DLA SMD-5962-89479 REV E-2012 MICROCIRCUIT LINEAR POSITIVE 10-VOLT ADJUSTABLE PRECISION VOLTAGE REFERENCE MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add radiation hardness requirements. Add table IIB. Add case outline H to 1.2.4, change 1.3 and figure 1 to include case H. lgt 00-08-24 R. MONNIN B Make changes to pin 3 on case H as specified in figure 1 and long term stability test as specifie

2、d in table I. - ro 01-11-26 R. MONNIN C Add case outlines P and 2. Make changes to 1.2.4, 1.3, and figure 1. rrp 02-04-22 R. MONNIN D Drawing updated to reflect current requirements. - rrp 09-02-17 R. HEBER E Add device type 03. - drw 12-05-29 Charles F. Saffle THE ORIGINAL FIRST SHEET OF THIS DRAWI

3、NG HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Rick C. Officer DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY

4、ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Charles E. Besore APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, POSITIVE 10-VOLT ADJUSTABLE PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON DRAWING APPROVAL DATE 90-01-11 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 5962-89

5、479 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E359-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89479 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCO

6、PE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available,

7、 a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: For device classes M and Q: 5962 - 89479 01 G A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Case outline (see 1.2.4) Lead finis

8、h (see 1.2.5) / / Drawing number For device class V: 5962 R 89479 01 V G A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q

9、and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device

10、. 1.2.2 Device types. The device types identify the circuit function as follows: Device type Generic number Circuit function 01 REF10A Precision reference +10 volt adjustable output, with guaranteed long-term stability 02 REF10B Precision reference +10 volt adjustable output, with guaranteed long-te

11、rm stability 03 REF10A Precision reference +10 volt adjustable output, with guaranteed long-term stability 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-ce

12、rtification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDA

13、RD MICROCIRCUIT DRAWING SIZE A 5962-89479 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can

14、 H GDFP1-F10 or CDFP2-F10 10 Flat pack P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 1.3 Absolute maximum ratings. 1/ In

15、put voltage (VIN) . 40 V dc Power dissipation (PD) . 500 mW 2/ Output short circuit duration . Indefinite Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +150C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Thermal resistan

16、ce, junction-to-ambient (JA): Case G 150C/W 2/ Case H 180C/W 2/ Case P 148C/W Case 2 . 95C/W 1.4 Recommended operating conditions. Input voltage (VIN) +15 V Ambient operating temperature range (TA). -55C to +125C 1.5 Radiation features. Device type 01: Maximum total dose available (dose rate = 50 30

17、0 rads(Si)/s) 100 Krads(Si) 3/ Device type 03: Maximum total dose available (dose rate 10 mrads(Si)/s) . 50 Krads(Si) 4/ _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability.

18、2/ For case G, derate above +80C, 6.8 mW/C. For case H, derate above +85C, 5.6 mW/C. For case P, derate above +75C, 6.6 mW/C. For case 2, derate above +72C, 7.8 mW/C. 3/ For device type 01, this part may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects

19、. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. 4/ For device type 03, radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, co

20、ndition D. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89479 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specifica

21、tion, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-385

22、35 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Dra

23、wings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a

24、conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual ite

25、m requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requi

26、rements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for devic

27、e classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Radiation exposure circuit. The radiation expos

28、ure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electric

29、al performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests fo

30、r each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of

31、 not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/com

32、pliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

33、rom IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89479 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/, 2/ -55C TA +125C VIN= 15 V Group A subgroups Device type Limits Unit

34、unless otherwise specified Min Max Quiescent supply current ISYNo load 1 All 1.4 mA 2, 3 2.0 M,D,P,L,R 1 01 1.4 M,D,P,L 1 03 1.4 Output adjustment range VTRIMRP= 10 k, 3/ TA= 25C 1 All 3.0 % Output voltage VOUTIL= 0 mA 1 01, 03 9.97 10.03 V 02 9.95 10.05 2, 3 01, 03 9.955 10.045 02 9.905 10.095 M,D,

35、P,L,R 1 01 9.94 10.06 M,D,P,L 1 03 9.94 10.06 Short circuit current IOSVO= 0 V 3/ 1 All +15 +60 mA Sink current IS3/ 1 All -0.3 Load regulation LD reg IL= 0 mA to 10 mA 4/, 5/ 1 01, 03 0.008 % / mA 02 0.010 M,D,P,L,R 1 01 0.015 M,D,P,L 1 03 0.015 IL= 0 mA to 8 mA 4/, 5/ 2, 3 01, 03 0.012 02 0.015 Li

36、ne regulation LN reg VIN= 13 V to 33 V 4/ 1 All 0.01 % / V 2, 3 All 0.015 M,D,P,L,R 1 01 0.03 M,D,P,L 1 03 0.03 Load current 7/ IL3/, 6/ 1 All 10 mA 2, 3 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROC

37、IRCUIT DRAWING SIZE A 5962-89479 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/, 2/ -55C TA +125C VIN= 15 V Group A subgroups Device type Limits Unit unless otherwis

38、e specified Min Max Output voltage noise enp-p0.1 Hz to 10 Hz 3/ 4 All 30 Vp-p Output voltage TCVO3/, 7/ 5, 6 01, 03 +8.5 ppm / temperature coefficient 02 +25 C Long term stability VOUT/ t Lot qualification test 3/, 8/ All 50 ppm/ 1k hr 1/ Device type 01 supplied to this drawing has been characteriz

39、ed through all levels M, D, P, L, and R of irradiation however this device is only tested at the R level. Device type 03 supplied to this drawing is only tested at the L level. Pre and post irradiation values are identical unless otherwise specified in table I. When performing post irradiation elect

40、rical measurements for any RHA level, TA= +25C. 2/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, co

41、ndition A for device type 01 and condition D for device type 03. Device type 03 has been tested at the low dose rate. 3/ This parameter is not tested post-irradiation. 4/ Line and load regulation specifications include the effect of self-heating. mAXVIVLDOUTOUTOUTREG%100 = 6/ Minimum load current gu

42、aranteed by load regulation test. 7/ TCVO= V10610 x 1/180C 125C)+ to(-55C V - V MINMAX. 8/ Each wafer lot is tested for long-term stability at a chip temperature of 76C for 168 hours. Sample size is 105 devices with an accept number of 2. 5/ Provided by IHSNot for ResaleNo reproduction or networking

43、 permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89479 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 Device types 01, 02 01, 03 Case outlines G H P 2 Terminal number Terminal symbol 1 NC NC NC NC 2 VINVINVINNC 3 NC NC

44、NC NC 4 GND GND GND NC 5 TRIM TRIM TRIM VIN6 VOUTVOUTVOUTNC 7 NC NC NC NC 8 NC NC NC NC 9 - NC - NC 10 - NC - GND 11 - - - NC 12 - - - TRIM 13 - - - NC 14 - - - NC 15 - - - VOUT16 - - - NC 17 - - - NC 18 - - - NC 19 - - - NC 20 - - - NC NC = No connection FIGURE 1. Terminal connections. Provided by

45、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89479 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. For device classes Q and V, a certificat

46、e of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-10

47、3 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class

48、M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change