EN 62429-2008 en Reliability growth - Stress testing for early failures in unique complex systems《可靠性增长 独立综合系统中早期失效应力试验》.pdf

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1、BRITISH STANDARD BS EN62429:2008Reliability growth Stress testing for earlyfailures in uniquecomplex systemsICS 03.120.01; 21.020; 29.020g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g

2、38g50g51g60g53g44g42g43g55g3g47g36g58Incorporating corrigendum October 2009BS EN 62429:2008This British Standard waspublished under the authorityof the Standards Policy andStrategy Committee on 31 July 2008 BSI 2009ISBN 978 0 580 69458 5National forewordThis British Standard is the UK implementation

3、 of EN 62429:2008. It isidentical to IEC 62429:2007. The UK participation in its preparation was entrusted by Technical CommitteeDS/1, Dependability and terotechnology, to Subcommittee DS/1/1,Dependability.A list of organizations represented on this committee can be obtained onrequest to its secreta

4、ry.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunity fromlegal obligations.Amendments/corrigenda issued since publicationDate Comments31 October 2009 Corr

5、ections made to the core text documentEUROPEAN STANDARD EN 62429 NORME EUROPENNE EUROPISCHE NORM April 2008 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Sta

6、ssart 35, B - 1050 Brussels 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62429:2008 E ICS 03.120.01; 03.120.99 English version Reliability growth - Stress testing for early failures in unique complex systems (IEC 62429:200

7、7) Croissance de fiabilit - Essais de contraintes pour rvler les dfaillances prcoces dun systme complexe et unique (CEI 62429:2007) Zuverlssigkeitswachstum - Beanspruchungsprfung auf Frhausflle in einzelnen komplexen Systemen (IEC 62429:2007) This European Standard was approved by CENELEC on 2008-03

8、-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obta

9、ined on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Cent

10、ral Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, M

11、alta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. EN 62429:2008 - 2 - Foreword The text of document 56/1232/FDIS, future edition 1 of IEC 62429, prepared by IEC TC 56, Dependability, was submitted to the IEC-CENELEC paral

12、lel vote and was approved by CENELEC as EN 62429 on 2008-03-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2008-12-01 latest date by which the national standards conflict

13、ing with the EN have to be withdrawn (dow) 2011-03-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62429:2007 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes

14、 have to be added for the standards indicated: IEC 60300-1 NOTE Harmonized as EN 60300-1:2003 (not modified). IEC 60300-2 NOTE Harmonized as EN 60300-2:2004 (not modified). IEC 60300-3-1 NOTE Harmonized as EN 60300-3-1:2004 (not modified). IEC 60706-5 NOTE Harmonized as EN 60706-5:2007 (not modified

15、). IEC 60812 NOTE Harmonized as EN 60812:2006 (not modified). IEC 61014 NOTE Harmonized as EN 61014:2003 (not modified). IEC 61025 NOTE Harmonized as EN 61025:2007 (not modified). IEC 61078 NOTE Harmonized as EN 61078:2006 (not modified). IEC 61160 NOTE Harmonized as EN 61160:2005 (not modified). IS

16、O 9000 NOTE Harmonized as EN ISO 9000:2005 (not modified). _ BS EN 62429:2008- 3 - EN 62429:2008 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this doc

17、ument. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Pub

18、lication Year Title EN/HD Year IEC 60050-191 1990 International Electrotechnical Vocabulary (IEV) - Chapter 191: Dependability and quality of service - - IEC 60300-3-5 -1)Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles - - IEC 6060

19、5-2 -1)Equipment reliability testing - Part 2: Design of test cycles - - IEC 61163-1 2006 Reliability stress screening - Part 1: Repairable assemblies manufactured in lots EN 61163-1 2006 IEC 61163-2 -1)Reliability stress screening - Part 2: Electronic components - - IEC 61164 -1)Reliability growth

20、- Statistical test and estimation methods EN 61164 20042)IEC 61710 -1)Power law model - Goodness-of-fit tests and estimation methods - - 1)Undated reference. 2)Valid edition at date of issue. BS EN 62429:2008 2 62429 IEC:2007 CONTENTS FOREWORD.4 1 Scope.6 2 Normative references .6 3 Terms, definitio

21、ns, abbreviations and symbols7 3.1 Terms and definitions 7 3.2 Acronyms 9 3.3 Symbols 9 4 General 10 5 Planning and performing a reliability growth test.13 5.1 Step 1 Should a reliability growth test be used? .13 5.2 Step 2 Failure definitions and data collection13 5.3 Step 3 Stress levels14 5.3.1 G

