DLA SMD-5962-90967-1991 MICROCIRCUIT LINEAR HIGH PERFORMANCE SIXTH ORDER SWITCHED CAPACITOR BUTTERWORTH LOW-PASS FILTER MONOLITHIC SILICON《硅单块 高性能第六序列开关电容器巴待沃思低通滤波器》.pdf

《DLA SMD-5962-90967-1991 MICROCIRCUIT LINEAR HIGH PERFORMANCE SIXTH ORDER SWITCHED CAPACITOR BUTTERWORTH LOW-PASS FILTER MONOLITHIC SILICON《硅单块 高性能第六序列开关电容器巴待沃思低通滤波器》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-90967-1991 MICROCIRCUIT LINEAR HIGH PERFORMANCE SIXTH ORDER SWITCHED CAPACITOR BUTTERWORTH LOW-PASS FILTER MONOLITHIC SILICON《硅单块 高性能第六序列开关电容器巴待沃思低通滤波器》.pdf（18页珍藏版）》请在麦多课文档分享上搜索。

1、I SMD-5962-909b7 59 9999996 0008573 3 I REVISIONS APPROVED LTR DESCRIPTION DATE (YR-MO-DA) REV SHEET REV SHEET 15 16 17 REV STATUS REV OF SHEETS SHEET 12 3 4 5 6 7 8 9 1011 121314 PMIC N/A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MILITARY DRAWING MICROCIRCUIT, LINEAR, HIGH PERFORMANCE SI

2、XTH ORDER SWITCHED CAPACITOR BUTTERWORTH LOW-PASS THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL 5962-90967 AMSC N/A REVISION LEVEL I 1 OF 17 SHEET ESC FORM 193 JUL 91 5962-EO25 DISTRIBUTION STATEMENT A. Approved for public release; di

3、stribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-90967 59 9999796 0008572 5 STANDARDIZED MILITARY DRAWING 1. SCOPE 1.1 Scope. This drawing forms a part of a one part - one part number documentation system (see 6.6 her

4、ein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). accordance with 1.2.1 of M

5、IL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. Device class M microcircuits represent non-JAN class B microcircuits in When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN. 1.2 m. The PIN shall be as shown

6、in the following example: SIZE 5962-90967 B 5962 - 90967 -CH- I I I I I II Federal RHA stock class designator designator (See 1.2.1) M I I I Devi ce Devi ce type c lass (See 1.2.2) designator (See 1.2.3) X - C - l I I I I Case Lead outline finish (See 1.2.4) (See 1.2.5) / / Drawing number 1.2.1 Radi

7、ation hardness assurance (RHA) designator. Device classes M, 8, and S RHA marked devices shall meet the MIL-M-38510 Specified RHA levels and shall be marked with the appropriate RHA designator. V RHA marked devices shall meet the MIL-1-38535 specified RHA levels and shall be marked with the appropri

8、ate RHA designator. A dash (-1 indicates a non-RHA device. Device classes Q and 1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function CLK/CO o1 LMF60-100 6th-order switched capacitor 1oo:l Butterworth low-pass fi Iter But

9、terworth Low-pass fi Iter 02 LMF60-50 6th-order switched capacitor 50: 1 1.2.3 Device class designator. The device class designator shall be a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requireme

10、nts for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Certificat ion and quali f i cat ion to MIL-M-38510 Certification and qualification to MIL-1-38535 i3 or S Q or V 1.2.4 Case outline(s1. For device classes M, 8, and S, case outline(s) shall meet the requirements in append

11、ix C of MIL-M-38510 and as listed below. MIL-1-38535, appendix C of MIL-M-38510, and as listed below. For device classes Q and V, case outline(s) shall meet the requirements of Outline letter Case outline C D-1 (14-lead, .785“ x .310“ x .200“), dual-in-line package 1.2.5 Lead finish. The lead finish

