ECMA 190-1993 Information Interchange on 300 mm Optical Disk Cartridges of the Write Once Read Multiple (Worm) Type Using the CCS Method《使用CCS方法的WORM型(一次写入 多次读取)300mm盒式光盘上的信息交换》.pdf
《ECMA 190-1993 Information Interchange on 300 mm Optical Disk Cartridges of the Write Once Read Multiple (Worm) Type Using the CCS Method《使用CCS方法的WORM型(一次写入 多次读取)300mm盒式光盘上的信息交换》.pdf》由会员分享,可在线阅读,更多相关《ECMA 190-1993 Information Interchange on 300 mm Optical Disk Cartridges of the Write Once Read Multiple (Worm) Type Using the CCS Method《使用CCS方法的WORM型(一次写入 多次读取)300mm盒式光盘上的信息交换》.pdf(95页珍藏版)》请在麦多课文档分享上搜索。
1、3404593 OOLBOLO 687 = ECMA EUROPEAN COMPUTER MANUFACTURERS ASSOCIATiON STANDARD ECMA - 190 INFORMATION INTERCHANGE ON 300 mm OPTICAL DISK CARTRIDGES OF THE WRITE ONCE, READ MULTIPLE (WORM) TYPE USING THE CCS METHOD June 1993 3404593 OOLBOLL 513 Free copies of this document itre available from ECMA,
2、European Computer Manufacturers Association, 114 Rue du Rhne - CH-1204 Geneva (Switzerland) Phone: 41 22 735 36 34 Fax: 41 22 786 52 31 X.400: C=ch, A=arcom, P=ecma, O=, OUl=ecma, S=helpdesk Internet: helpdeskecma.ch W 3404593 OOLBOL2 45T ECMA EUROPEAN COMPUTER MANUFACTURERS ASSOCIATION STANDARD ECM
3、A = 190 INFORMATION INTERCHANGE ON 300 mrn OPTICAL DISK CARTRIDGES OF THE WRITE ONCE, READ MULTIPLE (WORM) TYPE USING THE CCS METHOD June 1993 W 3404593 OOLBOL3 396 Brief history The first generation - in the eighties - of 300 mm Optical Disk Cartridges of the WORM Type has not been specified in a s
4、tandard. The second generation has two different formats: CCS and SSF. ISO/IEC JTCl/SC23 started their standardization in 1988, ECMA TC31 started in 1990. The ECMA work resulted in two ECMA Standards in June 1993: ECMA-189 Information Interchange on 300 rnm Optical Disk Cartridges of the Write Once,
5、 Read Multiple (WORM) Type Using the SSF Method JXMA-190 Information Interchange on 300 mm Optical Disk Cartridges of the Write Once, Read Multiple (WORM) Type Using the CCS Method Both standards have been registered in 1993 as ISO/IEC CD 13614 and CD 13403, respectively. The standards are identical
6、, except for the parts describing the two different formats, SSF and CCS, respectively. Adopted as an ECMA Standard by the General Assembly of June 1993. Section 1 - General 1 scope 2 Conformance 3 References 4 4.1 4.2 4.3 4.4 4.5 4.6 4.7 4.8 4.9 4.10 4.1 1 4.12 4.13 4.14 4.15 4.16 4.17 4.18 4.19 4.
7、20 4.21 4.22 4.23 4.24 5 5.1 5.2 6 7 8 8.1 Definitions CaSe Clamping Zone Control Track Cyclic Redundancy Check (CRC) defect management Disk Reference Plane cntrance surface Error Correction Code (ECC) format holding feature interleaving mark optical disk optical disk cartridge recording layer Reed-
8、Solomon code sec tor space spindle substrate track track pitch WORM disk zone Conventions Representation of numbers Names Acronyms Table of contents Page General description of the optical disk cartridge General requirements Environments 8.1.1 Testing environment 8.1.2 Operating environment 8.1.3 St
9、orage environment 8,1.4 Transportation 8.2 Safety requirements 8.3 Flammability i 1 1 1 1 1 1 1 1 1 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 3 3 3 3 4 4 4 H 3404593 OOLBOL5 Lb - 11 - 9 Reference Drive 9.1 Optical system 9.2 Opticalbeam 9.3 Read Channel 9.4 Tracking 9.5 Rotation of the disk Section 2 - Mechan
10、ical and physical characteristics 10 Dimensional and physical characteristics of the case 10.1 10.2 10.3 Dimensions of the case 10.3.1 Overall dimensions 10.3.2 Location Hole 10.3.3 Alignment Hole 10.3.4 Reference surfaces 10.3.5 Detents 10.3.6 Write-inhibit feature 10.3.7 10.3.8 10.3.9 Loading groo
11、ves 10.3.10 Sensor Holes 10.3.1 1 Gripper features 10.3.12 Label Area General description of the case Reference Planes of the case Head and spindle access windows Shutter, shutter opener and mis-insert protection feature 10.4 Mechanical characteristics 10.4.1 Material 10.4.2 Mass 10.4.3 Distortion 1
