DLA SMD-5962-88620-1988 MICROCIRCUITS DIGITAL HIGH SPEED CMOS 2-INPUT POSITIVE AND GATE WITH OPEN DRAIN OUTPUTS MONOLITHIC SILICON《硅单片2输入阳性闸门开漏输出高速互补型金属氧化物半导体数字微电路》.pdf

《DLA SMD-5962-88620-1988 MICROCIRCUITS DIGITAL HIGH SPEED CMOS 2-INPUT POSITIVE AND GATE WITH OPEN DRAIN OUTPUTS MONOLITHIC SILICON《硅单片2输入阳性闸门开漏输出高速互补型金属氧化物半导体数字微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-88620-1988 MICROCIRCUITS DIGITAL HIGH SPEED CMOS 2-INPUT POSITIVE AND GATE WITH OPEN DRAIN OUTPUTS MONOLITHIC SILICON《硅单片2输入阳性闸门开漏输出高速互补型金属氧化物半导体数字微电路》.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、* 7” 43-dl b DESC-DWG-BBb20 57 W 7777775 0033263 3 W DATE (YR-MO-DA) LTR DESCRIPTION APPROVED REV SHEET REV SHEET REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 I I PREPARED BY DEFENSE ELECTRONICS SUPPLY CENTER -v33llh%- DAYTON, OHIO 45444 PMIC N/A STANDARDIZED MILITARY MICROCIRCUITS, DIGITAL, HIG

2、H SPEED CMOS, 10 11 DRAWING CAGE CODE DRAWING APPROVAL DATE SIZE i 28 JULY 1988 A I 67268 lSl62-8862O THIS DRAWING IS AVAILABLE -OR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE 2-INPUT, POSITIVE AND GATE WITH OPEN DRAIN OUTPUTS, MONOLITHIC SILICON I REVISION LEVEL I 1 . AMSC NIA

3、I I SHEET 1 OF 11 *US. GOVERNMINT PRINTING OFFICE: 1987 - 748-12916091 I DESC FORM 193 SEP 87 5962- E894 DISTRIBUTION STATEMENT A. Approved for public release; dislribullon Is unilmiied. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1. SCOPE 1.1 Sc

4、ope. This drawing describes device requirements for class B microcircuits in accordance ith 1.2.1 of t4IL-STD-8U3, “Provisions for the use of MIL-STD-883 in conjunction with compliant oii-JAfi devices“. 1.2 Pdrt iiuiiilir.r. Tlic LOliIlJ1C!tC! pdrt riuiher shdl 1 bc ds stiowii iii the fol lowing c.x

5、di,iplc: U1 7 C T- x T 1.2.1 Device type. The device type shall identify the circuit function as follows: Device type Generic number Circuit function li1 54HC05 Quad, 2-input, positive AN gate with open drain outputs 1.2.2 Case outlines. The case outlines shall be as designated in dppendix C of EIIL

6、-M-3851OY and Outline letter Case outline s follorrs: C 2 1.3 Absolute iIiuxiiwu ratings. D-1 (14-lead, .785“ x .310“ x .200“), dual-in-line package C-2 (20-terminal, ,358“ x ,358“ x .100“), square chip carrier packie Supply voltdye range i/- - - - - - - - - - - - - - - DC input voltage (V IT DC out

7、put voltage (JOUTI 1 I I I - - - - - - - - - - Clamp diode current- - - - - - - - - - - - - - - - - EiC output current (per pin)- - - - - - - - - - - - - DC VCC or GNU current (per pin)- - - - - - - - - - - Storage temperature range- - - - - - - - - - - - - - Maxifiium power dissipation (PD) - - - -

8、 - - - - - - - Lead temperature (solderiny, 10 seconds) - - - - - - Thetnial resistance, junction-to-case (Jc) : Junction tevperdture (TJ)- - - - - - - - - - - - - - -_- cases C and 2- - - - - - - - - - - - - - - - - - - -0.5 V dc to t7.0 V dc -0.5 V dc to VCC +Oe5 V dc -0.5 V dC to VC +Os5 V dC *20

9、 mA *25 niA *50 tn4 -65OC to +15C 500 mi4 2/ +260 “C - See MIL-M-38510, appciidix C +175OC 1.4 Recommended operating conditions. Supply voltage (VCC) - - - - - - - - - - - - - - - - Case operating temperature range TC)- - - - - - - - Input rise or fall time: vcc = 2.0 y- - - - - - - - - - - - - - -

