DLA SMD-5962-91577 REV C-2006 MICROCIRCUIT DIGITAL CMOS 8-BIT MICROCONTROLLER WITH A D PWM AND EPROM MONOLITHIC SILICON《硅单块 带直 交流 脉宽调制和可擦与可编程只读存储的8比特微型控制器 互补金属氧化物半导体 数字微型电路》.pdf

《DLA SMD-5962-91577 REV C-2006 MICROCIRCUIT DIGITAL CMOS 8-BIT MICROCONTROLLER WITH A D PWM AND EPROM MONOLITHIC SILICON《硅单块 带直 交流 脉宽调制和可擦与可编程只读存储的8比特微型控制器 互补金属氧化物半导体 数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-91577 REV C-2006 MICROCIRCUIT DIGITAL CMOS 8-BIT MICROCONTROLLER WITH A D PWM AND EPROM MONOLITHIC SILICON《硅单块 带直 交流 脉宽调制和可擦与可编程只读存储的8比特微型控制器 互补金属氧化物半导体 数字微型电路》.pdf（23页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Converted document to new boilerplate; corrected table I footnotes; corrected table I, analog input voltage maximum value; added footnote to clocking parameters; corrected figures 3, 6, and 7, timing diagrams; editorial changes throughout. 92-12-

2、07 M. L. Poelking B Changes in accordance with NOR 5962-R064-94. 93-12-07 Monica L. Poelking C Update boilerplate to MIL-PRF-38535 requirements. - CFS 06-06-15 Thomas M. Hess REV SHET REV C C C C C C C C SHEET 15 16 17 18 19 20 21 22 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4

3、 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED Tim H. Noh DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Tim H. Noh COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Don M. Cool MICROCIRCUIT, DIGITAL, CMOS, 8-BIT M

4、ICROCONTROLLER WITH A/D, PWM AND AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 91-09-11 EPROM, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-91577 SHEET 1 OF 22 DSCC FORM 2233 APR 97 5962-E398-06 Provided by IHSNot for ResaleNo reproduction or networking

5、permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91577 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability

6、(device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as

7、shown in the following example: 5962 - 91577 01 M X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q, and V RHA marked devic

8、es meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s)

9、. The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 87C752 CMOS, 8-bit microcontroller with A/D, PWM, 2k EPROM memory (3.5 to 12 MHz) 02 87C752-16 CMOS, 8-bit microcontroller with A/D, PWM, 2k EPROM memory (3.5 to 16 MHz) 03 87C752 CMOS, 8-bi

10、t microcontroller with A/D, PWM, 2k one time programmable EPROM memory (3.5 to 12 MHz) 04 87C752-16 CMOS, 8-bit microcontroller with A/D, PWM, 2k one time programmable EPROM memory (3.5 to 16 MHz) 1.2.3 Device class designator. The device class designator is a single letter identifying the product a

11、ssurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case out

12、line(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDIP1-T28 or CDIP2-T28 28 Dual-in-line 1/ 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q, and V or MIL-PRF-38535, a

13、ppendix A for device class M. _ 1/ For device types 01 and 02, the lid shall be transparent to permit ultraviolet light erasure. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91577 DEFENSE SUPPLY CENTER COL

14、UMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage VCCto VSSrange -0.5 V dc to +6.5 V dc Voltage (any pin) to VSSrange . -0.5 V dc to VCC+ 0.5 V dc Storage temperature range -65C to +150C Maximum power dissipation (PD) 1.0 W

15、 Lead temperature (soldering, 5 seconds). +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Maximum low level input voltage (except SDA, SCL). 0.2VCC 0.25 V dc Maximum low level input voltage (SD

16、A, SCL) 0.3VCCMinimum high level input voltage (SDA, SCL) 0.7VCCMinimum high level input voltage (except X1, RST). 0.2VCC+ 0.9 V dc Minimum high level input voltage (X1, RST) 0.7VCCCase operating temperature range (TC) . -55C to +125C Oscillator frequency . 3.5 MHz to 16 MHz 2. APPLICABLE DOCUMENTS

17、2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE S

18、PECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of S

19、tandard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 1911

20、1-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/

21、Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWIN

22、G SIZE A 5962-91577 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q, and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modi

23、fied in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices

24、and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outline

25、s shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Block diagram. The block diagram shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherw

