DLA SMD-5962-92253 REV D-2006 MICROCIRCUIT HYBRID LINEAR SAMPLING A D CONVERTER 16-BIT RESOLUTION《16比特分辨度的取样交流 直流转变器 线性混合微型电路》.pdf

《DLA SMD-5962-92253 REV D-2006 MICROCIRCUIT HYBRID LINEAR SAMPLING A D CONVERTER 16-BIT RESOLUTION《16比特分辨度的取样交流 直流转变器 线性混合微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-92253 REV D-2006 MICROCIRCUIT HYBRID LINEAR SAMPLING A D CONVERTER 16-BIT RESOLUTION《16比特分辨度的取样交流 直流转变器 线性混合微型电路》.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R262-94. 94-08-16 Kendall A. Cottongim B Added device type 02. Redrew entire document. sld 99-07-22 Raymond Monnin C Update drawing to the current requirements of MIL-PRF-38534. 05-10-19 Raymond Monnin D Paragr

2、aph 1.3; changed Power dissipation (PD) from 740 mW to 815 mW. Table I; Changed the max limit for the positive supply current test (ICC) from 10 mA to 15 mA. Table I; Changed the max limit for the power dissipation test (PD) from 740 mW to 815 mW. sld 06-07-10 Raymond Monnin REV SHET REV SHET REV ST

3、ATUS REV D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Shelly M. Jenkins DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones APPROVED BY Kendall A. Cottongim MICROCIR

4、CUIT, HYBRID, LINEAR, SAMPLING A/D CONVERTER, 16-BIT RESOLUTION THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-12-21 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-92253 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E527-06 P

5、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92253 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five pro

6、duct assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PI

7、N shall be as shown in the following example: 5962 - 92253 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) desig

8、nator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 0

9、1 1/ MN6450T/B CH Sampling A/D converter, 16-bit resolution 02 MN6450S/B CH Sampling A/D converter, 16-bit resolution 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38

10、534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Sta

11、ndard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited tempera

12、ture range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class.

13、These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers int

14、ernal, QML certified flow. This product may have a limited temperature range. 1/ Device type 01 is no longer available, use device type 02 as a replacement. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-922

15、53 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 32 Dual-in-line 1.2.5 L

16、ead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage range (VCC). 0 V dc to +16.5 V dc Negative supply voltage range (VEE) . 0 V dc to -16.5 V dc Logic supply voltage range (VDD). -0.3 V dc to +6 V dc Analog input channels . 16.

17、5 V dc Digital input range . -0.3 V dc to +6 V dc Power dissipation (PD). 815 mW Thermal resistance, junction to case (JC). 5C/W Thermal resistance, junction to ambient (JA) 28C/W Lead temperature (soldering, 10 seconds) +300C Storage temperature range . -65C to +150C Junction temperature (TJ) +175C

18、 1.4 Recommended operating conditions. Positive supply voltage range (VCC). +11.4 V dc to +16.5 V dc Negative supply voltage range (VEE) . -11.4 V dc to -16.5 V dc Logic supply voltage range (VDD). +4.5 V dc to +5.5 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS

19、2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE S

20、PECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Micro

21、circuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ S

22、tresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

23、 SIZE A 5962-92253 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this

24、document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-385

25、34 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements a

26、s defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical d

27、imensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless ot

28、herwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests

29、for each subgroup are defined in table I. 3.5 Marking of Device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general

30、 performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of al

31、l parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall

32、be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conforma

33、nce as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) pl

34、an. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92253 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3

35、990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A Subgroups Device type Min Max Unit 0 +5 Unipolar 1,2,3 All 0 +10 V -5 +5 Input voltage range VIBipolar 1,2,3 All -10 +

36、10 V Input voltage high VIHFor all digital inputs 1,2,3 All +2.0 V Input voltage low VIL For all digital inputs 1,2,3 All +0.8 V Input current high IIHVIH= +2.4 V 1,2,3 All -10 +10 A Input current low IILVIL= +0.4 V 1,2,3 All -10 +10 A Output voltage high VOHIOH= -6 mA 2/ 1,2,3 All +3.9 V Output vol

