DLA SMD-5962-96811 REV B-2009 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 3 3-VOLT SCAN TEST DEVICE WITH 18- BIT UNIVERSAL BUS TRANSCEIVER WITH BUS HOLD THREE-STATE OUTPUTS TTL COMP.pdf

《DLA SMD-5962-96811 REV B-2009 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 3 3-VOLT SCAN TEST DEVICE WITH 18- BIT UNIVERSAL BUS TRANSCEIVER WITH BUS HOLD THREE-STATE OUTPUTS TTL COMP.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-96811 REV B-2009 MICROCIRCUIT DIGITAL ADVANCED BIPOLAR CMOS 3 3-VOLT SCAN TEST DEVICE WITH 18- BIT UNIVERSAL BUS TRANSCEIVER WITH BUS HOLD THREE-STATE OUTPUTS TTL COMP.pdf（31页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change the device name to reflect the Bus Hold feature, and adjust limits to characterize the performance of the optimized die. Editorial changes throughout. - CFS 99-03-12 Monica L. Poelking B Update boilerplate paragraphs to the current MIL-PRF

2、-38535 requirements. - LTG 09-05-01 Thomas M. Hess REV SHET REV B B B B B B B B B B B B B B B B SHEET 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby CHECKED BY Thanh V. N

3、guyen DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY Monica L. Poelking STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 96-02-01 MICROCIRCUIT, DIGITAL, ADVA

4、NCED BIPOLAR CMOS, 3.3-VOLT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, WITH BUS HOLD, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-96811 SHEET 1 OF 30 DSCC FORM 2233 APR 97 5962-E267-09 Provided by IHSNot for Resale

5、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96811 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels c

6、onsisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in th

7、e PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 96811 01 Q X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device cla

8、sses Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA

9、 device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54LVTH18502A 3.3-volt scan test device with 18-bit universal bus transceiver, with bus hold, three-state outputs, TTL compatible inputs 1.2.3 Device class design

10、ator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, app

11、endix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See Figure 1 68 Ceramic quad flat pack 1.2.5 Lead finish. The lead finish is as

12、 specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96811 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 4321

13、8-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +4.6 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to +7.0 V dc 4/ DC output current (IOL) (per output) +96 mA

14、 DC output current (IOH) (per output) . +48 mA 5/ DC input clamp current (IIK) (VINVCC. 6/ Power dissipation values are derived using the formula PD= VCCICC+ nVOLIOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified in table I herein, and n represents the total number of out

15、puts. 7/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96811 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B S

16、HEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in

17、the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEP

18、ARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4

19、D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption

20、has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not a

21、ffect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and

22、physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connection

23、s shall be as specified on figure 2. 3.2.3 Truth table. The truth table shall be as specified on figure 3. 3.2.4 Logic diagram. The block or logic diagram shall be as specified on figure 4. 3.2.5 Test access port controller and scan test registers. The test access port (TAP) controller and scan regi

24、sters shall be as specified on figure 5. 3.2.6 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 6. 3.2.7 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 7. 3.2.8 Radia

25、tion exposure circuit. The radiation exposure circuit shall be as specified when available. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96811 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVIS

26、ION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case

27、 operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manu

28、facturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for devic

29、e classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance m

30、ark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For

31、 device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affi

32、rm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MI

33、L-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to th

34、is drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shal

35、l be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permit

36、ted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96811 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C

37、 TC +125C +2.7 V VCC +3.6 V unless otherwise specified Devicetype VCCGroup A subgroups Limits 3/ Unit Min Max Negative input clamp voltage 3022 VIKFor input under test, IIN= -18 mA All 2.7 V 1,2,3 -1.2 V VOH1For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -100 A All 2.7 V and 3.

38、6 V 1,2,3 VCC-0.2 V VOH2For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -3 mA All 2.7 V 1,2,3 2.4 VOH3For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -8 mA All 3.0 V 1,2,3 2.4 High level output voltage 3006 VOH4For all inputs affecting output under test, VIN

39、= 2.0 V or 0.8 V IOH= -24 mA All 3.0 V 1,2,3 2.0 VOL1For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= 100 A All 2.7 V 1,2,3 0.2 V VOL2For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= 24 mA All 2.7 V 1,2,3 0.5 VOL3For all inputs affecting output under test, VIN

40、= 2.0 V or 0.8 V IOL= 16 mA All 3.0 V 1,2,3 0.4 VOL4For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= 32 mA All 3.0 V 1,2,3 0.5 Low level output voltage 3007 VOL5For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= 48 mA All 3.0 V 1,2,3 0.55 mOEAB,mOEBA, TDI, TMS A

41、ll 3.6 V 1,2,3 5.0 A mAn or mBn ports 3.6 V 20.0 For input under test, VIN= 5.5 V mCLKAB, mCLKBA mLEAB, mLEBA, TCK 0.0 V and 3.6 V 10.0 For input under test, VIN= VCCmCLKAB, mCLKBA mLEAB, mLEBA, TCK 3.6 V 1,2,3 +1.0 Input current high 3010 IIH4/ mAn or mBn ports 3.6 V 1,2,3 +1.0 See footnotes at end

42、 of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96811 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance charact

43、eristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max mOEAB, mOEBA, TDI, TMS 3.6 V-100.0mAn or mBn ports 3.6 V-5.0 Input current low 3009 IIL4/ For input u

44、nder test VIN= GND mCLKAB, mCLKBA, mLEAB, mLEBA, TCK All 3.6 V1,2,3 -1.0 A VIN= 0.8 V 75.0 500.0 Input bus hold current IHOLD4/ A or B ports VIN= 2.0 V All 3.0 V1,2,3 -75.0 -500.0 A Three-state output leakage current high 3021 IOZH5/ 6/ VOUT= 3.0 V All 3.6 V1,2,3 1.0 A Three-state output leakage cur

45、rent low 3020 IOZL5/ 6/ VOUT= 0.5 V All 3.6 V1,2,3 -1.0 A Three-state output current, power-up IOZPU5/ 6/ VOUT= 0.5 V to 3.0 V All 0.0 V to 1.5 V1,2,3 50.0 A Three-state output current, power-down IOZPD5/ 6/ VOUT= 0.5 V to 3.0 V All 1.5 V to 0.0 V1,2,3 50.0 A Outputs high 3.0 Outputs low 30.0 Quiesc

46、ent supply current 3005 ICCFor all inputs VIN= VCCor GND IOUT= 0.0 A Outputs disabled All 3.6 V1,2,3 3.0 mA Quiescent supply current delta, TTL input levels 3005 ICC7/ For input under test VIN= VCC - 0.6 V For all other inputs VIN= VCCor GND All 3.0 V and 3.6 V1,2,3 0.5 mA Low level ground bounce no

47、ise VOLP8/ All 3.0 V4 650 mV Low level ground bounce noise VOLV8/ All 3.0 V4 -900 High level VCCbounce noise VOHP8/ All 3.0 V4 1350 High level VCCbounce noise VOHV8/ VIH= 2.7 V, VIL= 0.0 V TA= +25C See figure 6 See 4.4.1d All 3.0 V4 -1450 See footnotes at end of table. Provided by IHSNot for ResaleN

48、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96811 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ UnitMin Max Input capacitance 3012 CINTC= +25C, See 4.4.1c VIN= 3.0 V or 0.0 V All 3.0 V 4 11.0 pF I/O capacitance CI/OTC