DLA SMD-5962-88612 REV A-1990 MICROCIRCUIT DIGITAL CMOS 16-BIT MICROPROCESSOR MONOLITHIC SILICON《硅单片16位微处理器互补型金属氧化物半导体数字微电路》.pdf

《DLA SMD-5962-88612 REV A-1990 MICROCIRCUIT DIGITAL CMOS 16-BIT MICROPROCESSOR MONOLITHIC SILICON《硅单片16位微处理器互补型金属氧化物半导体数字微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-88612 REV A-1990 MICROCIRCUIT DIGITAL CMOS 16-BIT MICROPROCESSOR MONOLITHIC SILICON《硅单片16位微处理器互补型金属氧化物半导体数字微电路》.pdf（26页珍藏版）》请在麦多课文档分享上搜索。

1、DESC-DWG-bL2 REV A 59 m 9779795 0020773 I = -_ LTR A ._ - - - . DESCRIPTION DATE (YR-MO-DA) APPROVED Add device type 04. Editorial changes throughout. 1990 APR 10 - - . - -_- _- .-_-_-il- - -II”- SHEET REV STATUS OF SHEETS PMIC NIA STANDARDIZED M I LITARY DRAWING THIS DRAWING IS AVAILABLE FOR USE BY

2、 ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC NIA DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 ICROPROCESSOR, MONOLITHIC DESC FORM 193 SEP 87 i US. MvtRHMINl WNlIHG OTFKI: 1967 - 748-119/6opIl 5962-El 524-3 DISTRIBUTION STATEMENT A. Approved lor public release; dislrlbullon

3、 is unlimiled. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-_- _- _ _- - _-_I_ DESC-DWG-b12 REV A 57 7777775 002077Y 3 a J. SCOPE 1.3 SCO e. This drawing describes device requirements for class B microtircuits in accordance with i.range (Vcc) - -

4、- - - - - - - - - - - Minimum input high voltage IVIH) - - - - - - - - - - Maximum input low voltage (VIL)- - - - - - - - - - - Case operatlng temperature range (TC)- - - - - - - - 4.5 V tic to 5.5 V dc 2.0 V dc .8 V dc -55C to +125C STANDARDIZED SIZE . i MILITARY DRAWMG A. 5 962-88612 DEFENSEELECTR

5、ONICS SUPPLY CENTER AEVISDN LEVEL SHEET DAlON, OHK) 45444 A 2 .QU S QOVERNMENTPRIMINWfFKjE 1888-550641 :SC FORM 193A iEP 81 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-. c SIZE A STANDARDIZED DESC-DWG-BBb12 REV A 57 I 7477975 00207755 m 5962-8861

6、2 2. APPLICABLE DOCUMENTS 2.1 Government s ecification, standard, and bulletin. Unless otherwise specified, the following specification, staniard, and bulletin of the issue listed in that issue of the Department of Defense index of Specifications and Standards specified in the solicitation, form a p

7、art of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-M- 38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. BULLETIN MILITARY MIL-BUL-103 - List of Standardized Military Drawing (SMDs). (Copies

8、of the specification, standard, and bulletin required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) references cited herein, the text of this drawing shall take precedence. 2.2 Order of

9、 precedence. 3. REQUIREKNTS 3.1 In the event of a conflict between the text of this drawing and the Item requirements. The individual item requirements shall be in accordance with 1.2.1 of UL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ 2nd as specif

10、ied herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-M-38510 and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connections. The terminal con

11、nections shall be as specified on figure 2. 3.2.3 Functional block diagram. The functional block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical )erformanCe characteristics are as specified in table I and apply

12、over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Markin Marking shall be in accordance with MIL-STD-883 (see 3.1 herein

13、). The part shall e markd the part number listed in 1.2 herein. In addition, the manufacturers part number nay also be marked as listed in MIL-BUL-103 (see 6.7 herein). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- DESC-DWG-BBh12 REV A 57 m 999777