12、 shall be as specified in MIL-M-38510 for classes M, 8, and S or MIL-1-38535 for classes Q and V. designation is for use in specifications when lead finishes A, 8, and C are considered acceptable and interchangeable without preference. Finish letter “X“ shall not be marked on the microcircuit or its

13、 packaging. The “X“ I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 1 REVfSION LEVEL I SHEET 2 I I I ZSC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-90967 59 9997796 0008573 7 M STANDARDIZED MILITARY DRAWING DEFEN

14、SE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 1.3 Absolute maximum ratings. I/ SIZE 5962-90967 A REVISION LEVEL SHEET 3 Total supply voltage (V+ - V-) 2/ - - - - - - - Voltage at any pin - - - - - - - - - - - - - - - input current at any pin 3/ - - - - - - - - - - Package input current 1/ - - - -

15、- - - - - - - Power dissipation (P 1 - - - - - - - - - - - - Lead temperature (sofdering, 10 seconds) - - - - Thermal resistance, junction-to-case (aJc) - - - Junction temperature (TJ) - - - - - - - - - - Storage temperature range - - - - - - - - - - - Thermal resistance, junction-to-ambient (OJA)-

16、- 15 V v+ + 0.2 v, v- - 0.2 v 5 mA 20 mA 500 mW +3m0 c See MIL-M-38510, appendix C +125“C 62OCIW -65OC to +15O0C 1.4 Recommended operatinq conditions. Total supply voltage range (V+ - V-) 2/ - - - 4 V to 14 V Ambient operating temperature range (TA) - - - -55OC to +125OC 2. APPLICABLE DOCUMENTS 2.1

17、Government specifications, standards, bulletin, and handbook. Unless otherwise specified, the following specifications, standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of

18、 this drawing to the extent specified herein. SPECIFICATIONS MILITARY MIL-M-3851 O - Microcircuits, General Specification for. MIL-1-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS MILITARY MIL-STD-480 - Configuration Control-Engineering Changes, Deviations and Waive

19、rs. MIL-STD-883 - Test Methods and Procedures for Microelectronics. BULLETIN MILITARY MIL-BUL-103 - List of Standardized Military Drawings (SMDIS). HANDBOOK MILITARY MIL-HDBK-780 - Standardized Military Drawings. (Copies of the specifications, standards, bulletin, and handbook required by manufactur

20、ers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) - I/ Stresses above the absolute maximum rating may cause permanent damage to the device. operation at the maximum Levels may degrade performance and af

21、fect reliability. - 2/ All voltages are measured with respect to AGND, unless otherwise specified. - 3/ When the input voltage at any pin exceeds the power supply rails (V Vi), the The 2hNmA package input Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,

22、-,-SMD-5962-90967 59 9999996 0008534 9 W - 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precedence. 3. REQUIREMENTS 3.1 The individual item requirements for device class M shall be in accorda

23、nce with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein. The individual item requireKents for device classes B and S shall be in accordance with MIL-M-38510 and as specified herein. be included in this SMD. MIL-1-38

24、535, the device manufacturers Quality Management (QM) plan, and as specified herein. %tem requirements. For device classes i3 and S, a full electrical characterization table for each device type shall The individual item requirements for device classes Q and V shall be in accordance with 3.2 Design,

25、 construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-M-38510 for device classes M, 8, and S and MIL-1-38535 for device classes Q and V and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.

26、2.2 Terminal connections. 3.2.3 Block diagram. 3.3 Electrical performance characteristics and posti rradiation parameter limits. The terminal connections shall be as specified on figure 1. The block diagram shall be as specified on figure 2. Unless otherwise specified herein, the electrical performa

27、nce characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical te.sts for each sub

28、group are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. Marking for device class M shall be in accordance with MIL-STD-883 (see 3.1 herein). MIL-BUL-103. classes Q and V shall be in accordance with MIL-1-38535. In addition, the manufacturers PIN may als

29、o be marked as listed in biarking for device classes B and S shall be in accordance with MIL-M-38510. Marking for device 3.5.1 Certification/compliance mark. The compliance mark for device class M shall be a “C“ as required in MIL-STD-883 (see 3.1 herein). in MIL-M-38510. The certification mark for

