ECA EIA-973-2018 Specification for M12 Hybrid (Data and Power) Circular Connectors.pdf

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1、EIASPECIFICATION Specification for M12 Hybrid (Data and Power) Circular ConnectorsEIA-973March 2018Electronic Components Industry Association EIA-973ANSI/EIA-973-2018 Approved: March 8, 2018 NOTICE EIA Engineering Specifications and Publications are designed to serve the public interest through elim

2、inating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Specifications and Publications shall n

3、ot in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Specifications and Publications, nor shall the existence of such Specifications and Publications preclude their voluntary use by those other than ECIA members, whether the standar

4、d is to be used either domestically or internationally. Specifications and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation wha

5、tever to parties adopting the Specification or Publication. This EIA specification is considered to have International Standardization implications, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA standard and the IE

6、C document can be made. This Specification does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Specification to establish appropriate safety and health practices and to determine the applicabi

7、lity of regulatory limitations before its use. NOTE The users attention is called to the possibility that compliance with this standard may require use of an invention covered by patent rights. By publication of this standard, no position is taken with respect to the validity of any such claim(s) or

8、 of any patent rights in connection therewith. If a patent holder has filed a statement of willingness to grant a license under these rights on reasonable and nondiscriminatory terms and conditions to applicants desiring to obtain such a license, then details may be obtained from the standards devel

9、oper Neither the standards developer nor ANSI is responsible for identifying patents for which a license may be required by an American National Standard or for conducting inquiries into the legal validity or scope of those patents that are brought to their attention. (From Standards Proposal No. 52

10、41, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Socket Standards.) Published by Electronic Components Industry Association 2018 EIA Standards and value for 8 positions (4 + 4), see figure 6. Figure 5 Current capacity versus temperature for 6 positions (4 + 2

11、) EIA-973 Page 9 Figure 6 Current capacity versus temperature for 8 positions (4 + 4) 4.2.3 Contact resistance Conditions: EIA 364-23, see figure 7. Mated connectors: 10 milliohms maximum initial. Figure 7 Contact resistance measurement points typical EIA-973 Page 10 4.2.4 Insulation resistance Cond

12、itions: EIA 364-21, test voltage 800 volts dc. Between adjacent contacts of mated and unmounted connectors: 100 megaohms minimum. 4.3 Mechanical 4.3.1 Durability cycling Conditions: EIA 364-09, mate and unmate connectors for 100 cycles at a maximum rate of 600 cycles per hour. There shall be no phys

13、ical damage, and subsequent tests shall be met. 4.3.2 Mating and unmating force Conditions: EIA 364-13, at a rate of 12.7 millimeters (0.5 inch) per minute Force necessary to mate connectors: 25 newtons (2549 grams-force) maximum per connector. Force necessary to unmate connector assemblies: 25newto

14、ns (2549grams-force) minimum per connector. 4.3.3 Vibration Condition: EIA 364-28, test condition VII, letter D, subject mated connectors to random vibration applied only between the frequency limits of 20 hertz and 500 hertz at a power spectral density (psd) of 0.02 g2/hertz for 1 hour in each of 3

15、 mutually perpendicular planes; see figures 8 and 9. There shall be no discontinuities of 1 microsecond duration or longer. EIA-973 Page 11 Figure 8 Vibration and physical shock test fixture straight typical EIA-973 Page 12 Figure 9 Vibration and physical shock test fixture free to free connector ty

16、pical 4.3.4 Physical shock Condition: EIA 364-27, test condition H, subject mated connectors to 30 gn peak acceleration, half-sine shock pulses of 11 milliseconds, 3 shocks applied along 3 mutually perpendicular planes, total 18 shocks; see figures 8 and 9. There shall be no discontinuities of 1 mic

17、rosecond duration or longer. 5 Test schedule5.1 General This test schedule shows the tests and the order in which they shall be carried out as well as the requirements to be met. Unless otherwise specified, mated sets of connectors shall be tested. When the initial tests have been completed, all spe

18、cimens are divided up according to the test groups. Care shall be taken to keep a particular combination of connectors together during the complete test sequence, i.e., when unmating is necessary for a certain test, the same connectors as before shall be mated for the subsequent tests. Before testin

19、g commences, the connectors shall have been stored for at least 24 hours in the non-inserted state under normal climatic conditions for testing. In the following test sequence tables, where an EIA test is specified without a letter suffix, the latest approved version of that test shall be used. EIA-

