DLA SMD-5962-90659 REV F-2008 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《可操作式放大器 大功率线性混合式微电子电路》.pdf

《DLA SMD-5962-90659 REV F-2008 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《可操作式放大器 大功率线性混合式微电子电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-90659 REV F-2008 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《可操作式放大器 大功率线性混合式微电子电路》.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Made technical changes to table I. Editorial changes throughout. 91-05-23 W. Heckman B Changes in accordance with NOR 5962-R188-93. 93-06-22 K. A. Cottongim C Changes in accordance with NOR 5962-R046-94. 93-11-18 K. A. Cottongim D Update drawing

2、requirements to MIL-PRF-38534. 01-02-14 Raymond Monnin E Table I, Stability/noise (EN) test, conditions column, delete G = 1 and add note 3. Update drawing boilerplate. 02-05-20 Raymond Monnin F Update drawing per 5 year review. -sld 08-07-07 Robert M. Heber THE ORIGINAL FIRST PAGE OF THIS DRAWING H

3、AS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Steve Duncan STANDARD MICROCIRCUIT DRAWING CHECKED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil/ THIS DRAWING IS AVAILABL

4、E FOR USE BY ALL DEPARTMENTS APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, HIGH POWER, OPERATIONAL AMPLIFIER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 91-02-15 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-90659 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E4

5、48-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90659 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents f

6、ive product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN.

7、 The PIN shall be as shown in the following example: 5962 - 90659 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA

8、) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit fun

9、ction 01 PA12M, MIOP42109 Power operational amplifier 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Clas

10、s H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for u

11、se in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufa

12、cturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition d

13、ocument; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited tempe

14、rature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Flange mount Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STA

15、NDARD MICROCIRCUIT DRAWING SIZE A 5962-90659 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. Supply voltage (VS). 50 V dc Output current (I

16、O). 15 A Power dissipation (PD) 1/ 125 W Input voltage (differential) . 50 V dc - 3 V dc Input voltage (common mode) 50 V dc Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +200C Storage temperature range. -65C to +150C 1.4 Recommended operating conditions. Supply voltag

17、e (VS). 40 V dc Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues

18、 of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electroni

19、c Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk,

20、700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulation

21、s unless a specific exemption has been obtained. 1/ Derate at 1.4C/W above case temperature (TC) of +25C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90659 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43

22、218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein

23、or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the appli

24、cable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and

25、herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance

26、characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking

27、 of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manuf

28、acturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if

29、 any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to

30、 this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided wi

31、th each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect

32、the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition D. The test circuit shall be maintained by the manufacturer under documen

33、t revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TCas

34、specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. c. Constant acceleration may be

35、 performed after burn-in upon approval by the qualifying activity. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90659 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC

36、FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C VS= 40 dc Group A subgroups Device type Limits Unit unless otherwise specified Min Max 1,2 50 Supply current IS VIN= 0 V dc, G = 100, 2/ RCL= 1.0 , VCM= 0 V dc 3 01 100 mA 1 -12.0 +12.0 2 -18.5

37、+18.5 VIN= 0 V dc, G = 100, 2/ VS= 10V dc , RCL= 1.0 3 -17.2 +17.2 mV 1 -6.0 +6.0 2 -12.5 +12.5 VIN= 0 V dc, G = 100, 2/ VS= 40 V dc , RCL= 1.0 3 -11.2 +11.2 mV 1 -7.0 +7.0 2 -13.5 +13.5 Input offset voltage VOSVIN= 0 V dc, G = 100, 2/ VS= 45 V dc , RCL= 1.0 3 01 -12.2 +12.2 mV 1 30.0 2 70.0 Input b

38、ias current, +IN +IBVIN= 0 V dc, RBIAS 100 M 3 01 115.0 nA 1 30.0 2 70.0 Input bias current, -IN -IBVIN= 0 V dc, RBIAS 100 M 3 01 115.0 nA 1 30.0 2 70.0 Input offset currentIOSVIN= 0 V dc, RBIAS 100 M 3 01 115.0 nA VS= 45 V dc, IO= 80 mA, RL= 500 4,5,6 40 V VS= 14 V dc, IO= 8 A, RL= 1 , TC= +125C, -

39、55C 5,6 8 V Output voltage VOVS= 16 V dc, IO= 10 A, RL= 1 , TC= +25C 4 01 10 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90659 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHI

40、O 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TC +125C VS= 35 V dc Group A subgroups Device type Limits Unit unless otherwise specified Min Max Current limits ICLRL= 6 , RCL= 1.0 , 2/ VS= 14 V d

41、c, TC= +25C 4 01 0.6 0.89 A Stability/noise ENVS= 40 V dc, CL= 1.5 nF 3/ 4,5,6 01 1.0 mV Slew rate SRRL= 500 , VS= 40 V dc, VIN 4 VP-P 4, 5,6 01 2.5 10 V/s Open loop gain AOLRL= 500 , VS= 40 V dc, f = 15 Hz, VIN 0.4 VP-P 4,5,6 01 96 dB Common mode rejection CMR VS= 15 V dc, f = dc, VCM= 9 V dc 4,5,6

42、 01 74 dB 1/ During all group A testing, terminal connection F. O. (pin 7) is left open. 2/ A current limiting resistor (RCL) is connected between CL+ to the output CL- to the output during these tests. 3/ Minimum gain condition is either G = +4 (non-inverting) or G = -3 (inverting). Provided by IHS

43、Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90659 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Millimeters InchesSymbol Min Max Min MaxA 38.35 3

44、9.37 1.510 1.550 B 19.30 19.81 .760 .780 C 7.37 .290 D 0.97 1.07 .038 .042 E 2.03 2.54 .080 .100 F 40 BSC 40 BSC G 12.7 BSC .500 BSC H 30.12 BSC 1.186 BSC J 15.06 BSC .593 BSC K 11.68 12.70 .460 .500 Q 3.84 4.09 .151 .161 R 25.15 25.65 .990 1.010 NOTES: 1. The U. S. preferred system of measurement i

45、s the metric SI. This case outline was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the inch-pound shall take precedence. 2. Pin numbers are for reference and may not be marked on package. 3. The seating plane of the hea

46、der shall be flat within .001 inch (0.03 mm) concave to .004 inch (0.10 mm) convex insides .930 Inch (23.62 mm) diameter circle on the center of the header and flat within .001 inch (0.03 mm) concave to .006 inch (0.15 mm) convex overall. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo re

47、production or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90659 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 Output

48、 +Current limit (CL+) +VS +IN -IN -VS F. O. -Current limit (CL-) FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90659 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 9 DSCC FORM 2234 APR 97