ECA 535ABAD-1987 Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode《非固体电解质和多孔阳极的固定钽电容器》.pdf

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1、P d a m in o v I W 0 /- -. EIA 535ABAD 87 3234600 0074022 b DETAIL S P E C I F I CAT I ON Fixed Tantalum Capacitors With Non-Solid Electrolyte And Porous Anode EIA-535ABAD ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT _ EIA 535ABAD 87 3234600 0074023 W NOTICE EIA Engineering Standards and

2、 Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his partic

3、ular need. Existence of such Standards and Pub- lications shall not in any respect preclude any member or non-member of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary us

4、e by those other than EIA members, whether the standard ia to be used either domestically or internationally. Recommended Standards and Publications are adopted by EIA without regard to whether or not their adoption may involve patents on articles, materials, or processes. By such action, EIA does n

5、ot assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Recom- mended Standard or Publication. Published by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Eye Street, NW Washington, D.C. 20006 Copyright 19 8 7 ELECTRONIC INDUSTRI

6、ES ASSOCIATION PRICE: $9.00 3216 E- 5 INTERNATIONAL ELECTROTECHNICAL COM M ISS1 O N Quality Assessment System for Electronic Components Detail Specification for use in electronic equipment Fixed Tantalum Capacitors with Non-Solid Electrolyte and Porous Anode ECCB THE ELECTRONIC COMPONENTS CERTIFICAT

7、ION BOARD, INC. The U.S. Nationai Authorized Institution for the IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS 2001 Eye Street. N.W. Wuhingion. D.C. 20006 CSA o i: l- O EIA 535ABAD 87 m 3234600 0074025 I m EIA-535ABAD FIXED TANTALUM CAPACITORS WITH NON-SOLID ELECTROLYTE AND POROUS MODE Thi

8、s Standard represents US adoption of International Electrotechnical Commission Quality Assessment Systems (IECQ) Detail Specification QC300202/US0004, January 1984. It is issued as an EIA document to provide a Specification in the National Electronic Components Quality Assessment System (NECQ). IEC

9、documents referenced in this Detail Specification (e.g. QC 300000) may be obtained from the American National Standards Institute, 1430 Broadway, New York, New York 10018. EIA numbers are assigned to these IEC documents for reference purposes and to facilitate later publication of equivalent EIA doc

10、uments. i EIA 535ABAD 87 m 323VbOO 007V02b 3 m I National Standards Organization ELECTRONIC INDUSTRIES ASSOCIATION r Generic SFecificatiar, Number Electronic comoonenta of a88eS8.d quality !n accordance with QC 3 0 0 O O 0 ( EU-5 3 5 00 0 O Outline Drawing (See Table 1) (First Angle Projection) . a

11、. I LCASE INSULATED indicate Positive Lead End (Other shapes are permitted within the dimensions given) EIA-53 5ABAD QC3 002 02 /US 0004 Page 1 Detail Specification Number QC300202/US0004 (EIA-535ABAC) 6lank Detail Specification Number QC300 202 (EIA-535AB00) Product Description Fixed antalum Capaci

12、tors with Non-Solid Electrolyte and Porous Anode Electrical Circuit Typical Construction Silver Case, Axial Lead, Polarized, Nickel Positive, Copper Negative Lead, Case insolated. Elastomer Seal Application/Assessment Level Assessment Level (s : E Performance Grade : Long Life Infarmatlon on the rva

13、ilabillty of components q u allfle d to thi8 rpscificatlon I8 given in the Qualltlod Producta List. - EIA 535ABAD 87 m 3234600 0074027 5 m EIA-535ABAD QC300202/USOOO4 Page 2 1. 1.1 1.2 1.3 PART ONE - GENERAL DATA GENERAL DATA RECOMMENDED METHODS OF MOUNTING a. By the leads in the absence of vibratio

14、n or shock. b. By body clamp and leads if vibration or shock can exist. DIMENSIONS TABLE I RATINGS AND CHARACTERISTICS Capacitance Range Tolerance On Rated Capacitance Rated Voltage (Ur) C1 imat ic Category Rated Temperature Var ia tion of Capacitance With Tempera ture Tangent Of Loss Angle Leakage

15、Current Impedance Reverse Voltage (see Table II) +,-5%; +,-lo%, +,-20% (see Table II) 55/85/21 85 C (see Table II) (see Table II) (see Table II) (see Table II) O (No reversal of voltage permitted) EIA 535ABAD 87 m 3234600 0074028 7 = EIA-535ABAD QC300202/USO004 Page 3 EIA 535ABAD 87 m 3234600 007402