20、973 Page 13 5.2 Test sequences 5.2.1 Minimum test sequences for product qualification 5.2.1.1 Test group P - Preliminary Representative specimens should be subjected to the following tests to verify that the connectors are acceptable to go through the remaining AP- DP tests. Table 5- Test group P -

21、General examinationTest phase Test Measurement to be performed Comments Title EIA 364 Test No. Severity or condition of test Title EIA 364 Test No. P1 General examination Unmated connectors Visual inspection 18 There shall be no defects that would impair normal operationsExamination of dimensions 18

22、 Dimensions shall comply with this documentEIA-973 Page 14 5.2.1.2 Test group AP - Mating force, durability, vibration, shock and unmating force Table 6 - Test group APTest phase Test Measurement to be performed Comments/requirements Title EIA 364 Test No. Severity or condition of test Title EIA 364

23、 Test No. AP1 Mating force 13 Measure force to mate at a rate of 12.7 mm (0.5 in) per min max25N (2549 gf) max per connector AP2 20 mV max open circuit at 100 mA max.; see figure 7Low-level contact resistance23 Measure initial resistance, see note AP3 Durability 09 100 cycles at maximum rate of 600

24、cycles per hourNo physical damage and shall meet requirements of subsequent testsAP4 Shock 27 30 gn peak accelerat- ion half sine 11 ms 3 shocks applied along 3 mutually perpend- icular planes total 18 shocks; see figures 8 and 9.Continuity 46 No discontinuities of 1 s or longer duration, see note A

25、P5 Vibration 28 20-500 Hz random at a power spectral density of 0.02 G2/Hz for 1 hr in each of 3 mutually perpendicular planes; see figures 8 and 9.Continuity 46 No discontinuities of 1 s or longer duration, see note AP6 Same as AP2 Low-level contact resistance23 10 milliohms max increase, see note

26、AP7 Unmating force 13 Measure force to unmate at a rate of 12.7 mm (0.5 in) per min max25 N (2549 gf) minimum per connector AP8 General examination Unmated connectors Visual inspection 18 There shall be no defects that would impair normal operationsExamination of dimensions 18 Dimensions shall compl

27、y with this documentNOTE - During vibration and shock perform discontinuity on two specimens in the group. Low-level contact resistance shall be performed on 30 random contacts from the remaining three specimens.EIA-973 Page 15 5.2.1.3 Test group BP - Temperature life, mixed flowing gas, vibration a

28、nd temperature rise versus current Table 7 - Test group BPTest phase Test Measurement to be performed Comments/requirements Title EIA 364 Test No. Severity or condition of test Title EIA 364 Test No. BP1 20 mV max open circuit at 100 mA max.; see figure 7Low-level contact resistance23 Measure initia

29、l resistance BP2 Durability (pre-conditioning)09 10 cycles at maximum rate of 600 cycles per hourNo physical damage and shall meet requirements of subsequent testsBP3 Mixed flowing gas 65 Class II for 14 days mated No physical damage and shall meet requirements of subsequent testsBP4 Same as BP1 Low

30、-level contact resistance23 15 milliohms max increase over initial valuesBP5 Temperature life 17 80C for 1000 hours No physical damage and shall meet requirements of subsequent testsBP6 Same as BP1 Low-level contact resistance23 10 milliohms max increase BP7 Vibration 28 20-500 Hz random at a power

31、spectral density of 0.02 G2/Hz for 1 hr in each of 3 mutually perpendicular planes; see figures 8 and 9.Continuity 46 No discontinuities of 1 s or longer duration BP8 Same as BP1 Low-level contact resistance23 10 milliohms max increase BP9 Current versus temperature rise70 30 C temperature rise; see

32、 figures 5 and 6 12 A max for figure 5 and 6 A max for figure 6 BP10 Same as BP1 Low-level contact resistance23 10 milliohms max increase BP11 General examination Unmated connectors Visual inspection 18 There shall be no defects that would impair normal operationsExamination of dimensions 18 Dimensi

33、ons shall comply with this documentEIA-973 Page 16 5.2.1.4 Test group CP - Thermal shock and humidity-temperature cycling Table 8 - Test group CPTest phase Test Measurement to be performed Comments/requirements Title EIA 364 Test No. Severity or condition of test Title EIA 364 Test No. CP1 Test volt

