ECA EIA-364-32G-2014 TP-32G Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets.pdf

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1、 EIA STANDARD TP-32G Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets EIA-364-32G (Revision of EIA-364-32F) August 2014 ANSI/EIA-364-32G-2014 Approved: August 15, 2014 EIA-364-32G NOTICE EIA Engineering Standards and Publications are designed to serve the publ

2、ic interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and P

3、ublications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, whether th

4、e standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any obligation

5、 whatever to parties adopting the Standard or Publication. This standard is based upon the major technical content of International Electrotechnical Commission standard 60512-11-4 (was IEC 512-6, test 11d), Rapid Change of Temperature, 2002-02, first edition. There are known differences between this

6、 standard and the IEC standard. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicabili

7、ty of regulatory limitations before its use. (From Standards Proposal No. 5332, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards.) Published by Electronic Components Industry Association 2014 EIA Standards see 4.3. EIA-364-32G Page 3 4 Test proc

8、edure 4.1 Mounting The specimens shall be placed in such a position with respect to the air stream that there is substantially no obstruction to the flow of air across and around each specimen. When special mounting is required, it shall be specified. 4.2 Initial measurements Specified measurements

9、shall be made prior to the first cycle, and they shall be made at standard ambient conditions. 4.3 Specimen mass determination The mass of the specimen in table 2 is the total mass of the mated assembly, wire and any fixture attached to the specimen. Table 2 - Exposure time at temperature extremes M

10、ass of specimen Minimum time for steps 1 and 3,hours 28 g (1 oz) and below ; or (when specified) 28 g (1 oz) to 136 g (0.3 lb) inclusive 136 g (0.3 lb) to 1.36 kg (3 lb) inclusive 1 1.36 kg (3 lb) to 13.6 kg (30 lb) inclusive 2 13.6 kg (30 lb) to 136 kg (300 lb) inclusive 4 NOTE When step one consis

11、ts of cryogenic immersion of the specimen in liquid nitrogen, as specified in table 4, exposure time shall be as specified in table 2 or the amount of time necessary to obtain thermal stability of the test specimen. 4.4 Cycling 4.4.1 Subject test specimens to the test method, test condition and test

12、 duration as specified in the referencing document. 4.4.2 When a test is not specified in the referencing document, method A, test condition I, test duration A, shall be used as the default. 4.4.3 The first five cycles shall be run continuously. After five cycles, the test may be interrupted after t

13、he completion of any full cycle and the specimens allowed to return to room ambient temperature before testing is resumed. One cycle consists of steps 1 through 4 of the applicable test condition. The test may be started in either the hot or cold temperature. At the conclusion of the test the specim

14、ens may be removed from the chamber or the specimens may remain in the chamber while the chamber returns to room ambient conditions. 4.4.4 Specimens shall not be subjected to forced circulating air while being transferred from one chamber to another or to a dewar of liquid nitrogen. EIA-364-32G Page

15、 4 Table 3 Method A, air-to-air thermal shock test conditions Step Test condition I Test condition II Test condition III Temperature, C Time, minutes Temperature, C Time, minutes Temperature, C Time, minutes 1 +0 -55 -5 See table 2 +0 -65 -5 See table 2 +0 -65 -5 See table 2 2 Specimen transfer time

16、 from cold to hot. 5 max (see 2.1.3) Specimen transfer time from cold to hot. 5 max (see 2.1.3) Specimen transfer time from cold to hot. 5 max (see 2.1.3) 3 +3 85 -0 See table 2 +3 105 -0 See table 2 +3 125 -0 See table 2 4 Specimen transfer time from hot to cold. 5 max (see 2.1.3) Specimen transfer

17、 time from hot to cold. 5 max (see 2.1.3) Specimen transfer time from hot to cold. 5 max (see 2.1.3) Table 3 Method A, air-to-air thermal shock test conditions (continued) Step Test condition IV Test condition V Test condition VI Temperature, C Time, minutes Temperature, C Time, minutes Temperature,

18、 C Time, minutes 1 +0 -65 -5 See table 2 +0 -65 -5 See table 2 +0 -65 -5 See table 22 Specimen transfer time from cold to hot. 5 max (see 2.1.3) Specimen transfer time from cold to hot. 5 max (see 2.1.3) Specimen transfer time from cold to hot. 5 max (see 2.1.3) 3 +3 150 -0 See table 2 +3 175 -0 See

19、 table 2 +5 200 -0 See table 24 Specimen transfer time from hot to cold. 5 max (see 2.1.3) Specimen transfer time from hot to cold. 5 max (see 2.1.3) Specimen transfer time from hot to cold. 5 max (see 2.1.3) EIA-364-32G Page 5 Table 3 Method A, air-to-air thermal shock test conditions (continued) S

20、tep Test condition VII Test condition VIII Temperature, C Time, minutes Temperature, C Time, minutes 1 +0 -55 -5 See table 2 +0 -40 -5 See table 2 2 Specimen transfer time from cold to hot. 5 max (see 2.1.3) Specimen transfer time from cold to hot. 5 max (see 2.1.3) 3 +3 105 -0 See table 2 +3 105 -0

21、 See table 2 4 Specimen transfer time from hot to cold. 5 max (see 2.1.3) Specimen transfer time from hot to cold. 5 max (see 2.1.3) EIA-364-32G Page 6 Table 4 Method B, air-to-liquid nitrogen (cryogenic) thermal shock test conditions Step Test condition I Test condition II Test condition III Temper

