DLA SMD-5962-94610 REV C-2006 MICROCIRCUIT HYBRID DIGITAL FLASH ERASABLE PROGRAMMABLE READ ONLY MEMORY 128K X 32-BIT《128K X 32位动画可擦除 可程序化只读存储器 数字混合微型电路》.pdf

《DLA SMD-5962-94610 REV C-2006 MICROCIRCUIT HYBRID DIGITAL FLASH ERASABLE PROGRAMMABLE READ ONLY MEMORY 128K X 32-BIT《128K X 32位动画可擦除 可程序化只读存储器 数字混合微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-94610 REV C-2006 MICROCIRCUIT HYBRID DIGITAL FLASH ERASABLE PROGRAMMABLE READ ONLY MEMORY 128K X 32-BIT《128K X 32位动画可擦除 可程序化只读存储器 数字混合微型电路》.pdf（32页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added case outlines M, N, 4, and 5. 96-10-15 K. A. Cottongim B Figure 1; For the case outlines 4 and 5 changed dimension D3 min and max from 1.030 and 1.040 inches to 1.020 and 1.060 inches. Changed dimension A min from .156 inches to .135 inches

2、. Changed dimension L min from .145 inches to .132 inches. -sld 98-07-08 K. A. Cottongim C Update drawing to the latest requirements. -sld 06-06-30 Raymond Monnin REV SHEET REV C C C C C C C C C C C C C C C C SHEET 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 REV STATUS REV C C C C C C C C C C C

3、C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil/ THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A.

4、 Cottongim MICROCIRCUIT, HYBRID, DIGITAL, FLASH, ERASABLE/PROGRAMMABLE READ ONLY MEMORY, 128K x 32-BIT AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 95-01-31 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-94610 SHEET 1 OF 30 DSCC FORM 2233 APR 97 5962-E417-06 Provided by IHS

5、Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94610 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance

6、 classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as

7、shown in the following example: 5962 - 94610 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA mar

8、ked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function Access Time 01

9、WF128K32-200HQ FLASH EPROM, 128K X 32-bit 200 ns 02 WF128K32-150HQ FLASH EPROM, 128K X 32-bit 150 ns 03 WF128K32-120HQ FLASH EPROM, 128K X 32-bit 120 ns 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are define

10、d by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended f

11、or use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspecti

12、ons with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken

13、to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level

14、is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94610 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,

15、OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style M See figure 1 68 Ceramic, single/dual cavity, quad pack, lead formed N See figure

16、 1 68 Ceramic, single cavity, quad flat pack W See figure 1 66 Hex-in-line, single cavity, with standoffs X See figure 1 66 Hex-in-line, single cavity, without standoffs Y See figure 1 66 Hex-in-line, single cavity, with standoffs Z See figure 1 66 Hex-in-line, single cavity, without standoffs 4 See

17、 figure 1 66 1.075“, hex-in-line, single cavity, with standoffs 5 See figure 1 66 1.075“, hex-in-line, single cavity, with standoffs 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) 2/ -2.0 V dc to +7.0 V dc Signal

18、 Voltage range (any pin except A9) 2/ -2.0 V dc to +7.0 V dc Power dissipation (PD) . 2.2 W Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds). +300 C Thermal resistance junction-to-case (JC): Case outlines W, X, Y, Z, 4, and 5 . 7.8C/W Case outline M . 11.3C/W Case out

19、line N 1.7C/W Data retention 10 years minimum Endurance (write/erase cycles) 10,000 cycles minimum VPPsupply voltage (with respect to ground) 3/ -2.0 V dc to +14.0 V dc 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input low voltage range (VIL) -0.5 V dc to

20、+0.8 V dc Input high voltage range (VIH) +2.0 V dc to VCC+ 0.3 V dc VPPhigh voltage (VPPH) +11.4 V dc to +12.6 V dc VPPlow voltage (VPPL) 0 V dc to 6.5 V dc Case operating temperature range (TC). -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Ex

