EN 61646-2008 en Thin-film terrestrial photovoltaic (PV) modules - Design qualification and type approval (Remains Current)《地面用薄膜光伏组件设计鉴定和定型》.pdf

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1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI British StandardsWB9423_BSI_StandardColCov_noK_AW:BSI FRONT COVERS 5/9/08 12:55 Page 1Thin-film terrestrial photovoltaic(PV) modules Designqualification and type approvalBS EN 61646:2008Incorporating

2、 Corrigendum August 2009National forewordThis British Standard is the UK implementation of EN 61646:2008. It is identi-cal to IEC 61646:2008. It supersedes BS EN 61646:1997 which is withdrawn.The UK participation in its preparation was entrusted to Technical CommitteeGEL/82, Solar photovoltaic energ

3、y systems.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2009 ISBN 978 0 580 68994 9ICS 27.160BRITISH STAND

4、ARDBS EN 61646:2008Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on Amendments issued since publicationDate Text affected31 July 200931 August 2009 Correction to

5、missing CENELEC pages EUROPEAN STANDARD EN 61646 NORME EUROPENNE EUROPISCHE NORM August 2008 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1

6、050 Brussels 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61646:2008 E ICS 27.160 Supersedes EN 61646:1997English version Thin-film terrestrial photovoltaic (PV) modules - Design qualification and type approval (IEC 61646:

7、2008) Modules photovoltaques (PV) en couches minces pour application terrestre - Qualification de la conception et homologation (CEI 61646:2008) Terrestrische Dnnschicht-Photovoltaik (PV)-Module - Bauarteignung und Bauartzulassung (IEC 61646:2008) This European Standard was approved by CENELEC on 20

8、08-06-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be

9、 obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the

10、 Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembou

11、rg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. EN 61646:2008 - 2 - Foreword The text of document 82/512/FDIS, future edition 2 of IEC 61646, prepared by IEC TC 82, Solar photovoltaic energy systems, was submitted

12、to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61646 on 2008-06-01. This European Standard supersedes EN 61646:1997. EN 61646:2008 includes the following significant technical changes with respect to EN 61646:1997: The major change is in the pass/fail criteria. It no longer relie

13、s on meeting a plus/minus criterion before and after each test, but rather on meeting the rated power after all of the tests have been completed and the modules have been light-soaked. This was done to eliminate the technology-specific preconditioning necessary to accurately measure the changes caus

14、ed by the test. (Some modules lose power in light while others lose power during dark heat.) Since all modules must work after exposure to light, this seemed like a good approach and will streamline the test procedure, hopefully reducing the testing cost. updated normative references; added a defini

15、tion of “minimum value of maximum output power”; modified the wording in major visual defects to allow some bending and misalignment without failure; added requirements to the report from EN ISO/IEC 17025; removed the “Twist Test” as was done from EN 61215, since no one has ever failed this test; ma

16、de the pass/fail criteria for insulation resistance and wet leakage current dependent on the module area; added the temperature coefficient of power () to the required measurements; modified temperature coefficient section to allow for measurements under natural sunlight or a solar simulator; delete

17、d reference plate method from NOCT; added apparatus sections to those test procedures that did not have apparatus sections in EN 61646:1997; rewrote the hot-spot test; eliminated edge dip method from wet leakage current test; changed mechanical load test to 3 cycles to be consistent with other stand

18、ards; added bypass diode thermal test. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2009-03-01 latest date by which the national standards conflicting with the EN have to b

19、e withdrawn (dow) 2011-06-01 Annex ZA has been added by CENELEC. _ BS EN 61645:2008- 3 - EN 61646:2008 Endorsement notice The text of the International Standard IEC 61646:2008 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the foll

20、owing notes have to be added for the standards indicated: IEC 60904-5 NOTE Harmonized as EN 60904-5:1995 (not modified). IEC 60904-8 NOTE Harmonized as EN 60904-8:1998 (not modified). _ BS EN 61646:2008EN 61646:2008 - 4 - Annex ZA(normative) Normative references to international publications with th

21、eir corresponding European publications The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When

22、 an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60068-1 -1)Environmental testing - Part 1: General and guidance EN 60068-1 19942)IEC 60068-2-21 -1)Environmental testing - Part 2-21: Tests -

23、 Test U: Robustness of terminations and integral mounting devices EN 60068-2-21 20062)IEC 60068-2-78 2001 Environmental testing - Part 2-78: Tests - Test Cab: Damp heat, steady state EN 60068-2-78 20012)IEC 60410 -1)Sampling plans and procedures for inspection by attributes - - IEC 60721-2-1 -1)Clas

24、sification of environmental conditions - Part 2-1: Environmental conditions appearing in nature - Temperature and humidity HD 478.2.1 S1 19892)IEC 60891 -1)Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline silicon photovoltaic devices EN 6089119942)

25、IEC 60904-1 2006 Photovoltaic devices - Part 1: Measurement of photovoltaic current-voltage characteristics EN 60904-1 20062)IEC 60904-2 -1)Photovoltaic devices - Part 2: Requirements for reference solar devices EN 60904-2 20072)IEC 60904-3 -1)Photovoltaic devices - Part 3: Measurement principles fo

26、r terrestrial photovoltaic (PV) solar devices with reference spectral irradiance data EN 60904-3 20082)IEC 60904-7 -1)Photovoltaic devices - Part 7: Computation of spectral mismatch error introduced in the testing of a photovoltaic device EN 60904-7 19982)IEC 60904-9 -1)Photovoltaic devices - Part 9

