DLA SMD-5962-92240 REV A-1996 MICROCIRCUIT DIGITAL FAST CMOS OCTAL BUS TRANSCEIVER WITH NONINVERTING OPEN-DRAIN OUTPUTS TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING MONOL.pdf

《DLA SMD-5962-92240 REV A-1996 MICROCIRCUIT DIGITAL FAST CMOS OCTAL BUS TRANSCEIVER WITH NONINVERTING OPEN-DRAIN OUTPUTS TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING MONOL.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-92240 REV A-1996 MICROCIRCUIT DIGITAL FAST CMOS OCTAL BUS TRANSCEIVER WITH NONINVERTING OPEN-DRAIN OUTPUTS TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING MONOL.pdf（22页珍藏版）》请在麦多课文档分享上搜索。

1、 SMD-5962-92240 REV A 99%999b 0089423 287 U DEFENSE LOGISTICS AGENCY DEFENSE SUPPLY CENTER, COLUMBUS 3990 EAST BROAD STREET COLUMBUS, OH 43216-5000 IN REPLY REFERTO: DSCC-VAC (Mr. Miesse/(614) 692-0543 (DSN 850) SEP 2 6 1996 SUBJECT: Notice of Revision (NOR) 5962421 1-96 for Standard Microcircuit Dr

2、awing (SMD) 5962-92240 Military/Industry Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD-100 SMD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. After completion, the NOR shoul

3、d be attached to the subject SMD for future reference. Those companies who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DSCC a certificate of compliance. This is evidenced by an existing active current c

4、ertificate of compliance on file at DSCC with a DSCC record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DSCC is otherwise notified. If you have comments or questions, please contact Mr. Bernard Miesse at (614) 692-054

5、3 (DSN 850). 1 Encl MONICA L. POELKIN add l1A1l. Revisions description colm; add IlChanges in accordance with NOR 5962-R211-9611. Revisions date colum; add 1196-09-0611. Revision level block; add alAns. Rev status of sheets; for sheets 1 and 8, add IlAli. Table 1, low level ground bounce noise, VOL,

6、 change maximun Limit from 11-140011 to 11-1600m1. Revision level block; add I1A1I. Sheet 8: c. TYPED NAME (First, Middle Initial, Last) i. TITLE Chief, Custom Microelectronics I I(2) Revised document must be received before manufacturer may incorporate this change. e. SIGNATURE Monica L. Poelking 1

7、5a. ACTIVITY ACCOMPLISHING REVISION DSCC-VAC I Monica L. Poelking b. REVISION COMPLETED (Signature) DSCC-VAC I Bernard J. Miesse I I ID Form 1695, APR 92 Previous editions are obsolete. f. DATE SIGNED (YYMMDD) 96-09-06 c. DATE SIGNED (YYMMDD) 96-09-06 Provided by IHSNot for ResaleNo reproduction or

8、networking permitted without license from IHS-,-,-. DESCRIPTION DATE (YR-MO-DA) - LTR c-4 -I.*- SMD-5962-92240 D 9999996 0057843 TT4 m APPROV t.;D SIZE ICACE CODE A 67268 =+-l-dT SHEET 5962-92240 REV STATUS OF SHEETS PMIC NIA STANDARDIZED MILITARY DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEP

9、ARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A PREPARED BY Joseph A. Kerby CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking DRAWING APPROVAL DATE 94-03-08 REVISIONLEVEL DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL BUS TRANSCEIVER

10、WITH NON- INVERTING OPEN-DRAIN OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON SHEET 1 OF 19 - )ESC FORM 193 JUL 91 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. 5962-E215-93 Provided by IHSNot for ResaleNo reproduction or netwo

11、rking permitted without license from IHS-,-,-5q62-92240 W 9999996 0059844 930 w 7 1. SCOPE 1.1 Scopc. This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). TWO product assurance classes consisting of military high reliabi lity (device classes (;I and M) and

12、 space application (Sevice class V), and a choice of case outlines and lead finishes are available and are reflected in the Fart or Identifying Number (PIN). 1-2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. available, a choice of Radiation

13、Hardness Assurance (RHAI levels are reflected in the PIN. Device class M microcircuits represent non-JAN class B microcircuits in accordance with When STANDARDIZED MIL I TARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 1.2 m. The PIN shall be as shown in the following example: SIZE

