DLA SMD-5962-97586 REV A-2007 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL BUFFERS W ACTIVE LOW ENABLED 3-STATE NON-INVERTED OUTPUTS MONOLITHIC SILICON《微型电路 数字型 双极 改进型肖.pdf

《DLA SMD-5962-97586 REV A-2007 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL BUFFERS W ACTIVE LOW ENABLED 3-STATE NON-INVERTED OUTPUTS MONOLITHIC SILICON《微型电路 数字型 双极 改进型肖.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-97586 REV A-2007 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL BUFFERS W ACTIVE LOW ENABLED 3-STATE NON-INVERTED OUTPUTS MONOLITHIC SILICON《微型电路 数字型 双极 改进型肖.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements. Editorial changes throughout. - gap 07-01-04 Joseph D. Rodenbeck REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Larry E. Shaw D

2、EFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Tuan D. Nguyen COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond L. Monnin MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, OCTAL BUFFERS W/ACTIVE AND

3、AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 97-04-30 LOW ENABLED 3-STATE NON-INVERTED OUTPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-97586 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E084-07 Provided by IHSNot for ResaleNo reproduction or networking pe

4、rmitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97586 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (d

5、evice classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as s

6、hown in the following example: 5962 - 97586 01 Q R X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices

7、 meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s).

8、The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54F244 Octal buffers w/active low enabled 3-state non-inverted outputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as

9、follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case

10、outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line package S GDFP2-F20 or CDFP3-F20 20 Flat package 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as sp

11、ecified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97586 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3

12、990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) . -0.5 V dc to 7.0 V dc Input voltage range (VI) 2/ -1.2 V dc to 7.0 V dc Input current range -30 mA to 5 mA Voltage range applied to any output in the disabled or power-off state . -0.5 V

13、to 5.5 V Voltage range applied to any output in the high state -0.5 V to VCC Current into any output in the low state . 96 mA Operating free-air temperature range (TA) . -55C to +125C Maximum power dissipation (PD) . 71.5 mW Storage temperature range . -65C to +150C Thermal resistance, junction-to-c

14、ase (JC) See MIL-STD-1835 Junction temperature (TJ) . 175C 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) . +2.0 V Maximum low level input voltage (VIL) . +0.8 V Input clamp current (IIK) . -18mA Maximum high level outpu

15、t current (IOH) -12 mA Maximum low level output current (IOL) +48 mA Operating free-air temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the exte

16、nt specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method

17、 Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dl

18、a.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing tak

19、es precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and a

20、ffect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97586 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requir

21、ements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described here

22、in. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-P

23、RF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth ta

24、ble shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and timing waveforms. The test circuit and timing waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics and postirradiation parameter

25、limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgr

26、oups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to sp

27、ace limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with

28、 MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For

29、device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an appr

30、oved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein o

31、r for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits del

32、ivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. Fo

33、r device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. D

34、evice class M devices covered by this drawing shall be in microcircuit group number 9 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97586 DEFENSE SUPPLY CENTER COLUMBUS COLU

35、MBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C Group A subgroups Limits Unit unless otherwise specified Min Max High level output voltage VOHVCC= 4.5 V 2/ IOH= -3 mA 1, 2, 3 2.4 V VCC= 4.5

36、V 2/ IOH= -12 mA2 Low level output voltage VOLVCC= 4.5 V 2/ IOL= 48 mA 1, 2, 3 0.55 V Input clamp voltage VIKVCC= 4.5 V II= -18 mA 1, 2, 3 -1.2 V High level input current IIHVCC= 5.5 V VI= 2.7 V 1, 2, 3 20 A Low level input current IILVCC= 5.5 V OE 1, 2, 3 -1 mA VI= 0.5 V Any A -1.6 Input current II

37、VCC= 5.5 V VI= 7 V 1, 2, 3 0.1 mA Short circuit output current IOSVCC= 5.5 V 3/ VO= 0 V 1, 2, 3 -100 -225 mA Supply current ICCHOutputs high60 mA ICCLVCC= 5.5 V Outputs low 1, 2, 3 90 ICCZOutputs disabled 90 Off-state output leakage current IOZHVCC= 5.5 V VO= 2.7 V 1, 2, 3 50 A IOZLVCC= 5.5 V VO= 0.

38、5 V 1, 2, 3 -50 A Functional tests See 4.4.1b, VCC= 4.5 V, 5.5 V 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97586 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3

39、990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TC +125C Group A subgroups Limits Unit unless otherwise specified Min Max Propagation delay time, low- to-high level output, tPLH4/ 5/ 9 2.5 5.2 ns from any

40、A to Y 10, 11 2.0 6.5 Propagation delay time, high- to-low level output, tPHL9 2.5 5.2 ns from any A to Y 10, 11 2.0 7.0 Output enable time, high tPZH9 2.0 5.7 ns level output, OE to Y 10, 11 2.0 7.0 Output enable time, low level tPZL9 2.0 7.0 ns output, OE to Y 10, 11 2.0 8.5 Output disable time, h

41、igh tPHZ9 2.0 6.0 ns level output, OE to Y 10, 11 2.0 7.0 Output disable time, low tPLZ9 2.0 6.0 ns level output, OE to Y 10, 11 2.0 7.5 1/ Unused inputs that do not directly control the pin under test must be put at +2.5 V or - 0.4 V. No unused inputs shall exceed 5.5 V or go less than 0.0 V. No in

42、puts shall be floated. 2/ All outputs must be tested. In the case where only one input at VILmaximum or VIHminimum produces the proper state, the test must be performed with each input being selected as the VILmaximum or VIHminimum input. 3/ The output conditions have been chosen to produce a curren

43、t that closely approximates one half of the true short circuit output current, IOS. Not more than one output will be tested at one time and duration of the test condition shall not exceed one second. 4/ For group A subgroup 9, VCC= 5 V, CL= 50 pF, and RL= 500 . 5/ For group A subgroups 10, 11, VCC=

44、4.5 V to 5.5 V, CL= 50 pF, and RL= 500 . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97586 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outl

45、inesR, S, and 2 Terminal number Terminal symbol 1 1 OE 2 1A1 3 2Y4 4 1A2 5 2Y3 6 1A3 7 2Y2 8 1A4 9 2Y1 10 GND 11 2A1 12 1Y4 13 2A2 14 1Y3 15 2A3 16 1Y2 17 2A4 18 1Y1 19 2 OE 20 VCCFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fro

46、m IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97586 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 (each buffer) Inputs Output OE A Y L H H L L L H X Z H = High level voltage L = Low level voltage X = Irrelevant FIGURE 2. Truth table. FI

47、GURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97586 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 See notes on next sheet. FI

48、GURE 4. Test circuit and timing waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97586 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 NOTES: 1. CLincludes probe and jig capacitance. 2. All input pulses are supplied by generators having the following characteristics: PRR 1 MHz, tr= tf 2.5 ns, duty cycle = 50%. 3. When measuring prop