of nanopart

46、icles in powder form are listed in Table 1, with unit and measurement method for each characteristic. The characteristics shall be measured using each measurement method listed and their results shall be reported as specified in Clause 7.Characteristics 1, 2, 3, and 4 shall be measured for crystalli

47、ne nanoparticles in powder form.Characteristics 1, 2, and 5 shall be measured for non-crystalline nanoparticles in powder form.NOTE If necessary, characteristic 5 may also be measured for crystalline nanoparticles in powder form.Table 1 Fundamental characteristics with units and corresponding measur

48、ement methodsCharacteristics Unit Measurement methods (for detail, see Clause 6)1) Chemical composition (in terms of the measurand, mass fraction of substance)1 or g/g analysis shown to provide metro-logically traceable results2) Specific surface area m2/g BET method3) Composition of crystal structu

49、re (in terms of the measurand, molar fraction of the substance)1 or mol/mol XRD method4) Average crystallite size nm XRD (Scherrer formula) method5) Average and standard deviation of the measured primary particle sizesnm TEM method5 Sample preparationThe sample subjected to a measurement method shall be chosen as to be representative of the parent population of the nanoparticles in powder form. ISO 14488 applies to sampling and sample splitting procedure.Any influences of the sampling process on the measured characteristics of the