EN 61788-16-2013 en Superconductivity - Part 16 Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies.pdf
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1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationSuperconductivityPart 16: Electric characteristic measurements Power-dependent surface resistance of superconductors at microwave frequenciesBS EN 61788-16:2013National forewordT
2、his British Standard is the UK implementation of EN 61788-16:2013. It is identical to IEC 61788-16:2013. The UK participation in its preparation was entrusted to Technical Committee L/-/90, Super Conductivity.A list of organizations represented on this committee can be obtained on request to its sec
3、retary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2013.Published by BSI Standards Limited 2013.ISBN 978 0 580 69203 1 ICS 17.220.20; 29.050Compliance with a British Stan
4、dard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 April 2013.Amendments issued since publicationDate Text affectedBRITISH STANDARDBS EN 61788-16:2013EUROPEAN STANDARD EN 61788-16 NORME EUROP
5、ENNE EUROPISCHE NORM April 2013CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2013 CENELEC - All rights of exploitation in any form
6、 and by any means reserved worldwide for CENELEC members. Ref. No. EN 61788-16:2013 E ICS 17.220.20; 29.050 English version Superconductivity - Part 16: Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies (IEC 61788-16:2013) Supraco
7、nductivit - Partie 16: Mesures de caractristiques lectroniques - Rsistance de surface des supraconducteurs aux hyperfrquences en fonction de la puissance (CEI 61788-16:2013) Supraleitfhigkeit - Teil 16: Messung der elektronischen Eigenschaften - Leistungsabhngiger Oberflchenwiderstand bei Mikrowelle
8、nfrequenzen (IEC 61788-16:2013) This European Standard was approved by CENELEC on 2013-02-20. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to
9、-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by tran
10、slation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
11、Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN
12、61788-16:2013EN 61788-16:2013 Foreword The text of document 90/309/FDIS, future edition 1 of IEC 61788-16, prepared by IEC TC 90,“Superconductivity“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC asEN 61788-16:2013. The following dates are fixed: latest date by which the docu
13、ment has to be implemented at national level bypublication of an identical national standard or by endorsement (dop) 2013-11-20 latest date by which the national standards conflicting with thedocument have to be withdrawn (dow) 2016-02-20 Attention is drawn to the possibility that some of the elemen
14、ts of this document may be the subject ofpatent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patentrights. Endorsement notice The text of the International Standard IEC 61788-16:2013 was approved by CENELEC as a EuropeanStandard without any modification. B
15、S EN 61788-16:2013EN 61788-16:2013 Annex ZA (normative) Normative references to international publicationswith their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated refe
16、rences, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HDapplies. Year Publication EN/HD Ti
17、tle Year Series IEC 60050 International electrotechnical vocabulary - - IEC 61788-15 Superconductivity - - Part 15: Electronic characteristicmeasurements - Intrinsic surface impedance of superconductor films at microwavefrequencies EN 61788-15 - BS EN 61788-16:201361788-16 IEC:2013 CONTENTS INTRODUC
18、TION . 6 1 Scope . . 7 2 Normative references . 7 3 Terms and definitions . 7 4 Requirements . 8 5 Apparatus . 8 5.1 Measurement system . 8 5.1.1 Measurement system for the tan of the sapphire rod . . 8 5.1.2 Measurement system for the power dependence of the surface resistance of superconductors at
19、 microwave frequencies 9 5.2 Measurement apparatus . . 10 5.2.1 Sapphire resonator 10 5.2.2 Sapphire rod . 10 5.2.3 Superconductor films . . 11 6 Measurement procedure . 11 6.1 Set-up . 11 6.2 Measurement of the tan of the sapphire rod . . 11 6.2.1 General . 11 6.2.2 Measurement of the frequency res
20、ponse of the TE021mode . 11 6.2.3 Measurement of the frequency response of the TE012mode . 13 6.2.4 Determination of tan of the sapphire rod . . 13 6.3 Power dependence measurement . 14 6.3.1 General . 14 6.3.2 Calibration of the incident microwave power to the resonator. 15 6.3.3 Measurement of the
21、 reference level 15 6.3.4 Surface resistance measurement as a function of the incident microwave power . 15 6.3.5 Determination of the maximum surface magnetic flux density 15 7 Uncertainty of the test method . . 16 7.1 Surface resistance. 16 7.2 Temperature . 17 7.3 Specimen and holder support stru
22、cture . . 18 7.4 Specimen protection . 18 8 Test report 18 8.1 Identification of the test specimen . 18 8.2 Report of power dependence of Rsvalues 18 8.3 Report of test conditions . . 18 Annex A (informative) Additional information relating to Clauses 1 to 7 . . 19 Annex B (informative) Uncertainty
23、considerations . . 24 Bibliography . 29 Figure 1 Measurement system for tan of the sapphire rod . . 9 Figure 2 Measurement system for the microwave power dependence of the surface resistance . . 9 BS EN 61788-16:201361788-16 IEC:2013 Figure 3 Sapphire resonator (open type) to measure the surface res
24、istance of superconductor films 10 Figure 4 Reflection scattering parameters (|S11| and |S22|) . . 13 Figure 5 Term definitions in Table 3 . 17 Figure A.1 Three types of sapphire rod resonators 19 Figure A.2 Mode chart for a sapphire resonator (see IEC 61788-15) . 20 Figure A.3 Loaded quality factor
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