10、- - - - - Vcc = 6.0 y- - - - - - - - - - - - - - - - - - - - t2.0 V dc to t6.0 V dc -55OC to +125C O to 1000 ns O to 500 ns O to 400 ns vcc = 4.5 v- - - - - - - - - - - - - - - - - - - - / Unless otherwise specified, all voltages are referenced to ground. 1 For TC = +lOOC to +125C, derate linearly a

11、t 12 inW/C. SIZE A 59C2-8862U STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 L , DESC FORM 193A SEP a7 -_ v- - ii U. S. QOVERNMENT PRINTING OFFICE: 1988-549 934 Provided by IHSNot for ResaleNo reproduction or networking permitted without licen

12、se from IHS-,-,-DESC-DWG-620 57 m 9799795 0033265 7 m _ SIZE A STANDARDIZED 2.1 Government specification and standard. Unless otherwise specified, the following lecification and standard, of the issue listed in that issue of the Department of Defense Index of oecifications and Standards specified in

13、 the solicitation, form a part of this drawing to the (tent specified herein. SP EC I F CAT I ON MILITARY 5962-88620 MIL-M-38510 - Microcircuits, General Specification for STANDARD MILITARY MI L-STO-883 - Test Methods and Procedures for Microelectronics (Copies of the specification and standard requ

14、ired by manufacturers in connection with specific cquisition functions should be obtained from the contracting activity or as directed by the mtracting activity. 1 ?ferences cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence. In the event of a conflict between the

15、text of this drawing and the 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of IL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ nd as specified herein. 3.2 Design, construction, and physical d

16、imensions. 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Truth table. The truth table shall be as specified on figure 2. 3.2.3 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.4 Case outlines. The case outlines shall be in accord

17、ance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified, the electrical The design, construction, and physical imensions shall be as specified in MIL-M-38510 and herein. erformance characteristics are as specified in table I and apply over the full case peratin

18、g temperature range. arked withe part number listed in 1.2 herein. ay also be marked as listed in 6.4 herein. 3.5 Certificate of compliance. A certificate of compliance shall be required from a manufacturer n order to be listed as an approved source of supply in 6.4. The certificate of compliance ub

19、mitted to DESC-ECS prior to listing as an approved source of supply shall state that the anufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) and the requirements erei n. erein) shall be provided with each lot of microcircuits delivered to this drawing. 3.4 Marking. Marking sh

20、all be in accordance with MIL-STD-883 (see 3.1 herein). The part shall In addition, the manufacturers part number 3.6 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 1 SHEET DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL DAYTON, OHIO 45444 3 DESC FORM 1

21、93A SEP 87 h U S GOVERNUENT PRINTINQ OFFICE: 1888-%9 9M Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I TABLE I. Electrical performance characteristics. I l I I I Test 1Symboi I Conditions I Group A I Limits I Unit I I -55C TC +125“C 1/ Isubgroupsl

22、 Min I Max I - I I unless oTherwTse specified I I I I I I I I l I I Low levei output voltage IVOL IVIN = VIH or VIL, IVcc = 2.0 V I 1, 2, 3 I I 0.1 I v I IIOL = 20 IVCC = 4.5 v I I I 0.1 I I I 0.1 I 1 I I I 1-7-7 I I I I I I I I IIOL = 4.0 mA IVCC = 4.5 v I I l 0.4 I I I I I I I I I I II I- -Ir- -i

23、I I 0.4 I I . I I IIOL = 5.2 m4 r-l- I 3.151 I I I IVCC = 4.5 Y I I 4.2 I I I 1 I I I I I l I I I I 1 I I I 0.9 I I I 1.2 I I l I I I l I I 1 I I I I I I ITc = +25C, see 4.3.1 I I I I I I I I I I I I I I I I I IVIN = Vcc or GND, IOUT = O I I I I IVCC = 6*o “ I IVCC = I I I -_-_ -T _-_I -1- - IVcc =

24、6*o IVCC = I ._. I I _I_I_ 2/ ivcc = 2.0 v I 1, 2, 3 I 1.5 I IV High level input voltage IVIH I - 2/ IVCC = 2.0 v I 1, 2, 3 I I 0.3 I V Low level input voltage IVIL I - I I IVCC = 4.5 v I Input capacitance ICIN IvCC = 2.0 v to 6.0 vy VIN = 0 vy I 4 I I 10 I pF Quiescent current IIcc IVCC = 6.0 Y, I

