DLA SMD-5962-91770 REV B-2006 MICROCIRCUIT LINEAR SAMPLING A D CONVERTER 16-BIT RESOLUTION MONOLITHIC SILICON《硅单块 16比特最小识别距离 选样交直流转换器 直线式微型电路》.pdf

《DLA SMD-5962-91770 REV B-2006 MICROCIRCUIT LINEAR SAMPLING A D CONVERTER 16-BIT RESOLUTION MONOLITHIC SILICON《硅单块 16比特最小识别距离 选样交直流转换器 直线式微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-91770 REV B-2006 MICROCIRCUIT LINEAR SAMPLING A D CONVERTER 16-BIT RESOLUTION MONOLITHIC SILICON《硅单块 16比特最小识别距离 选样交直流转换器 直线式微型电路》.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added device type 02. Redrew entire document. -sld 99-07-22 Raymond Monnin B Paragraph 1.3; changed Power dissipation (PD) from 740 mW to 785 mW. Table I; changed the max limit for the positive supply current test (ICC) from 10 mA to 13 mA. Table

2、 I; changed the max limit for the power dissipation test (PD) from 740 mW to 785 mW. sld 06-07-06 Raymond Monnin REV SHET REV SHET REV STATUS REV B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Shelly M. Jenkins DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OH

3、IO 43218-3990 http:/www.dscc.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones APPROVED BY Gregory Lude THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-06-15 MICROCIRCUIT, LINEAR, SAMPLING A/D CONVERTER, 16-BIT

4、RESOLUTION, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-91770 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E526-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91770 DEFENSE SUPPLY

5、 CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in th

6、e Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 91770 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish design

7、ator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non

8、-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 1/ MN6400T/B CH Sampling A/D converter, 16-bit resolution 02 MN6400S/B CH Sampling A/D converter, 16-bit resolution 1.2.3 Device class designator. This devic

9、e class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Dev

10、ice class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing ver

11、sion of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D)

12、. E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s)

13、taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1/ Device type 01 is no longer available, use device type 02 as a replacement. Pr

14、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91770 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as de

15、signated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 28 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage range (VCC). -0.5 V dc to +18 V dc

16、 Negative supply voltage range (VEE) . +0.5 V dc to -18 V dc Logic supply voltage range (VDD). 0 V dc to +7 V dc Analog input channels . 22 V dc Digital input range . -0.3 V dc to +6 V dc Power dissipation (PD). 785 mW Thermal resistance, junction to case (JC). 5C/W Thermal resistance, junction to a

17、mbient (JA) 28C/W Lead temperature (soldering, 10 seconds) +300C Storage temperature range . -65C to +150C Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Positive supply voltage range (VCC). +14.55 V dc to +15.45 V dc Negative supply voltage range (VEE) . -14.55 V dc to -15.45

18、 V dc Logic supply voltage range (VDD). +4.75 V dc to +5.25 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent spec

19、ified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircu

20、its. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ o

21、r http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and aff

22、ect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91770 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the e

23、vent of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The indi

24、vidual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the appl

25、icable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or fun

26、ction of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure

27、1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperatu

28、re range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of Device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be mark

29、ed with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from

30、the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufa

31、cturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the

32、 manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sa

33、mpling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or network

34、ing permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91770 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TA +125C unless ot

35、herwise specified Group A subgroups Device Type Min Max Unit 0 +5 Unipolar 1,2,3 All 0 +10 V -5 +5 Input voltage range VIBipolar 1,2,3 All -10 +10 V Input voltage high VIHFor all digital inputs 1,2,3 All +2.0 V Input voltage low VIL For all digital inputs 1,2,3 All +0.8 V Input current high IIHVIH=

36、+2.4 V 1,2,3 All -10 +10 A Input current low IILVIL= +0.4 V 1,2,3 All -10 +10 A Output voltage high VOHIOH= -6 mA 1,2,3 All +3.9 V Output voltage low VOLIOL= +6 mA 1,2,3 All +0.26 V Positive supply current ICCVCC= +15 V 1,2,3 All 13 mA Negative supply current IEEVEE= -15 V 1,2,3 All -31 mA Logic sup