12、0.4.4 Compliance 10.4.5 Shutter opening force 11 Dimensional, mechanical and physical characteristics of the disk 11.1 11.2 1 1.3 General description of the disk Reference axis and plane of the disk Dimensions of the disk 1 1.3.1 Centre Zone 11.3.2 Clamping Zone 11.3.3 Transition Zone 11.3.4 Informa
13、tion Zone 11.3.5 RimZone 11.4 Mechanical characteristics 11.4.1 1 1.4.2 11.4.3 11.4.4 11.4.5 11.4.6 1 1.4.7 1 1.4.8 1 1.4.9 Material Mass Moment of inertia Imbalance Axial deflection Axial acceleration Radial mnout Radial acceleration Tilt 8 8 8 8 8 8 9 9 9 10 10 11 11 12 12 13 14 14 14 15 15 15 15
14、15 15 15 15 15 16 16 16 16 16 16 16 16 16 16 16 17 17 17 - 3404593 OOLO1b OT5 . - 111 - 11.5 Optical characteristics 11.5.1 Index of refraction 1 1.5.2 11.5.3 Birefringence 1 1.5.4 Reflectance Thickness of the substrate 12 Interface between cartridge and drive 12.1 Clamping method 12.2 Hub 12.3 Clam
15、ping force 12.4 Capture cylinder 12.5 Disk position in operating condition Section 3 - Format of information 13 Track geometry 13.1 Track shape 13.2 Direction of rotation 13.3 Track pitch 13.4 Track number 14 Track format 14.1 Track layout 14.2 Radial alignment 14.3 Sector Number 15 Sector format 15
16、.1 15.2 15.3 15.4 15.5 15.6 15.7 15.8 15.9 15.10 15.1 1 Sector layout WO fields Address Sync (AS) Address Fields Postambles (PA) Mirror Field (MF) Gap Flag CFLG) Laser Power Test Field (LPT) Data Sync (DS) Data Field 15.1 1.1 User Data byles 15.1 1.2 Address data bytes 15.1 1.3 15.1 1.4 Resync bytes
17、 15.12 Buffer Field CRC and ECC bytes 16 Recording code 17 Format of the Information Zone 17.1 17.2 General description of the Information Zone Division of the Information Zone 17.2.1 Mirror Zone 17.2.2 PEP Control Zone 17.2.3 Acquire zone 17 17 17 18 18 18 18 18 19 19 19 33 33 33 33 33 33 33 33 33
18、33 34 34 34 34 35 35 35 35 35 35 35 36 36 36 36 36 36 36 37 37 37 37 37 38 3404593 OOL017 T3L - iv - 17.2.4 Test Zones 17.2.5 SFP Control Zones 17.2.6 Data Zone 17.2.7 Buffer Zone 38 38 38 38 18 Format of the Data Zone 18.1 Defect Management Areas 18.2 Disk Structure Table (DST) 18.3 User Zone 18.4
19、WDL Zone 19 Defect management 19.1 19.2 19.2.1 19.2.2 19.3 19.4 19.5 19.6 19.7 Media initialization Certification Slipping Algorithm Linear Replacement Algorithm Disks not certified Write procedure Primary Defect List (PDL) Secondary Defect List (SDL) Working Defect List (WDL) Section 4 - Characteri
20、stics of embossed information 20 Method of testing 20.1 Environment 20.2 Use of the Reference Drive 20.2.1 Optics and mechanics 20.2.2 Read power 20.2.3 Read Channels 20.2.4 Tracking 20.3 Definition of signals 21 Signals from grooves 21.1 Track-cross signal 21.2 Push-pull signal 21.3 On-track signal
21、 2 1.4 Phase depth 21.5 Track location 22 Signal from Headers 22.1 WO 1 and WO2 22.2 Address Sync, Address Field and Postamble 23 Signais from embossed Recording Fields 24 Signals from PEP Control Zone Section 5 - Characteristics of the recording layer 38 38 39 40 40 41 41 41 41 41 41 41 42 42 43 44
22、 44 44 44 45 45 45 45 45 47 47 47 47 47 47 47 47 48 48 48 49 25 Method of testing 49 3404593 OOl180L8 978 -v- 25.1 Environment 25.2 Reference Drive 25.2.1 Optics and mechanics 25.2.2 Read power 25.2.3 Read Channel 25.2.4 Tracking 25.3 Write conditions 25.3.1 Write pulse 25.4 Definition of signals 26
23、 Optical Characteristics 26.1 Baseline reflectivity 26.2 Uniformity of reflectivity 27 Read and write characteristics 27.1 Sensitivity of the recording layer 27.1.1 Optical conditions 27.1.2 27,1.3 27.1.4 Definition and measurement conditions Write power and writing conditions Characteristics of the
24、 written marks 27.2 Read characteristics 27.2.1 Optical conditions 27.2.2 Read power 27.2.3 Reflectivity characteristics 27.2.4 Carrier-to-noise ratio 27.2.6 Timing jitter 27.2.5 Cross-talk Section 6 - Characteristics of user data 28 Method of testing 28.1 Environment 28.2 Reference Drive 28.2.1 Opt
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