DLA SMD-5962-97625 REV B-2009 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 16-BIT BUS TRANSCEIVER WITH BUS HOLD AND THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change ground bounce limits jak. 00-01-19 Monica L. Poelking B Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - LTG 09-04-23 Thomas M. Hess REV SHET REV B B B SHEET 15 16 17 REV STATUS REV B B B B B B B B B B B B B B OF

2、SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby CHECKED BY Charles F. Saffle, Jr. DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY Monica L. Poelking STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL D

3、EPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 99-04-23 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER WITH BUS HOLD AND THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-97625 SHEET

4、1 OF 17 DSCC FORM 2233 APR 97 5962-E275-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97625 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOP

5、E 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available,

6、a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 97625 01 Q X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (se

7、e 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are ma

8、rked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ABTH16245 16-bit bus transceiver with bus hold and three-state outputs, TTL compatible

9、inputs. 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in a

10、ccordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F48 48 Flat pack 1.2.5 Lead finish. The

11、lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97625 DEFENSE SUPPLY CENTER COLUMBUS CO

12、LUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) (except I/O ports) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) (high or power-off state) -0.5 V dc

13、 to +5.5 V dc DC input clamp current (IIK) (VIN 0.0 V). -18 mA DC output clamp current (IOK) (VOUT 0.0 V). -50 mA DC output current (IOL) (per output) +96 mA Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . S

14、ee MIL-STD-1835 Junction temperature (TJ) +175C Maximum power dissipation (PD): 599 mW 5/ 1.4 Recommended operating conditions. 2/ 3/ 6/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT). +0.0 V dc to VCCMinimum High level input v

15、oltage (VIH) +2.0 V Maximum Low level input voltage (VIL). +0.8V Case operating temperature range (TC) -55C to +125C Maximum input transition rise or fall rate (t/V) (outputs enabled). 10 ns/V Maximum High level output current (IOH) -24 mA Maximum Low level output current (IOL). +48 mA 1/ Stresses a

16、bove the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the fu

17、ll specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output voltage ratings may be exceeded provided that the input and output clamp-current ratings are observed. 5/ Power dissipation values are derived using the formula Pd = VCCICC+ nVOLIOL, where VCCand IOLare as spe

18、cified in 1.4 above, ICCand VOLare as specified in table 1 herein, and “n“ represents the total number of outputs. 6/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICRO

19、CIRCUIT DRAWING SIZE A 5962-97625 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing

20、to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 -

21、Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/ass

22、ist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedenc

23、e. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as m

24、odified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devic

25、es and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2 Design, construction, and phys

26、ical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal

27、connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and

28、waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.2.7 Radiation exposure circuit. The radiation exposure circuit shall be as specified when available. 3.3 Electrical performance chara

29、cteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. Provided by IHSNot for ResaleNo reproduction

30、 or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97625 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups spec

31、ified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limit

32、ations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-

33、38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device cl

34、asses Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved sour

35、ce of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for dev

36、ice class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to

37、 this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device

38、class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device cla

39、ss M devices covered by this drawing shall be in microcircuit group number 126 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97625 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OH

40、IO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V Devicetype VCCGroup A subgroups Limits 3/ Unit unless otherwise specified Min Max 4.5 V 1, 2, 3

41、2.5 IOH= -3.0 mA All 5.0 V 1, 2, 3 3.0 High level output voltage 3006 VOH For all inputs affecting output under test VIN= 2.0 V or 0.8 V IOH= -24 mA All 4.5 V 1, 2, 3 2.0 V Low level output Voltage 3007 VOL For all inputs affecting output under test VIN= 2.0 V or 0.8 V IOL= 48 mA All 4.5 V 1, 2, 3 0

42、.55 V Negative input clamp voltage 3022 VIC- For input under test IIN= -18 mA All 4.5 V 1, 2, 3 -1.2 V Control inputs 1, 2, 3 +1.0 A Input current high 3010 IIH 4/ For output under test VIN= 5.5 V A or B ports All 5.5 V 1, 2, 3 +100.0Control inputs 1, 2, 3 -1.0 A Input current low 3009 IIL 4/ For ou

43、tput under test VIN= 0.0 V A or B ports All 5.5 V 1, 2, 3 -100.0VIN= 0.8 V 1, 2, 3 +100.0 A Input hold current II(hold) A or B ports VIN= 2.0 V All 4.5 V 1, 2, 3 -100.0 Three-state Power-up current IOZPU 5/ mOE = 2.0 V or 0.0 V VOUT= 0.5 V to 2.7 V All 0.0 V to 1.9 V 1, 2, 3 50.0 A Three-state Power

44、-down current IOZPD 5/ mOE = 2.0 V or 0.0 V VOUT= 0.5 V to 2.7 V All 1.9 V to 0.0 V 1, 2, 3 50.0 A Off-state leakage current IOFF For input or output under test VINor VOUT 4.5 V All other pins at 0.0 V All 0.0 V 1 100.0A High-state leakage current ICEX For output under test VOUT= 5.5 V Outputs at hi

45、gh logic state All 5.5 V 1, 2, 3 50.0 A Output current 3011 IOUT6/ VOUT= 2.5 V All 5.5 V 1, 2, 3 -50.0 -180.0mA Quiescent supply current delta, TTL input level 3005 ICC7/ For input under test VIN= 3.4 V For all other inputs VIN= VCCor GND All 5.5 V 1, 2, 3 1.5 mA See footnotes at end of table. Provi

46、ded by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97625 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continu

47、ed. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V Devicetype VCCGroup A subgroups Limits 3/ Unit unless otherwise specified Min Max Quiescent supply current , outputs high 3005 ICCHAll 5.5 V 1, 2, 3 2.0 Quiescent supply current , outputs low 3005 ICCLA

48、ll 5.5 V 1, 2, 3 32.0 Quiescent supply current , outputs disabled 3005 ICCZA or B ports For all inputs VIN= VCCor GND IOUT= 0.0 A All 5.5 V 1, 2, 3 2.0 mA Input capacitance 3012 CINControl inputs TC= +25C See 4.4.1c All 5.0 V 4 10.0 pF Input output capacitance 3012 CI/OA or B ports TC= +25C See 4.4.1c All 5.0 V 4 13.0 pF VOLP8/ All 5.0 V 4 1050 Low level ground bounce noise VOLV8/ All 5.0 V 4 -1575 VOHP8/ All 5.0 V 4 1750 High level VCCbounce noise VOHV8/ VIH= 3.0 V, VIL= 0.0 V TC= +25C See 4.4.1d See figure 4 All 5.0 V 4 -550 mV All 4.5 V 7, 8 L H Functional tests