37、ply current IDDVDD= +5 V 1,2,3 All 25 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91770 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6

38、DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Min Max Unit Power dissipation PDWorse case (all 1s or all 0s) 1,2,3 All 785 mW +14.5 V VCC +15.5 V -0.001 +0.001

39、 -15.5 V VEE -14.5 V -0.001 +0.001 Power supply rejection ratio PSSR +4.75 V VDD +5.25 V 1,2,3 All -0.001 +0.001 %FSR/%Vs 01 +9.99477 +10.0048 Unipolar 10 V 2/ V+FSMSB LSB nominal 1111 1111 1111 111* +9.99977 4 02 +9.98977 +10.0098 V 01 +4.99477 +5.00477 02 +4.98977 +5.00975 01 -5.00492 -4.99492 Bip

40、olar 10 V 2/ V+FSV-FSMSB LSB nominal 1111 1111 1111 111* +4.99977 MSB LSB nominal 0000 0000 0000 000* -4.99992 4 02 -5.0099 -4.98993 V 01 +9.98954 +10.0095 02 +9.97954 +10.0195 01 -10.0098 -9.98985 Bipolar 20 V 2/ V+FSV-FSMSB LSB nominal 1111 1111 1111 111* +9.99954 MSB LSB nominal 0000 0000 0000 00

41、0* -9.99985 4 02 -10.0198 -9.97985 V 01 -1.924 +2.076 Unipolar offset 10 V 2/ VUOMSB LSB nominal 0000 0000 0000 000* +0.076 4 02 -2.924 +3.076 mV 01 -2.076 +1.924 Bipolar 10 V zero 2/ VBZ1MSB LSB nominal * * * * -0.076 4 02 -3.0765 +2.9235 mV See footnotes at end of table. Provided by IHSNot for Res

42、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91770 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Sym

43、bol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Min Max Unit 01 -4.153 +3.847 Bipolar 20 V zero 2/ VBZ2MSB LSB nominal * * * * -0.153 4 02 -6.153 +5.847 mV 01 -2.5 +2.5 Bipolar zero drift dVBZ/dT 5,6 02 -4 +4 01 -2.5 +2.5 Unipolar offset drift dVUO/dT 5,6 02

44、-4 +4 01 -10 +10 Unipolar full scale drift dVFS/dT 5,6 02 -15 +15 01 -10 +10 Bipolar full scale drift dVFS/dT 5,6 02 -15 +15 ppmFSR/C 4,5,6 01 -0.0015 +0.0015 %FSR 4 -0.0015 +0.0015 Integral linearity error LE offset endpoint method 1 LSB at 16 bits 5,6 02 -0.0022 +0.0022 %FSR Differential linearity

45、 error DLE No missing codes at 16 bits 4,5,6 All -0.9 LSB Resolution RES 4,5,6 All 16 bits Reference voltage VREF4 All +4.45 +4.55 V Reference drift dVREF/dT 5,6 All -10 +10 ppm/C See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from

46、 IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91770 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Grou

47、p A subgroups Device type Min Max Unit Conversion time tc9,10,11 All 16.275 s Output leakage high impedance IOZ1,2,3 All -10 +10 A 01 -98 4 02 -96 01 -96 Bipolar 10 V range, FSAMPLE= 50 kHz, fIN= 1 kHz 5,6 02 -94 01 -92 4 02 -90 01 -90 Spurious signals range SSR Bipolar 10 V range, FSAMPLE= 50 kHz, fIN= 12 kHz 5,6 02 -88 dB 01 87 4 02 85 01 84 Bipolar 10 V range, 3/ FSAMPLE= 50 kHz, fIN= 1 kHz, 0 dB 5,6 02 83 01 84 4 02 81 01 82 Signal to noise ratio SNR Bipolar 10 V range, FSAMPLE= 50 kHz, fIN= 12 kHz, 0 dB 5,6 02 79 dB See footnotes at top of next page. Provided by IHSNot for Resale