34、age 800 V dcInsulation resistance21 100 megohms minimum CP2 Test voltage 800 V ac for 60 seconds Dielectric withstanding voltage20 No breakdown or flashover CP3 Thermal shock 32 5 cycles between 0 C (32 F) and 80 C (176F), mated connectorsNo physical damage and shall meet requirements of subsequent

35、tests CP4 Humidity- temperature cycling 31 10 cycles between 25 C (77 F) and 65 C (149 F) at 95% rh, 240 hours duration, mated connectorsNo physical damage and shall meet requirements of subsequent tests CP5 Test voltage 800 V dcInsulation resistance21 100 Megaohms minimum CP6 Test voltage 800 V ac

36、for 60 seconds Dielectric withstanding voltage20 No breakdown or flashover CP7 General examination Unmated connectors Visual inspection 18 There shall be no defects that would impair normal operationsExamination of dimensions 18 Dimensions shall comply with this documentEIA-973 Page 17 5.2.1.5 Test

37、group DP Signal integrity Table 9 - Test group DPTest phase Test Measurement to be performed Comments/requirements Title Severity or condition of test Title Test No. DP1 Insertion lossIEC 60512-29-100, Test a0,04 fsee note c, d, e, f DP2 Near end crosstalk All pairs, both directions, (pair to pair)

38、NEXT IEC 60512-29-100, Test c 83 - 20log(f)see note a, d, e, f DP3 Return loss All pairs, both directions IEC 60512-29-100, Test b 60 - 20log(f)see note b, d, e, fDP4 Far end crosstalkAll pairs, both directions, (pair to pair)FEXT loss IEC 60512-29-100, Test d 75,1 - 20log(f) dBsee note d, e, f, h D

39、P5 Transverse conversion loss All pairs, both directions TCL IEC 60512-29-100, Test f All pairs: 68 - 20log(f) dB See note d, e, f, gDP6 Transverse conversion transfer loss All pairs, both directions TCTL IEC 60512-29-100, Test g All pairs: 68 - 20log(f) dB see note d, e, f, gDP7 Transfer impedance

40、IEC 60512-26-100, Test e 0,1 x f 0,3 from 1 MHz to 10 MHz 0,02 x f from 10 MHz to 100 MHz see note fDP8 Input to output resistance Measurement points as defined in 6.1.1 All signals contacts and screen/specimens Millivolt level method EIA-364-23 Signal contact resistance 200 m max. Screen resistance

41、 100 m max. DP9 Resistance unbalance Measurement points as defined in 6.1.1 All signals contacts Millivolt level method EIA-364-23 Unbalance resistance 50 m max. NOTES a NEXT loss at frequencies that correspond to calculated values of greater than 80 dB shall revert to a minimum requirement of 80dB.

42、 b Return loss at frequencies that correspond to calculated values of greater than 30 dB shall revert to a minimum requirement of 30 dB. c Attenuation at frequencies that correspond to calculated values of less than 0,1 dB shall revert to a requirement of 0,1 dB maximum d All transmission results sh

43、all report worst case overall for the corresponding pair or pair combination after testing all the specimens. e All measurements to be performed on mated contacts. f For all formulas f is frequency in MHz. Frequency range from 1 to 100 MHz. g TCL and TCTL at frequencies that correspond to calculated

44、 values of greater than 50 dB shall revert to a minimum requirement of 50 dB. h FEXT loss at frequencies that correspond to calculated values of greater than 75 dB shall revert to a minimum requirement of 75 dB. EIA-973 Page 18 6 Quality assessment procedures 6.1 Qualification approval testing The f

45、ollowing number of specimens shall be subjected to the tests under the conditions as specified in clause 5. The specimens shall meet the requirements with not more than the number of defectives permitted in accordance with the following table 10. Table 10 - Qualification approval testsTest group as

46、in 5.1 Performance level PL-1 Minimum number of specimens Permitted number of defectives per group P 30 0AP 5 0BP 5 0CP 5 0DP 5 06.2 Reinspection Connectors stored for a period of more than 36 months after the release of the lot shall be tested prior to delivery according to the table 11. Once a lot

47、 has been satisfactorily re-inspected, the quality is assessed for a further 36 months. Table 11 - ReinspectionInspection group Test phase as in 5.1 Test or measurement to be performed per requirements and severities in 5.1 EIA 364 Test No. Comments A1 P1 Visual examination 18 There shall be no defe

48、cts that would impair normal operations.ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Associa

49、tion EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLYResponsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letterProject numberP