DLA SMD-5962-94773-1995 MICROCICUIT DIGITAL 9-BIT TTL BTL ADDRESS DATA TRANSCEIVER MONOLITHIC SILICON《9-BIT晶体管数据收发器硅单片电路线型微电路》.pdf

《DLA SMD-5962-94773-1995 MICROCICUIT DIGITAL 9-BIT TTL BTL ADDRESS DATA TRANSCEIVER MONOLITHIC SILICON《9-BIT晶体管数据收发器硅单片电路线型微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-94773-1995 MICROCICUIT DIGITAL 9-BIT TTL BTL ADDRESS DATA TRANSCEIVER MONOLITHIC SILICON《9-BIT晶体管数据收发器硅单片电路线型微电路》.pdf（20页珍藏版）》请在麦多课文档分享上搜索。

1、. LTR SMD-5962-94773 = 9999996 0071456 5T7 DESCRIPTION DATE (YR-MO-DA) APPROVED REV i SI ON S I 1 I DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC NIA MICROCIRCUIT, DIGITAL,g-BIT TTL/BTL ADDRESS/DATA TRANSCEIVER, MONOLITHIC APPROVED BY . S

2、ILICON DRAWING APPROVAL DATE 95-01-26 SIZE CAGE CODE 5962-94773 A 67268 REVISION LEVEL PREPARED BY PMIC N/A I Thomas M. Hess 1 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 CHECKED BY STANDARD MICROCIRCUIT Thomas M. Hess 1 DF 19 1 I SHEET JUL 94 OISTRIBUTION STATEMENT A. Approved for public r

3、elease; distribution is unlimited. 5962-E096-95 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5qb2-94773 m 999999b 0071457 433 m 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part number documentation system (see 6.6 herein)

4、. TWO product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PI#). available, a choice of Radiation Hardness

5、Assurance (RHA) levels are reflected in the PIN. Device class M microcircuits represent non-JAN class i3 microcircuits in accordance with 1 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STO-883 in conjunction with conpliant non-JAN devices”. When 1.2 fi. The PIN shall be as shown in the follo

6、wing example: - T X - I I L 5962 94773 O1 9 I I I I I I I I I Lead Case Dev i ce Devi ce 11 Federa 1 RHA stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) LA (see 1.2.3) I Drawing number 1.2.1 RHA desianator. Device class M RHA mar

7、ked devices shall meet the MIL-1-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. non-RHA devi ce. Device classes Q and V RHA marked devices shall nieet the A dash

8、(-) indicates a 1.2.2 Device tmels). The device type(s) shall identify the circuit function as follows: Device t.we Gener i c number Circuit function o1 54F82031 9-bi t TTL/BTL addreddata transceivers 1.2.3 Device class desiqnator. The device class designator shall be a single letter identifying the

9、 product assurance level as fol lows: Device class Device reauirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STO-883 Q or V Certification and qualification to MIL-1-38535 1.2.4 Case outline(s1. The case outline

10、(s) shall be as designated in MIL-STD-1835 and as follows: Outiine letter Descriptive desiqnator Terminals Packaae style X GDFPl-F48 48 Flat pack 1.2.5 Lead finish. The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-1-38535 for classes Q and V. designation is fo

11、r use in specifications when lead finishes A, B. and C are considered acceptable and interchangeable without preference. Finish letter “X” shall not be marked on the microcircuit or its packaging. The “X” STANDARD 5962-94773 MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 P

12、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-94773 7777976 0073458 37T I 1.3 Absolute maximum ratinqs. J 21 A/ 1 REVISION LEVEL Supply voltage range (V c) DC input voltage range except B port) (viN) DC input voltage range (B port) (V . DC

13、output voltage range (B port) (ioUT) in the disabted or power-off state . DC output voltage range (VouT) in the high state OC input current range (except B port) DC output current (IoL) (per output): A port DC output current (IOL) (per output): 6 port Storage temperature range (T ) Lead temperature

14、(soldering,% seconds) Thermal resistance, junction-to-case (OJc) . Junction temperature (TJ) . Maximum power dissipation (PD) at TA = 25C (in still air): Supply voltage range (Vcc, BIAS Vc BG Vc ) LOW levei input voltage range (V j( por!) ._. Minimum high level input voltage range (V “)(except B por

15、t) 1.4 Recomnded operatinq conditions. 2/ 3/ 61 Maximum low level input voltage bI ) Lexcept 6 port) . High level input voltage range (VIH (B port) ._. . Maximum high level output current (Io ) (1 port) Maximum low level output current (IoL! (4 port) Maximum low level output current (IoL) (B port) I