30、device classes B and S shall be a “J“ or “JAN“ as required The certification mark for device classes Q and V shall be a “QML“ as required in MIL-1-38535. 3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an a

31、pproved source of supply in MIL-BUL-103 (see 6.7.3 herein). classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.2 herein). prior to listing as an approved source of supply for this drawing

32、 shall affirm that the manufacturers product meets, for device class I.) the requirements of MIL-STD-883 (see 3.1 herein), or for device classes Q and V, the requi rements of MIL-1-38535 and the requirements herein. For device The certificate of compliance submitted to DESC-ECS 3.7 Certificate of co

33、nformance. A certificate of conformance as required for device class M in MIL-STD-883 (see 3.1 herein) or device classes B and S in MIL-M-38510 or for device classes Q and V in MIL-1-38535 shall be provided with each lot of microcircuits delivered to this drawing. 3.8 2. For device class Pl, notific

34、ation to DESC-ECS of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-480. 3.9 Verification and review for device class M. For device class M, DESC, DESCs agent and the acquiring activity retain the option to review the ma

35、nufacturers facility and applicable required documentation. documentation shall be made available onshore at the option of the reviewer. Offshore 5962-90967 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 3SC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reprodu

36、ction or networking permitted without license from IHS-,-,-. ,. SMD-5762-90967 59 9999996 0008575 O = I SIZE A STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 Test 5962-90967 REVISION LEVEL SHEET 5 Clock frequency range Supply current DC gain Clock to cutoff freque

37、ncy ratio iymbo 1 CLK IS AVdc CLK/ f CO See footnote at end of table. TABLE I. Electrical performance characteristics. Conditions unless otherwise specified -55OC 5 TA 5 +125“C v+ = +5 v, v- = -5 v, I/ V+ = +2.5 V, V- = -2.5 V, I/ v+ = +5 v, v- = -5 v, fCLK = 500 kHz V+ = +2.5 V, V- = -2.5 V, fCLK =

38、 250 kHz vt = +5 v, v- = -5 v, f CLK = 500 kHz, R - 2 162 V+ = +2.5 V, V- = -2.5 V, fCLK = 250 kHz, R - 2 M v+ = +5 v, v- = -5 v, fCLK = 500 kHz Vt = +2.5 V, V- = -2.5 V, fCLK = 250 kHz I ;roup A IDevice subgroups 1 type I I I I I 4,5,6 I All I L AL1 I I I I I I I 1 2, 3 1 2, 3 1 I ALL 2, 3 ! I 1 I

39、I I 2, 3 I I L o1 I I 1 O2 I I L o1 I I 1 02 I I 1 2, 3 1 2, 3 1 2, 3 1 2, 3 I 1 unit I 1 I I I I I Limits Min I Max I I 1.5 I MHz 1750 I kHz - I I I I -12.0 1+12.0 1 I I I I I I -l-.-l I I a I I a I I -7.0 I t7.0 1 mA -5.0 I t5.0 L -6.5 I t6.5 I -0.26 I 0.10 I dB -0.30 I 0.10 I -0.26 I 0.10 I -0.30

40、 I 0.10 I 97.315 97.119 48.608 48.51 97.315 97.119 48.608 48.51 I I I I 49.49 L I I I I 49.49 I 98.885L 99.081 I 49.392 1 98.885 L 99.081 I 49.3921 JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- SMD-5962-90967 59 = 9999996 0008576 2 TABLE 1.