37、tage low VOLIOL= +6 mA 2/ 1,2,3 All +0.26 V Conversion status output voltage high VOH1IOH= 40 A 1,2,3 All +2.4 V Conversion status output voltage low VOL1IOL= 1.6 mA 1,2,3 All +0.4 V Positive supply current ICCVCC= +16.5 V 1,2,3 All 15 mA Negative supply current IEEVEE= -16.5 V 1,2,3 All -31 mA Logi

38、c supply current IDDVDD= +5.5 V 1,2,3 All 25 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92253 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D S

39、HEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A Subgroups Device type Min Max Unit Power dissipation PDWorse case (all 1s or all 0s) 1,2,3 All 815 mW +14.5 V VCC +15.5 V -0.001

40、 +0.001 -15.5 V VEE -14.5 V -0.001 +0.001 Power supply rejection ratio PSSR +4.75 V VDD +5.25 V 1,2,3 All -0.001 +0.001 %FSR/%Vs 01 +9.99477 +10.0048 Unipolar 10 V 3/ V+FSMSB LSB nominal 1111 1111 1111 111* +9.99977 4 02 +9.98977 +10.0098 V 01 +4.99477 +5.00477 02 +4.98977 +5.00975 01 -5.00492 -4.99

41、492 Bipolar 10 V 3/ V+FSV-FSMSB LSB nominal 1111 1111 1111 111* +4.99977 MSB LSB nominal 0000 0000 0000 000* -4.99992 4 02 -5.0099 -4.98993 V 01 +9.98954 +10.0095 02 +9.97954 +10.0195 01 -10.0098 -9.98985 Bipolar 20 V 3/ V+FSV-FSMSB LSB nominal 1111 1111 1111 111* +9.99954 MSB LSB nominal 0000 0000

42、0000 000* -9.99985 4 02 -10.0198 -9.97985 V 01 -1.924 +2.076 Unipolar offset 10 V 3/ VUOMSB LSB nominal 0000 0000 0000 000* +0.076 4 02 -2.924 +3.076 mV 01 -2.076 +1.924 Bipolar 10 V zero 3/ VBZ1MSB LSB nominal * * * * -0.076 4 02 -3.0765 +2.9235 mV See footnotes at end of table. Provided by IHSNot

43、for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92253 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits T

44、est Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A Subgroups Device type Min Max Unit 01 -4.153 +3.847 Bipolar 20 V zero 3/ VBZ2MSB LSB nominal * * * * -0.153 4 02 -6.153 +5.847 mV 01 -2.5 +2.5 Bipolar zero drift dVBZ/dT 5,6 02 -4 +4 01 -2.5 +2.5 Unipolar offset drift dVUO/dT

45、5,6 02 -4 +4 01 -10 +10 Unipolar full scale drift dVFS/dT 5,6 02 -15 +15 01 -10 +10 Bipolar full scale drift dVFS/dT 5,6 02 -15 +15 ppmFSR/C 4,5,6 01 -0.0015 +0.0015 %FSR 4 -0.0015 +0.0015 Integral linearity error LE Offset endpoint method 1 LSB at 16 bits 4/ 5,6 02 -0.0022 +0.0022 %FSR Differential

46、 linearity Error DLE No missing codes at 16 bits 4,5,6 All -0.9 LSB Resolution RES 4,5,6 All 16 bits Reference voltage VREF5/ 4 All +4.45 +4.55 V Reference drift dVREF/dT 5,6 All -10 +10 ppm/C See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without

47、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92253 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Min Max Unit Conversion time tc9,10,11 All 17.525 s Output leakage high impedance IOZ1,2,3 All -10 +10 A 01 -98 4 02 -96 01 -96 Bipolar 10 V range, FSAMPLE= 47 kHz, fIN= 1 kHz 5,6 02 -94 01 -92 4 02 -90 01 -90 Spurious signals range SSR Bipolar 10 V