DLA SMD-5962-89640 REV C-2011 MICROCIRCUIT LINEAR WIDEBAND FAST SETTLING OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Sheet 4. TABLE I. Input bias current test. For group A subgroup 1, delete -8 A minimum limit. For group A subgroups 2 and 3, delete -12 A minimum limit. Output current test. For +IOUT, under the conditions column, delete “VOUT= 10 V” and substitu

2、te “VOUT= 0 V”. For -IOUT, under the conditions column, delete “VOUT= 10 V” and substitute “VOUT= 0 V”. Changes in accordance with N.O.R. 5962-R002-94 94-01-03 M. A. FRYE B Drawing updated to reflect current requirements. Redrawn. - ro 01-04-09 R. MONNIN C Update boilerplate paragraphs to current MI

3、L-PRF-38535 requirements. - ro 11-03-10 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK C. OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.

4、dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, WIDEBAND, FAST SETTLING OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE

5、92-04-16 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-89640 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E208-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89640 DLA LAND AND MARITIME COLUMBUS, OHIO

6、 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in

7、 the following example: 5962-89640 01 C A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 AD840 Wideband, fast settling operational a

8、mplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified

9、in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. 1/ 2/ Voltage between +VSand VSterminals . 36 V dc Differential input voltage . 6.0 V dc Voltage at either input terminal . +VSand VSPeak output current ( 10 % duty cycle) . 100 mA Power dissipation (PD): Case C 1.3 W 3/ Case 2 . 1.0 W 3/ J

10、unction temperature (TJ) . +175C Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC): Case C 30C/W Case 2 . 35C/W Thermal resistance, junction-to-case (JA): Case C 110C/W Case 2 . 150C/W _ 1/ Stresses above the absolute

11、 maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise specified, TA= +25C. 3/ Derate linearly above TA= +25C for case C at 8.7mw/C and case 2 at 6.7 mW/C. Provided by IHSNot for ResaleNo

12、reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89640 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Positive supply voltage range (+VS) . +5 V dc to +15

13、V dc Negative supply voltage range (-VS) -5 V dc to 15 V dc Common mode input voltage (VCM) . 10 V dc Load resistance (RL) . 500 Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standar

14、ds, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

15、DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of the

16、se documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited h

17、erein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A

18、 for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product

19、 in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or functio

20、n of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical di

21、mensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwis

22、e specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89

23、640 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking sh

24、all be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of

25、 not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MI

26、L-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and M

27、aritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be pro

28、vided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime s agent, and the acqui

29、ring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

30、 MICROCIRCUIT DRAWING SIZE A 5962-89640 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C VS= 15 V Group A subgroups Device type Limits Unit unless otherwise specified

31、 Min Max Input offset voltage VIOVCM= 0 V 1 01 -1.0 +1.0 mV 2,3 -2.0 +2.0 Input bias current IBVCM= 0 V 1 01 +8 A 2,3 +12 Input offset current IIOVCM= 0 V 1 01 -0.4 +0.4 A 2,3 -0.6 +0.6 Output current +IOUTVOUT= 0 V, TA= +25C 1 01 50 mA -IOUT-50 Common mode voltage range +VCM+VS= 5.0 V, -VS= -25 V V

32、OUT= -10 V 1,2,3 01 10 V -VCM+VS= 25 V, -VS= -5 V VOUT= 10 V -10 Large signal voltage gain +AVOLVOUT= 0 V and 10 V, 1 01 75 kV/V RL= 500 2,3 30 VOUT= 0 V and 10 V, 1 100 RL= 1 k 2,3 50 -AVOLVOUT= 0 V and -10 V, 1 75 RL= 500 2,3 30 VOUT= 0 V and -10 V, 1 100 RL= 1 k 2,3 50 Common mode rejection ratio

33、 +CMRR VCM= 10 V, +VS= 5.0 V, 1 01 90 dB -VS= -25 V, VOUT= -10 V 2,3 85 -CMRR VCM= -10 V, +VS= 25 V, 1 90 -VS= -5 V, VOUT= 10 V 2,3 85 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

34、 5962-89640 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA+125C VS= 15 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Output vo

35、ltage swing +VOUTRL= 500 1,2,3 01 10 V -VOUT-10 Quiescent power supply current ICCVOUT= 0 V, IOUT= 0 mA 1 01 14 mA 2,3 18 Power supply rejection ratio +PSRR +VS= 5.0 V to 18 V, 1 01 90 dB -VS= -15 V 2,3 80 -PSRR -VS= -5.0 V to 18 V 1 90 +VS= +15 V 2,3 80 Quiescent power 3/ consumption PCVOUT= 0 V, I

36、OUT= 0 mA 1 01 420 mW 2,3 540 Differential input 2/ resistance RINVCM= 0 V, TA= +25C 4 01 12 k Gain bandwidth 2/ product GBWP VOUT= 90 mVPP, f1= 100 kHz, f2= 10 MHz, RL= 500 , TA= +25C 4 01 200 MHz Full power 2/ 4/ bandwidth FPBW VPK= 10 V, RL= 500 , TA= +25C 4 01 4.7 MHz Slew rate 2/ +SR VOUT= -5.0

37、 V to 5.0 V, measured from 4.0 V to 4 01 280 V/s +4.0 V, RL= 500 , AV= -10 V/V 5,6 180 -SR VOUT= 5.0 V to -5.0 V, measured from 4.0 V to 4 280 +4.0 V, RL= 500 , AV= -10 V/V 5,6 180 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fro

38、m IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89640 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA+125C VS= 15 V Group A subgroups Device type Limits Uni

39、t unless otherwise specified Min Max Closed loop stable 2/ gain CLSG RL= 500 , CL 10 pF 4,5,6 01 10 V/V Settling time 2/ tSAV= -10, RL= 500 , 10 V step at 0.1 % of the fixed value, TA= +25C 9 01 150 ns AV= -10, RL= 500 , 10 V step at 0.01 % of the fixed value, TA= +25C 200 Overshoot 2/ +OS VOUT= 0 V

40、 to +200 mV, AV= +10, RL= 500 , TA= +25C 9 01 30 % -OS VOUT= 0 V to -200 mV, AV= +10, RL= 500 , TA= +25C 30 Rise time 2/ 5/ tRVOUT= 0 V to +200 mV, AV= +10, RL= 500 , 9,10,11 01 12 ns Fall time 2/ 5/ tFVOUT= 0 V to -200 mV, AV= +10, RL= 500 , 9,10,11 01 12 ns 1/ Unless otherwise specified, for dc te

41、sts, RL= 100 k and VOUT= 0 V. 2/ If not tested, shall be guaranteed to the limits specified in table I herein. 3/ Quiescent power consumption is based on quiescent supply current test maximum with no load on outputs. 4/ Full power bandwidth = SR / ( 2 x VPK). 5/ Rise and fall times measured between

42、10 percent and 90 percent point. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89640 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlin

43、es C 2 Terminal number Terminal symbol 1 NC NC 2 NC BALANCE3 BALANCE NC 4 -INPUT NC 5 +INPUT -INPUT 6 -VSNC 7 NC +INPUT 8 NC NC 9 NC NC10 OUTPUT -VS11 +VSNC 12 BALANCE NC 13 NC NC14 NC NC 15 - OUTPUT16 - NC 17 - +VS18 - NC 19 - NC 20 - BALANCE NC = No connection FIGURE 1. Terminal connections. Provi

44、ded by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89640 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspec

45、tion procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, metho

46、d 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and pow

47、er dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discr

48、etion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7 and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electr