DLA SMD-5962-96820 REV C-2009 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS QUADRUPLE 2-INPUT POSITIVE AND GATE MONOLITHIC SILICON.pdf

《DLA SMD-5962-96820 REV C-2009 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS QUADRUPLE 2-INPUT POSITIVE AND GATE MONOLITHIC SILICON.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-96820 REV C-2009 MICROCIRCUIT DIGITAL ADVANCED HIGH SPEED CMOS QUADRUPLE 2-INPUT POSITIVE AND GATE MONOLITHIC SILICON.pdf（17页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change ground bounce limits. Editorial changes throughout jak. 99-08-21 Monica L. Poelking B Change ground bounce limits. Corrections made to 1.4. Editorial changes throughout jak. 99-09-24 Monica L. Poelking C Update boilerplate paragraphs to th

2、e current MIL-PRF-38535 requirements. - LTG 09-05-01 Thomas M. Hess REV SHET REV C C SHET 15 16 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby CHECKED BY Thanh V. Nguyen DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43

3、218-3990 http:/www.dscc.dla.mil APPROVED BY Monica L. Poelking STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 96-07-09 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, QUADRUPLE 2-INPUT POSITIVE AND G

4、ATE, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-96820 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E268-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96820 DEFENSE SUPPLY CENTER

5、 COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes

6、 are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 96820 01 Q C A Federal stock class designator RHA designator (see 1.2

7、.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device cla

8、ss M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01

9、 54AHC08 Quadruple 2-input positive-AND gate 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non

10、-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDFP1-T14

11、 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction

12、 or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96820 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC in

13、put voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to VCC + 0.5 V dc DC input clamp current (IIK) (VINVCC) 20 mA Continuous output current (IOUT) (VOUT= 0.0 V to VCC) 20 mA Continuous output current (VCCor GND) . 50 mA Storage temperature range (TSTG) . -65C

14、 to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +150C Maximum power dissipation at TA= +55C (in still air) (PD): 500 mW 5/ 1.4 Recommended operating conditions. 2/ 3/ 6/ Supply voltage range (VCC) +2.0 V

15、 dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT). +0.0 V dc to VCCMinimum high level input voltage (VIH): VCC= 2.0 V +1.5 V VCC= 3.0 V +2.1 V VCC= 5.0 V 0.5 V . +3.85 V Minimum low level input voltage (VIL): VCC= 2.0 V +0.5 V VCC= 3.0 V +0.9 V VCC= 5.0 V 0.5 V .

16、 +1.65 V Minimum high level output current (IOH): VCC= 2.0 V -50 A VCC= 3.3 V 0.3 V . -4.0 mA VCC= 5.0 V 0.5 V . -8.0 mA Minimum low level output current (IOL): VCC= 2.0 V +50 A VCC= 3.3 V 0.3 V . +4.0 mA VCC= 5.0 V 0.5 V . +8.0 mA Maximum input rise or fall rate (t/V): VCC= 3.3 V 0.3 V . 100 ns/V V

17、CC= 5.0 V 0.5 V . 20 ns/V Case operating temperature range (TC) -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are r

18、eferenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output voltage ratings may be exceeded provided that the input and output clamp-current ratings are observed. 5/ Unused input

19、s must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96820 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234

20、 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or c

21、ontract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HA

22、NDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 1

23、9111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3.

24、 REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit,

25、or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions s

26、hall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figur

27、e 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching wavefor

28、ms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.2.7 Radiation exposure circuit. The radiation exposure circuit shall be as specified when available. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise sp

29、ecified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II.

30、 The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96820 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FOR

31、M 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ o

32、n the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certific

33、ation mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a

34、QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of

35、compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herei

36、n. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For de

37、vice class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the op

38、tion to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group

39、number 36 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96820 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I.

40、 Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V VCCGroup A subgroups Limits 3/ Unit unless otherwise specified Min Max 2.0 V 1.90 3.0 V 2.90 IOH= -50.0 A 4.5 V 1, 2, 3 4.40 1 2.58 IOH= -4.0 mA 3.0 V 2, 3 2.48 1 3.

41、94 High level output voltage 3006 VOH For all inputs affecting output under test VIN= VIHor VIL For all other inputs VIN= VCCor GND IOH= -8.0 mA 4.5 V 2, 3 3.80 V 2.0 V 0.10 3.0 V 0.10 IOL= 50.0 A 4.5 V 1, 2, 3 0.10 1 0.36 IOL= 4.0 mA 3.0 V 2, 3 0.50 1 0.36 Low level output voltage 3007 VOL For all

42、inputs affecting output under test VIN= VIHor VIL For all other inputs VIN= VCCor GND IOL= 8.0 mA 4.5 V 2, 3 0.50 V 1 +0.1 A Input current high 3010 IIHFor output under test VIN= VCC For all other inputs VIN= VCCor GND 5.5 V 2, 3 +1.0 1 -0.1 A Input current low 3009 IILFor output under test VIN= VCC

43、 For all other inputs VIN= VCCor GND 5.5 V 2, 3 -1.0 1 2.0 Quiescent supply current 3005 ICCFor all inputs VIN= VCCor GND IOUT= 0.0 A 5.5 V 2, 3 20.0 A Input capacitance 3012 CINTC= +25C, VIN= VCCor GND See 4.4.1c 5.0 V 4 10.0 pF Power dissipation capacitance CPD4/ CL= 50 pF minimum f = 1 MHz, See 4

44、.4.1c 5.0 V 4 18.0 pF See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96820 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR

45、97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V VCCGroup A subgroups Limits 3/ Unit unless otherwise specified Min Max VOLP5/ 5.0 V 4 900 Low level ground bounce noise VOLV5/ 5.0 V 4 -950 VOHP

46、5/ 5.0 V 4 450 High level VCCbounce noise VOHV5/ VIH= VCC, VIL= 0.0 V TC= +25C See 4.4.1d See figure 4 5.0 V 4 -650 mV 2.0 V 3.0 V Functional test 3014 6/ VIN= VIHor VILVerify output VOUTSee 4.4.1b 5.5 V 7, 8 L H 9 8.8 3.0 V and 3.6 V 10, 11 1.0 10.5 9 5.9 CL= 15 pF minimum See figure 5 8/ 4.5 V and

47、 5.5 V 10, 11 1.0 7.0 9 12.3 3.0 V and 3.6 V 10, 11 1.0 14.0 9 7.9 Propagation delay time, mAn to mBn or mBn to mAn 3003 tPLH7/ CL= 50 pF minimum See figure 5 4.5 V and 5.5 V 10, 11 1.0 9.0 ns 9 8.8 3.0 V and 3.6 V 10, 11 1.0 10.5 9 5.9 CL= 15 pF minimum See figure 5 8/ 4.5 V and 5.5 V 10, 11 1.0 7.

48、0 9 12.3 3.0 V and 3.6 V 10, 11 1.0 14.0 9 7.9 tPHL7/ CL= 50 pF minimum See figure 5 4.5 V and 5.5 V 10, 11 1.0 9.0 ns See footnotes on next sheet. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96820 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. 1/ For tests not listed in the referenced MIL-STD-883 (e.g. ICC), utilize