DLA SMD-5962-97638 REV C-2010 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 3 3 VOLT 16-BIT TRANSPARENT D-TYPE LATCH WITH BUS HOLD EQUIVALENT 22 OHM SERIES OUTPUT RESISTORS THREE-STATI.pdf

《DLA SMD-5962-97638 REV C-2010 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 3 3 VOLT 16-BIT TRANSPARENT D-TYPE LATCH WITH BUS HOLD EQUIVALENT 22 OHM SERIES OUTPUT RESISTORS THREE-STATI.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-97638 REV C-2010 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 3 3 VOLT 16-BIT TRANSPARENT D-TYPE LATCH WITH BUS HOLD EQUIVALENT 22 OHM SERIES OUTPUT RESISTORS THREE-STATI.pdf（19页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change to footnote 5/ in table I. Update boilerplate to MIL-PRF-38535 requirements. LTG 03-01-22 Thomas M. Hess B Add VINtest conditions for VOHand VOLin table I. Add table III, delta limits. jak 03-04-30 Thomas M. Hess C Update boilerplate parag

2、raphs to the current MIL-PRF-38535 requirements. - LTG 10-11-22 Thomas M. Hess REV SHET REV C C C C SHEET 15 16 17 18 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:

3、/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Charles F. Saffle, Jr. APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3 VOLT 16-BIT TRANSPARENT D-TYPE LA

4、TCH WITH BUS HOLD, EQUIVALENT 22 SERIES OUTPUT RESISTORS, THREE-STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 98-01-14 REVISION LEVEL C SIZE A CAGE CODE 67268 5962-97638 SHEET 1 OF 18 DSCC FORM 2233 APR 97 5962-E061-11 Provided by IHSNot for ResaleNo reproduction

5、or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97638 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliabi

6、lity (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN i

7、s as shown in the following example: 5962 - 97638 01 V X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked de

8、vices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type

9、(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54LVTH162373 3.3 V ABT 16-bit transparent D-type latch with bus hold, equivalent 22 series resistors, three-state outputs, and TTL compatible inputs 1.2.3 Device class designator. The dev

10、ice class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or

11、V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F48 48 Flat pack1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 fo

12、r device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97638 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FO

13、RM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +4.6 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ Voltage range applied to any output in the high or power-off state (VOUT) . -0.5 V dc to 7.0 V dc 4/ Current into any output in the low state

14、 (IOL) 30 mA Current into any output in the high state (IOH) 30 mA 5/ Input clamp current (IIK) (VINVCC. 6/ The maximum package power dissipation is calculated using a junction temperature at 150C and a board trace length of 750 mils. 7/ Unused inputs must be held high or low to prevent them from fl

15、oating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97638 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specificatio

16、n, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535

17、- Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawin

18、gs. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a con

19、flict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item r

20、equirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requi

21、rements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for devic

22、e classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specifie

23、d on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce test circuit and waveforms. The ground bounce test circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circui

24、t shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case oper

25、ating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-S

26、TANDARD MICROCIRCUIT DRAWING SIZE A 5962-97638 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of

27、the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Mar

28、king for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-385

29、35, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required f

30、rom a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for de

31、vice classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38

32、535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any

33、 change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation

34、shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 127 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking p

35、ermitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97638 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC

36、+125C +2.7 V VCC +3.6 V unless otherwise specified VCCGroup A subgroups Limits 3/ UnitMin Max Negative input clamp voltage 3022 VIKFor input under test IIN= -18 mA 2.7 V 1, 2, 3 -1.2 V High level output voltage 3006 VOHFor all inputs affecting output under test, VIN= VIH= 2.0 V or VIL= 0.8 V IOH= -1

37、2 mA 3.0 V 1, 2, 3 2.0 V Low level output voltage 3007 VOLFor all inputs affecting output under test, VIN= VIH= 2.0 V or VIL= 0.8 V IOL= 12 mA 3.0 V 1, 2, 3 0.8 V Input current high 3010 IIHFor input under test, VIN= 5.5 V 0.0 V and 3.6 V 1, 2, 3 10.0 A For control inputs under test VIN= VCCor GND 3

