DLA SMD-5962-92073 REV B-2006 MICROCIRCUIT HYBRID LINEAR ANALOG TO DIGITAL CONVERTER 8-BIT RESOLUTION《八比特最小识别距离 模拟到数字转换器 直线式混合微型电路》.pdf

《DLA SMD-5962-92073 REV B-2006 MICROCIRCUIT HYBRID LINEAR ANALOG TO DIGITAL CONVERTER 8-BIT RESOLUTION《八比特最小识别距离 模拟到数字转换器 直线式混合微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-92073 REV B-2006 MICROCIRCUIT HYBRID LINEAR ANALOG TO DIGITAL CONVERTER 8-BIT RESOLUTION《八比特最小识别距离 模拟到数字转换器 直线式混合微型电路》.pdf（12页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing. 06-05-04 Raymond Monnin B Table I: Start convert input current low (IIL) and clock input current low (IIL), unit column, correct A to mA (2 places). Integral linearity error (LE), max limit column, correct +0.05 LSB to +0.5 LSB. 0

2、6-05-30 Raymond Monnin REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Shelly M. Jenkins DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:

3、/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, ANALOG TO DIGITAL CONVERTER, 8-BIT RESOLUTION AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-12-21 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 6726

4、8 5962-92073 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E480-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92073 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM

5、2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hard

6、ness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 92073 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3)

7、/ Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit fun

8、ction as follows: Device type Generic number Circuit function 01 MN5100 Analog to digital converter, 8-bit resolution, 1.5 s 02 MN5101 Analog to digital converter, 8-bit resolution, 900 ns 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product as

9、surance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class

10、 available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class

11、 H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes

12、(K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer sp

13、ecified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92073 DEFE

14、NSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 24 Hybrid 1.2.5 Lead finish. T

15、he lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage range (VCC) . -0.5 V dc to +18 V dc Negative supply voltage range (VEE) +0.5 V dc to -18 V dc Logic supply voltage range (VDD) . -0.5 V dc to +7 V dc Analog input channels 25 V dc Digital

16、input range -0.5 V dc to +5.5 V dc Power dissipation (PD) . 1550 mW Thermal resistance, junction-to-case (JC) . 10C/W Thermal resistance, junction-to-ambient (JA) 40C/W Lead temperature (soldering, 10 seconds). +300C Storage temperature range -65C to +150C Junction temperature (TJ) +175C 1.4 Recomme

17、nded operating conditions. Positive supply voltage range (VCC) . +14.5 V dc to +15.5 V dc Negative supply voltage range (VEE) -14.5 V dc to -15.5 V dc Logic supply voltage range (VDD) . +4.75 V dc to +5.25 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Govern

18、ment specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATI

19、ON MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit

20、 Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order o

21、f precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the abs

22、olute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92073 D

23、EFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may

24、 include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as define

25、d in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimension

26、s shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise

27、specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each

28、 subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general perform

29、ance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parame

30、ters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be requi

31、red from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as r

32、equired in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The

33、modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circ

34、uit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the inten

35、t specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion

36、of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92073 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performan

37、ce characteristics. Limits Test Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified Group A subgroups Device type Min Max Unit Unipolar 0 0 0 0 +5 +10 -5 -10 Input voltage range VIBipolar 1,2,3 All -2.5 -5 -10 +2.5 +5 +10 V Input voltage high VIHFor all digital inputs 1,2,3 All +2.0 V I

38、nput voltage low VILFor all digital inputs 1,2,3 All +0.8 V Start convert input current high IIHVIH= +2.4 V 1,2,3 All 80 A Start convert input current low IILVIL= +0.4 V 1,2,3 All -1.6 mA Clock input current high IIHVIH= +2.4 V 1,2,3 All 40 A Clock input current low IILIOL= +0.4 V 1,2,3 All -1.6 mA

39、Conversion status output voltage high VOHIOH= 80 mA1,2,3 All +2.4 V Conversion status output voltage low VOLIOL= 3.2 mA1,2,3 All +0.4 V Positive supply current ICCVCC= +15 V 1,2,3 All 35 mA Negative supply current IEEVEE= -15 V 1,2,3 All 35 mA Logic supply current IDDVDD= +5 V 1,2,3 All 100 mA Power

40、 dissipation PDWorst case (all 1s or all 0s) 1,2,3 All 1550 mW See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92073 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REV

41、ISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified Group A subgroups Device type Min Max Unit +14.5 V dc VCC +15.5 V dc -0.75 +0.75 -15.5 V dc VEE -14.5 V dc -0.15 +0.15

42、 Power supply rejection ratio PSSR +4.75 V dc VDD +5.25 V dc 1,2,3 All -0.05 +0.05 %FSR / %VS Unipolar 10 V V+FSMSB LSB 0000 000* 4 All +9.941 +9.980 V Bipolar 10 V V+FSV-FSMSB LSB 0000 000* 1111 111* 4 All +4.941 -4.980 +4.980 -4.941 V Bipolar 20 V V+FSV-FSMSB LSB 0000 000* 1111 111* 4 All +9.883 -

43、9.961 +9.961 -9.883 V Unipolar offset 10 V VUOMSB LSB 1111 111* 4 All +0.020 +0.059 V Bipolar 10 V zero VBZ1MSB LSB * * 4 All -0.020 +0.020 V Bipolar 20 V zero VBZ2MSB LSB * * 4 All -0.039 +0.039 V Unipolar 10 V V+FSMSB LSB 0000 000* 5,6 All +9.883 +10.039 V Bipolar 10 V V+FSV-FSMSB LSB 0000 000* 11

44、11 111* 5,6 All +4.883 -5.039 +5.039 -4.883 V Bipolar 20 V V+FSV-FSMSB LSB 0000 000* 1111 111* 5,6 All +9.766 -10.078 +10.078 -9.766 V Unipolar offset 10 V VUOMSB LSB 1111 111* 5,6 All +0.039 +0.117 V Bipolar 10 V zero VBZ1MSB LSB * * 5,6 All -0.078 +0.078 V Bipolar 20 V zero VBZ2MSB LSB * * 5,6 All

45、 -0.156 +0.156 V Integral linearity error LE 4,5,6 All -0.5 +0.5 LSB See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92073 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-39

46、90 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ 2/ -55C TA +125C unless otherwise specified Group A subgroups Device type Min Max Unit Differential linearity error DLE No missing codes at 8 bits 4,5,6 All

47、 -0.9 +1.0 LSB Minimum resolution for no missing codes 8 Bits Reference voltage VREF 4,5,6 All -6.93 -5.67 V 01 1.5 s Conversion time tC 9,10,11 02 900 ns 1/ VCC= +15 V, VEE= -15 V, VDD= +5 V, unless otherwise specified. 2/ * The output will transition from a “1“ to “0“ or vice versa as the analog input passes through the voltages listed in the limit columns. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,