14、5962-92240 A REVISION LEVEL SHEET - 92240 _ 5962 01 I I I I 1 I M - I 1 X - R - I I I l I RHA Federal I Lead Case I Device Device stock class designator type class outline finish designator (See 1.2.1) (See 7-2-21 designator (See 1.2.4) (See 1.2.5) / (See 1.2.3) f Drawing number 1.2.1 RHA designator

15、. Device class M RHA marked devices shall meet the MIL-1-38535 appendix A specified RHA Levels and shall be marked with the appropriate RHA designator. MIL-1-38535 specifid RHA Levels and shall be marked with the appropriate RHA designator. non-RHA device. Device classes Q and V RHA marked devices s

16、hall meet the A dash (-1 indicates a 1.2.2 Device type(?.). The device type(s) shall identify the circuit function as follows: Devi ce type Generic number Circuit function o1 02 54FCT621 T Octal bus transceiver with non-inverting open-drain outputs, TTL compatible inputs and limited output voltage s

17、wing 54FCT621AT Octal bus transceiver with non-inverting open-drain outputs, TTL Compatible inputs and limited output voltage swing 1.2.3 Device class desiqnator. The device class designator shall be a single letter identifying the product assurance level as follows: Device class Device requirements

18、 documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of HIL-STD-883 Q or Y Certification and qualification to MIL-I-38535 1.2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835, and as follows: Outline le

19、tter Descriptive designator Termina 1s Package style R S 2 GDIPI-T2O or CDIP2-T2O 20 Dual-i n-line GDFP2-F2O or CDFP3420 20 Flat pack CQCCI-N20 20 Leadless-chip-carrier 1.2.5 Lead finish. The lead finish shall be as specified in MIL-CTD-883 (see 3.1 herein) for ctass M or MIL-1-38535 for classes Q a

20、nd V. designation is for use in specifications when lead finishes A, 6, and C are considered acceptable and interchangeable without preference. Finish letter “X“ shall not be marked on the microcircuit or its packaging. The “X“ DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or ne

21、tworking permitted without license from IHS-,-,-SMD-59b2-922Y = 999999b 00598Y5 877 1.3 Absoiiite maximum ratings. I/ z/ 3/ Supply voltage range (V 1 - - - - - - - - - - - - - - - - - DC input voltage range (VIN) - - - - - - - - - - - - - - - - DC output voltage range (VOUT) - - - - - - - - - - - -

22、- - - DC input clamp current III() (VIN = -0.5 V - - - - - - - - - DC output clamp current (Io1i Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified ere i n. SPECIFICATION MILITARY MIL-i-38535 - STANDARDS M I LI TARY MI L-STD-883 - MIL-STD-

23、973 - MIL-STD-1835 - BULLETIN MILITARY MIL-BUL-103 - HANDBOOK MILITARY MIL-HDBK-780 - Integrated Circuits, Manufacturing, General Specification for. Test Methods and Procedures for Microelectronics. Configuration Management. Microcircuit Case Outlines List of Standardized Military Drawings (SMDs). S

24、tandardized Military Drawings. (Copies of the specification, standards, bulletin, and handbook required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. In the eve

25、nt of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precedence. 3. REQUIREMENTS 3.1 The individual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conju

26、nction with compliant non-JAN devices“ and as specified herein. device manufacturers Quality Management (QM) plan, and as specified herein. Item requirements. The individual item requirements for device classes Q and V shalt be in accordance with MIL-1-38535, the 3.2 Design, construction, and physic

27、al dimensions. The design, construction, and physical dimensions shall be as specified in MIL-STD-883 (see 3.1 herein) for device class M and MIL-1-38535 for device classes Q and V and herein. 3.2.1 3.2.2 Terminal connections. 3.2.3 Truth table. 3.2.4 Loqic diaqram. 3.2.5 Ground bounce load circuit

28、and waveforms. Case outlines. The case outlines shatl be in accordance with 1.2.4 herein. The terminal connections shall be as specified on figure 1. The truth table shall be as specified on figure 2. The logic diagram shall be as specified on figure 3. The ground bounce toad circuit and waveforms s

29、hall be as specified on figure 4. 3.2.6 figure 5. Switching waveforms and test circuit. The Switching waveforms and test circuit shall be as specified on STANDARDIZED 5962-92240 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL ESC FORM 193A JUL 91 Provided by IHSN

30、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-92240 W 9999996 0059847 64T W STANDARDIZED SIZE MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 3.3 Ele,:rical F;erfomnce characteristics and postirradiation parameter limits. Unless ot