38、.6 V 1.0 For data inputs under test VIN= VCC1.0 Input current low 3009 IILFor control inputs under test VIN= GND 3.6 V 1, 2, 3 -1.0 A For data input under test VIN= 0.0 V -5.0 Offstate leakage current IOFFFor output under test, VINor VOUT= 0.0 to 4.5 V 0.0 V 1, 2, 3 100 A Input bus hold current IIN(

39、hold)A inputs VIN= 0.8 V 3.0 V 1, 2, 3 75.0 A VIN= 2.0 V -75.0 Three-state output leakage current high 3021 IOZHVOUT= 3.0 V 3.6 V 1, 2, 3 5.0 A Three-state output leakage current low 3020 IOZLVOUT= 0.5 V 3.6 V 1, 2, 3 -5.0 A Three-state output current, power-up IOZPU4/ VOUT= 0.5 V to 3.0 V mOE = Don

40、t care 0.0 V to 1.5 V 1, 2, 3 100 A Three-state output current, power-down IOZPD4/ VOUT= 0.5 V to 3.0 V mOE = Dont care 1.5 V to 0.0 V 1, 2, 3 100 A Quiescent supply current 3005 ICCVIN= VCCor GND IOUT= 0.0 A Outputs high 3.6 V 1, 2, 3 0.19 mA Outputs low 5.0 Outputs disabled 0.19 See footnotes at e

41、nd of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97638 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristic

42、s - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Quiescent supply current delta, TTL input levels 3005 ICC 5/ One input at VCC-0.6 V Other inputs at VCCor GND 3.0 V and

43、3.6 V 1, 2, 3 0.2 mA Input capacitance 3012 CINTC= +25C See 4.4.1c 0.0 V and 3.6 V 4 9.0 pF Output capacitance 3012 COUTTC= +25C See 4.4.1c 0.0 V and 3.6 V 4 12.0 pF Low level ground bounce noise VOLP6/ VIH= 2.7 V,VIL= 0.0 V TA= +25C See 4.4.1d See figure 4 3.0 V 4 450 mV Low level ground bounce noi

44、se VOLV6/ 3.0 V 4 -300 mV High level VCC bounce noise VOHP6/ 3.0 V 4 600 mV High level VCC bounce noise VOHV6/ 3.0 V 4 -1000 mV Functional test 3014 7/ VIN= VIHor VILVerify output VOUTSee 4.4.1b 2.7 V and 3.6 V 7, 8a, 8b L H Pulse duration, mLE high twCL= 50 pF minimum RL= 500 See figure 5 3.0 V and

45、 3.6 V 9, 10,11 3.0 ns 2.7 V 3.0 Setup time, data before mLE tsuCL= 50 pF minimum RL= 500 See figure 5 3.0 V and 3.6 V 9, 10,11 1.3 ns 2.7 V 0.6 Hold time, data after mLE thCL= 50 pF minimum RL= 500 See figure 5 3.0 V and 3.6 V 9, 10,11 1.0 ns 2.7 V 1.1 See footnotes at end of table. Provided by IHS

46、Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97638 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-

47、STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max Propagation delay time, mDn to mQn 3003 tPLH1 8/ CL= 50 pF minimum RL= 500 See figure 5 3.0 V and 3.6 V 9,10,11 1.8 5.0 ns 2.7 V 5.7 tPHL1 8/ 3.0 V

48、and 3.6 V 9,10,11 1.8 4.4 2.7 V 4.8 Propagation delay time, mLE to mQn 3003 tPLH28/ CL= 50 pF minimum RL= 500 See figure 5 3.0 V and 3.6 V 9,10,11 2.1 5.4 ns 2.7 V 6.2 tPHL28/ 3.0 V and 3.6 V 9,10,11 2.1 4.9 2.7 V 4.7 Propagation delay time, output enable, mOE to mQn 3003 tPZH8/ CL= 50 pF minimum RL= 500 See figure 5 3.0 V and 3.6 V 9,10,11 1.7 5.6 ns 2.7 V 7.0 tPZL8/ 3.0 V and 3.6 V 9,10,11 1.7 5.3 2.7 V 5.9 Propagation delay time, output disable, mOE to mQn 3003 tPHZ8/ CL= 50 pF minimum RL= 500 See figure 5 3.0 V and 3.6 V 9,10,11 2.3 6.3 ns