21、tended operation at the maximum levels may degrade performance and affect reliability. 2/ Minimum DC voltage on input or I/O pins is -0.5 V dc. During voltage transitions, inputs may undershoot GND to -2.0 V dc for periods of up to 20 ns. Maximum DC voltage on output and I/O pins is VCC+ 0.5 V dc. D

22、uring voltage transitions, outputs may overshoot to VCC+ 2.0 V dc for periods up to 20 ns. 3/ Minimum DC input voltage on A9 pin is -0.5 V dc. During voltage transitions, A9 may undershoot GND to -2.0 V dc for periods up to 20 ns. Maximum DC input voltage on A9 is +13.5 V dc which may overshoot to +

23、14.0 V dc for periods up to 20 ns. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94610 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE D

24、OCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF

25、DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Stand

26、ard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-50

27、94.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIR

28、EMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (

29、QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan

30、shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in ac

31、cordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3. 3.2.4 Timing diagram(s). The timing diagram(s) shall be as specified on figure 4, 5, and 6. 3.2

32、.5 Block diagram. The block diagram shall be as specified on figure 7. 3.2.6 Output load circuit. The output load circuit shall be as specified on figure 8. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in t

33、able I and shall apply over the full specified operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94610 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEE

34、T 5 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Programming procedure. The programming procedure shall be as specified by the manufacturer and

35、 shall be available on request. 3.6 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.7 Data. In addition to the general performan

36、ce requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all paramete

37、rs manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.8 Certificate of compliance. A certificate of compliance shall be require

38、d from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.9 Certificate of conformance. A certificate of conformance as req

39、uired in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 3.10 Endurance. A reprogrammability test shall be completed as part of the vendorss reliability monitor. The reprogrammability test shall be done for the initial characterization and after any design p

40、rocess changes which may affect the reprogrammability of the device. The methods and procedures may be vendor specific, but shall guarantee the number of program/erase endurance cycles listed in section 1.3 herein over the full military temperature range. The vendors procedure shall be kept under do

41、cument control and shall be made available upon request of the acquiring of preparing activity. 3.11 Data retention. A data retention stress test shall be completed as part of the vendors reliability monitors. This test shall be done for initial characterization and after any design or process chang

42、e which may affect data retention. The methods and procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the full military temperature range. The vendors procedure shall be kept under document control and shall be made available upon request of

43、the acquiring or preparing activity. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or f

44、unction as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94610 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical p

45、erformance characteristics. Limits Test Symbol Conditions 1/ 2/ -55C TC+125C unless otherwise specified Group A subgroups Device type Min Max Unit DC parameters Supply current, static ICCSCS = VIH, OE = VIH, VCC= 5.5 V dc 1,2,3 All 1.0 mA Supply current, 32-bit mode ICC32CS = VIL, OE = VIH, VCC= 5.5

46、 V dc, f = 5 MHz 1,2,3 All 120 mA Standby current ISBCS = VIH, OE = VIH, VCC= 5.5 V dc, f = 5 MHz 1,2,3 All 6.5 mA Input leakage current ILI VIN= GND or VCC, VCC= 5.5 V dc 1,2,3 All 10 A Output leakage current ILO CS = VIH, OE = VIH, VOUT= GND or VCC, VCC= 5.5 V dc 1,2,3 All 10 A Output low voltage

47、VOLVCC= 4.5 V dc, IOL= 2.1 mA 1,2,3 All 0.45 V Output high voltage VOH VCC= 4.5 V dc, IOH= -2.5 mA 1,2,3 All 2.4 V VCCprogram current ICC2VPP= VPPH = 12.6 V 1,2,3 All 120 mA VCC erase current ICC3VPP= VPPH = 12.6 V 1,2,3 All 120 mA VPPprogram current IPP2VPP= VPPH = 12.6 V 1,2,3 All 120 mA VPP erase

48、 current IPP3VPP= VPPH = 12.6 V 1,2,3 All 120 mA VPPreadcurrent IPPRx32VPP= VPPH = 12.6 V 1,2,3 All 800 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94610 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ 2/ -55C TC+125C