16、nput clamp current ( IIK) . Ambient operating temperature (TA) . SHEET 3 -0.5 V dc to +7.0 V dc -1.2 V dc to +3.5 V dc i/ -1.2 V dc to t7.0 V dc A/ -0.5 V dC to t5.5 V dC -0.5 V dc to Vcc -40 mA to 5 rrd +48 mA +200 m4 -65C to +150C +300“C See MIL -STD- 1835 t175“C 1.5 U 21 i/ t4.5 V dc to t5.5 V dc

17、 t0.75 V dc to t1.47 V dc t0.8 V dc +1.62 V dc to 2.3 V dc t2.0 V dc -3 rrd +24 m4 +loo m4 -18 mA -55C to +125OC 1.5 Diqital loqic testing for device classes Q and V. Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . XX percent L/ L/ - 21 3/ 4/ 3 - 6/ L/ Stres

18、ses above the absolute maximum rating may cause permanent damage to the device. maximum levels may degrade performance and affect reliability. Unless otherwise noted, all voltages are referenced to GND. The limits for the parameters specified herein shall apply over the full specified Vcc range and

19、ambient temperature range of -55C to t125OC. The input negative voltage rating may be exceeded provided that the input clamp current rating is observed. Power dissipation values are derived using the formula P - Vc 1 specified in 1.4 above, Icc and VOL are as specified in Fable kerein, an n represen

20、 s the otal number Of outputs. Unused or floating pins (input or I/O) must be held high or low. Values will be added when they become available, Extended operation at the + nVoLIgL, where VCF and IpL are as STBARD MICROCIRCUIT DRAUING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I SIZE 1 A 5

21、962-94773 DESC FORM 193A JUL 94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-94773 = 9999996 0071459 206 i 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards. bulletin, and handbook. Unless otherwise specified, the fOllOWing

22、specification, standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent Specified herein. SPECIF I CATION Ml L ITARY MIL-1-38535 - Integrated Circuit

23、s, Manufacturing, General Specification for. STWARDS MILITARY MIL-STO-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MfL-STD-1835 - Microcircuit Case Outlines. BULLETIN MILITARY MIL-BUL-103 - List of Standardized Military Drawings (SMDs). HANDBOOK MIL

24、ITARY MIL-HDBK-780 - Standardized Mi 1 itary Drawings. (Copies of the specification, standards, bulletin, and handbook required by manufacturers in connection wtth specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity . ) 2.2 Non G

25、overnment publications. The following document(s) for a part of this document to the extent specified herein. Unless otherwise specified, the issues of the documents which are DOO adopted are those listed in the isSue of the DODISS cited in the solicitation. are the issues of the documents cited in

26、the solicitation. INSTITUTE OF ELECTRICAL. AND ELECTRONICS ENGINEERS (IEEE) Unless otherwise specified, the issues of documents not listed in the DDDISS IEEE Standard 1149.1 - IEEE Standard Test Access Port and Boundary Scan Architecture. (Applications for copies shouldbe addressed to the Institute

27、of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway. NJ 08854-4150.) (Non-Government standards and other pub1 ications are normally available from the organizations that prepare or distribute the documents. These documents may also be available in or through libraries or other informa

28、tional sevices.) herein, the text of this drawing shall take precedence. 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited STANDARD 5962-94773 MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 P

29、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STO-883, “Provisions for the use of MIL-STD-883 in conjunct ion with co

30、mpliant non-JAN devices“ and as specified herein. The individual item requirements for device classes Q and V shall be in accordance with MIL-1-38535, the device mnufacturers Quality Management (QM) plan, and as specif ied herein. specified in MIL-STD-883 (see 3.1 herein) for device class M and MIL-

31、1-38535 for device classes Q and V and herein. 3.2 Desiqn, construction, and physical dimensions. The design, construction, and physical dimensions shall be as 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. 3.2.3 Truth table(s). 3.2.4 Block

32、 diaqran. The block diagram shall be as specified on figure 3. 3.2.5 Radiation exposure circuit. 3.3 Electrical performance characteristics and postirradiation parameter limits. The terminal connections shall be as specified on figure 1. The truth table(s) shall be as specified on figure 2. The radi

33、ation exposure circuit shall be as specified when available. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter 1 imits are as specified in table I and shall apply over the full ambient operating temperature range. The electrical tests for eac