16、9 9 = TABLE II - STANDARD RATINGS (Continued) .-_I_- RATING CASE MAX. MAX. MAX. MAX. %CAP. (UF) (Ur) 20 C 85 C 20 c -55 c -55 C 85 C 3.3 63.0 D 2.0 6.0 0.12 680 -25 +9 4.7 63.0 A 2.0 6.0 0.16 400 -30 +9 6.8 63.0 A 2.0 6.0 0.16 367 -30 +9 10.0 63.0 B 2.0 8.0 0.20 217 -35 +9 15.0 63.0 B 2.0 8.0 0.21 1

17、74 -35 +9 22.0 63.0 B 2.0 8.0 0.21 140 -30 +9 33.0 63.0 C 2.0 10.0 0.15 75 -35 +9 47.0 63.0 C 2.0 10.0 0.16 62 -40 +9 68.0 63.0 C 2.0 10.0 0.16 51 -40 +9 CAP. WVDC SIZE DCL (UA) tan d IMP.(ohm) CHANGE FROM 20 C . 1.4 RELATED DOCUMENTS Generic Specification: IEC Publication 384-1 (1981) (QC 300000) S

18、ectional Specification: IEC Publication 384-15 (1982) - at (EIA-5350000) I present Document 40 (Central Office)462 ( E o o o o (EIA-535A000) 1.5 MARKING The marking of the capacitor and the packing shall be in accordance with the requirements of IEC Publication 384-15, Sub- clause 1.6. The following

19、 items are to be marked on the capacitor: a. Rated capacitance in the form “XXXUF“. b. Rated DC voltage in the form IyyyVDC“. c. Polarity identification by one or more positive signs near the positive termination. d. Tolerance code per IEC Publication 62. The code letter will follow the marking of r

20、ated capacitance per item a. or will be on a separate line. e. Date code per IEC Publication 62. f. Manufacturers name or trade mark. g. Manufacturers type designation (optional) . h. Reference detail specification (optional). I I 1.6 ORDERING INFORMATION Orders for capacitors covered by this specif

21、ication shall contain, in clear or in coded form, the following minimum information: a. Rated capacitance. b. Tolerance on rated capacitance. c. Rated d.c. voltage. d. iJurnber and issue reference of the detail specification and style reference. EIA 535ABAD 87 m 323LIbOO 007LI030 5 m EIA-535ABAD QC3

22、00202/USOOO4 Page 5 1.7 CERTIFIED RECORDS OF RELEASED LOTS Required 1.8 ADDITIONAL INFORMATION (not for inspection purposes) None. 1.9 ADDITIONAL OR INCREASED SEVERITIES OR REQUIREMENTS TO THOSE SPECIFIED IN THE GENERIC AND/OR SECTIONAL SPECIFICATION None. PART TWO - INSPECTION REQUIREMENTS 2.1 PROC

23、EDURES 2.1.1 For Qualification Approval, the procedures shall be in accordance with the Sectional Specification, IEC Publication a 384-15, Sub-clause 3.4, 2.1.2 For Quality Conformance Inspection the test schedule (Table IV) includes sampling, periodicity, severities and requirements. The formation

24、of inspection lots is covered by Sub-clause 3.5.1 of the Sectional Specification. TABLE IV Note 1: Clause numbers of tests and performance requirements refer to the Sectional Specification, ZEC Publication 384-15 and Part One of this specification. Note 2: Inspection Levels and AQLs are selected fro

25、m IEC Publication 410. Note 3: In this table: P = periodicity (in months) n = sample size C = acceptance criterion (permitted number of defectives ) D = destructive ND = non-destructive IL = inspection level (see IEC 410) AQL = acceptable quality level (see IEC 410) EIA 535ABAD 87 H 3234600 0074033

26、7 E I A- 5 3 5 ABAD QC300202/US0004 Page 6 TABLE IV (continued) Clause number and Test (see Note 1) D Conditions of IL IAQL Performance or test (see Note i) (see requirements ND Note 2) (see Note 1) Sub-group Al 4.1 Visual examination 4.1 Dimensions (gauging) ND s-4 2.5% 4s in 4.1, legible marking a

27、nd as speci- fied in 1.5 of this specifi- cation. As specified in Table I of this specification. Sub-group A2 4.2.1 4.2.2 4.2.3 4.2.4 Leakage current Capacitance Tangent of loss angle Impedance (if applicable) ND Protective Resis- tance: 1000 ohms Frequency: 120Hz Frequency: 120Hz Not App 1 ic ab 1

28、e at 20 C II 1.0% Table II Within specified tolerance Table II EIA 535ABAD 87 m 3234600 0074032 9 m E I A-5 3 5 ABAD QC300202/USO004 Page 7 TABLE IV (continued) . Clause number and D Conditions of IL IAQL Performance Test (see Note i) or test (see Note i) (see requirements ND Note 2) (see Note i) Su

