DLA SMD-5962-88747 REV G-2006 MICROCIRCUIT LINEAR 12 VOLT NEGATIVE REGULATOR FIXED MONOLITHIC SILICON《硅单片12 V阴性固定调节器线性微电路》.pdf
《DLA SMD-5962-88747 REV G-2006 MICROCIRCUIT LINEAR 12 VOLT NEGATIVE REGULATOR FIXED MONOLITHIC SILICON《硅单片12 V阴性固定调节器线性微电路》.pdf》由会员分享,可在线阅读,更多相关《DLA SMD-5962-88747 REV G-2006 MICROCIRCUIT LINEAR 12 VOLT NEGATIVE REGULATOR FIXED MONOLITHIC SILICON《硅单片12 V阴性固定调节器线性微电路》.pdf(19页珍藏版)》请在麦多课文档分享上搜索。
1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add case outline N. Make changes to 1.2.2, 1.3, and figure 1. - ro 98-12-17 R. MONNIN B Add case outline 2. Make changes to 1.2.2, 1.3, table I, and figure 2. - ro 99-10-21 R. MONNIN C Add radiation hardness requirements. Add case outline M. Make
2、 changes to 1.2.2, 1.3, table I, figure 1, and figure 2. - ro 00-02-23 R. MONNIN D Add case outlines 4 and 5. - ro 01-05-18 R. MONNIN E Make pin assignment corrections to case outlines N and 5 as specified in figure 2. - ro 02-04-15 R. MONNIN F Add a footnote to case outline U, TO-257 package as spe
3、cified under 1.2.3 and figure 1. -rrp 05-02-04 R. MONNIN G For case outline T only, add footnote 1/ under 1.2.3 and make change to note 2 under figure 1. -rrp 06-01-23 R. MONNIN THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV G G G SHEET 15 16 17 REV STATUS REV G G G G G G G
4、 G G G G G G G OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY JOSEPH A. KERBY DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVE
5、D BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, 12 VOLT NEGATIVE REGULATOR FIXED, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 89-09-14 AMSC N/A REVISION LEVEL G SIZE A CAGE CODE 67268 5962-88747 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E157-06 Provided by IHSNot for
6、 ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88747 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-S
7、TD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962 F 88747 01 M X Federal RHA Device Case Lead stock class designator type outline finish designator (see
8、 1.2.1) (see 1.2.2) (see 1.2.3) (see 1.2.4) / / Drawing number 1.2.1 RHA designator. RHA marked devices shall meet the MIL-PRF-38535 or MIL-PRF-38535, Appendix A specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s).
9、 The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 7912A 1.0 A negative regulator, fixed 12-volt 1.2.3 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Pack
10、age style M See figure 1 3 Surface mount N CBCC2-N3 3 Bottom terminal chip carrier T 1/ See figure 1 3 TO-257, single row flange mount, glass sealed U 1/ See figure 1 3 TO-257, single row flange mount with an isolated tab, glass sealed X See figure 1 3 TO-39, can Y See figure 1 2 TO-3, flange mount
11、Z MBFM4-P2 2 TO-66, flange mount 2 CQCC1-N20 20 Square leadless chip carrier 4 See figure 1 3 Flange mount, glass sealed with gull wing leads 5 CBCC1-N3 3 Bottom terminal chip carrier 1.2.4 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1/ For outline letters T and U, CAG
12、E 34333 manufacturers the TO-257 package with ceramic seal.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88747 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 3 DSCC FORM 223
13、4 APR 97 1.3 Absolute maximum ratings. Input voltage: Operating or input shorted to ground . -35 V dc Transient -50 V dc 2/ Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Power dissipation (PD): TC= +25C: Cases M, N, T, U, Z, 4, and 5. 15 W Cases X and 2 . 2 W
14、 Case Y 20 W TA= +25C: Cases M, N, T, U, and Z. 3.0 W Cases X and 2 1.0 W Case Y 3.6 W Case 4 . 1.7 W Case 5 . 1.3 W Junction temperature (TJ) +150C 3/ Thermal resistance, junction-to-case (JC): Case M. 5.5C/W Cases N and T . 3.5C/W Case U . 4.2C/W Case X . 15C/W Case Y . 3C/W Case Z . 6C/W Case 2 S
15、ee MIL-STD-1835 Case 4 . 5.1C/W Case 5 . 3.6C/W Thermal resistance, junction-to-ambient (JA): Cases M, T, U, and Z 42C/W Cases N, X, and 2 120C/W Case Y . 35C/W Case 4 . 60C/W Case 5 . 80C/W 1.4 Recommended operating conditions. Input voltage range (VIN) . -14.5 V dc to -27 V dc Ambient operating te
16、mperature range (TA) -55C to +125C 1.5 Radiation features: Maximum total dose available (dose rate = 50 300 rads(Si) / s) . 300 Krads 4/ _ 2/ The 50-volt input rating refers to the ability of the regulator to withstand high line or transient conditions without damage. Since the regulators maximum cu
17、rrent capability is reduced, the output may fall out of regulation at high input voltages under nominal loading. 3/ The device is protected by a thermal shutdown circuit which is designed to turn off the output transistor whenever the device junction temperature is in excess of +150C. 4/ These parts
18、 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. Provided by IHSNot for ResaleNo reproduction or networ
19、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88747 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specificat
20、ion, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specifi
21、cation for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (C
22、opies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of
23、 this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in a
24、ccordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-P
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