14、5 0020796 7 I TABLE I. Electrical performance characteristics. I I I I I I I I -55C 5 TC 5 +125*C Isubgroups Itypes 1-1 I I I I unless otherwise specified I VIH I 1, 2, 3 I All I 2.01 1 V III I I I I Ill - I I 0.81 Test ISYmbOl I Conditions I Group A IDevicel Limits IUnit IMin .$x I . I Ivoltage for

15、 aB inputs L/ I I vcc = 4.5 v to 5.5 v IGuaranteed in ut logical high Input high voltage I I I i Input low voltage !VIL Guaranteed input logical low i I I I Ivoltage for all Snputs L/ I I I I Input high current IIIH IVcc = 5.5 V, VIN E 5.0 V I I I I Input low current JIIL IVcc = 5.5 Y, VIN = 0.5 V i

16、 I I I I I I I I I I 1 I I I I I Output low voltage I I I I i I i I I Yo = 2*4 Off state (high impedance) /IOZH Vcc = 5.5 V I I I- I output current I IV0 = 0.5 V i i I I I I I I I Static power supply currentiicc IvCC = 5.5 v /VIN = v c i I 110 = O mA lor GND FCMOSI 1 I I I i I I I I I IVIN = 0.5 V I

17、 I lor 2.4 V (TTL)I I I I I I I I I 1 I Input capacitance CIN See 4.3.1 g/ 141 I I I I I I I i !COUT I I yo i I I I I I I I I I I I I I ISee 4.3.ld I 7,8 I .I Output capacl tance 1/0 capacitance I I Functional testing I I III I 110 l PA I 1-10 I +I- m III I * I 2.41 I V II I I 0.51 III Tt-t-. I. YO1

18、 !lA I I 1-10 I t-t-F- I 1145 I mA III III III I 1200 I III III II I I III f 1251 I III I 1251 I lo I pF III I I III See footnotes at end of table. SIZE A 5962-88612 STANDARDIZED MILTTARY DRAWING L REVISION LEVEL SHEET 4 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 A ESC FORM 193A B U. S. GO

19、VERNMENT PRIMING OFFICE 1989-749 033 SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-bL2 REV A 57 7777775 0020777 7 STANDARDIZED MILITARY DRAWING TABLE I. SIZE A 5962-88612 Electrical performance characteristics - Continued. Test Comb

20、inational delay, 1 and 2 input: 10-4 (ADDR) output: 0-15 1-4 Combinational delay, 3 and 4 Input: 10-15 (DATA) output: 0-15 T1-4 Combinational delay, 5 - 7 Input: 10-15 (INSTR) 0-15 output: T1-4 CT ;ee footnotes at end of table. Symbol tpdl tpd2 tpd3 tpd4 tpd5 tpd6 tpd7 I I I I Conditions 3/ I Group

21、A Device1 Limits IUnit -55C .uzo (1.51 .03U O. 76 .MO, 1.02 .O45 1.14- .O55 1.40 .o60 1.52 .O64 l.6X Inches m. .a85 2.16 .a90 2.29 .35 8.89 .390 9.91 .9L 23.11. .930 23.62 1.690 42.93. .mo 19.81 ,880 2z.s 1.570 39.88 2. Metric equivalents are. given far general information.unly. DESCL FQRRM Irta$ ri

22、 ,S GOVERNMEM PiNTINGOFiWF 3988-550-547 SEP) 8T Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3 DESC-DWG-88bL2 REV A 57 H 7777795 0020807 8 H - CASE Z k.600 ElSc i .760 , ,740 Inches mm .O03 0.08 ,006 0.15 .O15 0.38 .O22 0.56 .O28 0.71 .O45 1.14 .O

23、50 1.27 ,054 1.37 .O55 1.40 .O64 1.63 Inches ,065 .O75 ,077 .O93 .300 .600 .660 .740 ,760 mm 1.65 1.90 1.96 2.36 7.62 5.24 6.76 8.80 9.30 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. FIGURE 1. Case outlines - Continued, SIZE 5962-88612 STANDARDIZE

24、D MILITARY DRAWING A I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I SHEET I RNISIoNLEVEL A 15 . . ii U.S. QOVERNMENT PRINTiNQ OFFICE: lW-5S3-547 DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-88612 REV A 57 W