29、b-group B2 4.15 Characteristics at high and low temperatures (if required) . YD rhe capacitors shall be measured it each step Step 1: (+20 C) Leakage current Capacitance Tangent of loss angle tep 2: Lower (-55 C) category temperature Capacitance Tangent of loss angle Impedance Step 3: Rated temperat

30、ure (+85 Cl Leakage Capacitance Current Ur Tangent of loss angle 5-3 2.5% - For use as - reference value - Table II Not applicable Table II Table II Table II Table II EIA 535ABAD 87 3234b00 0074033 O EIA-535ABAD QC300202/ Page 8 TABLE IV (continued) Sub-group C1A Part of sample of Sub-group C1 4.3.1

31、 Initial measurement 4.3 Robustness of terminations 4.4 Resistance to soldering heat 4.4.2 Final measurements D Capacitance Test Ua Force = 10N Test Ub ( 2 bends) Test Uc (2 rotations) Visual Examination Method: Solder Bath Test Tb, Method 1A (10 +,-1s immer- sion time) Visual Examin- ation - Not mo

32、re than 1 defective for Subgroups Other part of sample I Sub-group C1B ID 4.6.1 Initial measurement 4.6 Rapid change of temperature Capacitance 9A = Lower category tempera ture (-55 C) 6 9 C 1A 6 18 1 and 1 No visible damage and no leakage of electrolyte No visible damage and no leakage of electroly

33、te Legible marking C1B combined- - EIA 535ABAD 87 m 3234b00 0074034 2 m TABLE IV 4.6.3 Final measurements 4.7 Vibr ti n 4.7.2 Final mea sur emen ts 4.8 Bump 4.9 Shock (Sub-group C1B - continued) 0B = Upper category temperature (+85 C) 5 cycles Duration t = 30 minutes Leakage current Capacitance Tang

34、ent of loss angle Method of Mounting : see 1.1 of this specification Procedure B4 Frequency Range : 10 to 2000Hz Amplitude: 0.75 mm or acceler- ation 15g, whichever is less severe Total Duration: 6h Visual Examination Not Applicable Method of Mounting : see 1.1 of this specification Acceleration: 98

35、1 m/s/s Duration of pulse: 6 ms Rated Voltage applied EIA-53 5ABAD QC300202/USO004 Page 9 :,= 1.25 times Table II (cf-Ci)/Ci: +,- 5% of value measured in 4.6.1 /= 100M ohms No breakdown or flashover Sub-group C3 4.12 Endurance 4.12.1 Initial mea sur ement 4.12.3 Final measurements Duration: 1000 h A

36、mbient temperature: 1 +85 C Applied Voltage: 1 Ur. Recovery: 16 h I Capacitance Visual examination Leakage current Capacitance Tangent of loss angle 3 24 1 Reference Value No visible Legible marking damage Table II (Cf-Ci)/Ci: /= 15% of value measured in 4.12.1 /= 1.3 times Table II EIA 535ABAD 87 m

37、 3234b00 0074038 T m ELA-535ABAD QC300202/USO004 Page 13 TABLE IV (continued) Clause nunber and Test (see Note 1) D ND or Conditions of test (see Note 1) Sample size and criterion of accept- ability (see Note 3) Performance requirements (see Note 1) Sub-group C4A 4.13 Surge 4.13.1 Initial measuremen

38、t 4.13.3 Final measurements D Number of cycles: 1000 Temperature:85 C Protective resistor: 1000 ohms +,-lo& Duration of charge: 30 s Duration of dis- charge: 5 min 30 s Capacitance Leakage current Capacitance Tangent of loss angle Visual examination 12 3 - Not more than 1 defective for Subgroups C4A

39、 I 12 I Sub-group C4B ID I II 4.14 Reverse voltage Not applicable (if required) a 6 1 and Reference Value Table II (Cf-Ci)/Ci: ,= 108 of value measured in 4.13.1 ,= 1.3 times Table II No visible damage and no leakage of electrolyte C4B combined- EIA 535ABAD 87 = 3234bQ0 0074039 1 ND E IA- 5 3 5ABA Q

40、C300202/USO004 Page 14 15 Clause number and Test (see Note 1) 1 D Conditions of or I test (see Note 1) Sample size and criterion of accept- ability (see Note 3) - PI4 Performance requirements (see Note 1) Sub-group C5 4.15 Characteristics at high and low tenipera ture 4.16 Charge and discharge (if required) D Not applicable Test made in Group a2 Not applicable 6