41、 Electrical performance characteristics - Continued. Test Stop band attenuation DC offset voltage Output voltage swing Additional magnitude response test points See footnote at end of tabte. I I Conditions IGroup A IDevice -55OC 5 TA S +12SoC Isubgroups 1 type unless otherwise specified 1 I I I f g

42、500 kHz, l I I v+ = +5 v, v- = -5 v, I 1,2,3 I ALL I atCY x fCO I I I - I i V+ = +z.5 Y, V- = -2.5 V, i I I I I I I I IA3 I vt = +5 v, v- = -5 v, fCLK = 900 kHz I V+ = t2.5 V, V- = -2.5 V, i i o1 fCb, = 250 kttz I v+ = +5 v, v- = -5 v, I ?_ fCLK = 500 kHz I I- l o2 I I I I 2, 3 I I I 2, 3 I I I All

43、I I I+ = t2.5 V, V- -2.5 V, fCLK = 250 kHr u+ = t5 v, v- = -5 i!, I1 I 01 f CtK-= 500 kHz, Id I I 2, 3 fIN - 6 kHZ I I I v+ = +5 v, v- = -5 v, I 1, I I 500 kHz, I :CLK-= IN - 4.5 kM I2,3 I I v+ = +5 v, v- = -5 v, 1 02 500 kHz, I I I I :;=I2 kHz I a,3 I 11 v+ = +5 v, v- = -5 v, L f 500 kHz, I t fff=9

44、 kHz I2/3 I I Unit I I I I I I I I I I I I I I l I l l I I I I I +loa 1 I I I I I I 3.9 1 v I . -4.2 I I 3.7 1 I -4.0 I I I I -2.0 I I 1.2 I I l I Limits Max I Min I 1 -36 I dB - mV -150 1+150 -109 -90 -60 1 +90 I +60 1.4 L -1.8 1 -976 1 , -8.84 1 dB -9.80 I -8.80 1 -1.03 I 0.71 -1.07 I -0.67 I I I

45、I I a I I I I I I I I -9.91 I -8.99 I -9,95 I -8.95 1 -1.03 I -0.71 1 -1.07 I -0.67 I 5962-90967 REVISION LEVEL SHEET STANRAWZE B 2, V+ = t2.5 V, I1 V- = -2.5 V I I I I I I 1.3 I 5962-90967 STANDARD1 ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 JUL 91 Provided by IHSNot

46、for ResaleNo reproduction or networking permitted without license from IHS-,-,- SMD-59b2-90967 59 999999b 0008578 b I TABLE I. Electrical performance characteristics - Continued. L Unit I I I I I Conditions IGroup A !Device I Limits I I I Test ISymbol I Max I I -55C 5 TA 5 +125C Isubgroups I type I

47、I I unless otherwise specified I I Min I DC LOGIC INPUT-OUTPUT TESTS: SCHMITT TRIGGER I I Positive going i I v+ = +10 v, threshold voltage I VTH+ I LEVEL SHIFT pin = O V clock IN pin I I V-=ov I I I I Negative gQing I clock IN pin I I v-=ov I I I I I v+ = +5 v, I v-=ov I I vt = +IO v, I LEVEL SHIFT

48、pin = O V I I v+ = 4-5 v, I v-=ov I LEVEL SHIFT pin = O V threshold voltage I VTH- I LEVEL SHIFT pin = O V I I Hysteresis clock 1 at I I (TH+ - VTH-) I I I vt = 4-10 v, I v-=ov I 1 LEVEL SHIFT pin = O V i v4- = +5 v, I LEVEL SHIFT pin = O V i I I I l v-=ov I v- = o v, I I v- = o v, Logical “1“ outpu

49、t I VOH I Io = -10 PA, V+ = +?O V, voltage CLK R pin I I I I l I I I LEVEL SHIFT pin = O V I Io = -10 FA, V+ 95 V, I LEVEL SHIFT PIN = O V Logical “O1 output I VOL I Io = 10 FA, V+ = +IO V, voltage CLK R pin I I I I I v- = o v, I I v- - o v, I I LEVEL SHIFT pin = O V I Io 10 PA, V+ = +5 V, I LEVEL SHIFT pin = O V See footnote at end of table. I All I I I I I I I I I I I I I I I I I I I I 1 2, 3 1 2, 3 1 2, 3 1 2, 3 1 2, 3 1 2,