22、ature, C Time, minutes Temperature, C Time, minutes Temperature, C Time, minutes 1 +0 -195.8 -5 See table 2 +0 -195.8 -5 See table 2 +0 -195.8 -5 See table 22 Specimen transfer time from cold to hot. 15 max (see 2.1.3) Specimen transfer time from cold to hot. 15 max (see 2.1.3) Specimen transfer tim

23、e from cold to hot. 15 max (see 2.1.3) 3 +3 85 -0 See table 2 +3 105 -0 See table 2 +3 125 -0 See table 24 Specimen transfer time from hot to cold. 15 max (see 2.1.3) Specimen transfer time from hot to cold. 15 max (see 2.1.3) Specimen transfer time from hot to cold. 15 max (see 2.1.3) Table 4 Metho

24、d B, air-to-liquid nitrogen (cryogenic) thermal shock test conditions (continued) Step Test condition IV Test condition V Test condition VI Temperature, C Time, minutes Temperature, C Time, minutes Temperature, C Time, minutes 1 +0 -195.8 -5 See table 2 +0 -195.8 -5 See table 2 +0 -195.8 -5 See tabl

25、e 22 Specimen transfer time from cold to hot. 15 max (see 2.1.3) Specimen transfer time from cold to hot. 15 max (see 2.1.3) Specimen transfer time from cold to hot. 15 max (see 2.1.3) 3 +3 150 -0 See table 2 +3 175 -0 See table 2 +5 200 -0 See table 24 Specimen transfer time from hot to cold. 15 ma

26、x (see 2.1.3) Specimen transfer time from hot to cold. 15 max (see 2.1.3) Specimen transfer time from hot to cold. 15 max (see 2.1.3) EIA-364-32G Page 7 Table 5 Test durations Test duration Number of cycles A 5A-1 25 A-2 50 A-3 100 A-4 10 4.5 Final measurements The specimens shall be returned to the

27、rmal stability at standard ambient conditions before the final measurements are made, unless otherwise specified in the referencing document. 4.6 Failures Effects of thermal shock testing may include, (the referencing document shall specify pass/fail criteria): 4.6.1 Excessive permanent dimensional

28、changes. 4.6.2 Cracking delamination of finishes. 4.6.3 Cracking and crazing of embedding and encapsulating compounds. 4.6.4 Opening of seals and seams. 4.6.5 Leakage of potting materials. 4.6.6 Excessive displacement or rupture of connector shells, inserts, contacts, wire or sealing plugs. 4.6.7 Ex

29、cessive hardening or softening of resilient dielectric materials. 4.6.8 Fusing or seizure of mating specimen components and contacts. 4.6.9 Change in electrical characteristics. 4.6.10 Changes in mating and unmating characteristics. EIA-364-32G Page 8 5 Details to be specified The following details

30、shall be specified in the referencing document: 5.1 Number of specimens to be tested 5.2 Test method, test condition and test duration 5.3 Mated or unmated state of test specimens, and assembly of test specimen if other than specified in 3.1 or 3.2 5.4 Wire type and size, if applicable; see 3.2.1 5.

31、5 Number of contacts and sealing plugs, if applicable; see 3.2.1 5.6 Specimen accessories, if applicable 5.7 Special mounting, if required; see 4.1 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specim

32、en description, including fixturing and wiring 6.3 Test equipment used, and date of last and next calibration 6.4 Test and measuring procedure 6.5 Values and observations 6.5.1 Results of visual inspection 6.5.2 Record of chamber temperature and recovery 6.5.3 Initial measurements; see 4.2 6.5.4 Spe

33、cimen mass; see 4.3 6.5.5 Exposure time at each temperature; see 4.3 6.5.6 Final measurements; see 4.5 6.6 Name of operator and start/finish date(s) of test EIA-364-32G Page A-1 Annex A Previous MIL-STD-1344 designations (Informative) This informative annex is provided as a cross reference to the de

34、signations previously contained in MIL-STD-1344, method 1003.1. Table A.1 Test duration designation EIA-364-32 designations MIL-STD-1344, method 1003.1 designations Method A, condition I, test duration A (5 cycles) Condition A (5 cycles) Method A, condition I, test duration A-1 (25 cycles) Condition

35、 A-1 (25 cycles) Method A, condition I, test duration A-2 (50 cycles) Condition A-2 (50 cycles) Method A, condition I, test duration A-3 (100 cycles) Condition A-3 (100 cycles) ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety,

36、 health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telep

37、hone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments fo

38、rwarded to Committee Chairman: Revision History Revision letter Project number Publication date Additions, changes and deletions - SP-1016 December 1969 Initially published in EIA RS-364 A SP-1419 November 1983 Was published as EIA RS-364-32A B SP-2908 October 1992 C SP-4418 May 2000 D SP-5134-A Dec

39、ember 2006 Added paragraph 1.2, 5.2, table 1 and 5. Changed paragraph 4.3, 4.4, and table 2 note. Deleted paragraph 5.7 and 5.8. E SP-5168 May 2008 Added note to table 1 and Annex A F SP-5216 June 2011 Revised paragraph 2.1.3 and 4.4.3 Revised Steps 2 and 4 in tables 3 and 4 Change cold temperature

40、tolerance from +0 / -3 to +0 / -5 in Test condition 1, step 1, Method A G SP-5332 Corrected table reference in Table 3, Test condition VI, Step 1. Was listed as “See table 1”. Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org