25、 7777775 0020808 T = c I I I Device I Al 1 I types I I I I I I Case I X I Y I outlines I I I I I Terminal I Terminal symbol I Z.and u I number I I 1 I I1 12 13 14 15 16 17 18 19 I 10 I 11 I 12 I 13 I 14 I I5 I 16 I 17 I 18 I 19 I 20 I 21 I 22 I 23 I 24 I 25 L 26 I 27 I 28 I 29 L 30 I 31 I 32 I i. I

26、I I I Device I Al 1 I types I I I I .I I Case I X I Y I 2 and U I I ou-lines. I ,I ,.,. !. I I I I I Terminal I Termi ml symbol I I. . number . I. _ . . . - I I I l -. . . _ I- i 33 I 34 I 35 I 36 I 37 I 38 I 39 I 41 I 42 I 43 I 44 I 45 I 46 I 47 I 48 I 49 I 51 I 52 I 53 I 54 I 55 I 56 I 57 I 58 I 5

27、9 I 60 I 61 I 62 I 63 i 64 t 40 I 50 FIGURE 2. Teminal connections. I I I I I I I i I I l I f I I I I I l l I I I I I F i I I t 1 I i STANDARDIZED MILITARY DRAWING I REVISION LEVEL 1 SHEET A Ia. I: . I I - It U S GOVERNMENT PINTlN6 OFFICE i489 -141033 DESC FORN 193A SEP 81- Provided by IHSNot for Re

28、saleNo reproduction or networking permitted without license from IHS-,-,- DESC-DWG-BBbL2 REV A 57 4 7777775 O020807 L STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 !? .I W SIZE A 5962-8a612 SHEET 17 A REVISION LEVEL o oro L u -+ t -+ I- V ri U.S. QOVERNMENT PRINT

29、IN OFFICE lOW-5WS47 DESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- _- DESC-DWG-Bb12 REV A 57 m 7777975 0020810 m . THREE STATE OUTPUTS “cc y NORMAL OUTPUTS Ri = 300Q 300 n “OUT “OUT 1 cLI NOTES: b, s3 OUTPUT LOAD CIRCUITS R2 =

30、 3 ksl i 1. CL E 50 pF includes scope probe, wiring and stray capacitances without device in test fixture. 2. Si, SE, and S3 are closed during function test and all ac tests except output enable tests, 3. Si and $3 are closed while $2 is open for tpZH test, $1 and S2 are closed while S3 is open for

31、tp L test. 4, CL = 5.0 pF for output disable tests. FIGURE 4. Switching waveforms and test circuits. SIZE 5962-88612 STANDARDIZED MILITARY RRAWING A I REVISION LEVEL 18 !EENSE UE.cTAoNIcs SUPPLY CENTW DAYTON, OHIO 45444 A 1. _. . . . I . . . . ir U. 9 OOVERNMENT PiUMINQ OFFICE 1988-550.547 SC FORM 1

32、93A EP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-/ 3v MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SAME PHASE- INPUT TRANSITION AI 5962-88612 I REVISION LEVEL SHEET A 19 OUTPUT - VOL -j tpd c -1 I/- 3v 1.5 V OPPOSITE

33、 PHASE - INPUT TRANSITION .o v Propagation delay time waveforms. ENABLE 7 DISABLE I3V CONTROL INPUT OUTPUT NORMALLY LOW OUPUT NORMALLY HIGH x 1.5 V Output enable and disable times waveforms. NOTE: Diagram shown for input enable-low and input control disable-high. FIGURE 4. Switching waveforms and te

34、st circuits - Continued. I STANDARDIZED I SIZE I I t U. S. GOVERNMENT PRINTING OFFICE 1989-748-035 SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-8bL2 REV A 57 W 7777775 0020832 3 LO W-H IGH-LO W PULSE - 7 1.5 V HIGH-LOW-HIGH - PULSE

35、 Pulse wldth timing diagram. 1 -ONE CYCLE Setup and hold time waveforms. FIGURE 4. Switching waveforms and test circuits - Continued. SIZE 5962-88612 STANDARDIZED MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 A 29 ;SC FORM 193A SEP 87 i U. S. QOVERNMENT