34、h subgroup are defined in table I. accordance with MIL-STD-883 (see 3.1 herein). MIL-BUL-103. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. Marking for device class M shall be in 3.5 Marking. The part shall be marked with the PIN lis

35、ted in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in Marking for device classes Q and V shall be in accordance with MIL-1-38535. 3.5.1 Certification/compliance mark. The compliance mark for device class M shall be a “C“ as required in MIL-STD-883 (see 3.1 herein). in

36、 MIL-1-38535. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required 3.6 Certificate of compliance, For device class M, a certificate of compiance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-BUL-103 (see 6.7.2 here

37、in). classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.1 herein). The certificate of compliance submitted to DESC-EC prior to listing as an approved source of supply for this drawing sha

38、ll affirm that the manufacturers product meets, for device class M, the requirements of MIL-STD-883 (see 3.1 herein), or for device classes Q and V, the requirements of MIL-1-38535 and the requirements here in. 3.1 herein) or for device classes Q and V in MIL-1-38535 shall be provided with each lot

39、of microcircuits delivered to this drawing. (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-STO-973. retain the option to review the manufacturers facility and applicable required documentation. shall be mde available onshore at the option of

40、the reviewer. microcircuit group number 127 (see MIL-1-38535, appendix A). For device 3.7 Certificate of conformance. A certificate of conformance as required for device class M in MIL-STD-883 (Se 3.8 Notification of chanqe for device class M. For device class M, notification to DESC-EC of change of

41、 product 3.9 Verification and review for device class M. For device class M, DESC, DESCs agent, and the acquiring activity Offshore documentation 3.10 Microcircuit qroup assiqnment for device class M. Device class M devices covered by this drawing shall be in STANDARD MICROCIRCUIT DRAWING DEFENSE EL

42、ECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE 5962-94773 A REVISION LEVEL SHEET 5 DESC FORM 193A JUL 94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE 5962-947

43、73 A REVISION LEVEL SHEET 6 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Test and test method lJ MIL-STO-883 STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 High level output voltage, A port 3006 SIZE 5962-94773

44、A REVISION LEVEL SHEET Low level output voltage, A port 3007 Low level output voitage, B port 3007 Output vol tage, B port 3007 Negative input clamp voltage, B port 3022 Negative input clamp yoltage, except B port 3022 Input current, except B port 3010 Input current high. except B port 301 O Input c

45、urrent low, Except B port 3010 Input current low, B port 3010 Output current A port Output current, Ei port 3011 Ouiput current, B port 3011 Oufput current, B port 301 1 See footnotes at end o syllbo 1 OH VOL1 VOL 2 “O O3 table. TABLE I. Electri ca 1 performance characteristics Test conditions 2/ -5

46、5C I TA I t125C +4.5 v I VtC I +5.5 v unless otherwise specified For all inputs affecting output under test For all inputs affecting IoL = 24 m4 output under test, IN IH Or IL 1 1 1: 1 IoL = 80 m4 VI (BIAS Vcc) = 4.5 V to 5.5 V TA = 25C I oo For input under test IiN = -18 mA I 4*5 For input under te

47、st 4.5 v IIN = -40 IW For input under test 5.5 v VIN = 5.5 v For input under test VIN = 2.7 V I 5-5 For input under test 5.5 v VIN = 0.5 V For input under test 5.5 v VIN = 0.75 V vo - o 5.5 v VB IV, VI (BIAS Vcc) = 4.5 V TO 5.5 V I Omo OE6 = O to 0.8 V 0.0 v to 5.5 v OEB = o to 5 v 0.0 v I 2120v DES

48、C FORM 193A JUL 94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- vo = 2.1 v 0.0 v to 5.5 v r For all inputs, lo = O SUD-5b2-74773 m b 00714b3 737 m TABLE Test and symbo 1 MIL-STO-883 test method L/ OH High level Qutput current, B port Icc1 Quiesce

49、nt supply current, A port to B port 3005 Icc2 Quiescent supp 1 y current, B port to A port 3005 current, (bfAS VCC) 3005 Quiescent supp 1 y I CIN Input capacitance 3012 Output capacitance, COUT AO port 3012 CI /o I/Q capacitance, R port per P1194.0 301 2 Functional test 61 ti Propagation delay tim, A (thru mode) 7J to 6 3003 t i L/ See footnotes at end of table. STANDARD SIZE 5962-94773 MICROC