22、eneral .14 5.3.2 Increased operating load .14 5.3.3 Increased environmental stress .15 5.4 Step 4 Failure analysis and classification of failures .15 5.4.1 General .15 5.4.2 Relevant failures .16 5.4.3 Non-relevant failures .17 5.5 Step 5 Stop criteria.17 5.5.1 General .17 5.5.2 Method 1 Fixed testi

23、ng programs17 5.5.3 Method 2 Graphical analysis.18 5.5.4 Method 3 Success ratio test19 5.5.5 Method 4 Estimation of reliability 21 5.5.6 Method 5 Comparison with acceptable instantaneous failure intensity.22 5.5.7 Method 6 Estimation of remaining latent faults24 5.5.8 Method 7 Reliability indicator

24、testing 24 5.6 Step 6 Verification of repairs and reliability growth .25 5.7 Step 7 Reporting and feedback.26 Annex A (informative) Practical example of method 3 Success ratio test.27 Annex B (informative) Practical example of method 5 Comparison with acceptable instantaneous failure intensity.28 An

25、nex C (informative) Practical example of method 6 Estimation of remaining latent faults 31 Bibliography33 Figure 1 The bathtub curve 12 Figure 2 Evaluating whether the cumulative failure curve has levelled out18 Figure 3 Method 219 Figure B.1 A reliability growth plot of the data from Table B.1 29 B

26、S EN 62429:200862429 IEC:2007 3 Table 1 Probability that a system with failure probability of 0,001 will pass N successive tests .21 Table 2 Probability that a system with failure probability of 0,000 001 will pass N successive tests .21 Table 3 Correct and incorrect decisions using reliability indi

27、cators.25 Table B.1 Reliability growth and stopping times for the practical example 28 Table C.1 Determining when to stop the test32 BS EN 62429:2008 4 62429 IEC:2007 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ RELIABILITY GROWTH STRESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS FOREWORD 1

28、) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrica

29、l and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technica

30、l committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organizat

31、ion for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical com

32、mittee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications

33、is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and

34、 regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in con

35、formity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for

36、any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Norma

37、tive references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held respon

38、sible for identifying any or all such patent rights. International Standard IEC 62429 has been prepared by IEC technical committee 56: Dependability. The text of this standard is based on the following documents: FDIS Report on voting 56/1232/FDIS 56/1249/RVD Full information on the voting for the a

39、pproval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date ind

40、icated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be BS EN 62429:200862429 IEC:2007 5 reconfirmed, withdrawn, replaced by a revised edition, or amended. BS EN 62429:2008 6 62429 IEC:2007 RELIABILITY GROWTH STR

41、ESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS 1 Scope This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests. “Unique” me

42、ans that no information exists on similar systems, and the small number of produced systems means that information deducted from the test has limited use for future production. This standard concerns reliability growth of repairable complex systems consisting of hardware with embedded software. It c

43、an be used for describing the procedure for acceptance testing, “running-in“, and to ensure that reliability of a delivered system is not compromised by coding errors, workmanship errors or manufacturing errors. It only covers the early failure period of the system life cycle and neither the constan

44、t failure period, nor the wear out failure period. It can also be used when a company wants to optimize the duration of internal production testing during manufacturing of prototypes, single systems or small series. It is applicable mainly to large hardware/software systems, but does not cover large

45、 networks, for example telecommunications and power networks, since new parts of such systems cannot usually be isolated during the testing. It does not cover software tested alone, but the methods can be used during testing of large embedded software programs in operational hardware, when simulated

46、 operating loads are used. It addresses growth testing before or at delivery of a finished system. The testing can therefore take place at the manufacturers or at the end users premises. If the user of a system performs reliability growth by a policy of updating hardware and software with improved v

47、ersions, this standard can be used to guide the growth process. This standard covers a wide field of applications, but is not applicable to health or safety aspects of systems. This standard does not apply to systems that are covered by IEC 6227939. 2 Normative references The following referenced do

48、cuments are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-191:1990, International Electrotechnical Vocabulary Chapter 191: D

49、ependability and quality of service IEC 60300-3-5, Dependability management Part 3-5: Application guide Reliability test conditions and statistical test principles IEC 60605-2, Equipment reliability testing Part 2 Design of test cycles BS EN 62429:200862429 IEC:2007 7 IEC 61163-1:2006, Reliability stress screening Part 1: Repairable assemblies manufactured in lots IEC 61163-2, Reliability stress screening Part