36、 PRINTING OFFICE- 1889-749033 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I DESC-DWG-BbL2 REV A 57 M 7777775 0020L3 - 3 = k- ONE CYCLE _fl I , I I -lw- I I - IEN DISABLE WRITE - IEN ENABLE WRITE DLE I -%i2 -4- th12-4 - SRE I Y (INPUT) P-iST CYCLE

37、+2ND CYCLE -4 - IEN IO - 15 = INSTRUCTIONS O - 15 = DATA - Dont care h449 - High-to-low transition only Setup and hold time waveforms FIGURE 4. Switching waveforms and test circuits - Continued. SIZE 5962-88612 STANDARDIZED MILITARY DRAWING A I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 A

38、I REVISION LEVEL fSC FORM 193A t U. S. GOVERNMENT PRINTING OFFKE: 1888-550-547 SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- DESC-DWG-BBb12 REV AS7 7777775 0020834 5 _. . . - . TABLE II. Electrical test requirements. I .- I I MIC-STO-883 te

39、st requirements I Subgroups I I (per method I I 5005, table I) I I I I I I i I I I I interim electrical parameters I -c I (method 5004) I I I I I Final electrical test parameters I 1*, 2, 3, 7, 8, I I (method 5004) I 9, 10, Il I .I I I Group A test requirements 1 1, 2, 3, 4s 79 I I (method 5005) I 8

40、, 9, 10, 11 /I I I -“ 1 lY 29 3y 7, I I Groups C and D end-point I electrical parameters * PRA applies to subgroup 1, I (method 5095) . ,_ I I 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-38SIU. .- - 6. NOTES 6.1 Intended use. Microcircult

41、s conforming to this drawing are intended for use when military specifications do not exist and qualified militar devices that wi1.l perform the required function are not available for OEM applfcation. When a mifitary speclfieatlon exists and the product coverecl by this drawing has been qualified f

42、or listing on QPL-38510, the device specified herein will be inactivated and will not be used for new design. The QPL-38510 product shall be the preferred Stem for all applications. 6.2 Re Iaceability. MicrocSrcuits covered by this drawing will replace the same generic device 6.3 Configuration contr

43、ol of SMRs, All proposed changes to existing SMDs will be coordinated covered ae-, y a contrac or-prepared specification or drawing. dith th% users of record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-481 uslng DD Form 1693, Engineering Change Pro

44、posal (Short Form), Center when a system application requires configuration control and the applicable SMD. DESC will neintain d record of users and this ist wfll be used for Goordingtion and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) shou

45、ld contact 3ESC-ECC, telephone (513) 296-8525. 6.5 Comments. Comments on this drawing should be directed to DESC-ECC, Dayton, Ohio 45444, or telephom 296-8525. 6.6 Pin functions. Microcircuits conforming to this drawing shall have pin functions as cpecifiZXT6ETI herein. 6.4 Record of users. Military

46、 and industrial users shall inform Defense Electronics Supply .I “. -. ? - .- ; SIZE gm8aau STANDARDIZED MILITARY DRAWING A, DEFENSE ELECTRONICS SUPPLY CENTER DAWN, OH0 45444 ._ . - ESC FORM 193A SEP 87 ii U. S. GOVERNMENT PRItfflNG OFFICE- 1989-7L-033 Provided by IHSNot for ResaleNo reproduction or

47、 networking permitted without license from IHS-,-,- DESC-DWG-b12 REV A 57 7777775 0020815 7 W STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 TABLE III. Pin functions. I I I I I Pin name I I/O I Functions I I I I I I IClock Pulse I IThe clock input to the device. T

48、he RAM latch is transparent when the I I IData is written into the RAM during the low period of the clock provided I IXN is low and if the instruction being executed designates the RAM as I Ithe destination of operation. The accumulator and status register will I laccept data on the low-high transition of the clock if is also low. I IThe instruction latch becomes transparent when it exits an imnediate I linstruction mode during a low-high transition of the clock. I I