27、: Solar simulator performance requirements EN 60904-9 20072)IEC 60904-10 -1)Photovoltaic devices - Part 10: Methods of linearity measurement EN 60904-10 19982)IEC 61215 -1)Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval EN 61215 20052)1)Undated refe

28、rence. 2)Valid edition at date of issue. BS EN 61645:2008- 5 - EN 61646:2008 Publication Year Title EN/HD Year ISO/IEC 17025 -1)General requirements for the competence of testing and calibration laboratories EN ISO/IEC 17025 20052)BS EN 61646:2008 2 61646 IEC:2008 CONTENTS FOREWORD.5 1 Scope and obj

29、ect7 2 Normative references .7 3 Sampling 8 4 Marking 8 5 Testing .9 6 Pass criteria .9 7 Major visual defects10 8 Report 10 9 Modifications 11 10 Test procedures .14 10.1 Visual inspection .14 10.1.1 Purpose.14 10.1.2 Procedure14 10.1.3 Requirements 14 10.2 Maximum power determination 14 10.2.1 Pur

30、pose.14 10.2.2 Apparatus14 10.2.3 Procedure14 10.3 Insulation test15 10.3.1 Purpose.15 10.3.2 Apparatus15 10.3.3 Test conditions 15 10.3.4 Procedure15 10.3.5 Test requirements16 10.4 Measurement of temperature coefficients 16 10.4.1 Purpose.16 10.4.2 Apparatus16 10.4.3 Procedure16 10.5 Measurement o

31、f nominal operating cell temperature (NOCT).18 10.5.1 Purpose.18 10.5.2 Introduction .18 10.5.3 Principle 18 10.5.4 Apparatus18 10.5.5 Test module mounting .19 10.5.6 Procedure19 10.6 Performance at STC and NOCT 21 10.6.1 Purpose.21 10.6.2 Apparatus22 10.6.3 Procedure22 10.7 Performance at low irrad

32、iance .22 10.7.1 Purpose.22 10.7.2 Apparatus22 10.7.3 Procedure22 10.8 Outdoor exposure test.23 BS EN 61646:200861646 IEC:2008 3 10.8.1 Purpose.23 10.8.2 Apparatus23 10.8.3 Procedure23 10.8.4 Final measurements 23 10.8.5 Requirements 23 10.9 Hot-spot endurance test 23 10.9.1 Purpose.23 10.9.2 Hot-sp

33、ot effect.23 10.9.3 Classification of cell interconnection24 10.9.4 Apparatus25 10.9.5 Procedure25 10.9.6 Final measurements 26 10.9.7 Requirements 26 10.10 UV preconditioning test.27 10.10.1 Purpose 27 10.10.2 Apparatus .27 10.10.3 Procedure .27 10.10.4 Final measurements27 10.10.5 Requirements .27

34、 10.11 Thermal cycling test27 10.11.1 Purpose 27 10.11.2 Apparatus .28 10.11.3 Procedure .28 10.11.4 Final measurements28 10.11.5 Requirements .29 10.12 Humidity-freeze test29 10.12.1 Purpose 29 10.12.2 Apparatus .29 10.12.3 Procedure .30 10.12.4 Final measurements30 10.12.5 Requirements .30 10.13 D

35、amp heat test .30 10.13.1 Purpose 30 10.13.2 Procedure .30 10.13.3 Final measurements30 10.13.4 Requirements .30 10.14 Robustness of terminations test31 10.14.1 Purpose 31 10.14.2 Types of terminations31 10.14.3 Procedure .31 10.14.4 Final measurements32 10.14.5 Requirements .32 10.15 Wet leakage cu

36、rrent test.32 10.15.1 Purpose 32 10.15.2 Apparatus .32 10.15.3 Procedure .32 10.15.4 Requirements .32 10.16 Mechanical load test.33 10.16.1 Purpose 33 BS EN 61646:2008 4 61646 IEC:2008 10.16.2 Apparatus .33 10.16.3 Procedure .33 10.16.4 Final measurements33 10.16.5 Requirements .33 10.17 Hail test33

37、 10.17.1 Purpose 33 10.17.2 Apparatus .33 10.17.3 Procedure .35 10.17.4 Final measurements36 10.17.5 Requirements .36 10.18 Bypass diode thermal test.36 10.18.1 Purpose 36 10.18.2 Apparatus .37 10.18.3 Procedure 1 37 10.18.4 Procedure 2 38 10.18.5 Final Measurements38 10.18.6 Requirements .39 10.19

38、Light-soaking39 10.19.1 Purpose 39 10.19.2 Apparatus .39 10.19.3 Procedure .39 10.19.4 Final measurements39 10.19.5 Requirements .39 Bibliography40 Figure 1 Qualification test sequence 12 Figure 2 NOCT correction factor 21 Figure 3 Hot-spot effect in a thin-film module with serially connected cells.

39、 Worst case shading condition is shading of 4 cells at the same time.24 Figure 4 Thermal cycling test .28 Figure 5 Humidity-freeze cycle.29 Figure 6 Hail test equipment 35 Figure 7 Impact locations.36 Figure 8 Bypass Diode Thermal Test .38 Table 1 Summary of test levels 13 Table 2 Ice ball masses an

40、d test velocities 34 Table 3 Impact locations 36 BS EN 61646:200861646 IEC:2008 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ THIN-FILM TERRESTRIAL PHOTOVOLTAIC (PV) MODULES DESIGN QUALIFICATION AND TYPE APPROVAL FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organiza

41、tion for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC

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43、 may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agr

44、eement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC

45、 Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are use

46、d or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the co

47、rresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have th

48、e latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever

49、, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be