26、ise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in tab

27、le II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the

28、manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appen

29、dix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and

30、V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply

31、 in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M,

32、 the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawin

33、g. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSC

34、C, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices

35、 covered by this drawing shall be in microcircuit group number 105 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91577 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-39

36、90 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.11 Processing EPROMs. All testing requirements and quality assurance provisions herein shall be satisfied by the manufacturer prior to delivery. 3.11.1 Erasure of EPROMs. When specified, devices shall be erased in accordance with the procedures and

37、 characteristics specified in 4.5. 3.11.2 Programmability of EPROMs. When specified, devices shall be programmed to the specified pattern using the procedures and characteristics specified in 4.6 and table III. 3.11.3 Verification of erasure of programmability of EPROMs. When specified, devices shal

38、l be verified as either programmed to the specified pattern or erased. As a minimum, verification shall consist of performing a functional test (subgroup 7) to verify that all bits are in the proper state. Any bit that does not verify to be in the proper state shall constitute a device failure, and

39、shall be removed from the lot. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91577 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical

40、 performance characteristics. See footnotes at end of table. Limits Test Symbol Conditions 1/ -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Group A subgroupsDevice types Min Max Unit Output low voltage, Ports 1, 3, 0.3, and 0.4 (PWM disabled) VOLIOL= 1.6 mA 0.45 V Output low voltage, Port

41、 0.2 VOL1IOL= 3.2 mA 0.45 V Ports 0.0 and 0.1 (I2C) - Drivers output low voltage VOL2IOL= 3.2 mA 0.45 V IOH= -60 A 2.4 IOH= -25 A 0.75VCCOutput high voltage, Ports 1, 3, 0.3 and 0.4 (PWM disabled) VOHIOH= -10 A 0.9VCCV IOH= -400 A 2.4 Output high voltage, Port 0.4 (PWM disabled) VOH1IOH= -40 A VCC=

42、4.5 V VIN= VILmax, VIHmin 0.9VCCV Logic 0 input current, ports 1, 3, 0.3, and 0.4 (PWM disabled) IILVIN= 0.45 V, VCC= 5.5 V 0 -50 A Logic 1 to 0 transition current, ports 1, 3, 0.3, and 0.4 ITLVIN= 2.0 V, VCC= 5.5 V 0 -650 A VIN= VCC0 10 Input leakage current, port 0.0, 0.1, and 0.2 ILIVIN= 0.45 V V

43、CC= 5.5 V 0 -10 A Reset pull-down resistor RRST1, 2, 3 All 25 175 k Driver, receiver combined capacitance C See 4.4.1.b 10 pF Pin capacitance CI/OSee 4.4.1.b 4 All 10 pF Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI

44、ZE A 5962-91577 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. See footnotes at end of table. Limits Test Symbol Conditions 1/ -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specifie

45、d Group A subgroupsDevice types Min Max Unit 01, 03 21 Supply current, active ICCVCC= 5.5 V, 2/ 3/ See figure 3. 02, 04 24 mA 01, 03 4 Supply current, idle ICC1VCC= 5.5 V, 3/ 4/ See figure 3. 1, 2, 3 02, 04 5 mA Power down current IPDVCC= 2 V, 5.5 V 5/ 1, 2, 3 All 50 A VPPprogram voltage VPPVCC= 4.5

46、 V, 5.5 V VSS= 0 V 12.5 13.0 V Program current IPPVPP= 13.0 V 1 All 50 mA A/D converter parameters 6/ Analog supply voltage AVCCAVCC= VCC0.2 V 7/ 4.5 5.5 V Analog input voltage AVINAVCC= 5.12 V 1, 2, 3 All AVSS 0.2 AVCC+ 0.2 V Analog input capacitance CIASee 4.4.1b 4 All 15 pF Sampling time TADS8/ 8

47、tCYs Conversion time TADS8/ 9, 10, 11 All 40tCYs Resolution R 8 bits Differential non-linearity DNL8/ 1 LSB Zero scale offset OSe1 LSB Full scale gain error Ge0.4 % Channel to channel matching MCTC9/ 1 LSB Crosstalk CT0 100 kHz 7/ 8/ 4, 5, 6 All -60 dB Provided by IHSNot for ResaleNo reproduction or

48、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91577 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. 1/ Unless otherwise specified, parameters are valid over operating temperature range. All parameters must be tested by using the worst case forcing condition unless otherwise noted. 2/ ICCis measured with all output pins disconnected; X1 driven with tCLCH, tCHCL= 5 ns, VIL=