31、herwise specified lierein, the electrical performance characteristics and postirradiation parameter limits are as specified in tabie I and shall apply over the full case operating temperature range. and limits are as specifid in table 1. 3.4 Electrical test requirements. Test conditions for these sp

32、ecified characteristics The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3-5 Marking. The part shall be marked with the PIN listed in 1.2 herein. Marking for device class M shall be in accordance with MIL-ST

33、D-883 (see 3.1 herein). MiL-BUL-103. In addition, the manufacturers PIN may also be marked as listed in Narking for device classes Q and V shall be in accordance with MIL-1-38535. 5962-92240 REVISION LEVEL SHEET 3.5.1 Certification/compliance mark. The compliance mark for device class M shall be a “

34、C“ as required in MIL-STD-883 (see 3.1 herein). in NIL-1-38535. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required 3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from manufacturer in order to be listed as an approve

35、d source of supply in MIL-BUL-I03 (see 6.7.2 herein). classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.1 herein). listing as an approved source of supply for this drawing shall affirm t

36、hat the manufacturers product meets, for device class M the requirements of MIL-STD-883 (see 3.1 herein), or for device classes Q and V, the requirements of MIL-1-38535 and the requirements herein. For device The certificate of compliance submitted to DESC-EC prior to 3.7 Certificate of conformance.

37、 A certificate of conformance as required for device class M in MIL-STD-883 (See 3.1 herein) or for device classes Q and V in MIL-1-38535 shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DES

38、C-EC of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in HIL-STD-973. 3.9 Verification and review for device class M. For device class M, DESC, DESCs agent, and the acquiring activity Offshore documentation retain the option to re

39、view the manufacturers facility and applicable required documentation. shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 37 (see MIL-1-38535, appen

40、dix A). 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. For device class M, sampling and inspection procedures shall be in accordance with For device classes Q and V, sampling and inspection procedures shall be in accordance MIL-STD-883 (see 3.1 herein). with MIL-1-38535 and the device

41、manufacturers QM plan. 4.2 Screeninq. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. For device classes Q and V, screening shall be in accordance with MIL-1-38535, and shall be condu

42、cted on all devices prior to qualification and technology conformance inspect ion. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, 8, C or D. The test circuit shall be maintained by the manufacturer under document revision level contro

43、l and shalt be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015. (2) TA = +12SoC, minimum. b. Interim and final electrical

44、test parameters shall be as specified in table II herein. DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SID-5962-922LlO W 9999946 0059848 58b STANDARDIZED SIZE MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO

45、45444 REVISION LEVEL TABLE I. Electrical performance characteristics. 5962-92240 SHEET 6 Test and I Symbol MIL-STD-883 test 1 method I/ 1 A l output current I I OH iiiyh level 1 i (E bus) I 3007 I I I I “0L.l Low level output voltage I I I output voltage 1 (A bus) 1 3007 I I v0L2 Low level I clamp v

46、oltage I 3022 I Negative input I VIc- I I input current 1 II, high I 3010 I I input current i Low 301 O I I I I I I Test conditions -55C S TC d +125OC 4.5 v 5 vcc 5 5.5 v unless otheruise specified 2/ For all inputs affecting output under test IN f ir IL i 0.8 V or at1 other inputs V = V or GND I P5

47、.5 6C OH For akl inputs affecting output under test VIN = V or VIL “VI“ = 0.8 V = 2Ttl v Forlkll other inputs IoL - = 48 Vc mk Or per GND output For all inputs affecting output under test VIN = V or VIL :? = 0.8 V = 2JB v Forkll other inputs VIN = Vc or GND IOL - 32 mi per output For input under tes

48、t IIN = -18 mA I For input under test I VIN = v For all .%er inputs VIN = Vcc or GND 1 Except I/O 1 pins I I I I/O pins I l 1 Except I/o I pins 1 I I / pins I For input under test I VIN = GND For all other inputs VIN = VCc or GND Devi ce type AL L ALL All All All All All Ice 5.5 v 4.5 v 4.5 v 4.5 v

49、5.5 v 5.5 v Group A I I Unit subgroupsl Limits 31 I I I l I I 1 Min I Max I I l I I I 1,2,3 I I 20 , See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE 5962-92240 A REVISION LEVEL SHEET 7 TABLE I. Electrical performance characteristics - continued. Group A 1 I iu