25、1, 2, 3 I I 40 I NA I I I I I I I I I I I I Input leakage current 111 IVcc = 6.0 V, I 1, 2, 3 I I *l I iiA IVIN = Vcc or GND I I I I I IVIN = VIH or VIL I I I I I I l I I I I I I I I I Functional tests I ISee 4.3.ld 171 I I I I I l I I I I I -.-_- I I I -_ ,- I- _ -I-I- High level output currentlI0H

26、 IVcc = 6.0 Y, Vo = Vcc, I 1, 2, 3 I I 10 I NA See footnotes at end of table. SIZE A 5962-88620 STANDARDIZED MILITARY DRAWING SHEET REVISION LEVEL DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 4 . ii U S GOVLIINHENt PRINTINO WFK,t. (888 MO OM DESC FORM 193A SEP 87 Provided by IHSNot for Resal

27、eNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-hall be made available onshore at the option of the reviewer. Offshore documentation SIZE A 5962-88620 REVISION LEVEL SHEET 9 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures

28、 shall be in accorddnce with 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be iection 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein). :onducted on all devices prior to quality conformance inspection. ;hall apply: The following ad

29、ditional criteria a. Burn-in test method 1015 of MIL-STD-883. (1) (2) TA = +125C, minimum. Test condition A, By Cy or D using the circuit submitted with the certificate of compl i ance ( see 3.5 herein) . 4.3.1 a. b. C. d. 4.3.2 a. b. b. Interim and final electrical test parameters shall be as speci

30、fied in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Quality confonnance inspection shall be in accordance with 4.3 Quality conformance ins ection. iethod XD?5 of MIL - STD 883 incyuding groups A, By C, and O inspecti

31、ons. The following additional :riteria shall apply. Group A inspection. Tests shall be as specified in table II herein. Subgroups 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. Subgroup 4 (GIN measurement) shall be measured only for the initial test and after process or design

32、changes which may affect input capacitance. Subgroup 7 tests sufficient to verify the truth table. Groups C and D inspections. End-point electrical parameters shall be as specified in table II herein. Steady-state life test method 1005 of MIL-STD-883 conditions: (1) Test condition A, By C, or D usin

33、g the circuit submitted with the certificate of compliance (see 3.5 herein). (2) TA = +125OC, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I 5. PACKAGING S

34、TANDARDIZED SIZE MILITARY DRAWING A 5962-88620 DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET b DAYTON, OHIO 45444 10 DESC-DWG-AB620 57 m 7777775 0033272 4 m - . TABLE II. Electrical test requirements. 1 I . Subgroups I I MIL-STD-883 test requirements I (per method I I I 5005, table I) I I I

35、 l I I I I interim electrical parameters I I (method 5004) I I I I I I I I Final electrical test parameters I 1*,2,9 I I (method 5004) I I I I I I I I Group A test requirements I 1,2,3,4*, I I (method 5005) I 7,9,10,11 I I I I I I I I Groups C and D end-point I electrical parameters I (method 5005)

36、I I I 1 1s2,3 I I I * * See 4.3.1 PDA applies to subgroup 1. 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-38510 I I 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and q

37、ualified military devices that will perform the required function are not available for OEM application. When a military specification exists and the product covered by this drawing has been qualified for listing on QPL-38510, the device specified herein will be inactivated and will not he used for

38、new design. for al 1 applications. The QPL-38510 product shall be the preferred item by this drawing will replace the same generic device or drawing. :- Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-b _. t c DESC-DWG-b20 57 7777775 OOl13273 b - I S

39、IZE A STANDARDIZED 6.4 Approved source of sup ly. An approved source of supply is listed herein. Additional ources will be added as theybecome available. The vendor listed herein has agreed to this drawing nd a certificate of compliance (see 3.5 herein) has been submitted to DESC-ECS. 5962-88620 1 I

40、 Vendor I Vendor I I Military drawing I CAGE I similar part I I part number I number I number L/ I I I I I I I I 5962-8862001CX f 01295 I 1 I SNJ54HC09J MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON. OHIO 45444 ! I I SHEET REVISION LEVEL 11 I I I 5962-88620012X 01295 . I SNJMHCOSFK I .I

41、I I I - i/ . Caution. Do not use this number for item acquisition. Items acquired by this number may not satisfy the performance requi rements of thi s drawi ny . Vendor CAGE number 01295 Vendor name and address Texas Instruments, Incorporated P.O. Box 6448 Midland, TX 79711 IESC I ORM lr1:A SFP 07 Ii II S OOVEIINMTNI IIUNIIHROFIICC tnnii !i10 mi4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-